Patents Issued in December 25, 2007
-
Patent number: 7312426Abstract: A cooking apparatus includes a heater mounting unit that mounts a heater on a reflecting plate in a simple manner and allows an internal construction of the cooking apparatus to be simple. The cooking apparatus also includes a cabinet, at least one heater mounted in the cabinet, a grill unit positioned on a top of the cabinet to allow food to be cooked while being laid thereon, at least one reflecting plate mounted behind the heater to reflect heat radiated toward a position behind the heater, and at least one elastic mounting unit to mount the heater on the reflecting plate through an elastic deformation thereof. Accordingly, an efficiency of production of the cooking apparatus may be improved, and the cooking apparatus may have a simple internal construction.Type: GrantFiled: October 20, 2003Date of Patent: December 25, 2007Assignee: Samsung Electronics Co., Ltd.Inventors: Dae-Sung Han, Chul Kim, Yong-Woon Han, Seong-Deog Jang, Kyung-Hee Ham, Joo-Yeong Yeo, Han-Seong Kang
-
Patent number: 7312427Abstract: A high-frequency dielectric heating device includes: a microwave output unit including an inverter unit using a semiconductor switching element, heat-radiating fins for radiating the heat generated by an IGBT, and a printed board having a thermistor for detecting the temperature of the semiconductor switching element, The thermistor is soldered to a leg portion of the semiconductor switching element or near to the leg portion thereof on the side of the soldering surface of the printed board. The device also includes: a booster transformer, a high-voltage rectifier unit, and a magnetron; and a heat-cooking chamber fed with microwaves radiated from the magnetron. When the thermistor has assumed a predetermined resistance, a power-down control operation is effected by greatly decreasing the power fed to the semiconductor switching element. Then, permitting the power fed to the semiconductor switching element to vary depending upon the resistance of the thermistor.Type: GrantFiled: April 21, 2004Date of Patent: December 25, 2007Assignee: Matsushita Electric Industrial Co., Ltd.Inventors: Haruo Suenaga, Hideaki Moriya, Shinichi Sakai
-
Patent number: 7312428Abstract: A medium (24 and 124) made up of fossil fuel hydrocarbons (304) is heated by maintaining at least a portion or area of the medium (334) in an alternating current electrical field (36 and 136) provided by a radio frequency signal at a radio frequency that matches a Debye resonance frequency or frequencies of one or more components of the medium (334). As the medium (334), or as at least one individual component of the medium (334) increases in temperature, the frequency of the radio frequency signal is automatically adjusted to track changes in the Debye resonance frequency, which shifts in frequency as the temperature rises. Portions, areas and/or individual chemical compositions of the medium (334) can be heated, by the use of grid electrodes (22, 22, 120, 124), at different rates to assure uniform temperature increases or to achieve a particular desired warming pattern.Type: GrantFiled: September 1, 2006Date of Patent: December 25, 2007Inventor: Dwight Eric Kinzer
-
Patent number: 7312429Abstract: A single, hard-mounted set of optics is utilized to replace a two field-of-view system for directed countermeasures. It includes within one continuous but distorted field of view the capability to detect, acquire and characterize targets at the edge of the field while precisely tracking with high target fidelity at the field center. With multiple targets, both tracking of a primary target and acquisition of a secondary target can occur simultaneously, greatly improving countermeasure effectiveness.Type: GrantFiled: October 17, 2003Date of Patent: December 25, 2007Assignee: BAE Systems Information and Electronic Systems Integration Inc.Inventors: Robert C. Guyer, Anthony Kirkham
-
System, display apparatus and method for providing controlled illumination using internal reflection
Patent number: 7312430Abstract: A system, display apparatus and method for providing illumination uses internal reflection to monitor and control the illumination, which is produced by light from a number of light source devices, such as light emitting diodes. Some of the light generated by the light source devices is transmitted into an optically transparent region between the light source devices and a substrate, where the light is internally reflected within the optically transparent region. The optical properties of the light within the optically transparent region are measured using an optical sensor positioned within the optically transparent region so that the light generated by the light source devices can be selectively adjusted to control the illumination.Type: GrantFiled: July 1, 2005Date of Patent: December 25, 2007Assignee: Avago Technologies ECBUIP Pte LtdInventors: Lye Yee Wong, Kok Peng Lim, Kar Phooi Foong -
Patent number: 7312431Abstract: Embodiments of the invention provide pixel cells that allow both automatic light control and correlated double sampling operations. The pixel cell includes first and second photo-conversion devices that can be separately read out. For example, the second photo-conversion device can be the pixel cells' floating diffusion region, with an area and doping profile suitable for photo-conversion. An image sensor may include an array of pixel cells, some or all of which have two photo-conversion devices, and peripheral circuitry for reading out signals from the pixel cells. The image sensor's readout circuitry may monitor charge generated by the second photo-conversion devices to determine when to read out signals from the first photo-conversion devices.Type: GrantFiled: November 14, 2005Date of Patent: December 25, 2007Assignee: Micron Technology, Inc.Inventor: Howard E. Rhodes
-
Patent number: 7312432Abstract: A single-axis illumination system for a multiple-axis imaging system, particularly an array microscope. A single-axis illumination system is used to trans-illuminate an object viewed with an array of imaging elements having multiple respective axes. The numerical apertures of the imaging elements are preferably matched to the numerical aperture of the illumination system. For Kohler illumination, the light source is placed effectively at the front focal plane of the illumination system. For critical illumination, the light source is effectively imaged onto the object plane of the imaging system. For dark field illumination, an annular light source is effectively provided. For phase contrast microscopy, an annular phase mask is placed effectively at the back focal plane of the objective lens of the imaging system and a corresponding annular amplitude mask is provided effectively at the light source.Type: GrantFiled: July 8, 2002Date of Patent: December 25, 2007Assignee: DMetrix, Inc.Inventor: Chen Liang
-
Patent number: 7312433Abstract: The invention relates to a measuring device 5 of the type which detects the interruption of a beam of radiation (e.g. light 20) by an object (50 FIG. 1) in the beam. The device includes a light emitter 12 and a light detector 32 each enclosed in a housing 10 and 30. In order to accommodate different spacings between the housings different caps 14 having varying size apertures 11 are fittable to the housings. This allows varying amounts of light to be issued and/or detected. Other ways of adjusting the amount of light passing through the cap are disclosed.Type: GrantFiled: July 30, 2004Date of Patent: December 25, 2007Assignee: Renishaw PLCInventors: Victor G. Stimpson, Benjamin J. Merrifield
-
Patent number: 7312434Abstract: A method is provided for suppressing a predetermined portion of an optical spectrum emanating from a light emitter. The optical spectrum illuminates an illumination area. The method includes the steps of fabricating a filter having a spectrophotometric transmittance and varying the spectrophotometric transmittance of the filter. The filter is positioned between the light emitter and the illumination area, such that the filter absorbs the predetermined portion of the optical spectrum.Type: GrantFiled: December 26, 2006Date of Patent: December 25, 2007Assignee: Eaton CorporationInventor: Robert P. Helstern
-
Patent number: 7312435Abstract: The present invention relates to a determination of a physical state of an optical device by measuring a response signal. At least two subsequent measurements are executed. Therefore, a first optical signal is transmitted to the optical device, wherein a first optical property of said first signal is varied according to a first function of the time. A second optical property of a first response signal returning from the optical device is measured over the time and a first result function of the second optical property of the first response signal over the first optical property of first optical signal is established. Further, a second optical signal is transmitted to the optical device, wherein the first optical property of said signal is varied according to a second function of the time that is different from the first function of time.Type: GrantFiled: April 14, 2005Date of Patent: December 25, 2007Assignee: Agilent Technologies, Inc.Inventor: Bernd Nebendahl
-
Patent number: 7312436Abstract: An optical position measuring system that includes a measuring graduation and a scanning unit that is movable in relation to the measuring graduation in a measuring direction. The scanning unit includes a light source that generates light towards the measuring graduation so that scanning signals result from an interaction of the light with the measuring graduation and an opto-electronic detector arrangement has a plurality of detector element units, whose geometric shape and/or arrangement has been selected in such a way that through them at least a partial filtering of undesired harmonics out of the scanning signals results. The measuring graduation includes an arrangement of graduation areas with different optical properties, which is periodic in the measuring direction and has a periodicity TPM and which has been selected in such a way that through them at least a partial filtering of undesired harmonics out of the scanning signals results.Type: GrantFiled: August 23, 2005Date of Patent: December 25, 2007Assignee: Dr. Johannes Heidenhain GmbHInventor: Heinz Tovar
-
Patent number: 7312437Abstract: A displacement sensor which detects a positional displacement of a movable member, comprises a position signal generating section configured to generate a periodical signal in accordance with movement of the movable member, a generating section of a signal for detecting a reference position, configured to generate the signal for detecting the reference position, when the movable member is in a predetermined position, a reference position detection circuit configured to detect that the movable member is in a reference position based on the signal for detecting the reference position, generated by the generating section of the signal for detecting the reference position, in synchronization with the periodical signal generated by the position signal generating section, and a selecting section configured to be capable of selecting a phase position to be synchronized from a plurality of phase positions on the periodical signal in the synchronization in the reference position detection circuit.Type: GrantFiled: July 1, 2003Date of Patent: December 25, 2007Assignee: Olympus CorporationInventor: Jun Hane
-
Patent number: 7312438Abstract: A processing circuit, which carries out coincidence counting, acquires calibration data so that time delays of ?-ray detection signals from radiation detectors coincide with one another. A technique for acquiring calibration data faster and easily is provided to attain high time precision and respond to multi-channeling of detectors. A signal from a test signal generator is sent to signal processing apparatuses and coincidence count events are generated as a test. The events generated are processed by a delay time control apparatus and a variable delay circuit is controlled to improve the accuracy of coincidence counting.Type: GrantFiled: August 14, 2006Date of Patent: December 25, 2007Assignee: Hitachi, Ltd.Inventors: Takafumi Ishitsu, Kensuke Amemiya, Yuuichirou Ueno, Takashi Matsumoto, Takashi Matsumoto
-
Patent number: 7312439Abstract: A new type of radon progeny monitor called an electret radon progeny integrating sampling unit (E-RPISU) using an electret ion chamber to measure radon progeny concentration. A conventional 1 LPM particulate air sampling system is used to collect the radon progeny on a roughly 3.5 cm2 filter that is mounted on a side of an electret ion chamber such that the collected progeny are exposed to the inside of the chamber. Alpha radiation emitted by the progeny collected on the filter ionizes the air in the approximately 220 ml chamber. Ions of opposite polarity collect on the surface of the electret of suitable thickness and reduce its surface voltage. A specially built surface voltmeter is used to measure the electret voltage before and after sampling. The electret voltage drop that occurs during the sampling period is proportional to the time integrated progeny concentration. A similar unit with a screen in the place of filter is used to measure unattached progeny concentration.Type: GrantFiled: August 17, 2004Date of Patent: December 25, 2007Assignee: Rad Elec Inc.Inventors: Payasada Kotrappa, Lorin R. Stieff, John C. Dempsey
-
Patent number: 7312440Abstract: Apparatus for transporting a fluid, atomizers, reactors, integrated fuel processing apparatus, combinations thereof, methods of atomizing reactants, methods of moving fluids, methods of reverse-flow in a reactor, and combinations thereof, are provided. One exemplary apparatus for transporting a fluid, among others, includes: a channel for receiving a fluid; a sensor for determining an internal condition of the fluid in the channel; and a channel actuator in communication with the sensor for changing a cross-sectional area of the channel based on the internal condition, wherein the change in cross-sectional area controls a parameter selected from a pressure and a fluid flow.Type: GrantFiled: January 13, 2004Date of Patent: December 25, 2007Assignee: Georgia Tech Research CorporationInventors: F. Levent Degertekin, Andrei G. Fedorov
-
Patent number: 7312441Abstract: A method of controlling the population of ions in a mass spectrometer in which a first sample of ions is provided in the mass spectrometer, a measure of abundance of a species of interest in the first sample of ions is determined, the measure of abundance comprising an intensity value, and a second sample of ions is introduced into the mass spectrometer. The second sample of ions is introduced in an amount determined at least in part on the measure of abundance of the species of interest in the first sample of ions.Type: GrantFiled: March 9, 2005Date of Patent: December 25, 2007Assignee: Thermo Finnigan LLCInventors: Adrian Land, Lee Earley, Mark Hardman, Rexford T. Heller, Michael W. Senko
-
Patent number: 7312442Abstract: A method for processing ions in mass spectrometry is provided. The method provides for processing ions in a ion processing cell having elongated segmented rods, a circuit for applying RF voltages and a circuit for applying DC voltage selectively to the segments of the segmented rods. The method comprises applying an RF field to the elongated volume, applying DC voltage selectively to the segments to form a plurality of potential regions having discrete potentials; providing analyte ions to a first potential region and processing at least a portion of the analytes in the first potential region. In one embodiment, the potential region is a potential well.Type: GrantFiled: September 13, 2005Date of Patent: December 25, 2007Assignee: Agilent Technologies, IncInventor: Stuart C. Hansen
-
Patent number: 7312443Abstract: A reflectron (109) is provided with at least two sets of field resistances (131a-131n, 137a-137n) which may be connected together or separately to the reflectron electrodes (123a-123n) in order to be able to provide a plurality of different shaped electrical fields inside the reflectron (109).Type: GrantFiled: November 19, 2003Date of Patent: December 25, 2007Assignee: GE Healthcare Bio-Sciences ABInventor: Jan Axelsson
-
Patent number: 7312444Abstract: The present invention relates to an apparatus and method for focusing, separating, and detecting gas-phase ions using the principles of electrohydrodynamic quadrupole fields at high pressures, at or near atmospheric pressure. Ions are entrained in a concentric flow of gas and travel through a high-transmission element into a RF/DC quadrupole, exiting out of the RF/DC quadrupole, and then impacting on an ion detector, such as a faraday plate; or through an aperture or capillary tube with subsequent identification by a mass spectrometer. Ions with stable trajectories pass through the RF/DC quadrupole while ions with unstable trajectories drift off-axis collide with the rods and are lost. Alternatively, detection of ions with unstable trajectories can be accomplished by allowing the ions to pass through the rods and be detected by an off-axis detector.Type: GrantFiled: May 24, 2005Date of Patent: December 25, 2007Assignee: Chem - Space Associates, Inc.Inventors: Ross Clark Willougbhy, Edward William Sheehan
-
Patent number: 7312445Abstract: Disclosed herein is a pyramid-shaped near field probe which forms and changes a near field at the aperture of the probe. The pyramid-shaped near field probe of the present invention includes a probe body and metal films. The probe body is constructed in the form of a pyramid using a semiconductor process using a dielectric member and receives an electromagnetic wave. The metal films are symmetrically coated on two predetermined sides of four sides of the probe body while being spaced apart from each other. The pyramid-shaped near field probe allows a surface plasmon wave induced on the surfaces of the metal films due to the electromagnetic wave to progress to the aperture of the probe body through the boundary surface between the probe body and the metal films.Type: GrantFiled: April 13, 2005Date of Patent: December 25, 2007Assignee: Samsung Electro-Mechanics Co., Ltd.Inventors: Anatoliy Lapchuk, Ho Seop Jeong, Dong Ik Shin
-
Patent number: 7312446Abstract: Systems and methods for process monitoring based upon X-ray emission induced by a beam of charged particles such as electrons or ions. Concept as expressed herein.Type: GrantFiled: October 8, 2003Date of Patent: December 25, 2007Assignee: Applied Materials, Israel, Ltd.Inventor: Dror Shemesh
-
Patent number: 7312447Abstract: There is described a method for depicting a predetermined pattern, such as a diffraction pattern employed in an optical element, on a substrate. The method includes the steps of: acquiring shape data of the predetermined pattern; generating a first input signal for deflecting an electron beam emitted from an electron gun in a main-scanning direction, and a second input signal for deflecting the electron beam in a sub-scanning direction, based on the shape data of the predetermined pattern; adjusting an alternating bias signal, having a specific frequency, according to the shape data of the predetermined pattern; superposing the alternating bias signal on the second input signal; and deflecting the electron beam emitted from the electron gun in the sub-scanning direction according to the second input signal on which the alternating bias signal is superposed, while scanning the electron beam by deflecting it in a main-scanning direction.Type: GrantFiled: March 8, 2004Date of Patent: December 25, 2007Assignee: Konica Minolta Holdings Inc.Inventors: Osamu Masuda, Kazumi Furuta
-
Patent number: 7312448Abstract: A method and an apparatus are for three-dimensional tomographic image generation in a scanning electron microscope system. At least two longitudinal marks are provided on the top surface of the sample which include an angle therebetween. In consecutive image recordings, the positions of these marks are determined and are used to quantify the slice thickness removed between consecutive image recordings.Type: GrantFiled: April 6, 2005Date of Patent: December 25, 2007Assignee: Carl Zeiss NTS GmbHInventor: Edward Principe
-
Patent number: 7312449Abstract: An electron beam system wherein a shot noise of an electron beam can be reduced and a beam current can be made higher, and further a shaped beam is formed by a two-stage lenses so as to allow for an operation with high stability. In this electron beam system, an electron beam emitted from an electron gun is irradiated onto a sample and secondary electrons emanated from the sample are detected. The electron gun is a thermionic emission type and designed to operate in a space charge limited condition. A shaping aperture and a NA aperture are arranged in front locations of the electron gun. An image of the shaping aperture formed by an electron beam emitted from the thermionic emission electron gun is focused onto a surface of the sample through the two-stage lenses.Type: GrantFiled: January 14, 2005Date of Patent: December 25, 2007Assignee: Ebara CorporationInventors: Mamoru Nakasuji, Takao Kato, Tohru Satake, Kenji Watanabe, Takeshi Murakami, Nobuharu Noji
-
Patent number: 7312450Abstract: An infrared detecting device for reducing current consumption while maintaining performance is disclosed. The device includes a drive power supply circuit which comprises a current generating circuit and a distribution circuit, and which supplies a drive current to each of signal circuits comprising an I/V conversion circuit, a voltage amplification circuit, a detection circuit and an output circuit. The current generating circuit includes a reference current source, a fixed current source providing a fixed current based on the reference current and a variable current source providing a variable current stepped up or down to any different currents based on the reference current. The distribution circuit distributes the drive current to a part of the signal circuits based on the current from the fixed current source and distributes the drive current to a remaining part of the signal circuits based on the current from the variable current source.Type: GrantFiled: November 11, 2004Date of Patent: December 25, 2007Assignee: Matsushita Electric Works, Ltd.Inventors: Suguru Fukui, Teruki Hatatani, Yuji Takada, Atsushi Hironaka
-
Patent number: 7312451Abstract: Improved techniques for estimating dough development times are provided in order to permit rapid and accurate forecasts of dough development times in commercial baking operations with different lots of wheat flour. The method of the invention involves directing near infrared radiation against a dough formulation during mixing thereof, and collecting a plurality of time-dependant absorbance spectra; the spectral data are then analyzed, preferably by calculating magnitude ratios at predetermined spectral absorbances, and then estimating the dough development time as a function of the magnitude ratios.Type: GrantFiled: June 22, 2004Date of Patent: December 25, 2007Assignee: American Institute of BakingInventors: Richard Dempster, Maureen Olewnik, Virgil S. Smail
-
Patent number: 7312452Abstract: The invention relates to a mobile remote detection device for accumulations of methane, comprising an emitter device having a light source in order to generate light, the wavelength of said light source being tuned with the spectral signature of methane, whereby the light can be directed onto a measuring field. The detection device also comprises a detector device for detecting backscattered light, and an evaluation device. The aim of the invention is to improve the remote detection device in such a manner that it has a high degree of measuring sensitivity with a compact and stable structure. According to the invention, the light source generates light with a wavelength at which methane is absorbed, wherein the wavelength lies between 3200 nm and 3300 nm, and the light source has an optical parametric oscillator with injection seeding, the oscillator being associated with a pump laser.Type: GrantFiled: October 21, 2005Date of Patent: December 25, 2007Assignee: Deutsches Zentrum fur Luft- und Raumfahrt E.V.Inventors: Hans H. Klingenberg, Andreas Fix, Peter Mahnke, Christian Lemmerz
-
Patent number: 7312453Abstract: Methods for determining corrosion products on a substrate are disclosed. In one embodiment, a non-destructive method for determining an amount of corrosion product on a metallic substrate includes non-destructively determining a value Ia of infrared energy absorbed in a corrosion product on a metallic substrate; and correlating the value Ia of the infrared energy absorbed to an amount of the corrosion product.Type: GrantFiled: September 25, 2006Date of Patent: December 25, 2007Assignee: The Boeing CompanyInventors: Bruce R. Davis, Paul H. Shelley
-
Patent number: 7312454Abstract: A non-destructive inspection device has an infrared sensor for infrared thermography inspection of a structure or surface. A rotatable reflector reflects infrared light from an inspected surface to an infrared sensor. An inspecting portion of a non-destructive device is magnetically coupled to an actuating portion of the device for concerted movement of the portions. An inspection device includes both an infrared sensor for infrared imaging and an optical device such as a camera for visible light imaging.Type: GrantFiled: October 26, 2005Date of Patent: December 25, 2007Assignee: The Boeing CompanyInventors: Morteza Safai, Gary E. Georgeson
-
Patent number: 7312455Abstract: Methods and systems for providing scatter correction in a positron emission tomography (PET) system are provided. The method includes determining a look-up table of scatter sinograms during a PET acquisition scan period. The method further includes scatter correcting acquired scan data obtained during the PET acquisition scan period.Type: GrantFiled: January 12, 2005Date of Patent: December 25, 2007Assignee: The General Electric CompanyInventors: Ravindra Mohan Manjeshwar, Floribertus Philippus Martinus Heukensfeldt Jansen, Charles William Stearns
-
Patent number: 7312456Abstract: A dynamic Single Photon Emission Computed Tomography (SPECT) system utilizes an array of modular detectors structured in a dome shape and being independently tiltable in polar or azimuth angle. The system can be used to image cardio-vascular studies as well as other quantitative studies and 3D imaging studies, without requiring movement or motion of the detectors.Type: GrantFiled: September 28, 2005Date of Patent: December 25, 2007Assignee: Siemens Medical Solutions USA, Inc.Inventors: Jinhun Joung, John C. Engdahl
-
Patent number: 7312457Abstract: A spectrometer having improved energy resolution by correcting for error introduced by charge carrier trapping. By monitoring the shape of the pulses produced by the detector, a digital filter is adjusted to improve the energy resolution. The adjustment is performed manually by an operator or automatically by an automatic optimizer circuit that modifies the digital filter until the spectral peaks have a width and shape matching the desired characteristics, which are a minimum width and a substantially symmetrical shape. By correcting for the energy loss associated with long rise time events, the charge-trapping correcting spectrometer produces spectral peaks with improved energy resolution.Type: GrantFiled: May 2, 2005Date of Patent: December 25, 2007Assignee: Advanced Measurement Technology, Inc.Inventors: Frank Sergent, Jesse Ursery, Rex C. Trammell
-
Patent number: 7312458Abstract: A method of reducing polarization within an image detecting device includes coupling at least one blocking contact to the image detecting device, and heating the image detecting device to facilitate reducing polarization within the image detecting device.Type: GrantFiled: June 22, 2005Date of Patent: December 25, 2007Assignee: General Electric CompanyInventor: Ira Blevis
-
Patent number: 7312459Abstract: Disclosed is a measuring apparatus for measuring the position, size and/or shape of a light convergent point of an EUV light source. In one preferred form, the apparatus includes a light receiving device for receiving EUV light diverging from a light convergent point, an optical system for directing the EUV light toward the light receiving device, a light blocking member disposed in a portion of light path for the EUV light and having a plurality of openings, and a system for detecting a spatial distribution of the EUV light at the light convergent point, on the basis of reception of EUV light by the light receiving device.Type: GrantFiled: March 17, 2005Date of Patent: December 25, 2007Assignee: Canon Kabushiki KaishaInventors: Mitsuaki Amemiya, Akira Miyake
-
Patent number: 7312460Abstract: The present invention relates to a method of detecting and localizing gamma radiation from a target source in the possible presence of background gamma radiation, said method comprising the steps of: a) detecting the directional intensity distribution of gamma rays with respect to a preferred direction, b) analysing the direction dependence, correcting for efficiency and solid angle of the detection means, c) determining the amount and spatial distribution of background radiation, d) determining the background contribution of the intensity measured in the preferred direction from the amount and spatial distribution of background radiation, e) determining the strength of gamma radiation in a preferred direction by subtracting from the intensity measured in the preferred direction any background contribution from non preferred directions.Type: GrantFiled: May 10, 2005Date of Patent: December 25, 2007Assignee: GFE Gesselschaft fur Forschungsund Entwicklungsservice mbHInventors: Jurgen Gerl, Ivan Kojouharov, Frederic Ameil, Alicija Surowiec
-
Patent number: 7312461Abstract: A laparoscopic tumor therapy method and an articulated electron beam transport system are provided for use with a high power, long focus electron source for tumor therapy. The high power, long focus electron source generates an e-beam. The e-beam is transported through a laparoscopic tube proximate a target tumor for electron irradiation therapy.Type: GrantFiled: June 2, 2005Date of Patent: December 25, 2007Assignee: UChicago Argonne LLCInventors: John W. Lewellen, John Noonan
-
Patent number: 7312462Abstract: There is provided an illumination system. The illumination system includes a source for light having a wavelength ?193 nm, a field plane, and a collector having a mirror shell for receiving a part of the light. The mirror shell is arranged so that a real image of the source is formed and comes to lie in a plane that is defocused relative to the field plane by more than 30 mm, so that the field plane is illuminated in a predetermined region, substantially homogeneously.Type: GrantFiled: August 31, 2004Date of Patent: December 25, 2007Assignee: Carl Zeiss SMT AGInventors: Wolfgang Singer, Johannes Wangler, Eric Sohmen
-
Patent number: 7312463Abstract: A catadioptric projection optical system for forming a reduced image of a first surface (R) on a second surface (W) is a relatively compact projection optical system having excellent imaging performance as well corrected for various aberrations, such as chromatic aberration and curvature of field, and being capable of securing a large effective image-side numerical aperture while suitably suppressing reflection loss on optical surfaces. The projection optical system comprises at least two reflecting mirrors (CM1, CM2), and a boundary lens (Lb) whose surface on the first surface side has a positive refracting power, and an optical path between the boundary lens and the second surface is filled with a medium (Lm) having a refractive index larger than 1.1.Type: GrantFiled: October 20, 2006Date of Patent: December 25, 2007Assignee: Nikon CorporationInventor: Yasuhiro Omura
-
Patent number: 7312464Abstract: An ion implantation apparatus structure is provided that does not allow gas to accumulate in the vicinity of a wafer when implantation ions to the wafer. The ion implantation apparatus includes a rotating body that rotates in a fixed direction, a vacuum chamber that houses the rotating body, and an ion beam injecting portion that injects an ion beam to a wafer placed on the rotating body. The rotating body comprises one or more wafer placement boards having a wafer placement face on one face, a driving portion that drives the wafer placement board, and a gas evacuation member provided protruding from one face of the wafer placement board having a gas evacuation wall face on the front in the direction of rotation, and functions such that due to rotation of the wafer placement board, the gas evacuation wall face collides with gas present on one face of the wafer placement board and the gas is evacuated upward or to the rear face of the wafer placement face.Type: GrantFiled: September 27, 2005Date of Patent: December 25, 2007Assignee: Sharp Kabushiki KaishaInventor: Yoshihiro Sohtome
-
Patent number: 7312465Abstract: A radiation-shielding container for storing a syringe includes a base assembly, a sleeve and a cap assembly securable to the base assembly. The base assembly includes a body portion defining a chamber portion for receiving the syringe and including a base portion coupled to the body portion. The base portion includes a radiation shield and a shell positioned proximate an outer surface of the radiation shield. The sleeve configured for receiving a portion of the syringe is housed within the chamber portion and releasably secured to the base assembly. The cap assembly defines a second chamber portion for receiving the syringe and includes a radiation shield and a shell positioned proximate an outer surface of the radiation shield.Type: GrantFiled: October 20, 2005Date of Patent: December 25, 2007Assignee: Vulcan Global Manufacturing Solutions, Inc.Inventor: Brian M Schaber
-
Patent number: 7312466Abstract: Embodiments of a radiation shield are disclosed. One non-limiting embodiment of the radiation shield may comprise a first layer, a second layer, and a third layer. The first layer may include a neutron moderating material. The second layer may be adjacent the first layer and may include a neutron absorbing material. The third layer may be adjacent the second layer, and may include a photonic radiation attenuating material. At least the first layer and the second layer may be removable from the radiation shield.Type: GrantFiled: May 26, 2005Date of Patent: December 25, 2007Assignee: TDY Industries, Inc.Inventor: Steven G. Caldwell
-
Patent number: 7312467Abstract: An apparatus and associated method for reading out X-ray information of an X-ray picture stored in a phosphor layer includes: an irradiation device for irradiating the phosphor layer with a stimulating light beam to be moved along a line over the phosphor layer, and in so doing stimulating the phosphor layer into emitting emission light; a detector for collecting the emission light emitted from the storage phosphor layer and for converting the emission light collected into a detector signal S; a processing unit for deducing picture signal values B for pixels of the picture along the line from the detector signal S; and two or more sensors located at different reference positions to collect reference times when the light beam is located at the different reference positions. The processing unit deduces a number of detector signal values D from the detector signal S to deduce the picture signal values B between the two reference times.Type: GrantFiled: June 28, 2005Date of Patent: December 25, 2007Assignee: Agfa-Gevaert HealthCare GmbHInventors: Bernd Gerstlauer, Detlef Brautmeier, Rainer Nebosis, Axel Kasper
-
Patent number: 7312468Abstract: The semiconductor light-emitting element uses a compound semiconductor quantum well structure comprising a well layer, and barrier layers between which the well layer is sandwiched, as an active layer. In the adjacent well layer and barrier layers of the semiconductor light-emitting element, the well layer has in part a doped well region to which an n-type impurity is added at the interface with the barrier layer on the electron injection side, and in the vicinity of this interface, and the barrier layer has a doped barrier region to which the n-type impurity is added at least at the interface and in the vicinity of this interface.Type: GrantFiled: November 12, 2003Date of Patent: December 25, 2007Assignee: Pioneer CorporationInventors: Atushi Watanabe, Atsuya Ito, Hirokazu Takahashi, Yoshinori Kimura, Mamoru Miyachi
-
Patent number: 7312469Abstract: An electronic device comprising a semiconductor layer in contact with a number of electrodes, wherein the semiconductor layer includes a small molecular thiophene compound consisting of a plurality of thiophene units, each thiophene unit being represented by structure (A) wherein each thiophene unit is bonded at either or both of the second ring position and the fifth ring position, wherein there is at least one thiophene unit where R1 is present at the third ring position or the fourth ring position, or at both the third ring position and the fourth ring position, wherein for any two adjacent thiophene units there is excluded the simultaneous presence of the same or different R1 at the 3-position of one thiophene unit and at the 3?-position of the other thiophene unit.Type: GrantFiled: June 10, 2004Date of Patent: December 25, 2007Assignee: Xerox CorporationInventors: Beng S. Ong, Ping Liu, Maria Birau, Yiliang Wu
-
Patent number: 7312470Abstract: The present invention relates to a TFT array panel and a fabricating method thereof. A gate insulating layer and a passivation layer are formed by printing organic insulating material in order to simplify the fabricating process. The inventive TFT panel includes an insulating substrate, and a gate wire formed on the insulating substrate. The gate wire includes a gate line and a gate pad connected to one end of the gate line. A gate insulating layer is formed on the insulating substrate while exposing the gate pad and a portion of the gate line close to the gate pad. A semiconductor pattern is formed on the gate insulating layer. A data wire is formed on the gate insulating layer. The data wire includes a data line, a source electrode connected to the data line, a drain electrode facing the source electrode and a data pad connected to one end of the data line. A passivation layer is formed on the gate insulating layer while exposing the data pad and a portion of the data line close to the data pad.Type: GrantFiled: June 20, 2002Date of Patent: December 25, 2007Assignee: Samsung Electronics Co., Ltd.Inventors: Jae-Seong Byun, Kun-Jong Lee, Hyun-Su Lim, Jong-Hwan Cha, Bae-Hyoun Jung
-
Patent number: 7312471Abstract: A thin film transistor and a fabricating method of a thin film transistor for a liquid crystal display device includes forming a polycrystalline silicon film on a substrate, the polycrystalline silicon film having square shaped grains; forming an active layer by etching the polycrystalline silicon film; forming a gate electrode over the active layer, the gate electrode overlapping the active layer to form a channel region, the channel region being formed inside one of the grains; and forming source and drain electrodes connected to both sides of the active layer.Type: GrantFiled: December 29, 2003Date of Patent: December 25, 2007Assignee: LG.Philips LCD Co., Ltd.Inventor: Yun-Ho Jung
-
Patent number: 7312472Abstract: In the present invention, (Ti1?xAx)N [in which A is at least one kind of metal selected from the group consisting of Al, Ga, and In] is used as a metal nitride layer, so that a Group III nitride compound semiconductor layer is formed on the metal nitride layer. When a Ti layer is formed between the metal nitride layer having a sufficient thickness and a substrate and the titanium layer is removed, a Group III nitride compound semiconductor device using metal nitride as a substrate can be obtained.Type: GrantFiled: January 10, 2002Date of Patent: December 25, 2007Assignee: Toyoda Gosei Co., Ltd.Inventors: Toshiaki Chiyo, Jun Ito, Naoki Shibata
-
Patent number: 7312473Abstract: In display devices using thin film transistors, a graphoepitaxy is used for a semiconductor layer crystallizing process. Thus, a display device in which crystallinity is improved, a variation in characteristics of thin film transistors is reduced, display nonuniformity is less, and a display quality is superior is provided. Steps are formed on a substrate in advance and an amorphous silicon film is formed thereon, and then laser crystallization is conducted in a direction perpendicular to the steps.Type: GrantFiled: December 27, 2002Date of Patent: December 25, 2007Assignee: Semiconductor Energy Laboratory Co., Ltd.Inventors: Jun Koyama, Atsuo Isobe, Hiroshi Shibata, Shunpei Yamazaki
-
Patent number: 7312474Abstract: A light emitting diode is provided having a Group III nitride based superlattice and a Group III nitride based active region on the superlattice. The active region has at least one quantum well structure. The quantum well structure includes a first Group III nitride based barrier layer, a Group III nitride based quantum well layer on the first barrier layer and a second Group III nitride based barrier layer. A Group III nitride based semiconductor device and methods of fabricating a Group III nitride based semiconductor device having an active region comprising at least one quantum well structure are provided. The quantum well structure includes a well support layer comprising a Group III nitride, a quantum well layer comprising a Group III nitride on the well support layer and a cap layer comprising a Group III nitride on the quantum well layer.Type: GrantFiled: October 13, 2004Date of Patent: December 25, 2007Assignee: Cree, Inc.Inventors: David Todd Emerson, James Ibbetson, Michael John Bergmann, Kathleen Marie Doverspike, Michael John O'Loughlin, Howard Dean Nordby, Jr., Amber Christine Abare
-
Patent number: 7312475Abstract: To improve the reliability of an optical element and its manufacturing method. An optical element includes a substrate, a columnar section formed above the substrate and having an upper surface for light emission or incidence, a resin layer including a first section formed above the substrate and around the columnar section, and a second section formed at an end section of the upper surface of the columnar section, and an electrode that passes above the first and second sections, of the resin layer and is electrically connected to an end section of an exposed area in the upper surface of the columnar section.Type: GrantFiled: June 14, 2005Date of Patent: December 25, 2007Assignee: Seiko Epson CorporationInventors: Michifumi Nagawa, Masato Gomi