Test meter

- Arkray, Inc.
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Description

FIG. 1 is a front elevational view of the test meter;

FIG. 2 is a rear elevational view of the test meter;

FIG. 3 is a left elevational view of the test meter;

FIG. 4 is a right elevational view of the test meter;

FIG. 5 is a top plan view of the test meter;

FIG. 6 is a bottom plan view of the test meter;

FIG. 7 is a bottom frontal perspective view of the test meter;

FIG. 8 is a top rear perspective view of the test meter;

FIG. 9 is a left elevational view of the test meter in accordance with an alternative embodiment;

FIG. 10 is a top plan view of the test meter; in accordance with the alternative embodiment; and,

FIG. 11 is a bottom plan view of the test meter in accordance with an alternative embodiment.

The front elevational view, the rear elevational view, the right elevational view, the bottom frontal perspective view, and the top rear perspective view of the test meter in accordance with the alternative embodiment are identical to FIGS. 1, 2, 4, 7 and 8 respectively.

The long-short dashed lines represent the bounds of the claim, and all other broken lines are for the purpose of illustrating unclaimed portions of the test meter. None of the broken lines form a part of the claimed design.

Claims

The ornamental design for a test meter, as shown and described.

Referenced Cited
U.S. Patent Documents
D406895 March 16, 1999 Byrd et al.
D545438 June 26, 2007 Huang et al.
D590063 April 7, 2009 Garthoff et al.
D595415 June 30, 2009 Fukuzawa
D670811 November 13, 2012 Fukuzawa
D690422 September 24, 2013 Oka
D696404 December 24, 2013 Golnik et al.
20110257533 October 20, 2011 Nishiyama
Patent History
Patent number: D724224
Type: Grant
Filed: Feb 28, 2014
Date of Patent: Mar 10, 2015
Assignee: Arkray, Inc. (Kyoto)
Inventors: Hisashi Nishiyama (Kyoto), Yeongkyu Yoo (Seoul), Youngduk Song (Seoul), Sunman Kwon (Seoul)
Primary Examiner: Anhdao Doan
Application Number: 29/483,654
Classifications