Dial gauge inspection machine
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Description
The broken lines depict environmental subject matter only and form no part of the claimed design.
Claims
The ornamental design for a dial gauge inspection machine, as shown and described.
Referenced Cited
U.S. Patent Documents
Other references
8092293 | January 10, 2012 | Richards |
- Catalog of Optimar 100, “Universal Dial Indicator Testing Machine,” Mahr GmbH Göttingen, Jun. 30, 2010.
- “i-Checker Full/Semi-Automatic Inspection System,” Mitutoyo Product News, Bulletin No. 1563, Mitutoyo America Corporation, Nov. 2002.
Patent History
Patent number: D784170
Type: Grant
Filed: Feb 10, 2016
Date of Patent: Apr 18, 2017
Assignee: MITUTOYO CORPORATION (Kawasaki)
Inventors: Shuichi Kamiyama (Yokohama), Yoshinosuke Murai (Kawasaki), Yu Sugai (Hadano), Shigeru Ohtani (Kawasaki)
Primary Examiner: Antoine D Davis
Application Number: 29/554,321
Type: Grant
Filed: Feb 10, 2016
Date of Patent: Apr 18, 2017
Assignee: MITUTOYO CORPORATION (Kawasaki)
Inventors: Shuichi Kamiyama (Yokohama), Yoshinosuke Murai (Kawasaki), Yu Sugai (Hadano), Shigeru Ohtani (Kawasaki)
Primary Examiner: Antoine D Davis
Application Number: 29/554,321
Classifications
Current U.S. Class:
Geometric (5) (D10/61)