Tamper evident bag
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The perspective views and rear view of the embodiments in
The elements shown in broken lines of dashes of substantially equal length indicate lines of perforations, which are aspects of the claimed design. The elements shown in broken lines in a dashed, long-short-short-long pattern form no part of the claimed design.
Break lines indicate no specific height or no specific width with portions between the respective break lines forming no part of the claimed design.
Claims
The ornamental design for a tamper evident bag, as shown and described.
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Type: Grant
Filed: Jun 8, 2018
Date of Patent: Jul 28, 2020
Assignee: Inteplast Group Corporation (Livingston, NJ)
Inventors: Sumei Lin (Morristown, NJ), Li-yung Chang (Livingston, NJ), Ben Tseng (Somerset, NJ)
Primary Examiner: Abraham Bahta
Application Number: 29/650,650