Analytical measuring instrument
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Description
The broken lines are for illustrating functional features and form no part of the claimed design.
Claims
The ornamental design for an analytical measuring instrument, as shown and described.
Referenced Cited
U.S. Patent Documents
D453905 | February 26, 2002 | Cheng |
D462024 | August 27, 2002 | Nardo et al. |
D718161 | November 25, 2014 | Derr |
D727764 | April 28, 2015 | Nothacker et al. |
D731341 | June 9, 2015 | Kobayakawa |
D732411 | June 23, 2015 | Waaler et al. |
20100041156 | February 18, 2010 | Brenneman et al. |
20130121875 | May 16, 2013 | Hsu et al. |
Patent History
Patent number: D748509
Type: Grant
Filed: Oct 28, 2014
Date of Patent: Feb 2, 2016
Assignee: Mettler-Toledo AG (Greifensee)
Inventors: Patrick Ammon (Brügg), Yves Marmier (La Chaux-de-Fonds), Thibault Escalier (La Chaux-de-Fonds), Roy Liu (Shanghai)
Primary Examiner: Antoine D Davis
Application Number: 29/507,435
Type: Grant
Filed: Oct 28, 2014
Date of Patent: Feb 2, 2016
Assignee: Mettler-Toledo AG (Greifensee)
Inventors: Patrick Ammon (Brügg), Yves Marmier (La Chaux-de-Fonds), Thibault Escalier (La Chaux-de-Fonds), Roy Liu (Shanghai)
Primary Examiner: Antoine D Davis
Application Number: 29/507,435
Classifications