Instrument cluster
Latest DENSO International America, Inc. Patents:
- Methods and systems for guiding road users
- SYSTEMS AND METHODS FOR CALIBRATING A RADAR SYSTEM
- Localization and passive entry/passive start systems and methods for vehicles
- Antenna switching control for AOA capturing in phone-as-a-key systems with de-whitened tone transmission, CRC based validation and event timing
- Mode selection according to system conditions
Description
The rear edge of the instrument cluster is depicted by a broken line since it forms no part of the claimed design. The portions of the gauges depicted by broken lines form no part of the claimed design.
Claims
The ornamental design for an instrument cluster, as shown and described.
Referenced Cited
U.S. Patent Documents
D467845 | December 31, 2002 | Pfeiffer |
D516482 | March 7, 2006 | Pfeiffer |
D557646 | December 18, 2007 | Portelance |
D581302 | November 25, 2008 | Wyszogrod |
D598832 | August 25, 2009 | Sauter |
D611861 | March 16, 2010 | Wiedeman |
D631808 | February 1, 2011 | Yamazaki |
D635073 | March 29, 2011 | Nield |
D705146 | May 20, 2014 | Takagi |
D705147 | May 20, 2014 | Kinoshita |
D727814 | April 28, 2015 | Paulke |
9358888 | June 7, 2016 | Schwantner |
20040056502 | March 25, 2004 | Jennings |
Patent History
Patent number: D777631
Type: Grant
Filed: Aug 24, 2015
Date of Patent: Jan 31, 2017
Assignees: DENSO International America, Inc. (Sout, MI), DENSO CORPORATION (Kariya)
Inventors: Gareth Webb (Farmington, MI), Marc Arceo (Livonia, MI), Cary Horvath (Dearborn, MI)
Primary Examiner: Phillip S Hyder
Application Number: 29/537,206
Type: Grant
Filed: Aug 24, 2015
Date of Patent: Jan 31, 2017
Assignees: DENSO International America, Inc. (Sout, MI), DENSO CORPORATION (Kariya)
Inventors: Gareth Webb (Farmington, MI), Marc Arceo (Livonia, MI), Cary Horvath (Dearborn, MI)
Primary Examiner: Phillip S Hyder
Application Number: 29/537,206
Classifications
Current U.S. Class:
Instrument Panel Or Element Thereof (D12/192)