Temperature probe
Description
The broken lines shown in the drawings depict portions of the temperature probe in which the design is embodied that form no part of the claimed design.
Claims
The ornamental design for a temperature probe, as shown and described.
Referenced Cited
Patent History
Patent number: D995322
Type: Grant
Filed: Jan 5, 2022
Date of Patent: Aug 15, 2023
Inventor: Wudai Hou (Kunming)
Primary Examiner: Antoine Duval Davis
Application Number: 29/791,244
Type: Grant
Filed: Jan 5, 2022
Date of Patent: Aug 15, 2023
Inventor: Wudai Hou (Kunming)
Primary Examiner: Antoine Duval Davis
Application Number: 29/791,244
Classifications
Current U.S. Class:
Thermometer (D10/57)