Patents Assigned to Mitutoyo Corporation
-
Publication number: 20250045943Abstract: Three-dimensional geometry measurement apparatuses includes: a first identification part that identifies a primary absolute phase value corresponding to each of a plurality of pixels of a first image capturing part; a second identification part that identifies a secondary absolute phase value corresponding to each of a plurality of pixels of a second image capturing part; a conversion identification part that identifies a conversion value for converting primary coordinates or secondary coordinates; and a geometry identification part that converts the primary coordinates or the secondary coordinates on the basis of the conversion value, and identifies a three-dimensional geometry of an object to be measured on the basis of the converted coordinates.Type: ApplicationFiled: July 24, 2024Publication date: February 6, 2025Applicant: MITUTOYO CORPORATIONInventor: Kaoru MIYATA
-
Publication number: 20250047960Abstract: A variable focal length lens device includes: a variable focal length optical system configured to change a focal length; a beam splitter configured to cause passing light, which is reflected off an object and passes through the variable focal length optical system, to branch into branched beams; an image-forming lens configured to condense the branched beams respectively; an image sensor configured to capture an image of the object by receiving the branched beam condensed by the image-forming lens; and an image sensor configured to capture an image of the object by receiving the branched beam condensed by the image-forming lens. An imaging distance on a first optical axis from the image sensor to the image-forming lens and an imaging distance on a second optical axis from the image sensor to the image-forming lens are different from each other.Type: ApplicationFiled: July 31, 2024Publication date: February 6, 2025Applicant: MITUTOYO CORPORATIONInventors: Yuko SHISHIDO, Koji KUBO, Tatsuya NAGAHAMA
-
Publication number: 20250035430Abstract: A calibration jig which calibrates a measurement apparatus that measures a three-dimensional geometry of a measurement target and includes a plurality of imaging parts that capture the measurement target, the calibration jig including: a plurality of elements to be measured; and a frame part to which the plurality of elements to be measured are attached, wherein each of the plurality of elements to be measured includes a main body part having a predetermined shape; and a plurality of label parts provided on the main body part, wherein an identification code for identifying the elements to be measured is shown on each label part.Type: ApplicationFiled: June 28, 2024Publication date: January 30, 2025Applicant: MITUTOYO CORPORATIONInventors: Ryosuke TANAKA, Yuji SADAHIRA, Takeshi SAEKI
-
Publication number: 20250035431Abstract: A calibration jig that calibrates a measurement apparatus for measuring a three-dimensional geometry of a measurement target, including: a plurality of elements to be measured, a frame part to which the plurality of elements to be measured are attached, and a mechanism part that moves the frame part, wherein the mechanism part includes: a rotation mechanism that rotates the frame part about a first axis; a first swinging mechanism that swings the frame part about a second axis orthogonal to the first axis; and a second swinging mechanism that swings the frame part about a third axis orthogonal to the first axis and the second axis.Type: ApplicationFiled: June 28, 2024Publication date: January 30, 2025Applicant: MITUTOYO CORPORATIONInventors: Ryosuke TANAKA, Hikaru SHIGENO, Yuji SADAHIRA
-
Patent number: 12210722Abstract: A method for specifying a position through touch input in a screen displayed on a touch panel display. The position is specified by acquiring an initial contact position with the touch panel display, displaying a position displaying cursor in a position according to the initial contact position, displaying the position displaying cursor in the position according to the initial contact position during the period for which the contact position sensing continues until the distance from the initial contact position to the contact position reaches a predetermined distance and terminating the display of the position displaying cursor where the contact position sensing is terminated before the distance reaches the predetermined distance, and displaying the position displaying cursor in such a way that the position displaying cursor follows movement of the contact position after the distance reaches the predetermined distance.Type: GrantFiled: April 13, 2023Date of Patent: January 28, 2025Assignee: MITUTOYO CORPORATIONInventors: Gyokubu Cho, Koichi Komatsu, Hiraku Ishiyama
-
Patent number: 12204226Abstract: A metrology system includes front and back vision components portions, and is configured to have a workpiece positioned between the two portions. The back vision components portion includes a light source and a diffuser. The front vision components portion includes a variable focal length lens, an objective lens and a camera. The metrology system includes a movement mechanism portion configured to align relative positions between the front and back vision components portions and an aperture defined through the workpiece such that at least a portion of the light from the light source that passes through the diffuser passes through the aperture for providing the illumination for imaging the aperture. The camera acquires an image stack of images of the aperture at different focus positions. Based on an analysis of the image stack, measurements related to workpiece features of the aperture (e.g., including a distance between workpiece features) can be determined.Type: GrantFiled: May 25, 2023Date of Patent: January 21, 2025Assignee: Mitutoyo CorporationInventors: Paul Gerard Gladnick, Christopher Richard Hamner, Pavel Ivanovich Nagornykh
-
Patent number: 12204073Abstract: A scale includes: a substrate; scale gratings that are formed on a face of the substrate and has a plurality of gratings at a predetermined interval; and a protective layer that is made of fluoride and covers the scale gratings and an exposed portion of the face of the substrate.Type: GrantFiled: April 29, 2021Date of Patent: January 21, 2025Assignee: MITUTOYO CORPORATIONInventor: Toshihiko Aoki
-
Patent number: 12196544Abstract: There is provided a test indicator 100 capable of replacing a stylus 210 with another stylus 210 having a different length to increase a reaching range of the stylus 210, and of increasing a rotation angle of the stylus 210 to display an accurate measurement value in a wide measurement range. A calculation unit 400 of the test indicator 100 includes a stylus-length storage unit 420 that sets and stores a length of the stylus 210, and a stylus-length correction calculation unit 400 that changes, according to the length of the stylus 210, a conversion ratio for converting a detection value by an encoder 340 into a measurement value to correct the measurement value.Type: GrantFiled: April 22, 2022Date of Patent: January 14, 2025Assignee: MITUTOYO CORPORATIONInventor: Tatsushi Terautchi
-
Patent number: 12198419Abstract: A measurement system includes: measurement target information database that stores measurement point information, including measurement conditions and guidance information for each measurement point, associated with the type of the measurement target; a measuring instrument that performs measurements on the measurement target; an image capturing unit that captures an image of a subject; a display unit; a measurement target identification unit that identifies the type of the measurement target based on the image captured by the image capturing unit; a measurement target information obtaining unit for obtaining the measurement point information corresponding to the type of the measurement target identified by the measurement target identification unit from the measurement target information database; and a setting unit that displays the guidance information included in the measurement point information obtained by the measurement target information obtaining unit on the display unit and sets the measurement conType: GrantFiled: November 9, 2021Date of Patent: January 14, 2025Assignee: MITUTOYO CORPORATIONInventors: Takanori Asamizu, Masaaki Shimizu
-
Patent number: 12188768Abstract: An angle detector includes a rotary scale having a scale pattern in which a plurality of patterns are arrayed along a circumference direction of the rotary scale, and a plurality of detection heads, each of which detects the plurality of patterns from the scale pattern. The plurality of detection heads are shifted from each other in the circumference direction of the rotary scale and are shifted from each other in a radial direction of the rotary scale.Type: GrantFiled: August 25, 2022Date of Patent: January 7, 2025Assignee: MITUTOYO CORPORATIONInventors: Shunsuke Tanaka, Yoshiaki Kato, Miyako Mizutani
-
Patent number: 12188765Abstract: A measuring system includes a measuring probe with a contact portion that contacts a workpiece to be measured. The measuring probe operates with a first update rate during at least part of a moving mode, wherein the moving mode includes movement of the measuring probe such that the contact portion is moved away from the workpiece and/or is moved at a distance from the workpiece that is equal to or greater than a threshold distance. The measuring probe operates with a second update rate (i.e., which is faster than the first update rate) during at least part of a measuring mode, wherein the measuring mode includes movement of the measuring probe such that the contact portion is moved toward the workpiece for obtaining a measurement. In various implementations, the combined use of the first and second update rates effectively reduces power-on drift of the measuring probe.Type: GrantFiled: September 7, 2022Date of Patent: January 7, 2025Assignee: Mitutoyo CorporationInventors: Scott Allen Harsila, Bjorn Erik Bertil Jansson, Hiroyuki Kanamori
-
Publication number: 20250005793Abstract: A graduation-plate posture inspection method includes an image data acquiring step of acquiring image data on the graduation plate from the camera, a region calculating step of extracting a first contrast region and a second contrast region in the image data, and a contrast processing step of contrasting the first contrast region with the second contrast region based on brightness or color. The contrast processing step includes calculating a difference between pixel values or luminance values of adjacent pixels in each of the first contrast region and the second contrast region to contrast a magnitude of the difference in the first contrast region with a magnitude of the difference in the second contrast region. The relative posture between the camera and the graduation plate is inspected based on a contrast result in the contrast processing step.Type: ApplicationFiled: June 26, 2024Publication date: January 2, 2025Applicant: MITUTOYO CORPORATIONInventors: Masaaki SHIMIZU, Kasumi KONDO
-
Patent number: 12174005Abstract: A metrology system is provided for use with a movement system that moves an end tool (e.g., a probe). The metrology system includes a sensor configuration, a light beam source configuration and a processing portion. The sensor configuration comprises a plurality of light beam sensors. The light beam source configuration directs light beams to the light beam sensors of the sensor configuration. One of the light beam source configuration or the sensor configuration is coupled to the end tool and/or an end tool mounting configuration of the movement system which moves the end tool. The light beams that are directed to the light beam sensors cause the light beam sensors to produce corresponding measurement signals. A processing portion processes the measurement signals from the light beam sensors which indicate the position and orientation of the end tool.Type: GrantFiled: December 27, 2021Date of Patent: December 24, 2024Assignee: Mitutoyo CorporationInventors: Joseph Daniel Tobiason, Michael Nahum, Norman Laman, Ted Staton Cook
-
Patent number: 12174013Abstract: A measuring probe for a coordinate measuring machine is provided. The measuring probe includes a stylus position detection portion with a sensing coil configuration, signal processing and control circuitry and a temperature dependent compensation portion. The temperature dependent compensation portion includes a temperature dependent component that is coupled to at least part of the sensing coil configuration such that a change in a characteristic of the temperature dependent component due to an increase in temperature of the temperature dependent component causes a ratio of a first current to a second current to increase in the sensing coil configuration, wherein the first and second currents are in at least one first sensing coil and at least one second sensing coil, respectively, of the sensing coil configuration. Such implementations are configured to increase accuracy of the processed signals by at least partially compensating for certain affects that occur due to temperature changes.Type: GrantFiled: December 28, 2022Date of Patent: December 24, 2024Assignee: Mitutoyo CorporationInventors: Christopher Richard Hamner, Scott Allen Harsila
-
Patent number: 12152913Abstract: A preamplifier amplifies signals input to first and second input terminals. A first switching circuit receives first and second input signals and respectively outputs those signals to the first and second input terminals. A switched capacitor circuit samples two signals amplified by the preamplifier. An integration circuit includes a fully differential operational amplifier outputting amplifying differential signals input between third and fourth input terminals between second and first output terminals, and first and second integration capacitors. A second switching circuit switches a connection relationship between the switched capacitor circuit, and the first and second integration capacitors. A third switching circuit switches a connection relationship between the first and second integration capacitors, and third and fourth output terminals.Type: GrantFiled: March 18, 2022Date of Patent: November 26, 2024Assignee: MITUTOYO CORPORATIONInventors: Shu Hirata, Tomohiro Tahara, Akio Kawai, Shun Mugikura
-
Patent number: 12151385Abstract: A measurement system includes a multi-axis robot, a measurement unit coupled to the multi-axis robot, and a data processing apparatus, wherein the measurement unit includes one or more imaging devices movable with respect to a reference position of the multi-axis robot, and a position specification device for specifying a position of one or more of the imaging devices with respect to the reference position, wherein the data processing apparatus includes an acquisition part for acquiring a plurality of pieces of captured image data generated by having one or more of the imaging devices capture images at two or more positions, and a measurement part for measuring a distance between the plurality of feature points in a workpiece on the basis of a position of the feature point of the workpiece included in the plurality of pieces of captured image data.Type: GrantFiled: August 23, 2022Date of Patent: November 26, 2024Assignee: MITUTOYO CORPORATIONInventor: Naoki Mitsutani
-
Patent number: 12148286Abstract: A measuring device includes a measured value obtainer, a display device configured to display a measured value obtained by the measured value obtainer, an illumination device configured to emit a light to the display device, a measurement state obtainer configured to obtain information regarding a state in which a measured value is obtained by the measured value obtainer, and an illumination color changer configured to change a color of the light in accordance with a measurement state obtained by the measurement state obtainer.Type: GrantFiled: April 30, 2021Date of Patent: November 19, 2024Assignee: MITUTOYO CORPORATIONInventors: Nobuyuki Hayashi, Takefumi Kiwada, Aki Hiroshima
-
Patent number: 12140452Abstract: There is provided a displacement measuring apparatus capable of being used in a vacuum environment. The displacement measuring apparatus includes a scale and a detection head part disposed in such a manner as to be relatively displaceable to the scale and as to face the scale with a predetermined gap. The detection head part detects a displacement or position relative to the scale. The scale is disposed in a vacuum. The detection head part is housed in a housing holder separating an atmospheric environment side from a vacuum environment side. In a gap between the detection head part and the scale, the housing holder includes a relay means for passing a detection signal between the detection head part and the scale.Type: GrantFiled: January 31, 2022Date of Patent: November 12, 2024Assignee: MITUTOYO CORPORATIONInventor: Masataka Yamamuro
-
Patent number: 12130125Abstract: A method provides distance calibration data for a chromatic range sensor system with a chromatic range sensor optical pen configured to focus different wavelengths at different distances along a distance measurement axis. The chromatic range sensor optical pen is arranged in a relationship relative to a spherical calibration object that has a nominally spherical calibration surface. Relative movement of the chromatic range sensor optical pen in relation to the nominally spherical calibration surface is controlled so as to perform a spiral scan of a portion of the nominally spherical calibration surface. Distance indicating data is determined as corresponding to the distances between the chromatic range sensor optical pen and surface points on the nominally spherical calibration surface as the spiral scan is performed. Distance calibration data for the chromatic range sensor system is determined based on the distance indicating data.Type: GrantFiled: October 13, 2021Date of Patent: October 29, 2024Assignee: Mitutoyo CorporationInventor: Pavel Ivanovich Nagornykh
-
Publication number: 20240346694Abstract: An automatic measuring system includes a measuring sensor tool that detects a surface of an object to be measured to measure a dimension or a shape of the object to be measured, a moving mechanism that relatively moves the measuring sensor tool with respect to the object to be measured, and an observation camera that images the object to be measured. A position and an orientation (posture) of a point to be measured are acquired from image data obtained by imaging the object to be measured by the observation camera, the measuring sensor tool is caused by the moving mechanism to approach the point to be measured, taking into account a position and posture offset between the observation camera and the measuring sensor tool, and a measurement value of the point to be measured is acquired by the measuring sensor tool.Type: ApplicationFiled: April 10, 2024Publication date: October 17, 2024Applicant: MITUTOYO CORPORATIONInventors: Daisuke SAKAI, Seiji SASAKI, Kunio UEDA