Industrial signal testing equipment for wireless devices

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Description

FIG. 1 is a front perspective view of the industrial signal testing equipment for wireless devices;

FIG. 2 is a rear perspective view thereof;

FIG. 3 is a front elevational view thereof;

FIG. 4 is a rear elevational view thereof;

FIG. 5 is a left side elevational view thereof;

FIG. 6 is a right side elevational view thereof;

FIG. 7 is a top plan view thereof; and,

FIG. 8 is a bottom plan view thereof.

Claims

The ornamental design for an industrial signal testing equipment for wireless devices, as shown and described.

Referenced Cited
U.S. Patent Documents
D192116 January 1962 Inhelder
D213781 April 1969 Dunlop
5130891 July 14, 1992 Christie
D334893 April 20, 1993 Cunningham
5898108 April 27, 1999 Mieczkowski
D519982 May 2, 2006 Haase
D699362 February 11, 2014 Corrigan
D725520 March 31, 2015 Varacca
D789931 June 20, 2017 Drew
D795722 August 29, 2017 Drew
D842144 March 5, 2019 Blier
D849566 May 28, 2019 Klintworth
D861517 October 1, 2019 Apenburg
D871364 December 31, 2019 Lundgard
D884515 May 19, 2020 Mathew
D884516 May 19, 2020 Mathew
10748356 August 18, 2020 Herron
D897873 October 6, 2020 Lu
D920816 June 1, 2021 Mathew
D925380 July 20, 2021 Lu
D928002 August 17, 2021 Lu
20100210929 August 19, 2010 Jossart
Patent History
Patent number: D983679
Type: Grant
Filed: Mar 20, 2020
Date of Patent: Apr 18, 2023
Assignee: AMBIT MICROSYSTEMS (SHANGHAI) LTD. (Shanghai)
Inventors: Ling-Li Zhu (Shenzhen), Jie-Ying Chen (Shenzhen)
Primary Examiner: Nicole C Shiflet
Assistant Examiner: Antoinette Martine Suiter
Application Number: 29/728,676
Classifications