Residual stress measuring device
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Description
The broken lines illustrate structure or features which form no part of the claimed design.
The drawings include surface shading which represents contour and not surface ornamentation.
Claims
The ornamental design for a residual stress measuring device, as shown and described.
Referenced Cited
Patent History
Patent number: D798753
Type: Grant
Filed: Jun 16, 2016
Date of Patent: Oct 3, 2017
Assignee: Sintokogio, Ltd.
Inventors: Kyoichi Iwata (Toyokawa), Takuya Koyama (Toyokawa)
Primary Examiner: Antoine D Davis
Application Number: 29/568,277
Type: Grant
Filed: Jun 16, 2016
Date of Patent: Oct 3, 2017
Assignee: Sintokogio, Ltd.
Inventors: Kyoichi Iwata (Toyokawa), Takuya Koyama (Toyokawa)
Primary Examiner: Antoine D Davis
Application Number: 29/568,277
Classifications
Current U.S. Class:
Weight, Force Or Density (D10/83)