Probe pin

- OMRON Corporation
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Description

FIG. 1 is a top front perspective view of a probe pin showing our new design;

FIG. 2 is a front view thereof;

FIG. 3 is a rear view thereof;

FIG. 4 is a left side view thereof;

FIG. 5 is a right side view thereof;

FIG. 6 is a top view thereof; and,

FIG. 7 is a bottom view thereof.

The shade lines in the figures show contour and not surface ornamentation.

Claims

The ornamental design for a probe pin, as shown and described.

Referenced Cited
U.S. Patent Documents
D229184 November 1973 Brown
D507197 July 12, 2005 Sun
D662895 July 3, 2012 Kimura
D665744 August 21, 2012 Yamauchi
D665745 August 21, 2012 Yamauchi
8366496 February 5, 2013 Hsu
8460010 June 11, 2013 Kimura
8669774 March 11, 2014 Kato
8808038 August 19, 2014 Hwang
9130290 September 8, 2015 Sakai
D749968 February 23, 2016 Huang
D750987 March 8, 2016 Huang
9322846 April 26, 2016 Sakai
Foreign Patent Documents
30-0653160 July 2012 KR
2007/097559 August 2007 WO
Other references
  • Korean Office Action issued in KR Appl. No. 30-2015-0027089.
  • U.S. Appl. No. 29/528,956, filed Jun. 2, 2015; Teranishi et al.
  • U.S. Appl. No. 29/528,960, filed Jun. 2, 2015; Teranishi et al.
Patent History
Patent number: D764331
Type: Grant
Filed: Jun 2, 2015
Date of Patent: Aug 23, 2016
Assignee: OMRON Corporation (Kyoto)
Inventors: Hirotada Teranishi (Osaka), Takahiro Sakai (Moriyama)
Primary Examiner: Antoine D Davis
Application Number: 29/528,958
Classifications