Input device for industrial equipment
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The parts shown in the broken lines do not form part of the claimed design.
Claims
The ornamental design for an input device for industrial equipment, as shown and described.
| D247746 | April 18, 1978 | Hall |
| D253234 | October 23, 1979 | Cooke |
| D306998 | April 3, 1990 | Mintz |
| D308359 | June 5, 1990 | Lauchnor |
| D415121 | October 12, 1999 | Uematsu |
| D430556 | September 5, 2000 | Takahashi |
| D480720 | October 14, 2003 | Sjoberg |
| D504872 | May 10, 2005 | Uehara |
| D521459 | May 23, 2006 | Yun |
| D552562 | October 9, 2007 | Yamamoto |
| D573548 | July 22, 2008 | Chouji |
| D585387 | January 27, 2009 | Fukano |
| D607846 | January 12, 2010 | Daniels |
| D611432 | March 9, 2010 | Ducret |
| D616439 | May 25, 2010 | Mugica |
| D619107 | July 6, 2010 | Giugiaro |
| D641734 | July 19, 2011 | Chou |
| D662478 | June 26, 2012 | Rantala |
| D730847 | June 2, 2015 | Weiss |
| D756334 | May 17, 2016 | Ducret |
| D785600 | May 2, 2017 | VanDuyn |
| D785601 | May 2, 2017 | VanDuyn |
| D790483 | June 27, 2017 | Yoon |
| D795444 | August 22, 2017 | Chen |
| D808909 | January 30, 2018 | Findik |
Type: Grant
Filed: Mar 10, 2017
Date of Patent: Aug 14, 2018
Assignee: Mitsubishi Electric Corporation (Tokyo)
Inventors: Yuki Mizushi (Tokyo), Yoshinori Saigusa (Tokyo), Koji Kiyohara (Tokyo), Hongkue Lee (Tokyo)
Primary Examiner: Jeffrey D Asch
Assistant Examiner: Rebekah A Caruso
Application Number: 29/596,702