Instrument cluster

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Description

FIG. 1 is an perspective view illustrating the instrument cluster;

FIG. 2 is front view of the instrument cluster;

FIG. 3 is a rear view of the instrument cluster;

FIG. 4 is a right view of the instrument cluster;

FIG. 5 is a left view of the instrument cluster;

FIG. 6 is a top view of the instrument cluster; and,

FIG. 7 is a bottom view of the instrument cluster.

The rear edge of the instrument cluster is depicted by a broken line since it forms no part of the claimed design. The portions of the gauges depicted by broken lines form no part of the claimed design.

Claims

The ornamental design for an instrument cluster, as shown and described.

Referenced Cited
U.S. Patent Documents
D467845 December 31, 2002 Pfeiffer
D516482 March 7, 2006 Pfeiffer
D557646 December 18, 2007 Portelance
D581302 November 25, 2008 Wyszogrod
D598832 August 25, 2009 Sauter
D611861 March 16, 2010 Wiedeman
D631808 February 1, 2011 Yamazaki
D635073 March 29, 2011 Nield
D705146 May 20, 2014 Takagi
D705147 May 20, 2014 Kinoshita
D727814 April 28, 2015 Paulke
9358888 June 7, 2016 Schwantner
20040056502 March 25, 2004 Jennings
Patent History
Patent number: D777631
Type: Grant
Filed: Aug 24, 2015
Date of Patent: Jan 31, 2017
Assignees: DENSO International America, Inc. (Sout, MI), DENSO CORPORATION (Kariya)
Inventors: Gareth Webb (Farmington, MI), Marc Arceo (Livonia, MI), Cary Horvath (Dearborn, MI)
Primary Examiner: Phillip S Hyder
Application Number: 29/537,206
Classifications