Testing device

Skip to: Description  ·  Claims  ·  References Cited  · Patent History  ·  Patent History
Description

1. Testing device

1.1 : Front

1.2 : Back

1.3 : Top

1.4 : Left

1.5 : Right

1.6 : Perspective view (front, top, right)

1.7 : Perspective view (back, top, left)

Claims

The ornamental design for testing device, as shown and described.

Referenced Cited
U.S. Patent Documents
7629533 December 8, 2009 Cole, Sr.
D638952 May 31, 2011 Oonuma
D712447 September 2, 2014 He
D787695 May 23, 2017 Mottscheller
D796360 September 5, 2017 Schulz
D801202 October 31, 2017 Johnston
D823149 July 17, 2018 Schulze
10156586 December 18, 2018 Adams
D840847 February 19, 2019 Doi
10209272 February 19, 2019 Li
D842726 March 12, 2019 Weaver
D847676 May 7, 2019 Matsumiya
D848882 May 21, 2019 Matsumiya
D848883 May 21, 2019 Matsumiya
D869969 December 17, 2019 Matsumoto
Patent History
Patent number: D881730
Type: Grant
Filed: May 2, 2018
Date of Patent: Apr 21, 2020
Inventors: Sigeru Matsumoto (Tama), Hiroshi Miyashita (Tama), Kazuyoshi Tashiro (Tama), Kazuhiro Murauchi (Tama)
Primary Examiner: Richard E Chilcot
Application Number: 35/505,963
Classifications
Current U.S. Class: Balancer (D10/82)