Dual measuring level
Description
The broken lines represent portions of the dual measuring level that forms no part of the claimed design.
Claims
The ornamental design for a dual measuring level, as shown and described.
Referenced Cited
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Patent History
Patent number: D943433
Type: Grant
Filed: Feb 10, 2020
Date of Patent: Feb 15, 2022
Inventors: Mark Parrish (Savannah, GA), Veronica Parrish (Savannah, GA)
Primary Examiner: L. A. Grabenstetter
Assistant Examiner: Antoinette Martine Suiter
Application Number: 29/723,652
Type: Grant
Filed: Feb 10, 2020
Date of Patent: Feb 15, 2022
Inventors: Mark Parrish (Savannah, GA), Veronica Parrish (Savannah, GA)
Primary Examiner: L. A. Grabenstetter
Assistant Examiner: Antoinette Martine Suiter
Application Number: 29/723,652
Classifications
Current U.S. Class:
Spirit Level (D10/69)