Testing instrument
Latest KOKUSAI KEISOKUKI KABUSHIKI KAISHA Patents:
Description
The broken lines depict either (i) enlargement areas that form no part of the claimed design, or (ii) parts of the testing device that form no part of the claimed design.
Claims
The ornamental design for a testing instrument, as shown and described.
Referenced Cited
U.S. Patent Documents
Foreign Patent Documents
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Patent History
Patent number: D953179
Type: Grant
Filed: Jul 20, 2020
Date of Patent: May 31, 2022
Assignee: KOKUSAI KEISOKUKI KABUSHIKI KAISHA (Tokyo)
Inventors: Sigeru Matsumoto (Tokyo), Hiroshi Miyashita (Tokyo), Kazuhiro Murauchi (Tokyo), Shuichi Tokita (Kanagawa)
Primary Examiner: Antoine Duval Davis
Application Number: 29/743,184
Type: Grant
Filed: Jul 20, 2020
Date of Patent: May 31, 2022
Assignee: KOKUSAI KEISOKUKI KABUSHIKI KAISHA (Tokyo)
Inventors: Sigeru Matsumoto (Tokyo), Hiroshi Miyashita (Tokyo), Kazuhiro Murauchi (Tokyo), Shuichi Tokita (Kanagawa)
Primary Examiner: Antoine Duval Davis
Application Number: 29/743,184
Classifications
Current U.S. Class:
Specific Gravity (8) (D10/84)