Sample holder for an electron microscope

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Description

FIG. 1 is a front, top and right side perspective view of a sample holder for an electron microscope showing our/my new design;

FIG. 2 is a front elevational view thereof;

FIG. 3 is a rear elevational view thereof;

FIG. 4 is a left side elevational view thereof;

FIG. 5 is a right side elevational view thereof;

FIG. 6 is a top plan view thereof; and,

FIG. 7 is a bottom plan view thereof.

The broken lines in FIGS. 2-5 and 7 views are included for the purpose of illustrating a portion of the sample holder for an electron microscope that forms no part of the claimed design.

Claims

We claim the ornamental design for a sample holder for an electron microscope, as shown and described.

Patent History
Patent number: D679411
Type: Grant
Filed: Jan 19, 2012
Date of Patent: Apr 2, 2013
Assignee: Hitachi High-Technologies Corporation (Tokyo)
Inventors: Kotaro Hosoya (Hitachinaka), Yoshihiro Takahoko (Hitachinaka)
Primary Examiner: Anhdao Doan
Application Number: 29/411,275