X-ray residual stress measuring instrument
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Description
Claims
The ornamental design for a X-ray residual stress measuring instrument, as shown and described.
Referenced Cited
Patent History
Patent number: D750783
Type: Grant
Filed: Jul 16, 2014
Date of Patent: Mar 1, 2016
Assignee: RIGAKU CORPORATION (Tokyo)
Inventors: Shoichi Yasukawa (Hino), Suguru Sasaki (Hamura)
Primary Examiner: Anhdao Doan
Application Number: 29/496,723
Type: Grant
Filed: Jul 16, 2014
Date of Patent: Mar 1, 2016
Assignee: RIGAKU CORPORATION (Tokyo)
Inventors: Shoichi Yasukawa (Hino), Suguru Sasaki (Hamura)
Primary Examiner: Anhdao Doan
Application Number: 29/496,723
Classifications
Current U.S. Class:
Image Generation Or Radiation Therapy (35) (D24/158)