Analytical measuring instrument
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The broken lines are for illustrating functional features and form no part of the claimed design.
The ornamental design for an analytical measuring instrument, as shown and described.
Filed: Oct 28, 2014
Date of Patent: Feb 2, 2016
Assignee: Mettler-Toledo AG (Greifensee)
Inventors: Patrick Ammon (Brügg), Yves Marmier (La Chaux-de-Fonds), Thibault Escalier (La Chaux-de-Fonds), Roy Liu (Shanghai)
Primary Examiner: Antoine D Davis
Application Number: 29/507,435