Probe pin
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Description
The dashed broken lines in the figures show portions of the probe pin that form no part of the claimed design. The dot-dash broken lines in the figures show boundaries of the claimed design.
Claims
The ornamental design for a probe pin, as shown and described.
Referenced Cited
U.S. Patent Documents
Other references
| D229184 | November 1973 | Brown et al. |
| D507197 | July 12, 2005 | Sun |
| D662895 | July 3, 2012 | Kimura |
| D665744 | August 21, 2012 | Yamauchi |
| D665745 | August 21, 2012 | Yamauchi |
| 8366496 | February 5, 2013 | Hsu |
| 8460010 | June 11, 2013 | Kimura |
| 8669774 | March 11, 2014 | Kato |
| 8808038 | August 19, 2014 | Hwang |
| 9130290 | September 8, 2015 | Sakai |
| 9207260 | December 8, 2015 | Ogasawara |
| D749968 | February 23, 2016 | Huang |
| D750987 | March 8, 2016 | Huang |
| 9322846 | April 26, 2016 | Sakai |
- U.S. Appl. No. 29/557,790, filed Mar. 11, 2016; Teranishi et al.
Patent History
Patent number: D769754
Type: Grant
Filed: Mar 11, 2016
Date of Patent: Oct 25, 2016
Assignee: OMRON Corporation (Kyoto)
Inventors: Hirotada Teranishi (Osaka), Takahiro Sakai (Moriyama), Makoto Kondo (Moriyama)
Primary Examiner: Antoine D Davis
Application Number: 29/557,788
Type: Grant
Filed: Mar 11, 2016
Date of Patent: Oct 25, 2016
Assignee: OMRON Corporation (Kyoto)
Inventors: Hirotada Teranishi (Osaka), Takahiro Sakai (Moriyama), Makoto Kondo (Moriyama)
Primary Examiner: Antoine D Davis
Application Number: 29/557,788
Classifications
Current U.S. Class:
Element Or Attachment (4) (D10/80)