Patents Assigned to Mitutoyo Corporation
  • Patent number: 11948321
    Abstract: A three-dimensional geometry measurement apparatus including: a preliminary measurement part that creates a plurality of pieces of preliminary measurement data indicating three-dimensional coordinates of a reference point on a reference instrument; a reference data creation part that creates reference data; a calculation part that calculates a correction value on the basis of the reference data and the preliminary measurement data which does not match the reference data; a target measuring part that creates target measurement data indicating results of measuring a measurement point of the object to be measured; a correction part that corrects the target measurement data in the measurement system corresponding to the preliminary measurement data that does not match the reference data, on the basis of the correction value; and a geometry identification part that identifies a geometry of the object to be measured using the corrected target measurement data.
    Type: Grant
    Filed: November 30, 2020
    Date of Patent: April 2, 2024
    Assignee: MITUTOYO CORPORATION
    Inventor: Kaoru Miyata
  • Publication number: 20240077292
    Abstract: A one dimensional measuring machine includes a scale having graduations, a mover that has a light source configured to emit light to the graduations of the scale and a light receiving element configured to receive the light having passed through the scale from the light source, and can move along the scale, a light amount information detector that detects information regarding a light amount of the light emitted to the scale from the light source while the mover moves along the scale, and a contamination detector that detects a degree of contamination of the scale, based the information regarding the light amount of the light detected by the light amount information detector.
    Type: Application
    Filed: August 16, 2023
    Publication date: March 7, 2024
    Applicant: MITUTOYO CORPORATION
    Inventor: Ryunosuke YANO
  • Patent number: 11924938
    Abstract: An illuminator includes: a light emitter including a light-emitting diode; a temperature sensor configured to detect a current temperature of the light emitter; and an illumination controller configured to adjust a drive voltage being supplied to the light emitter in accordance with the current temperature. The illumination controller includes a reference temperature storage in which a reference temperature is stored in advance and is configured to adjust the drive voltage by detecting the current temperature from the temperature sensor on a constant time cycle and comparing the current temperature with the reference temperature.
    Type: Grant
    Filed: June 13, 2022
    Date of Patent: March 5, 2024
    Assignee: MITUTOYO CORPORATION
    Inventors: Tadashi Yamazaki, Yuto Konno, Hideki Morita, Nobuya Kaneko, Satoru Hirasawa
  • Patent number: 11892362
    Abstract: There is provided a measuring device (dial gauge) capable of performing measurement with a desired measuring force regardless of the posture of the measuring device. A dial gauge in an exemplary embodiment of the present invention includes a measuring force adjustment unit provided to a body case and capable of moving and being positioned and fixed in a direction substantially parallel to a moving direction of a spindle. A biasing means has one end directly or indirectly engaged with the spindle and the other end directly or indirectly engaged with the measuring force adjustment unit, and biases the spindle toward a tip end. The measuring force adjustment unit includes an external thread portion and a connection supporting member having one end screwed with the external thread portion and the other end coupled to the biasing means.
    Type: Grant
    Filed: August 3, 2021
    Date of Patent: February 6, 2024
    Assignee: MITUTOYO CORPORATION
    Inventors: Yuichi Ichikawa, Osamu Saito
  • Publication number: 20240035816
    Abstract: An automatic measuring device includes a micrometer including a spindle that moves forward and backward to be brought into contact with or away from a workpiece and a displacement detector unit that detects displacement of the spindle, and an automatic operation unit that automates the forward and backward movement of the spindle by power. The automatic operation unit performs a first forward-movement step of moving the spindle forward to bring the spindle into contact with the workpiece, and a contact determination step of determining the contact between the spindle and the workpiece in the first forward-movement step. In the contact determination step, the spindle is determined to be in contact with the workpiece when a change in a position of the spindle detected by the displacement detector unit in the first forward-movement step becomes equal to or less than a predetermined contact determination threshold.
    Type: Application
    Filed: July 27, 2023
    Publication date: February 1, 2024
    Applicant: MITUTOYO CORPORATION
    Inventors: Keita OGAWA, Shuji HAYASHIDA, Masashi YAMAJI
  • Patent number: 11885879
    Abstract: A measurement apparatus includes a laser apparatus, a branch that branches a frequency-modulated laser beam into a reference light and a measurement light, a beat signal generator that generates a beat signal by mixing the reference light and a reflected light that is the measurement light radiated onto an object to be measured, a first analyzer that analyses a first signal component corresponding to a difference in a propagation distance between the reference light and the measurement light on the basis of the beat signal, a second analyzer that analyses a second signal component corresponding to a cavity frequency of an optical cavity on the basis of the beat signal, and calculation circuitry that calculates the difference in the propagation distance between the reference light and the measurement light.
    Type: Grant
    Filed: August 19, 2020
    Date of Patent: January 30, 2024
    Assignee: Mitutoyo Corporation
    Inventors: Yoshimasa Suzuki, Shinichi Hara, Hiroki Ujihara
  • Patent number: 11879975
    Abstract: A measurement apparatus including: a laser that outputs a frequency-modulated laser beam; a branch that splits the frequency-modulated laser beam into a reference light and a measurement light; a beat signal generator that generates a beat signal by mixing the reference light and a reflected light that is reflected by radiating the measurement light onto an object to be measured; a frequency analyzer that frequency-analyzes the beat signal; a storage that stores a reference frequency signal which is a frequency signal obtained by converting a reference signal output by the beat signal generator in a state without the object to be measured; and calculation circuitry that calculates a difference between propagation distances of the reference light and the measurement light.
    Type: Grant
    Filed: August 9, 2021
    Date of Patent: January 23, 2024
    Assignee: Mitutoyo Corporation
    Inventors: Shinji Komatsuzaki, Yoshimasa Suzuki, Tomotaka Takahashi
  • Patent number: 11867809
    Abstract: A measurement apparatus includes a laser apparatus, a branching part that branches a frequency-modulated laser beam output by the laser apparatus into a reference light and a measurement light; a beat signal generation part that generates a beat signal by mixing a reflected light and the reference light, a conversion part that converts the beat signal into a digital signal at a first sampling rate and frequency-analyses it, an extraction part that extracts a signal component corresponding to a cavity frequency from the frequency-modulated laser beam, a digital filter that digitally filters the extracted signal component at a second sampling rate; and a calculation part that calculates a difference in a propagation distance between the reference light and the measurement light.
    Type: Grant
    Filed: July 6, 2020
    Date of Patent: January 9, 2024
    Assignee: Mitutoyo Corporation
    Inventors: Yoshimasa Suzuki, Shinichi Hara, Shinji Komatsuzaki, Ryusuke Kato, Hiroki Ujihara, Masayuki Nara, Tomotaka Takahashi
  • Patent number: 11860602
    Abstract: A system is provided for programming workpiece feature inspection operations for a coordinate measuring machine. The system includes a user interface with a simulation portion (e.g., including a 3D view of a workpiece) and an editing user interface portion (e.g., including an editable plan representation of a current workpiece feature inspection plan). Transparency operations are performed including automatically identifying as a target feature a workpiece feature in the 3D view that corresponds to a workpiece feature or inspection operation representation in the editable plan representation that is indicated by a current feature-directed operation (e.g., a selection operation for selecting a workpiece feature or inspection operation in the editable plan representation). An occluding workpiece feature that would otherwise be occluding at least a portion of the target feature in the 3D view is then automatically rendered as at least partially transparent in the 3D view.
    Type: Grant
    Filed: December 10, 2018
    Date of Patent: January 2, 2024
    Assignee: Mitutoyo Corporation
    Inventors: Dahai Yu, Barry Saylor, Kai Kircher
  • Publication number: 20230384495
    Abstract: A grating part includes a first transparent substrate having an optical grating on a surface thereof, a second transparent substrate having an optical grating on a surface thereof, and a spacer positioned between the first transparent substrate and the second transparent substrate, the spacer bonding the first transparent substrate and the second transparent substrate.
    Type: Application
    Filed: August 11, 2023
    Publication date: November 30, 2023
    Applicant: MITUTOYO CORPORATION
    Inventors: Toshihiko AOKI, Kosaku MIYAKE
  • Patent number: 11823006
    Abstract: Facilitate the work of setting the part program used in the measuring device for each object to be measured. A measurement control apparatus of the present invention includes a code reader that reads a code containing at least a part program identification information, and a measurement information providing unit that, when the code is read by the code reader, sends a start command of a part program corresponding to the part program identification information recorded in the code to a measuring device, and causes the measuring device to execute processing according to the part program prepared in advance.
    Type: Grant
    Filed: April 1, 2022
    Date of Patent: November 21, 2023
    Assignee: MITUTOYO CORPORATION
    Inventors: Takayuki Ishioka, Kenta Fujioka
  • Patent number: 11821724
    Abstract: A digital micrometer includes a main-body frame, a spindle, a thimble part, and a displacement detector that detects displacement of the spindle. The main-body frame includes a U-shaped frame part, and a spindle holding part provided on the other end side of the U-shaped frame part and having a length in a direction away from an anvil. The spindle is held by a spindle holding part, provided to be movable forward and backward in an axial direction with respect to the anvil, and includes a contactor on one end face. The main-body frame and the spindle are formed of a non-magnetic material.
    Type: Grant
    Filed: June 7, 2019
    Date of Patent: November 21, 2023
    Assignee: MITUTOYO CORPORATION
    Inventors: Koji Matsumoto, Yuji Fujikawa, Shinichiro Yanaka, Osamu Saito
  • Patent number: 11808611
    Abstract: A scale includes a base material, scale patterns arranged at a predetermined periodicity on a main surface of the base material, and a fluorine film that covers the scale patterns and is at least partly a monomolecular fluorine compound.
    Type: Grant
    Filed: February 12, 2021
    Date of Patent: November 7, 2023
    Assignees: MITUTOYO CORPORATION, MITUTOYO CORPORATION
    Inventors: Kosaku Miyake, Toshihiko Aoki
  • Patent number: 11801570
    Abstract: A laser processing machine includes: a variable focal length optical system in which a focus position is periodically changed in response to a drive signal to be inputted; a position-detection light source configured to emit a detection light onto a workpiece through the variable focal length optical system; a light detector configured to receive the detection light reflected on the workpiece and output a light detection signal; a signal processor configured to output a synchronization pulse signal in synchronization with the focus timing when the detection light is focused on the surface of the workpiece in accordance with the inputted light detection signal; and a laser oscillator configured to oscillate a pulse laser beam in accordance with the inputted synchronization pulse signal to radiate the pulse laser beam on the workpiece through the variable focal length optical system.
    Type: Grant
    Filed: November 20, 2020
    Date of Patent: October 31, 2023
    Assignee: MITUTOYO CORPORATION
    Inventor: Koji Kubo
  • Patent number: D1001657
    Type: Grant
    Filed: September 7, 2021
    Date of Patent: October 17, 2023
    Assignee: MITUTOYO CORPORATION
    Inventors: Kenji Iwamoto, Ryohei Kanno, Atsushi Hattori, Junsuke Yasuno, Takaharu Imura
  • Patent number: D1008057
    Type: Grant
    Filed: December 10, 2021
    Date of Patent: December 19, 2023
    Assignee: MITUTOYO CORPORATION
    Inventors: Kenji Iwamoto, Yuichi Kikuchi, Masanori Seki
  • Patent number: D1009113
    Type: Grant
    Filed: November 26, 2021
    Date of Patent: December 26, 2023
    Assignee: MITUTOYO CORPORATION
    Inventors: Kenji Iwamoto, Yasushi Fukumoto, Takashi Honma
  • Patent number: D1012740
    Type: Grant
    Filed: April 14, 2022
    Date of Patent: January 30, 2024
    Assignee: MITUTOYO CORPORATION
    Inventors: Keiji Yamada, Kazuki Fujita, Takayuki Yonezawa, Shigemitsu Aoki
  • Patent number: D1013539
    Type: Grant
    Filed: April 14, 2022
    Date of Patent: February 6, 2024
    Assignee: MITUTOYO CORPORATION
    Inventors: Keiji Yamada, Kazuki Fujita, Takayuki Yonezawa, Shigemitsu Aoki
  • Patent number: D1020744
    Type: Grant
    Filed: February 17, 2021
    Date of Patent: April 2, 2024
    Assignee: MITUTOYO CORPORATION
    Inventors: Keisuke Iori, Aoi Shimizu