Portion of analysis unit

- Illumina, Inc.
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Description

FIG. 1 is an isometric view of a portion of an analysis unit.

FIG. 2 is a right side view thereof.

FIG. 3 is a left side view thereof.

FIG. 4 is a top view thereof.

FIG. 5 is a rear view thereof; and,

FIG. 6 is a front view thereof.

A portion of an analysis unit in the accompanying figures may be used in sequencing operations and may be configured to receive one or more cartridges for use in such operations.

Stipple shading is used in the accompanying FIGS. 1-6 to convey surface contouring and is not indicative of any particular texture or coloring.

In the drawings, the evenly spaced broken lines are for illustrating portions of a portion of an analysis unit which form no part of the claimed design. The heavy dot-dash-dot broken lines are for the purpose of showing boundaries of the claim and these heavy dot-dash-dot lines form no part of the claimed design.

Claims

We claim the ornamental design for a portion of an analysis unit, as shown and described.

Referenced Cited
U.S. Patent Documents
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5536084 July 16, 1996 Curtis
5765842 June 16, 1998 Phaneuf
D406894 March 16, 1999 Menhennett
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D568481 May 6, 2008 Martinson
7849859 December 14, 2010 Bochner
D687561 August 6, 2013 Iseki
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D782690 March 28, 2017 Kurihara
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D794211 August 8, 2017 Ang
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D848020 May 7, 2019 Kobeli
Foreign Patent Documents
D1344389 November 2008 JP
D1579840 June 2017 JP
D187235 December 2017 TW
Other references
  • Taiwan Office Action dated Apr. 4, 2018, issued in Taiwan Patent Application No. 106303764.
  • U.S. Appl. No. 29/589,975, filed Jan. 5, 2017, Williamson, et al.
Patent History
Patent number: D905248
Type: Grant
Filed: Jan 5, 2017
Date of Patent: Dec 15, 2020
Assignee: Illumina, Inc. (San Diego, CA)
Inventors: Erik Lewis Williamson (Carlsbad, CA), Anna Skaro Quackenbush (Poway, CA), Tricia Nguyen Lewis (San Diego, CA), Lea Sandra Kobeli (San Francisco, CA), Edward Wilson Licitra (San Francisco, CA)
Primary Examiner: Rhea Shields
Application Number: 29/589,976
Classifications