Analysis unit

- Illumina, Inc.
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Description

FIG. 1 is an isometric view of an analysis unit; FIG. 1 is reduced in scale by 10% from the other Figures in order to fit within the page margins, but is the same scale as FIG. 8.

FIG. 2 is a right side view of the analysis unit of FIG. 1.

FIG. 3 is a left side view of the analysis unit of FIG. 1.

FIG. 4 is a top view of the analysis unit of FIG. 1.

FIG. 5 is a bottom view of the analysis unit of FIG. 1.

FIG. 6 is a rear view of the analysis unit of FIG. 1; and,

FIG. 7 is a front view of the analysis unit of FIG. 1.

Stipple shading is used in the accompanying Figures to convey surface contouring and is not indicative of any particular texture or coloring.

The broken lines shown in the drawings illustrate portions of the analysis unit that form no part of the claimed design.

Claims

We claim the ornamental design for an analysis unit, as shown and described.

Referenced Cited
U.S. Patent Documents
D298854 December 6, 1988 Kame
D676976 February 26, 2013 Walsh
D687561 August 6, 2013 Iseki
D693019 November 5, 2013 Isozaki
D721820 January 27, 2015 Oonuma
D729405 May 12, 2015 Ramstad
D759519 June 21, 2016 Apotheloz
D788617 June 6, 2017 Barton
D794211 August 8, 2017 Ang
D799999 October 17, 2017 Barton
D802785 November 14, 2017 Barton
20090191619 July 30, 2009 Eisfeld
20130288355 October 31, 2013 DeWitte
Foreign Patent Documents
D1344389 November 2008 JP
D1579840 June 2017 JP
D187235 November 2016 TW
Other references
  • Illumina, posted at businesswire.com, posted Jan. 9, 2017, online, URL: https://www.businesswire.com/news/home/20170109006363/en/Illumina-Introduces-NovaSeq-Series%E2%80%94a-New-Architecture-Designed (Year: 2017).
  • Taiwan Office Action dated Apr. 4, 2018, issued in Taiwan Patent Application No. 106303764.
  • U.S. Appl. No. 29/589,976, filed Jan. 5, 2017, Williamson, et al.
Patent History
Patent number: D855823
Type: Grant
Filed: Jan 5, 2017
Date of Patent: Aug 6, 2019
Assignee: Illumina, Inc. (San Diego, CA)
Inventors: Erik Lewis Williamson (Carlsbad, CA), Anna Skaro Quackenbush (Poway, CA), Tricia Nguyen Lewis (San Diego, CA), Lea Sandra Kobeli (San Francisco, CA), Edward Wilson Licitra (San Francisco, CA)
Primary Examiner: Anhdao Doan
Assistant Examiner: Mary Shannon Malley
Application Number: 29/589,975
Classifications