Inspection system
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Description
Claims
The ornamental design for an inspection system, as shown and described.
Referenced Cited
U.S. Patent Documents
Other references
D556914 | December 4, 2007 | Okamoto |
D775365 | December 27, 2016 | Mathers |
D834724 | November 27, 2018 | Mathers |
D888705 | June 30, 2020 | Saito |
D909605 | February 2, 2021 | Mathers |
- “High Performance X-Ray Inspection Solution”, Baker Hughes a GE Company, Inspection Technologies, Sales Brochure—Micromex and Nanomex, 2019, 1-8.
- Electronics Testing Solutions—NDT for Semiconductors, PCBs and More, High-performance premium nanofocus and microfocus inspection for electronics:, https://www.bakerhughesds.com/industrial-x-ray-ct-scanners/phoenix-micromex-neo-nanomex-neo, Waygate Technologies, 2021.
Patent History
Patent number: D921497
Type: Grant
Filed: May 6, 2019
Date of Patent: Jun 8, 2021
Assignee: BAKER HUGHES OILFIELD OPERATIONS LLC (Houston, TX)
Inventors: Yanmin Zhan (Shanghai), Najie Jiao (Shanghai), Sanmao Xiong (Xi'an), Wenhan Fu (Shanghai), Xiaoyu Jiang (Shanghai)
Primary Examiner: Antoine Duval Davis
Application Number: 29/690,204
Type: Grant
Filed: May 6, 2019
Date of Patent: Jun 8, 2021
Assignee: BAKER HUGHES OILFIELD OPERATIONS LLC (Houston, TX)
Inventors: Yanmin Zhan (Shanghai), Najie Jiao (Shanghai), Sanmao Xiong (Xi'an), Wenhan Fu (Shanghai), Xiaoyu Jiang (Shanghai)
Primary Examiner: Antoine Duval Davis
Application Number: 29/690,204