Analytical measuring instrument

- Mettler-Toledo AG
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Description

FIG. 1 is a front perspective view of the analytical measuring instrument;

FIG. 2 is a top plan view of the FIG. 1 device;

FIG. 3 is a bottom plan view of the FIG. 1 device;

FIG. 4 is a left side elevation view of the FIG. 1 device;

FIG. 5 is a right side elevation view of the FIG. 1 device;

FIG. 6 is a rear elevation view of the FIG. 1 device; and,

FIG. 7 is a front elevation view of the FIG. 1 device.

The broken lines are for illustrating functional features and form no part of the claimed design.

Claims

The ornamental design for an analytical measuring instrument, as shown and described.

Referenced Cited
U.S. Patent Documents
D453905 February 26, 2002 Cheng
D462024 August 27, 2002 Nardo et al.
D718161 November 25, 2014 Derr
D727764 April 28, 2015 Nothacker et al.
D731341 June 9, 2015 Kobayakawa
D732411 June 23, 2015 Waaler et al.
20100041156 February 18, 2010 Brenneman et al.
20130121875 May 16, 2013 Hsu et al.
Patent History
Patent number: D748509
Type: Grant
Filed: Oct 28, 2014
Date of Patent: Feb 2, 2016
Assignee: Mettler-Toledo AG (Greifensee)
Inventors: Patrick Ammon (Brügg), Yves Marmier (La Chaux-de-Fonds), Thibault Escalier (La Chaux-de-Fonds), Roy Liu (Shanghai)
Primary Examiner: Antoine D Davis
Application Number: 29/507,435