Patents Assigned to Mitutoyo Corporation
  • Publication number: 20220373316
    Abstract: A surface texture measuring machine includes: a parameter setting unit configured to set one or more parameters related to a surface texture of a workpiece; a measurement unit configured to calculate a measurement value corresponding to each of the parameters on the basis of displacement measurement data obtainable by scanning a surface of the workpiece or a master workpiece; a judgment value calculation unit configured to calculate a judgment value corresponding to each of the parameters with an assumption that the measurement value of the master workpiece is defined as a reference value and a value having a predetermined ratio relative to the reference value is defined as a tolerance; and a judgment unit configured to compare the measurement value of the workpiece and the judgment value for each of the parameters.
    Type: Application
    Filed: May 23, 2022
    Publication date: November 24, 2022
    Applicant: MITUTOYO CORPORATION
    Inventor: Hiroomi HONDA
  • Patent number: 11506518
    Abstract: The photoelectric rotary encoder includes: a generally disk-shaped scale with a grating-like pattern formed with a predetermined period along a measurement direction, the measurement direction being a direction of rotation of a measurement target that rotates on a predetermined axis, the scale being plate-like and centered on an axis of rotation; and a head that detect, from the scale, the amount of displacement caused by the rotation of the measurement target. The head includes a light source, a diffraction unit with grating parts, and a light-receiving unit with light-receiving elements. The grating parts of the diffraction unit are formed as deformed grating parts that spread cut wide, from the center on the axis of rotation, along the grating-like pattern of the scale. The light-receiving elements are formed as linear grating parts.
    Type: Grant
    Filed: November 18, 2021
    Date of Patent: November 22, 2022
    Assignee: MITUTOYO CORPORATION
    Inventors: Yoshiaki Kato, Miyako Mizutani
  • Patent number: 11506490
    Abstract: A method for filtering a measurement data set usable for specifying and/or verifying an internal feature of a workpiece, the method includes providing a measurement data set comprising a plurality of measurement points of the internal feature; providing an auxiliary feature representing an ideal estimate for the internal feature of the workpiece; mirroring each measurement point of the measurement data set on a boundary element of the auxiliary feature, thereby generating a first modified data set comprising a plurality of first modified measurement points; determining a convex hull of the first modified measurement points and projecting the first modified measurement points onto the determined convex hull, thereby generating a second modified data set comprising a plurality of second modified measurement points; and mirroring each second modified measurement point on the boundary element of the auxiliary feature, thereby generating a filtered measurement data set comprising a plurality of filtered measuremen
    Type: Grant
    Filed: June 16, 2021
    Date of Patent: November 22, 2022
    Assignees: MITUTOYO CORPORATION, MITUTOYO EUROPE GMBH
    Inventor: Till Martin Bruckdorfer
  • Patent number: 11499821
    Abstract: A gauge inspection jig for performing an inspection easily and accurately in a reverse posture with a contact point facing upward when a gauge is inspected. The gauge inspection jig includes a body portion and a coupling portion. The body portion holds a member mounted to a body portion of the gauge. This holds the gauge in the reverse posture. The coupling portion is coupled to the body portion. The coupling portion is couplable to a distal end of a measurement spindle disposed on a gauge inspector to be movable in a measurement axis direction.
    Type: Grant
    Filed: February 28, 2020
    Date of Patent: November 15, 2022
    Assignee: Mitutoyo Corporation
    Inventors: Teppei Ohno, Mao Kikuchi
  • Patent number: 11499817
    Abstract: A coordinate measuring machine (CMM) system is provided including utilization of a vision probe (e.g., for performing operations for determining and/or measuring surface profiles of workpieces, etc.) The angular orientation of the vision probe may be adjusted using a rotation mechanism so that the optical axis of the vision probe is directed toward an angled surface of a workpiece (e.g., in some implementations the optical axis may be approximately perpendicular to the angled workpiece surface). X-axis, y-axis and z-axis slide mechanisms (e.g., moving in mutually orthogonal directions) may in conjunction move the vision probe to acquisition positions along an image stack acquisition axis (which may approximately coincide with the optical axis) for acquiring a stack of images of the angled workpiece surface. Focus curve data may be determined from analysis of the image stack, which indicates 3-dimensional positions of surface points on the angled surface of the workpiece.
    Type: Grant
    Filed: May 29, 2020
    Date of Patent: November 15, 2022
    Assignee: Mitutoyo Corporation
    Inventor: Travis Matthew Eiles
  • Patent number: 11493324
    Abstract: It is an object of the present invention to provide a measuring apparatus capable of easily grasping a tracking state of a target and performing an efficient measurement. One aspect of the present invention is a measuring apparatus that emits a light beam toward a target, captures and tracks the target, and measures the three-dimensional coordinates of the target. The measuring apparatus comprises: a light source for emitting light beam; an angle control unit for controlling the emission angle of the light beam emitted from the light source so as to track the moving target; a display unit that provided on a device that is wearable by a measurer; a calculation unit for calculating the three-dimensional coordinates of the target based on the emission angle of the light beam and the light returning from the target; and a display control unit that controls information displayed on the display unit based on the three-dimensional coordinates calculated by the calculation unit.
    Type: Grant
    Filed: June 16, 2020
    Date of Patent: November 8, 2022
    Assignee: MITUTOYO CORPORATION
    Inventors: Kuniyuki Nuka, Motonori Ogihara, Takeshi Kawabata
  • Patent number: 11493329
    Abstract: An optical measuring device includes: an emission device configured to emit a scanning light, of which an optical axis parallelly moves, to an object; a light receiving element configured to perform photoelectric conversion with respect to the scanning light after passing over the object; a calculation device configured to calculate, from a voltage wave obtained from time change of an electrical signal that is output by the light receiving element, a distance corresponding to a time range from a first edge with respect to a voltage value where the scanning light is not interrupted by the object and a second edge with respect to a voltage value where the scanning light is interrupted by the object, when a part of the scanning light is interrupted by the object for the time range.
    Type: Grant
    Filed: March 20, 2020
    Date of Patent: November 8, 2022
    Assignee: Mitutoyo Corporation
    Inventors: Ryoichi Imaizumi, Ichiro Taniguchi
  • Patent number: 11493330
    Abstract: A method for measuring a height map of a test surface having a varying reflectivity using a multi-sensor apparatus including a pre-scan sensor and a height measuring sensor is disclosed. The multi-sensor apparatus further comprises one or more light sources configured to illuminate the test surface and a spatial light modulator. The spatial light modulator is placed in a light path between the one or more light sources and a measuring location of the multi-sensor apparatus and is configured to modulate light emitted from at least one of the light sources. The method comprises performing a measurement for determining an illumination intensity map of the test surface and a measurement for performing a height map of the test surface.
    Type: Grant
    Filed: December 11, 2020
    Date of Patent: November 8, 2022
    Assignee: MITUTOYO CORPORATION
    Inventors: Hendrik Ketelaars, Adriaan Tiemen Zuiderweg, Lukasz Redlarski, John Quaedackers
  • Publication number: 20220349694
    Abstract: An abnormality determination apparatus includes a data acquisition part that acquires position data indicating a plurality of positions to be measured of a standard gage used in a coordinate measuring apparatus, in association with apparatus identification information for identifying the coordinate measuring apparatus, a generation part that generates distance data indicating a distance to be measured that is a distance between the plurality of positions to be measured indicated by the position data, a storage that stores an appropriate range in which the distance data is determined to be appropriate, and a determination part that determines whether there is an abnormality in the coordinate measuring apparatus on the basis of whether or not the distance to be measured indicated by the distance data is included in the appropriate range, and outputs a determination result in association with the apparatus identification information.
    Type: Application
    Filed: April 13, 2022
    Publication date: November 3, 2022
    Applicant: MITUTOYO CORPORATION
    Inventors: Yo TERASHITA, Yuuto KARASAWA, Akira TAKADA, Shinji HASHIMOTO, Takuya KOMADA
  • Patent number: 11486694
    Abstract: A chromatic range sensor (CRS) system is provided that determines a workpiece thickness and includes an optical pen, an illumination source, a wavelength detector and a processing portion. The optical pen includes an optics portion providing axial chromatic dispersion, the illumination source is configured to generate multi-wavelength light and the wavelength detector includes a plurality of pixels distributed along a measurement axis. In operation, the optical pen inputs a spectral profile from the illumination source and outputs corresponding radiation to first and second workpiece surfaces of a workpiece (e.g., which may be transparent) and outputs reflected radiation to the wavelength detector which provides output spectral profile data. The processing portion processes the output spectral profile data to determine a thickness of the workpiece.
    Type: Grant
    Filed: December 18, 2020
    Date of Patent: November 1, 2022
    Assignee: Mitutoyo Corporation
    Inventor: Norman Laman
  • Patent number: 11486735
    Abstract: An electromagnetic inductive encoder that can suppress the effect of changes in magnetic flux received by the receiver section and maintain the accuracy of measurement results is provided. The electromagnetic inductive encoder 1 includes a scale 2 and a head 3 that is provided to face the scale 2 and moves relative to the scale 2. The head 3 includes a transmitter section 4 and a receiver section 5 with a plurality of receiving coils 500. The receiver section 5 has a first receiver section 51 with at least one receiving coil 500, a second receiver section 52 that is provided apart from the first receiver section 51 and has at least one receiving coil 500 different from the first receiver section 51, and connection wiring 53 that connects the first receiver section 51 and second receiver section 52.
    Type: Grant
    Filed: October 7, 2021
    Date of Patent: November 1, 2022
    Assignee: MITUTOYO CORPORATION
    Inventor: Miyako Mizutani
  • Publication number: 20220341733
    Abstract: There is provided a test indicator 100 capable of replacing a stylus 210 with another stylus 210 having a different length to increase a reaching range of the stylus 210, and of increasing a rotation angle of the stylus 210 to display an accurate measurement value in a wide measurement range. A calculation unit 400 of the test indicator 100 includes a stylus-length storage unit 420 that sets and stores a length of the stylus 210, and a stylus-length correction calculation unit 400 that changes, according to the length of the stylus 210, a conversion ratio for converting a detection value by an encoder 340 into a measurement value to correct the measurement value.
    Type: Application
    Filed: April 22, 2022
    Publication date: October 27, 2022
    Applicant: MITUTOYO CORPORATION
    Inventor: Tatsushi TERAUTCHI
  • Patent number: 11480420
    Abstract: A computer-implemented method for determining a two-point size of a workpiece includes receiving a set of measuring points of the workpiece, determining a longitudinal axis of the workpiece based on the set of measuring points, projecting at least a part of the set of measuring points into a projection plane perpendicular to the longitudinal axis to obtain a set of projection points, and determining a two-point size of the workpiece based on the projection point.
    Type: Grant
    Filed: December 2, 2020
    Date of Patent: October 25, 2022
    Assignees: MITUTOYO CORPORATION, MITUTOYO EUROPE GMBH
    Inventors: Erich Otto Putnik, Till Martin Bruckdorfer
  • Publication number: 20220333920
    Abstract: A calibration method includes: measuring, with a CMM, a ball-to-ball distance of a plurality of edges of an inspection gauge installed in a first posture, a second posture and a third posture, and calculating a calibration value calibrating a ball-to-ball distance between two balls at respective ends of a plurality of edges of the inspection gauge by solving simultaneous equations including the ball-to-ball distance of the plurality of edges of the inspection gauge installed in the first posture, the ball-to-ball distance of the plurality of edges of the inspection gauge installed in the second posture, the ball-to-ball distance of the plurality of edges of the inspection gauge installed in the third posture, and a measurement error of the CMM at the measurement position.
    Type: Application
    Filed: March 14, 2022
    Publication date: October 20, 2022
    Applicant: MITUTOYO CORPORATION
    Inventors: Yuto INOUE, Masayuki NARA
  • Patent number: 11474285
    Abstract: A variable focal length lens device includes: a lens system of a liquid resonant type whose refractive index is changed in response to a drive signal to be inputted; a temperature sensor configured to acquire temperature information of the lens system; and a drive controller configured to control the lens system. The drive controller includes: a resonant frequency estimation unit configured to calculate an estimated value of a resonant frequency of the lens system on a basis of the temperature information; and a starting frequency setting unit configured to set a starting frequency of the lens system on a basis of the estimated value of the resonant frequency.
    Type: Grant
    Filed: January 5, 2021
    Date of Patent: October 18, 2022
    Assignee: MITUTOYO CORPORATION
    Inventors: Shiro Igasaki, Yuki Kurahashi
  • Patent number: 11466971
    Abstract: There is provided an automatic measurement device that automates a contact type measuring instrument, which is inexpensive and good usability. An automatic measurement device includes a measuring instrument support base portion that supports a measuring instrument and a workpiece holding base portion that holds a workpiece in a measurement region of the measuring instrument. The measuring instrument support base portion includes a measuring instrument holder that holds a fixed element of the measuring instrument and an automatic operation unit attachable to and detachable from the measuring instrument. The automatic operation unit is configured to automate advance and retreat of the movable element of the measuring instrument by a power from a motor.
    Type: Grant
    Filed: April 12, 2021
    Date of Patent: October 11, 2022
    Assignee: MITUTOYO CORPORATION
    Inventors: Masashi Yamaji, Hideyuki Morimoto, Kazuma Sorada
  • Patent number: 11466976
    Abstract: In a method and system for measuring a height map of a surface of an object, the following steps are carried out. Height maps of different sections of the surface of the object are measured, using an optical profilometer having a field of view covering an individual section, wherein each height map comprises height data. The measured height maps are grouped into different sets of height maps, wherein within each set each one of the height maps of the set has a valid overlap to at least one other height map of the set, and wherein each height map belongs to one set and does not have a valid overlap with any height map of another set. Within each set, the measured height maps are stitched to a sub-composite stitched height map. The sub-composite stitched height maps are combined to a composite height map.
    Type: Grant
    Filed: January 15, 2019
    Date of Patent: October 11, 2022
    Assignee: MITUTOYO CORPORATION
    Inventor: Johannes Anna Quaedackers
  • Patent number: 11467384
    Abstract: A telecentric optical apparatus that is capable of suppressing an increase in the number of components as well as achieving high precision optical axis alignment, is provided. The telecentric optical apparatus of the present invention is characterized in that it is provided with: a first telecentric lens surface that is provided on an object side; a second telecentric lens surface that is provided on an image side and that shares a focus position with the first telecentric lens surface; and an optical path trimming part that is provided, between the first telecentric lens surface and the second telecentric lens surface, in an outside region, which is located on a side further out than a light passing region having a center thereof located at the focus position, and that changes an optical path such that a light beam incident on the outside region is prevented from contributing to image formation.
    Type: Grant
    Filed: November 11, 2019
    Date of Patent: October 11, 2022
    Assignee: MITUTOYO CORPORATION
    Inventors: Kenji Okabe, Tatsuya Nagahama, Toru Yaku, Kimitoshi Ono
  • Publication number: 20220318537
    Abstract: Facilitate the work of setting the part program used in the measuring device for each object to be measured. A measurement control apparatus of the present invention includes a code reader that reads a code containing at least a part program identification information, and a measurement information providing unit that, when the code is read by the code reader, sends a start command of a part program corresponding to the part program identification information recorded in the code to a measuring device, and causes the measuring device to execute processing according to the part program prepared in advance.
    Type: Application
    Filed: April 1, 2022
    Publication date: October 6, 2022
    Applicant: MITUTOYO CORPORATION
    Inventors: Takayuki ISHIOKA, Kenta FUJIOKA
  • Patent number: 11460324
    Abstract: A scale includes a plurality of conductors that are arrayed in a given interval along a measurement axis, wherein each of the plurality of conductors has projection portions, each of which projects toward each side of the measurement axis, and wherein at least a part of each of the projection portions has a curve projecting in the measurement axis.
    Type: Grant
    Filed: November 19, 2020
    Date of Patent: October 4, 2022
    Assignee: MITUTOYO CORPORATION
    Inventor: Hiroto Kubozono