Diagnostic testing device
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Description
The broken lines in the drawings depict portions of the diagnostic testing device that form no part of the claimed design.
Claims
The ornamental design for a diagnostic testing device, as shown and described.
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Patent History
Patent number: D900334
Type: Grant
Filed: Jul 2, 2018
Date of Patent: Oct 27, 2020
Assignee: LEADWAY (HK) LIMITED (Hong Kong)
Inventors: Tao Liping (Hangzhou), Li Tianhao (Hangzhou)
Primary Examiner: Susan Bennett Hattan
Assistant Examiner: Omeed Agilee
Application Number: 29/655,361
Type: Grant
Filed: Jul 2, 2018
Date of Patent: Oct 27, 2020
Assignee: LEADWAY (HK) LIMITED (Hong Kong)
Inventors: Tao Liping (Hangzhou), Li Tianhao (Hangzhou)
Primary Examiner: Susan Bennett Hattan
Assistant Examiner: Omeed Agilee
Application Number: 29/655,361
Classifications
Current U.S. Class:
Interrelated Indication Or Reaction Set (i.e., "test Kit") (64) (D24/223)