Junction photovoltage probe face
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The broken lines shown of the junction photovoltage probe face in the above
The present design relates to an ornamental object that can be used as an input device for obtaining accurate junction photovoltage measurements of semiconductor wafers for semiconductor wafer testing equipment.
Claims
The ornamental design for a junction photovoltage probe face, as shown and described.
Type: Grant
Filed: Apr 7, 2010
Date of Patent: Sep 27, 2011
Assignee: Abhee 1, L.P. (Los Altos, CA)
Inventors: Yuen Lim (San Jose, CA), Michael Current (San Jose, CA)
Primary Examiner: Antoine D Davis
Application Number: 29/349,483