Bench top X-ray fluorescence (XRF) instrument

- Olympus
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Description

FIG. 1 is an isometric view of a bench top x-ray fluorescence (XRF) instrument showing my new design.

FIG. 2 is a front elevation view of the bench top x-ray fluorescence (XRF) instrument.

FIG. 3 is a right-side elevation view of the bench top x-ray fluorescence (XRF) instrument.

FIG. 4 is a rear elevation view of the bench top x-ray fluorescence (XRF) instrument.

FIG. 5 is a bottom plan view of the bench top x-ray fluorescence (XRF) instrument.

FIG. 6 is a left-side elevation view of the bench top x-ray fluorescence (XRF) instrument; and,

FIG. 7 is a top plan view of the bench top x-ray fluorescence (XRF) instrument.

The broken lines shown in the drawings are for the purpose of illustrating portions of the article that form no part of the claimed design.

Claims

The ornamental design for a bench top x-ray fluorescence (XRF) instrument, herein as shown and described.

Referenced Cited
U.S. Patent Documents
D628296 November 30, 2010 Hoshino
D637291 May 3, 2011 Wu et al.
D639948 June 14, 2011 Personnelli
Patent History
Patent number: D702350
Type: Grant
Filed: Feb 1, 2012
Date of Patent: Apr 8, 2014
Assignee: Olympus NDT, Inc. (Waltham, MA)
Inventor: Richard Nasella (Lawrence, MA)
Primary Examiner: T. Chase Nelson
Assistant Examiner: Ania Aman
Application Number: 29/412,249
Classifications
Current U.S. Class: Image Generation Or Radiation Therapy (35) (D24/158)