Optical measuring theodolite using light wave

- KABUSHIKI KAISHA TOPCON
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Description

FIG. 1 is a front elevational view of the optical measuring theodolite using light wave;

FIG. 2 is a rear elevational view thereof;

FIG. 3 is a left-side elevational view thereof;

FIG. 4 is a right-side elevational view thereof;

FIG. 5 is a top plan view thereof;

FIG. 6 is a bottom plan view thereof;

FIG. 7 is a front, right-side, top perspective view thereof; and,

FIG. 8 is a rear, left-side, top perspective view thereof.

The broken lines depict environmental subject matter only and form no part of the claimed design.

Claims

The ornamental design for an optical measuring theodolite using light wave, as shown and described.

Referenced Cited
U.S. Patent Documents
D409507 May 11, 1999 Ishii
6354010 March 12, 2002 Shirai
6492806 December 10, 2002 Shirai
D494074 August 10, 2004 Ishii
D526223 August 8, 2006 Ishii
D526588 August 15, 2006 Johansson
D531921 November 14, 2006 Banba
D558075 December 25, 2007 Ishii
D576062 September 2, 2008 Hayamizu
D605959 December 15, 2009 Apotheloz
7764809 July 27, 2010 Ohtomo
8264672 September 11, 2012 Cole
D684068 June 11, 2013 Ishii
D684069 June 11, 2013 Ishii
D723953 March 10, 2015 Ishii
Patent History
Patent number: D768516
Type: Grant
Filed: Jun 11, 2015
Date of Patent: Oct 11, 2016
Assignee: KABUSHIKI KAISHA TOPCON (Tokyo)
Inventor: Takeo Aoki (Tokyo)
Primary Examiner: Antoine D Davis
Application Number: 29/529,899
Classifications
Current U.S. Class: Transit Or Theodolite (D10/66)