Probe pin
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The dashed broken lines in the figures show portions of the probe pin that form no part of the claimed design.
The dot-dash broken lines in the figures show boundaries of the claimed design.
The shade lines in the figures show contour and not surface ornamentation.
Claims
The ornamental design for a probe pin, as shown and described.
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D229184 | November 1973 | Brown et al. |
D507197 | July 12, 2005 | Sun |
D662895 | July 3, 2012 | Kimura |
D665744 | August 21, 2012 | Yamauchi |
D665745 | August 21, 2012 | Yamauchi |
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8460010 | June 11, 2013 | Kimura |
8669774 | March 11, 2014 | Kato |
8808038 | August 19, 2014 | Hwang |
9130290 | September 8, 2015 | Sakai |
9207260 | December 8, 2015 | Ogasawara |
D749968 | February 23, 2016 | Huang |
D750987 | March 8, 2016 | Huang |
9322846 | April 26, 2016 | Sakai |
Type: Grant
Filed: Aug 18, 2015
Date of Patent: Jan 10, 2017
Assignee: OMRON Corporation (Kyoto)
Inventors: Hirotada Teranishi (Osaka), Takahiro Sakai (Moriyama)
Primary Examiner: Antoine D Davis
Application Number: 29/536,599