X-ray residual stress measuring instrument

- RIGAKU CORPORATION
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Description

FIG. 1 is a front elevational view of a X-ray residual stress measuring instrument showing our new design;

FIG. 2 is a top plan view thereof;

FIG. 3 is a bottom plan view therefore;

FIG. 4 is a rear elevational view thereof;

FIG. 5 is a left side elevational view thereof;

FIG. 6 is a right side elevational view thereof;

FIG. 7 is a cross-sectional view thereof, taken along the line 7-7 of FIG. 1;

FIG. 8 is a cross-sectional view thereof, taken along the line 8-8 of FIG. 2;

FIG. 9 is a perspective view thereof; and,

FIG. 10 is a perspective view thereof.

Claims

The ornamental design for a X-ray residual stress measuring instrument, as shown and described.

Referenced Cited
U.S. Patent Documents
4694480 September 15, 1987 Skillicorn
D371197 June 25, 1996 Golden
D554754 November 6, 2007 Ito
7515684 April 7, 2009 Gibson
D628296 November 30, 2010 Hoshino
D676554 February 19, 2013 Moon
D724214 March 10, 2015 Ihara
9146203 September 29, 2015 Toraya
Patent History
Patent number: D750783
Type: Grant
Filed: Jul 16, 2014
Date of Patent: Mar 1, 2016
Assignee: RIGAKU CORPORATION (Tokyo)
Inventors: Shoichi Yasukawa (Hino), Suguru Sasaki (Hamura)
Primary Examiner: Anhdao Doan
Application Number: 29/496,723
Classifications