Industrial signal testing equipment for wireless devices
Latest AMBIT MICROSYSTEMS (SHANGHAI) LTD. Patents:
Description
Claims
The ornamental design for an industrial signal testing equipment for wireless devices, as shown and described.
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Patent History
Patent number: D983679
Type: Grant
Filed: Mar 20, 2020
Date of Patent: Apr 18, 2023
Assignee: AMBIT MICROSYSTEMS (SHANGHAI) LTD. (Shanghai)
Inventors: Ling-Li Zhu (Shenzhen), Jie-Ying Chen (Shenzhen)
Primary Examiner: Nicole C Shiflet
Assistant Examiner: Antoinette Martine Suiter
Application Number: 29/728,676
Type: Grant
Filed: Mar 20, 2020
Date of Patent: Apr 18, 2023
Assignee: AMBIT MICROSYSTEMS (SHANGHAI) LTD. (Shanghai)
Inventors: Ling-Li Zhu (Shenzhen), Jie-Ying Chen (Shenzhen)
Primary Examiner: Nicole C Shiflet
Assistant Examiner: Antoinette Martine Suiter
Application Number: 29/728,676
Classifications
Current U.S. Class:
Provided With Handle, Or Hand-held (D10/78)