Probe pin

- OMRON Corporation
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Description

FIG. 1 is a perspective view of a probe pin;

FIG. 2 is a front elevational view thereof;

FIG. 3 is a rear elevational view thereof;

FIG. 4 is a left side view thereof;

FIG. 5 is a right side view thereof;

FIG. 6 is a top plan view thereof;

FIG. 7 is a bottom plan view thereof;

FIG. 8 is a perspective view of another probe pin;

FIG. 9 is a front elevational view thereof;

FIG. 10 is a rear elevational view thereof;

FIG. 11 is a left side view thereof;

FIG. 12 is a right side view thereof;

FIG. 13 is a top plan view thereof; and,

FIG. 14 is a bottom plan view thereof.

The dashed broken lines in the figures show portions of the probe pin that form no part of the claimed design.

The dot-dash broken lines in the figures show boundaries of the claimed design.

The shade lines in the figures show contour and not surface ornamentation.

Claims

The ornamental design for a probe pin, as shown and described.

Referenced Cited
U.S. Patent Documents
3555497 January 1971 Watanabe
D229184 November 1973 Brown et al.
D507197 July 12, 2005 Sun
D662895 July 3, 2012 Kimura
D665744 August 21, 2012 Yamauchi
D665745 August 21, 2012 Yamauchi
8366496 February 5, 2013 Hsu
8460010 June 11, 2013 Kimura
8669774 March 11, 2014 Kato
8808038 August 19, 2014 Hwang
9130290 September 8, 2015 Sakai
9207260 December 8, 2015 Ogasawara
D749968 February 23, 2016 Huang
D750987 March 8, 2016 Huang
9322846 April 26, 2016 Sakai
Patent History
Patent number: D775984
Type: Grant
Filed: Aug 18, 2015
Date of Patent: Jan 10, 2017
Assignee: OMRON Corporation (Kyoto)
Inventors: Hirotada Teranishi (Osaka), Takahiro Sakai (Moriyama)
Primary Examiner: Antoine D Davis
Application Number: 29/536,599
Classifications