Dial gauge inspection machine

- MITUTOYO CORPORATION
Skip to: Description  ·  Claims  ·  References Cited  · Patent History  ·  Patent History
Description

FIG. 1 is a perspective view of a dial gauge inspection machine;

FIG. 2 is a front view thereof;

FIG. 3 is a rear view thereof;

FIG. 4 is a left-side view thereof;

FIG. 5 is a right-side view thereof;

FIG. 6 is a top view thereof; and,

FIG. 7 is a bottom view thereof.

The broken lines depict environmental subject matter only and form no part of the claimed design.

Claims

The ornamental design for a dial gauge inspection machine, as shown and described.

Referenced Cited
U.S. Patent Documents
8092293 January 10, 2012 Richards
Other references
  • Catalog of Optimar 100, “Universal Dial Indicator Testing Machine,” Mahr GmbH Göttingen, Jun. 30, 2010.
  • “i-Checker Full/Semi-Automatic Inspection System,” Mitutoyo Product News, Bulletin No. 1563, Mitutoyo America Corporation, Nov. 2002.
Patent History
Patent number: D784170
Type: Grant
Filed: Feb 10, 2016
Date of Patent: Apr 18, 2017
Assignee: MITUTOYO CORPORATION (Kawasaki)
Inventors: Shuichi Kamiyama (Yokohama), Yoshinosuke Murai (Kawasaki), Yu Sugai (Hadano), Shigeru Ohtani (Kawasaki)
Primary Examiner: Antoine D Davis
Application Number: 29/554,321
Classifications
Current U.S. Class: Geometric (5) (D10/61)