Probe

- SINTOKOGIO, LTD.
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Description

FIG. 1 is a perspective view of a probe showing my new design;

FIG. 2 is a front view thereof, the rear view being a mirror image thereof;

FIG. 3 is a left side view thereof;

FIG. 4 is a right side view thereof;

FIG. 5 is a top plan view thereof; and,

FIG. 6 is a bottom plan side view thereof.

The drawings include surface shading which represents contour and not surface ornamentation.

The parallel “dash-dot-dash” broken lines represent a symbolic break in the length of a portion of the probe and forms no part of the claimed design.

Claims

The ornamental design for a probe, as shown and described.

Referenced Cited
U.S. Patent Documents
D414258 September 21, 1999 Yao
D433511 November 7, 2000 Nieves
D740750 October 13, 2015 Mayden
D744360 December 1, 2015 Makino
D775987 January 10, 2017 Sheridan
D776285 January 10, 2017 Dinger
Foreign Patent Documents
WO-9116638 October 1991 WO
Patent History
Patent number: D828191
Type: Grant
Filed: Mar 24, 2017
Date of Patent: Sep 11, 2018
Assignee: SINTOKOGIO, LTD.
Inventor: Yoshiyasu Makino (Toyokawa)
Primary Examiner: Melanie H Tung
Assistant Examiner: Fritzgerald L Butac
Application Number: 29/598,367
Classifications