Impedance measurement system component
Broken lines are used to illustrate features of the impedance measurement system component which form no part of the claimed design. In the alternative embodiment illustrated in
Claims
The ornamental design for an impedance measurement system component, substantially as shown and described herein.
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Type: Grant
Filed: Jun 7, 2016
Date of Patent: Mar 6, 2018
Inventors: Tim Essex (Clayfield), Matthew Joseph Miller (Carlsbad, CA)
Primary Examiner: Antoine Duval Davis
Application Number: 29/567,292