Inspection system

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Description

FIG. 1 is a front view of an inspection system;

FIG. 2 is a side view thereof;

FIG. 3 is another side view thereof;

FIG. 4 is a top view thereof;

FIG. 5 is a bottom view thereof;

FIG. 6 is a front perspective view thereof;

FIG. 7 is a back perspective view thereof; and,

FIG. 8 is another front perspective view thereof.

Claims

The ornamental design for an inspection system, as shown and described.

Referenced Cited
U.S. Patent Documents
D556914 December 4, 2007 Okamoto
D775365 December 27, 2016 Mathers
D834724 November 27, 2018 Mathers
D888705 June 30, 2020 Saito
D909605 February 2, 2021 Mathers
Other references
  • “High Performance X-Ray Inspection Solution”, Baker Hughes a GE Company, Inspection Technologies, Sales Brochure—Micromex and Nanomex, 2019, 1-8.
  • Electronics Testing Solutions—NDT for Semiconductors, PCBs and More, High-performance premium nanofocus and microfocus inspection for electronics:, https://www.bakerhughesds.com/industrial-x-ray-ct-scanners/phoenix-micromex-neo-nanomex-neo, Waygate Technologies, 2021.
Patent History
Patent number: D921497
Type: Grant
Filed: May 6, 2019
Date of Patent: Jun 8, 2021
Assignee: BAKER HUGHES OILFIELD OPERATIONS LLC (Houston, TX)
Inventors: Yanmin Zhan (Shanghai), Najie Jiao (Shanghai), Sanmao Xiong (Xi'an), Wenhan Fu (Shanghai), Xiaoyu Jiang (Shanghai)
Primary Examiner: Antoine Duval Davis
Application Number: 29/690,204