Inspection system
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Description
The broken line illustration of portions of the inspection system in the drawing is for illustrative purposes and is not part of the claimed design.
Claims
The ornamental design for an inspection system, as shown and described.
Referenced Cited
U.S. Patent Documents
Other references
D556914 | December 4, 2007 | Okamoto |
D775365 | December 27, 2016 | Mathers |
D834724 | November 27, 2018 | Mathers |
D888705 | June 30, 2020 | Saito |
D909605 | February 2, 2021 | Mathers |
- “High Performance X-Ray Inspection Solution”, Baker Hughes a GE Company, Inspection Technologies, Sales Brochure—Micromex and Nanomex, 2019, 1-8.
- Electronics Testing Solutions—NDT for Semiconductors, PCBs and More, High-performance premium nanofocus and microfocus inspection for electronics:, https://www.bakerhughesds.com/industrial-x-ray-ct-scanners/phoenix-micromex-neo-nanomex-neo, Waygate Technologies, 2021.
Patent History
Patent number: D920813
Type: Grant
Filed: May 6, 2019
Date of Patent: Jun 1, 2021
Assignee: BAKER HUGHES OILFIELD OPERATIONS LLC (Houston, TX)
Inventors: Yanmin Zhan (Shanghai), Najie Jiao (Shanghai), Sanmao Xiong (Xi'an), Wenhan Fu (Shanghai), Xiaoyu Jiang (Shanghai)
Primary Examiner: Antoine Duval Davis
Application Number: 29/690,205
Type: Grant
Filed: May 6, 2019
Date of Patent: Jun 1, 2021
Assignee: BAKER HUGHES OILFIELD OPERATIONS LLC (Houston, TX)
Inventors: Yanmin Zhan (Shanghai), Najie Jiao (Shanghai), Sanmao Xiong (Xi'an), Wenhan Fu (Shanghai), Xiaoyu Jiang (Shanghai)
Primary Examiner: Antoine Duval Davis
Application Number: 29/690,205