Interface for height gauge
Latest MITUTOYO CORPORATION Patents:
- Metrology system with position and orientation tracking utilizing patterns of light beams
- Metrology system utilizing scan lens for points-from-focus type processes
- METHOD FOR AUTOMATICALLY GENERATING A REFERENCE POSITIONING SYSTEM, RPS, ALIGNMENT PROGRAM FOR SHAPE MEASUREMENT OF A WORKPIECE
- Displacement measuring apparatus
- MEASURING INSTRUMENT AND CONNECTION STRUCTURE
Description
The broken lines depict environmental subject matter and form no part of the claimed design.
Claims
The ornamental design for a interface for height gauge, as shown and described.
Referenced Cited
U.S. Patent Documents
| D527665 | September 5, 2006 | Koide et al. |
| D610027 | February 16, 2010 | Li et al. |
| D628107 | November 30, 2010 | Lee |
| D690217 | September 24, 2013 | Sands et al. |
| D708083 | July 1, 2014 | Nardo et al. |
| D710227 | August 5, 2014 | Igelmund |
| D725517 | March 31, 2015 | Jeon |
| D725518 | March 31, 2015 | Jeon |
| D726045 | April 7, 2015 | Jeon |
| D726562 | April 14, 2015 | Jeon |
| 20140240903 | August 28, 2014 | Allore et al. |
| 20140365947 | December 11, 2014 | Karoji |
| 20150046867 | February 12, 2015 | Moore et al. |
Patent History
Patent number: D746164
Type: Grant
Filed: Sep 8, 2014
Date of Patent: Dec 29, 2015
Assignee: MITUTOYO CORPORATION (Kawasaki)
Inventors: Sadayuki Matsumiya (Kawasaki), Shigeru Ohtani (Kawasaki), Yu Sugai (Kawasaki), Kazuhiko Kimura (Utsunomiya), Takashi Gohma (Utsunomiya), Masanori Seki (Utsunomiya)
Primary Examiner: Antoine D Davis
Application Number: 29/501,707
Type: Grant
Filed: Sep 8, 2014
Date of Patent: Dec 29, 2015
Assignee: MITUTOYO CORPORATION (Kawasaki)
Inventors: Sadayuki Matsumiya (Kawasaki), Shigeru Ohtani (Kawasaki), Yu Sugai (Kawasaki), Kazuhiko Kimura (Utsunomiya), Takashi Gohma (Utsunomiya), Masanori Seki (Utsunomiya)
Primary Examiner: Antoine D Davis
Application Number: 29/501,707
Classifications