Temperature probe

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Description

FIG. 1 is a first perspective view of a temperature probe showing my new design;

FIG. 2 is a second perspective view thereof;

FIG. 3 is a front view thereof;

FIG. 4 is a back view thereof;

FIG. 5 is a left side view thereof;

FIG. 6 is a right side view thereof;

FIG. 7 is a top view thereof;

FIG. 8 is a bottom view thereof;

FIG. 9 is an enlarged view of the selected portion in FIG. 1; and,

FIG. 10 is an enlarged view of the selected portion in FIG. 2.

The broken lines shown in the drawings depict portions of the temperature probe in which the design is embodied that form no part of the claimed design.

Claims

The ornamental design for a temperature probe, as shown and described.

Referenced Cited
U.S. Patent Documents
D685658 July 9, 2013 Shibata
D723952 March 10, 2015 Gross
D738757 September 15, 2015 Gross
D969624 November 15, 2022 Cran
Patent History
Patent number: D995322
Type: Grant
Filed: Jan 5, 2022
Date of Patent: Aug 15, 2023
Inventor: Wudai Hou (Kunming)
Primary Examiner: Antoine Duval Davis
Application Number: 29/791,244
Classifications
Current U.S. Class: Thermometer (D10/57)