Thermogravimetric analyzer
Latest Hitachi High-Tech Science Corporation Patents:
- Spectrophotometer, spectroscopic measurement method, and program
- Mask defect repair apparatus and mask defect repair method
- Spectrofluorophotometer, spectrofluoro-measurement method, and image capturing method
- Thermostatic apparatus and analytical apparatus including the same
- SPECTROSCOPIC ANALYSIS SYSTEM AND SPECTROSCOPIC ANALYSIS METHOD
Description
The broken lines represent the portions of the design that form no part of the claim. The mesh portion around the claimed portion forms no part of the claimed design.
Claims
The ornamental design for a thermogravimetric analyzer, as shown and described.
Referenced Cited
U.S. Patent Documents
D283107 | March 25, 1986 | Collister |
D292979 | December 1, 1987 | Chow |
5322360 | June 21, 1994 | Willis et al. |
D381756 | July 29, 1997 | Ohnuma et al. |
6760679 | July 6, 2004 | Carney et al. |
6846455 | January 25, 2005 | Carney et al. |
D556914 | December 4, 2007 | Okamoto et al. |
D638545 | May 24, 2011 | Okawa et al. |
D689387 | September 10, 2013 | Muraoka et al. |
Patent History
Patent number: D758221
Type: Grant
Filed: Aug 26, 2014
Date of Patent: Jun 7, 2016
Assignee: Hitachi High-Tech Science Corporation (Minato-ku, Tokyo)
Inventor: Hirohito Fujiwara (Tokyo)
Primary Examiner: Antoine D Davis
Application Number: 29/500,561
Type: Grant
Filed: Aug 26, 2014
Date of Patent: Jun 7, 2016
Assignee: Hitachi High-Tech Science Corporation (Minato-ku, Tokyo)
Inventor: Hirohito Fujiwara (Tokyo)
Primary Examiner: Antoine D Davis
Application Number: 29/500,561
Classifications