X-ray residual stress measuring instrument
Latest RIGAKU CORPORATION Patents:
- Radiation detector, radiation measuring apparatus, and method for setting radiation detector
- Correction apparatus, system, method, and program
- Correction apparatus, correction method, and correction program
- CALCULATION APPARATUS, METHOD AND PROGRAM
- CONTROL APPARATUS, KRATZKY BLOCK, CONTROL METHOD AND CONTROL PROGRAM
Description
Claims
The ornamental design for a X-ray residual stress measuring instrument, as shown and described.
Referenced Cited
Patent History
Patent number: D750783
Type: Grant
Filed: Jul 16, 2014
Date of Patent: Mar 1, 2016
Assignee: RIGAKU CORPORATION (Tokyo)
Inventors: Shoichi Yasukawa (Hino), Suguru Sasaki (Hamura)
Primary Examiner: Anhdao Doan
Application Number: 29/496,723
Type: Grant
Filed: Jul 16, 2014
Date of Patent: Mar 1, 2016
Assignee: RIGAKU CORPORATION (Tokyo)
Inventors: Shoichi Yasukawa (Hino), Suguru Sasaki (Hamura)
Primary Examiner: Anhdao Doan
Application Number: 29/496,723
Classifications
Current U.S. Class:
Image Generation Or Radiation Therapy (35) (D24/158)