Measuring device for measuring in three-dimension

- Kabushiki Kaisha Topcon
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FIG. 1 is a front elevational view of the measuring device for measuring in three-dimension;

FIG. 2 is a rear elevational view thereof;

FIG. 3 is a left side elevational view thereof;

FIG. 4 is a right side elevational view thereof;

FIG. 5 is a top plan view thereof;

FIG. 6 is a bottom plan view thereof;

FIG. 7 is a perspective view thereof; and,

FIG. 8 is a perspective view thereof.

The broken lines depict environmental subject matter only and form no part of the claimed design. The light and shade illustrated by the surface of each figure are intended to identify a three-dimensional surface shape. The circular window part of the front center upper is transparent.


The ornamental design for a measuring device for measuring in three-dimension, as shown and described.

Referenced Cited
U.S. Patent Documents
D563247 March 4, 2008 Ishii
D581819 December 2, 2008 Banba et al.
RE44751 February 11, 2014 Riegl
D699768 February 18, 2014 Zhang et al.
D708970 July 15, 2014 Ishii
Patent History
Patent number: D723953
Type: Grant
Filed: Jan 24, 2014
Date of Patent: Mar 10, 2015
Assignee: Kabushiki Kaisha Topcon (Tokyo)
Inventor: Mitsuo Ishii (Tokyo)
Primary Examiner: Antoine D Davis
Application Number: 29/480,211