Probe

- SINTOKOGIO, LTD.
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Description

FIG. 1 is a perspective view of a probe showing my new design;

FIG. 2 is a front view thereof, the rear view being a mirror image thereof;

FIG. 3 is a left side view thereof;

FIG. 4 is a right side view thereof;

FIG. 5 is a top plan view thereof; and,

FIG. 6 is a bottom plan side view thereof.

The drawings include surface shading which represents contour and not surface ornamentation.

The parallel dash-dot-dash broken lines represent a symbolic break in the length of an element of the probe and form no part of the claimed design.

The appearance of any portion of the probe between the break lines forms no part of the claimed design.

Claims

The ornamental design for a probe, as shown and described.

Referenced Cited
U.S. Patent Documents
D431867 October 10, 2000 Maynard
D450000 November 6, 2001 Van
D571831 June 24, 2008 Ota
D744360 December 1, 2015 Makino
D808901 January 30, 2018 Kelly
20130314084 November 28, 2013 Lee
Foreign Patent Documents
WO-9116638 October 1991 WO
Patent History
Patent number: D830208
Type: Grant
Filed: Mar 24, 2017
Date of Patent: Oct 9, 2018
Assignee: SINTOKOGIO, LTD.
Inventor: Yoshiyasu Makino (Toyokawa)
Primary Examiner: Garth Rademaker
Assistant Examiner: Fritzgerald L Butac
Application Number: 29/598,346
Classifications