Particle characterization device

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Description

1. Particle characterization device

1.1 is a bottom view.

1.2 is a rear view.

1.3 is a front view.

1.4 is a side view.

1.5 is a front perspective view.

1.6 is a side view of the opposite side of 1.4.

1.7 is a top view.

The broken lines shown in the drawings illustrate portions that form no part of the claimed design.

The dash-dot lines shown in the drawings represent the bounds of the claimed design.

Claims

We claim the ornamental design for a particle characterization device, as shown and described.

Referenced Cited
U.S. Patent Documents
D644544 September 6, 2011 Yukikado
D665917 August 21, 2012 TerMaat
D683642 June 4, 2013 Buesser
D722515 February 17, 2015 Zock
D758221 June 7, 2016 Fujiwara
D762133 July 26, 2016 Derocher
D796979 September 12, 2017 Delavy
D797587 September 19, 2017 Delavy
D800000 October 17, 2017 Barton
D830210 October 9, 2018 Ihara
D838198 January 15, 2019 Kimura
Patent History
Patent number: D878227
Type: Grant
Filed: Dec 13, 2017
Date of Patent: Mar 17, 2020
Inventors: John Cross (Warwick), David Boyce (Warwick), Chris Langley (Warwick), Mark Shadbolt (Malvern)
Primary Examiner: George D. Kirschbaum
Application Number: 35/504,661
Classifications
Current U.S. Class: Chemical (12) (D10/81)