Radiation thermometer

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Description

FIG. 1 is a front elevational view of a radiation thermometer showing our new design;

FIG. 2 is a rear elevational view thereof;

FIG. 3 is a left side elevational view thereof;

FIG. 4 is a right side elevational view thereof;

FIG. 5 is a top plan view thereof; and,

FIG. 6 is a bottom plan view thereof.

Portions of the figures that are shown as broken lines are for illustrative purpose only and form no part of the claimed design.

Claims

The ornamental design for a radiation thermometer, as shown and described.

Referenced Cited
U.S. Patent Documents
D594891 June 23, 2009 Kaplan et al.
Patent History
Patent number: D613193
Type: Grant
Filed: Apr 3, 2009
Date of Patent: Apr 6, 2010
Assignee: NEC Avio Infrared Technologies Co., Ltd (Tokyo)
Inventors: Michinori Fukuoka (Saitama), Shigeru Machi (Kanagawa)
Primary Examiner: Antoine D Davis
Attorney: Ditthavong Mori & Steiner, P.C.
Application Number: 29/334,899
Classifications
Current U.S. Class: Thermometer (D10/57)