Probe pin

- OMRON CORPORATION
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Description

FIG. 1 is a perspective view of a probe pin;

FIG. 2 is a front elevation view thereof;

FIG. 3 is a rear elevation view thereof;

FIG. 4 is a left side view thereof;

FIG. 5 is a right side view thereof;

FIG. 6 is a top plan view thereof; and,

FIG. 7 is a bottom plan view thereof.

Claims

The ornamental design for a probe pin, as shown and described.

Referenced Cited
U.S. Patent Documents
D229184 November 1973 Brown et al.
D507197 July 12, 2005 Sun
D662895 July 3, 2012 Kimura
D665744 August 21, 2012 Yamauchi
D665745 August 21, 2012 Yamauchi
8366496 February 5, 2013 Hsu
8460010 June 11, 2013 Kimura
8669774 March 11, 2014 Kato
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9130290 September 8, 2015 Sakai
D749968 February 23, 2016 Huang
D750987 March 8, 2016 Huang
9322846 April 26, 2016 Sakai
Foreign Patent Documents
2011-232181 November 2011 JP
D157152 November 2013 TW
Other references
  • Taiwanese Office Action issued in TW Appl. No. 104303166 on Oct. 27, 2015.
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Patent History
Patent number: D769748
Type: Grant
Filed: Jun 15, 2015
Date of Patent: Oct 25, 2016
Assignee: OMRON CORPORATION (Kyoto)
Inventors: Hirotada Teranishi (Osaka), Takahiro Sakai (Moriyama)
Primary Examiner: Antoine D Davis
Application Number: 29/530,263
Classifications