Analytical instrument
Latest Cellspect Co., Ltd. Patents:
Description
The broken lines represent portions of the analytical instrument and form no part of the claimed design.
Claims
The ornamental design for an analytical instrument, as shown and described.
Referenced Cited
Patent History
Patent number: D877925
Type: Grant
Filed: Sep 14, 2018
Date of Patent: Mar 10, 2020
Assignee: Cellspect Co., Ltd. (Iwate)
Inventor: Koji Tanaka (Iwate)
Primary Examiner: Anhdao Doan
Application Number: 29/663,368
Type: Grant
Filed: Sep 14, 2018
Date of Patent: Mar 10, 2020
Assignee: Cellspect Co., Ltd. (Iwate)
Inventor: Koji Tanaka (Iwate)
Primary Examiner: Anhdao Doan
Application Number: 29/663,368
Classifications
Current U.S. Class:
Specimen Handling, Preparation Or Testing (62) (D24/216)