Electrical test lead
Latest Danaher (Shanghai) Industrial Instrumentation Technologies R&D Co., Ltd. Patents:
Description
Claims
The ornamental design for an electrical test lead, as shown and described.
Referenced Cited
U.S. Patent Documents
5136234 | August 4, 1992 | Shaw |
D474415 | May 13, 2003 | Kirsch |
9030220 | May 12, 2015 | Laurino et al. |
20090267590 | October 29, 2009 | Atta et al. |
20110309853 | December 22, 2011 | Tan |
20130320962 | December 5, 2013 | Rother et al. |
Patent History
Patent number: D749968
Type: Grant
Filed: Jul 23, 2014
Date of Patent: Feb 23, 2016
Assignee: Danaher (Shanghai) Industrial Instrumentation Technologies R&D Co., Ltd. (Shanghai)
Inventors: Wei Huang (Shanghai), Yurui Shen (Shanghai)
Primary Examiner: Antoine D Davis
Application Number: 29/497,386
Type: Grant
Filed: Jul 23, 2014
Date of Patent: Feb 23, 2016
Assignee: Danaher (Shanghai) Industrial Instrumentation Technologies R&D Co., Ltd. (Shanghai)
Inventors: Wei Huang (Shanghai), Yurui Shen (Shanghai)
Primary Examiner: Antoine D Davis
Application Number: 29/497,386
Classifications