Sample analyzer

- Sysmex Corporation
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Description

FIG. 1 is a perspective view of a sample analyzer of the present invention;

FIG. 2 is a front view thereof;

FIG. 3 is a rear view thereof;

FIG. 4 is a right side view thereof;

FIG. 5 is a left side view thereof;

FIG. 6 is a top view thereof; and,

FIG. 7 is a bottom view thereof.

The broken lines illustrate unclaimed portions of the sample analyzer and form no part of the claimed design.

Claims

I claim the ornamental design for a sample analyzer, as shown and described.

Referenced Cited
U.S. Patent Documents
D288478 February 24, 1987 Carlson et al.
D338275 August 10, 1993 Fischer et al.
D347478 May 31, 1994 Pinkney
5397537 March 14, 1995 Kanda et al.
D404140 January 12, 1999 Meguro
D405190 February 2, 1999 Pope-Morris
D434153 November 21, 2000 Anderson et al.
D597216 July 28, 2009 McGuigan et al.
D609351 February 2, 2010 Wagener et al.
D681231 April 30, 2013 Steinhauer et al.
Patent History
Patent number: D708757
Type: Grant
Filed: Jun 3, 2013
Date of Patent: Jul 8, 2014
Assignee: Sysmex Corporation (Kobe)
Inventor: Fumie Shibata (Tokyo)
Primary Examiner: Anhdao Doan
Application Number: 29/456,718
Classifications
Current U.S. Class: Specimen Handling, Preparation Or Testing (62) (D24/216)