Patents Issued in May 20, 2008
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Patent number: 7375500Abstract: A method of calculating torque of a Lundell-type synchronous generator is disclosed in which only power generation output current and a rotational speed are input for calculation of the amount of electric power and the amount of losses for thereby enabling calculation of power generating torque, based on a sum of the amount of electric power and the amount of losses, which is generated as an output. The present method establishes formulae enabling calculation based on only output current and the rotational speed, enabling a minimal number of inputs to shorten a calculation time interval.Type: GrantFiled: July 28, 2006Date of Patent: May 20, 2008Assignee: Denso CorporationInventors: Atsushi Umeda, Tsutomu Shiga, Kouichi Ihata
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Patent number: 7375502Abstract: A method and a circuit for scrambling the current signature of a load comprising at least one integrated circuit executing digital processings, including supplying at least the integrated circuit from a supply voltage external to the circuit by combining a current provided by a first linear regulator with a current provided by at least one capacitive switched-mode power supply circuit with one or several switched capacitances.Type: GrantFiled: February 7, 2006Date of Patent: May 20, 2008Assignees: STMicroelectronics S.A., Universite D.Aix-Marseille IInventors: Alexandre Malherbe, Edith Kussener, Vincent Telandro
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Patent number: 7375503Abstract: A system for sensing the supply current of a switched DC-to-DC converter. The system includes a first circuit that senses a first voltage that is proportional to the supply current, wherein the first voltage has first ripple; a second circuit coupled to the first circuit, wherein the second circuit outputs a second voltage that is based on the first voltage, and wherein the second voltage has a second ripple that is smaller than the first ripple; and a third circuit coupled to the second circuit, wherein the third circuit compares the second voltage to a reference voltage to provide an indication of the supply current.Type: GrantFiled: January 11, 2006Date of Patent: May 20, 2008Assignee: Atmel CorporationInventor: Gian Marco Bo
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Patent number: 7375504Abstract: Provided is a low-reference-current generator that includes a circuit employing two feedback loops enabling it to operate even at a low voltage, has a high power supply rejection ratio (PSRR) to control power supply noise, and simply forms a voltage without a voltage-to-current converter used in a conventional general reference current generator. The reference current generator includes: a first voltage generator receiving a predetermined current and generating a first voltage that decreases as temperature increases; a second voltage generator generating a second voltage that increases as temperature increases; a first current generator generating a first current corresponding to the first voltage; a second current generator generating a second current corresponding to the second voltage; and a reference current generator receiving the first current and the second current and generating a reference current that is the sum of the first current and the second current.Type: GrantFiled: December 9, 2005Date of Patent: May 20, 2008Assignee: Electronics and Telecommunications Research InstituteInventors: Bong Ki Mheen, Min Hyung Cho, Chong Ki Kwon, Jin Yeong Kang
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Patent number: 7375505Abstract: A method and an apparatus for testing the function of a plurality of microstructural elements by irradiation with particle radiation. All of the microstructural elements detected as malfunctioning are listed in a first error list in a first test sequence. The microstructural elements listed in the first error list are tested once more in at least one further test sequence and at least the result of the test sequence last carried out is evaluated to establish the overall test result. The first test sequence is designed so that, if possible, all of the microstructural elements which are actually malfunctioning are detected. The invention further relates to a method for producing microstructural elements which are constructed as a plurality on a substrate and are tested according to the above test method.Type: GrantFiled: April 4, 2002Date of Patent: May 20, 2008Assignee: Applied Materials, Inc.Inventors: Matthias Brunner, Ralf Schmid
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Patent number: 7375506Abstract: A comparison device includes a one-threshold comparator receiving an input signal and a set value and generating a resultant signal. The comparison device further includes a sampler for sampling the resultant signal and a controller for blocking the sampler, after a switching of the input signal, as long as a timeout mechanism does not indicate that a given timeout duration has elapsed since the verification of a predetermined instability criterion.Type: GrantFiled: July 28, 2006Date of Patent: May 20, 2008Assignee: Atmel Nantes SAInventor: Karl Courtel
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Patent number: 7375507Abstract: An assembly group for current measurement comprises a conductor plate with three cuts and a measuring element placed on the conductor plate that has a difference sensor formed from two magnetic field sensors. By means of the three cuts a first and a second conductor section are formed in the conductor plate, wherein the current direction in the second conductor section runs opposite to the current direction in the first conductor section. The first magnetic field sensor is located above the first conductor section and the second magnetic field sensor is located above the second conductor section. The magnetic field sensors are sensitive to a magnetic field that runs parallel to the surface of the conductor plate and orthogonal to the current direction in the two conductor sections.Type: GrantFiled: October 3, 2006Date of Patent: May 20, 2008Assignee: Melexis Technologies SAInventors: Robert Racz, Samuel Huber
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Patent number: 7375508Abstract: A device and a process for the calibration of a semi-conductor component test system The invention relates to a process and a device for the calibration of a probe card and/or of a semi-conductor component test apparatus including a first connection, at which a corresponding signal, in particular a calibration signal can be applied, and a second connection, connected or connectable with the first connection, at which the signal, in particular the calibration signal, can be emitted, and a third connection, at which a corresponding further signal, in particular a calibration signal, can be applied, and a fourth connection, connected or connectable with the third connection, at which the further signal, in particular the calibration signal, can be emitted.Type: GrantFiled: June 28, 2005Date of Patent: May 20, 2008Assignee: Infineon Technologies AGInventor: Thorsten Bucksch
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Patent number: 7375509Abstract: A position sensor includes a magnet and a sensor element that are movable relative to one another. The sensor element is capable of providing an output in response to a position of the magnet relative to the sensor element. Relative position sensing between the sensor element, such as a Hall Effect sensor, and the magnet may be determined by way of circuitry for detection of an approximate inflection point in the output of the sensor.Type: GrantFiled: March 2, 2006Date of Patent: May 20, 2008Assignee: Stoneridge Control Devices, Inc.Inventor: Todd Meaney
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Patent number: 7375510Abstract: A rotational position sensor having a compact and simple structure, in which a magnetic surface can be formed to have a more accurate shape, and an electronically controlled throttle device for an internal combustion engine, which employs the rotational position sensor. The rotational position sensor comprises a pair of substantially half disk-shaped magnetic cores disposed in an opposed relation to each other with a magnetic sensitive device interposed therebetween, a pair of substantially arc-shaped magnetic cores disposed in an opposed relation to each other along outer peripheries of the half disk-shaped magnetic cores, and a permanent magnet fixed in contact with at least one of the arc-shaped magnetic cores. Magnetic flux generating from the permanent magnet flows successively through one of the arc-shaped magnetic cores, the half disk-shaped magnetic cores, and the other of the arc-shaped magnetic cores, followed by returning to the permanent magnet.Type: GrantFiled: August 18, 2004Date of Patent: May 20, 2008Assignees: Hitachi, Ltd., Hitachi Car Engineering Co., Ltd.Inventors: Kenji Miyata, Masanori Kubota, Kenichi Katagishi, Kenji Ono, Masahiko Soshino, Mitsuru Sudo
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Patent number: 7375511Abstract: A rotary input apparatus is disclosed. The rotary input apparatus comprising a wheel of circular shape having an insertion hole, a center key inserted into the insertion hole and having one or more securing grooves, a magnet joined to a surface of the wheel to co-operate with the wheel and magnetized to have alternating N- and S-poles, a detection element positioned to face the magnet for detecting the rotation of the magnet, a printed circuit board on which the detection element mounted, a base to which the printed circuit board is secured and which has one or more support protrusions that are inserted into the securing grooves, and a holder joined to the base and interposed between the wheel and the base to rotatably support the wheel, allows greater aesthetic value as the center key is not rotated and always maintains a constant orientation.Type: GrantFiled: October 13, 2006Date of Patent: May 20, 2008Assignee: Samsung Electro-Mechanics Co., Ltd.Inventor: Eung-Cheon Kang
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Patent number: 7375512Abstract: A rotary input apparatus is disclosed. As the rotary input apparatus comprises a rotatable wheel; a magnet joined to a surface of the wheel to co-operate with the wheel and magnetized to have alternating N- and S-poles; an electromagnet part positioned facing the magnet and magnetized to have at least N- or S-pole; a printed circuit board, to which the electromagnet part is joined, including a driving part which supplies an electrical current to the electromagnet part, and a detection element which receives electrical power from the driving part for operation, is positioned facing the magnet, and which detects the rotation of the magnet; a control part which receives a signal and controls the operation of the driving part in correspondence with the received signal; and a base to which the printed circuit board is secured, various types of input may be made through the rotation speed, direction, and angle, etc.Type: GrantFiled: October 19, 2006Date of Patent: May 20, 2008Assignee: Samsung Electro-Mechanics Co., Ltd.Inventor: Eung-Cheon Kang
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Patent number: 7375513Abstract: A method for measuring a magnetostriction value of a magnetoresistive element according to one embodiment includes placing a substrate carrying one or more magnetoresistive elements on a fixture; applying a first magnetic field about parallel to the substrate; applying a second magnetic field about perpendicular to the substrate and about parallel to magnetoresistive layers of the one or more elements; measuring a signal from at least one of the one or more elements; applying a mechanical stress to the substrate; and monitoring the signal from the at least one of the one or more elements while changing the first magnetic field.Type: GrantFiled: October 1, 2007Date of Patent: May 20, 2008Assignee: International Business Machines CorporationInventor: Hubert Grimm
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Patent number: 7375514Abstract: A non-destructive testing device has an excitation coil with a plurality of conductor ribbons attached to a flexible membrane. A frame supports the membrane and incorporates wheels for translation across a surface to be inspected and resilient suspension for maintaining the membrane with the excitation coil and wheels in intimate contact with the surface, the membrane flexing to maintain contact with a smoothly curved surface as found in aircraft structures. A magnetoresitive (MR) array is supported within the frame inserted in the membrane to be in close proximity to the surface. The MR array detects the magnetic field resulting from the eddy currents created by the excitation coil for identification of cracks or features beneath the surface under inspection.Type: GrantFiled: November 1, 2005Date of Patent: May 20, 2008Assignee: The Boeing CompanyInventors: Raymond D. Rempt, George A. Perry
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Patent number: 7375515Abstract: A magnetic sensor circuit supplying an excitation current to an MI device, and having a detection signal supplied thereto corresponding to a magnetic field intensity from the MI device based on the excitation current. The magnetic sensor circuit includes a pulse current supplying circuit supplying a pulse current to the MI device; a sample-and-hold circuit maintaining an approximately peak value of the detection signal and outputting a hold signal; and a temperature compensation part compensating temperature characteristics of the magnetic sensor circuit with respect to the hold signal. The sample-and-hold circuit may include a switching circuit and a holding capacitor. The switching circuit may have an opening/closing control signal supplied thereto based on timing of the pulse current.Type: GrantFiled: December 23, 2005Date of Patent: May 20, 2008Assignee: Ricoh Company, Ltd.Inventors: Kazuya Omagari, Masaki Mori
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Patent number: 7375516Abstract: A magnetic field detector having a reference magnetoresistive element and a magnetic field detecting magnetoresistive element. The reference magnetoresistive element and the magnetic field detecting magnetoresistive element each has a stack structure including an antiferromagnetic layer, a fixed layer of a ferromagnetic material with the direction of magnetization fixed by the antiferromagnetic layer, a nonmagnetic layer, and a free layer of a ferromagnetic material with the direction of magnetization adapted to be changed by an external magnetic field. The reference magnetoresistive element is such that the direction of magnetization of the fixed layer and the direction of magnetization of the free layer in the nonmagnetic field are parallel or antiparallel to each other, and the magnetic field detecting magnetoresistive element is such that the direction of magnetization of the fixed layer and the direction of magnetization of the free layer in the nonmagnetic field are different from each other.Type: GrantFiled: September 22, 2004Date of Patent: May 20, 2008Assignee: Mitsubishi Electric CorporationInventors: Takashi Takenaga, Hiroshi Kobayashi, Takeharu Kuroiwa, Sadeh Beysen, Taisuke Furukawa
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Patent number: 7375517Abstract: A belt buckle includes a housing having a base, first and second sidewalls projecting from the base so as to form a substantially U-shaped member and a lug member projecting from said base. There is also an electrical switching fastened to the base that has a pair of contact pins. A tongue plate preferably has a base portion and an elongated portion projecting from the base portion. The elongated portion may have a free-end opposite the base portion, a lower planar surface having a recess and mating member mounted at the free end thereof. In an assembled position the tongue plate is inserted in the housing such that the lug engages the recess and the mating member engages the contact pins.Type: GrantFiled: February 18, 2005Date of Patent: May 20, 2008Assignee: Fonar CorporationInventors: Arto Cinoglu, Mark Gelbien, Joseph Citro
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Patent number: 7375518Abstract: A magnetic resonance imaging apparatus is provided in which vibration of a gradient magnetic field coil is reduced, the vibration is not transmitted to a static magnetic field correcting unit, and space can be saved.Type: GrantFiled: October 14, 2004Date of Patent: May 20, 2008Assignee: Hitachi Medical CorporationInventors: Akira Kurome, Yoshihide Wadayama
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Patent number: 7375519Abstract: Phase and magnitude correction is performed in two dimensions to reduce ghosting in single shot and multi-shot EPI scans. First, a phase/magnitude correction in the readout direction is carried out to reduce echo shifts and gradient waveform distortions. Then, a two dimensional phase/magnitude correction is performed to remove the remaining xy phase/magnitude errors.Type: GrantFiled: April 20, 2006Date of Patent: May 20, 2008Assignee: General Electric CompanyInventor: Yuval Zur
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Patent number: 7375520Abstract: A T2 preparation sequence uses a segmented BIR-4 adiabatic pulse with two substantially equal delays and is insensitive to B1 field variations and can simultaneously suppress fat signals with low specific absorption rate (SAR). An adiabatic reverse half passage pulse is applied followed by a predetermined delay. An adiabatic full passage pulse is applied followed by a substantially equal delay, followed by an adiabatic half passage pulse. Fat signal suppression is achieved by increasing or decreasing either the first delay or the second delay.Type: GrantFiled: April 20, 2006Date of Patent: May 20, 2008Assignees: The United States of America as represented by the Department of Health, Johns Hopkins UniversityInventors: Reza Nezafat, J. Andrew Derbyshire, Ronald Ouwerkerk, Matthias Stuber, Elliot R. McVeigh
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Patent number: 7375521Abstract: A patient is examined by magnetic resonance imaging in different positions relative to gravity by moving the patient relative to the magnet, and the acquired data is compared to show differences in anatomy due to differences in patient position. Individual data elements or groups of plural data elements representing particular locations in one set of image data can be compared with data elements associated with the same locations in another set of image data, to yield a set of comparison image data elements. The comparison data set can be used to detect difference caused by differences in position of the patient.Type: GrantFiled: July 31, 2006Date of Patent: May 20, 2008Assignee: Fonar CorporationInventors: Raymond V. Damadian, Robert Wolf
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Patent number: 7375522Abstract: A water and fat image are acquired using a pulse sequence in which NMR signals for one image data set are acquired with a readout gradient of one polarity and NMR signals for the other image data set are acquired with a readout gradient of the opposite polarity. A misalignment of fat signals caused by chemical shift is corrected by calculating separate water and fat image data sets in k-space and then transforming them to real space images.Type: GrantFiled: August 28, 2006Date of Patent: May 20, 2008Assignee: Wisconsin Alumni Research FoundationInventor: Scott B. Reeder
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Patent number: 7375523Abstract: A system and method for mapping the sensitivity of MR coils includes a neural network or other computer intelligence trained from sample MR data to determine coil sensitivity profiles or sensitivity normalizations. Once the network is trained, subsequent coil mapping determinations may include fewer mapping acquisitions per coil. The resulting sensitivity map can be used in compensating for B1 inhomogeneities, parallel imaging reconstruction, generating tailored excitation currents for each individual coil, RF shimming, or other processes.Type: GrantFiled: October 30, 2006Date of Patent: May 20, 2008Assignee: General Electric CompanyInventor: Ileana Hancu
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Patent number: 7375524Abstract: A magnetic resonance imaging system acquires a final image of a selected field of view with a selected spatial resolution. A magnetic resonance imaging scanner (10) encodes and receives magnetic resonance samples in phase encode and readout directions using a plurality of receive coils (14). The encoding and receiving undersamples in the readout direction. A reconstruction processor (30) reconstructs magnetic resonance samples acquired by each of the plurality of receive coils (14) into a corresponding plurality of intermediate reconstructed images. Each intermediate reconstructed image has aliasing and in some aspects degraded high spatial frequency characteristics due to the reduced sampling in the readout direction. A combining processor (40) combines the plurality of intermediate reconstructed images based on coil sensitivity factors (42) to produce the final reconstructed image with the selected field of view and the selected spatial resolution in the readout direction.Type: GrantFiled: June 1, 2004Date of Patent: May 20, 2008Assignee: Koninklijke Philips Electronics N.V.Inventors: Ulrich Katscher, Mark J. Loncar, Michael R. Thompson
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Patent number: 7375525Abstract: The use of multiple sensors improves the measurement speed of a nuclear quadrupole resonance detection system when the nuclear quadrupole resonance frequency is known only within a range of frequencies.Type: GrantFiled: December 15, 2004Date of Patent: May 20, 2008Assignee: E.I. du Pont de Nemours and CompanyInventors: Daniel B. Laubacher, James D. McCambridge, Charles Wilker
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Patent number: 7375526Abstract: The present invention provides an apparatus for reducing acoustic noise in a magnetic resonance imaging device including passive shielding located outside the actively shielded gradient winding elements in order to reduce the magnitude of fields that spread outside the gradient coil assembly in unwanted directions and interact with the magnet cryostat or other metallic magnet parts, inducing eddy currents that cause consequent acoustic noise. The passive shielding elements are conducting layers located on the outer radius of the cylindrical gradient coil assembly in a cylindrical magnet system, conducting layers located at the ends of the gradient coil assembly in a cylindrical magnet system, and conducting layers located inside the actively shielded gradient winding inner elements in a cylindrical magnet system. The passive shielding could also be located on separate structures that are vibrationally isolated from the magnet cryostat.Type: GrantFiled: October 20, 2006Date of Patent: May 20, 2008Inventors: William A. Edelstein, Tesfaye K. Kidane, Victor Taracilla, Tanvir N. Baig, Timothy P. Eagan, Robert W. Brown
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Patent number: 7375527Abstract: A magnetic resonance apparatus in embodiments of the invention may include one or more of the following features: (a) a coil having at least two sections, (b) the at least two sections having a resonant circuit, (c) the at least two sections being wirelessly coupled or decoupled, (d) the at least two sections being separable, (e) several openings allowing a subject to see and be accessed through the coil, (f) at least one cushioned head restraint, and (g) a subject input/output device providing visual data from in front and behind of the coil respectively; wherein the input/output device is selected from the group consisting of mirrors, prisms, video monitors, LCD devices, and optical motion trackers.Type: GrantFiled: February 14, 2007Date of Patent: May 20, 2008Assignee: MR Instruments, Inc.Inventor: John Thomas Vaughan, Jr.
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Patent number: 7375528Abstract: Magnetic resonance systems are provided which employ a shielded, asymmetric magnet to produce an offset dsv. The magnets include at least a first coil C1, which carries current in a first direction, and two coils C2 and C3, which are located at least in part within the internal envelope EC1 defined by the first coil and which carry current in an opposite direction to the first coil. The magnets are shielded by a shielding coil C4, which carries current in a direction opposite to that of the first coil, and/or a ferromagnetic structure (FS). The magnets can include additional coils, such as a fifth coil C5 at the magnet's distal end. The magnets can be used in, for example, orthopedic imaging.Type: GrantFiled: March 28, 2006Date of Patent: May 20, 2008Assignee: Magnetica LimitedInventors: Stuart Crozier, Feng Liu
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Patent number: 7375529Abstract: An array of induction magnetometers for use in airborne transient electromagnetic (ATEM) geophysical exploration is disclosed, having similar weight and external dimensions of prior art induction magnetometers but with improved signal strength, signal-to-noise ratio, higher frequency, self-resonance and bandwidth, and providing accurate and well monitored calibration.Type: GrantFiled: November 26, 2004Date of Patent: May 20, 2008Assignee: University of New BrunswickInventors: Jerome Christian Dupuis, Bruce Gordon Colpitts, Brent Robert Petersen
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Patent number: 7375530Abstract: Cross-component measurements made at a plurality of toolface angles are processed to remove bias. The amplitude of the resulting sinusoid is used to estimate a distance to an interface in an earth formation.Type: GrantFiled: December 9, 2005Date of Patent: May 20, 2008Assignee: Baker Hughes IncorporatedInventors: Roland E. Chemali, Paul Cairns, Tsili Wang, Wallace H. Meyer, Andrew G. Brooks, Otto N. Fanini, Gulamabbas Merchant
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Patent number: 7375531Abstract: A system for detecting spark in an igniter for a gas turbine engine. An igniter generates a plasma, or spark, somewhat similar to an automotive spark plug. In the invention, an inductive pick-up is positioned adjacent the igniter, to detect current pulses in the igniter, to thereby infer the presence of spark. A detection system detects the spark, and informs the pilot of the aircraft of the detected spark. Thus, if the pilot encounters a problem in starting the engine, the pilot can rapidly determine whether the igniter is involved in the problem.Type: GrantFiled: February 10, 2004Date of Patent: May 20, 2008Assignee: General Electric CompanyInventors: Robert Louis Ponziani, Roy Dale Earwood
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Patent number: 7375532Abstract: A physical layer device comprises a first port adapted to communicate with one end of a cable. A second port is adapted to communicate with an opposite end of a cable. A cable tester communicates with the first and second ports and selectively tests the cable to determine a cable status, which includes an open status, a short status, and a normal status. The cable tester includes a test module that transmits a test pulse on the cable, measures a reflection amplitude, calculates a cable length, and determines the cable status based on the measured amplitude and the calculated cable length. A frequency synthesizer selectively outputs a plurality of signals at a plurality of frequencies on the first port. An insertion loss calculator that receives the signals on the second port and that estimates insertion loss.Type: GrantFiled: July 11, 2006Date of Patent: May 20, 2008Assignee: Marvell International Ltd.Inventors: William Lo, Yiqing Guo, Tak Tsui, Tsin-Ho Leung, Runsheng He, Eric Janofsky
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Patent number: 7375533Abstract: An electrical continuity tester adaptor for attaching to a conventional continuity tester comprising first, second and third members. The first member is operably configured to engage a female F-type connector. The second member is operably configured to engage a female RJ series type connector. The third member includes a plurality of electrical connections and a printed circuit board to facilitate the electrical connectivity between the first and second members.Type: GrantFiled: June 15, 2006Date of Patent: May 20, 2008Inventor: Robert D. Gale
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Patent number: 7375534Abstract: A plurality of signal conductors and ground conductors are connected to associated measurement ports of a network analyzer. A short standard is connected between each of the signal conductors and the ground conductor at least three points in the longitudinal direction of each of the signal conductors, and an electrical characteristic is measured. A through chip is connected in series between the signal conductors, and electrical characteristics are measured. Error factors of a measurement system including a transmission line are calculated. An electronic device to be measured is connected between the signal conductors or among the signal conductors and the ground conductors, and electrical characteristics are measured. The error factors of the measurement system are removed from the measured values, thereby obtaining true values of the electrical characteristics of the electronic device to be measured.Type: GrantFiled: September 29, 2006Date of Patent: May 20, 2008Assignee: Murata Manufacturing Co., Ltd.Inventor: Gaku Kamitani
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Patent number: 7375535Abstract: A capacitive sensing system (100) can connect groups of capacitive sensors (112-1 to 112-N) to a common node (106) to detect change in capacitance. States of a set of capacitive sensors (112-1 to 112-N) can thus be scanned faster than approaches that scan such sensors one-by-one. Faster scanning can allow for reduced power consumption in applications that only periodically scan the set of capacitive sensors (112-1 to 112-N).Type: GrantFiled: September 19, 2005Date of Patent: May 20, 2008Assignee: Cypress Semiconductor CorporationInventors: Harold Kutz, Warren Snyder, Tim Williams, Andrew Page
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Patent number: 7375536Abstract: An electric circuit for capacitive sensor elements of a touch switch can be designed as a switch capacitor circuit and van be provided with a micro controller. The sensor elements are provided in sensor branches with a charging capacitor. In addition, a reference branch is provide. It contains a reference capacity and a reference charging capacitor, which have capacities that correspond to those of the sensor branches. By comparing the number of charge transfer processes required to reach the switching threshold in the sensor branch and the reference branch, fluctuations of the supply voltage, and consequently the switching threshold itself, can be compensated for.Type: GrantFiled: February 21, 2003Date of Patent: May 20, 2008Assignee: E.G.O. Elektro-Geraetebau GmbHInventors: Bernd Supper, Reiner Stäble
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Patent number: 7375537Abstract: A relative-dielectric-constant measuring apparatus according to the present invention includes an ellipsometer and a capacitance measuring part. The ellipsometer allows non-contact measurements of the film thickness and optical constants of an insulation film formed on the upper surface of a wafer. The capacitance measuring part, on the other hand, allows non-contact measurements of the gap between the insulation film and an electrode and accumulation capacitance. The relative-dielectric-constant measuring apparatus can calculate the relative dielectric constant of the insulation film based on the measured film thickness, gap, and accumulation capacitance. Thus, the relative dielectric constant of the insulation film can be determined without contact and with high precision.Type: GrantFiled: March 24, 2005Date of Patent: May 20, 2008Assignee: Dainippon Screen Mfg. Co., Ltd.Inventors: Toshikazu Kitajima, Motohiro Kono
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Patent number: 7375538Abstract: Electron beam is irradiated to a wafer in the midst of steps at predetermined intervals by a plurality of times under a condition in which a junction becomes rearward bias and a difference in characteristic of a time period of alleviating charge in the rearward bias is monitored. As a result, charge is alleviated at a location where junction leakage is caused in a time period shorter than that of a normal portion and therefore, a potential difference is produced between the normal portion and a failed portion and is observed in a potential contrast image as a difference in brightness. By consecutively repeating operation of acquiring the image, executing an image processing in real time and storing a position and brightness of the failed portion, the automatic inspection of a designated region can be executed. Information of image, brightness and distribution of the failed portion is preserved and outputted automatically after inspection.Type: GrantFiled: June 27, 2005Date of Patent: May 20, 2008Assignee: Hitachi, Ltd.Inventor: Mari Nozoe
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Patent number: 7375539Abstract: A printed-circuit-board testing device that tests an electronic component disposed on a printed circuit board includes printed-circuit-board-tilt measuring means for measuring tilting of the printed circuit board, measuring means for measuring tilting of an arm having a probe that comes into contact with and tests the electronic component, correcting means for correcting the tilting of the arm on the basis of the tilting of the printed circuit board and the tilting of the arm, inputting means for inputting positional information of the electronic component, arm disposing means for disposing the arm to a predetermined position in accordance with the positional information, and printed-circuit-board testing means for performing testing as a result of protruding the probe from the disposed arm.Type: GrantFiled: March 22, 2007Date of Patent: May 20, 2008Assignee: Fujitsu LimitedInventor: Yasuo Mori
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Patent number: 7375540Abstract: A method and system for monitoring and compensating the performance of an operational circuit is provided. The system includes one or more integrated circuit chips and a controller. Each integrated circuit chip includes one or more operational circuits, each operational circuit having at least one controllable circuit parameter. Each integrated circuit chip also includes a process monitor module at least partially constructed thereon. The controller is coupled to each process monitor module and to each operational circuit. The controller includes logic for evaluating the performance of an operational circuit based on data obtained from process monitor module and operational circuit related data stored in a memory. Based on the evaluation, the controller determines whether any deviations from desired or optimal performance of the circuit exist. If deviations exist, the controller generates a control signal to initiate adjustments to the operational circuit to compensate for the deviations.Type: GrantFiled: October 14, 2004Date of Patent: May 20, 2008Assignee: Broadcom CorporationInventors: Lawrence M. Burns, Leonard Dauphinee, Ramon A. Gomez, James Y. C. Chang
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Patent number: 7375541Abstract: A testing method utilizing at least one signal between ICs includes: coupling at least one testing device to a plurality of ICs that are capable of being tested by the testing device, the ICs including at least a first IC and a second IC; coupling the second IC to the first IC to utilize at least one output signal of the first IC to be at least one input signal of the second IC; and testing the second IC by utilizing the testing device and the output signal of the first IC.Type: GrantFiled: November 8, 2005Date of Patent: May 20, 2008Assignee: MediaTek Inc.Inventors: Yi-Chuan Chen, Hong-Ching Chen
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Patent number: 7375542Abstract: Automated test equipment is provided which includes a test head having a tester electronics bricks mounted to a device interface board. In some embodiments, support circuitry is positioned adjacent the tester electronics bricks opposite the DIB. The support circuitry may include power circuitry and/or data bus circuitry, which may be coupled to separate sides, or the same side of the tester electronics brick. A heat transfer apparatus located between the DIB and the support circuitry may be provided for cooling the tester electronics bricks. A tester electronics brick may include multi-chip modules arranged so that the edges generally define interface sides of the tester electronics brick. These sides may include a DIB interface side mounted to the DIB, a data bus interface side, a power interface side, and a heat transfer interface side. Contacts may be located at the edges of the MCMs.Type: GrantFiled: June 30, 2004Date of Patent: May 20, 2008Assignee: Teradyne, Inc.Inventor: Nicholas J. Teneketges
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Patent number: 7375543Abstract: The present invention provides a system and method for electrostatic discharge (ESD) testing. The system includes a circuit that has a switch coupled to an input/output (I/O) circuit of a device under test (DUT), a charge source coupled to the switch, and a control circuit coupled to the switch, wherein the control circuit turns on the switch to discharge an ESD current from the charge source to the I/O circuit, and wherein the circuit is integrated into the DUT. According to the system and method disclosed herein, the system provides on-chip ESD testing of a DUT without requiring expensive and specialized test equipment.Type: GrantFiled: July 21, 2005Date of Patent: May 20, 2008Assignee: LSI CorporationInventors: Choshu Ito, William M. Loh, Jau-Wen Chen
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Patent number: 7375544Abstract: In a signal transmission system between a plurality of semiconductor apparatuses, a logic level decision circuit deciding a logic level of an input signal in accordance with which of two reference signals a signal level of the input signal is close to, by using two reference signals Vref1, Vref0 having a “1” level and a “0” level as reference signals for deciding the logic level of the input signal having a binary logic level, is used as an input receiver of the each semiconductor apparatus.Type: GrantFiled: July 22, 2003Date of Patent: May 20, 2008Assignee: Kabushiki Kaisha ToshibaInventor: Yoshihisa Iwata
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Patent number: 7375545Abstract: The distance between a drain contact and gate electrode in a terminating transistor, which couples a termination resistor connected to an output terminal to a power source node, is set shorter than in an output transistor, which drives an output node in accordance with an internal signal. The area of the terminating circuit is reduced while the reliability against the surge is maintained. Thus, an output circuit containing the terminating circuit that occupies a small area and is capable of transmitting a signal/data at high speed is provided.Type: GrantFiled: May 5, 2006Date of Patent: May 20, 2008Assignee: Renesas Technology Corp.Inventor: Takashi Kubo
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Patent number: 7375546Abstract: Methods of compensating for power supply variations in an integrated circuit. During operation of the IC die, a power supply voltage level is monitored. When the power supply voltage level drops below a specified level, a performance compensation circuit in the IC is enabled, bringing a first delay (e.g., the rising delay) for a compensated circuit in the IC more closely into alignment with a second delay (e.g., a falling delay) for the circuit. When the power supply voltage level exceeds the specified level, the performance compensation circuit is disabled. When the IC is a programmable IC, for example, the compensated circuit can be a programmable interconnect multiplexer of the programmable IC. In these embodiments, the power supply voltage level for the pass transistors in the interconnect multiplexer can be monitored and compensated for as described above.Type: GrantFiled: June 8, 2006Date of Patent: May 20, 2008Assignee: Xilinx, Inc.Inventor: Arifur Rahman
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Patent number: 7375547Abstract: An SOI structure semiconductor integrated circuit is disclosed that reduces the number of power supply wires setting substrate potential of a semiconductor element and reduces power consumption. With an SOI structure semiconductor integrated circuit, a first circuit block 51 does not include a critical path and a second circuit block 61 does include a critical path. First power supply wiring 28 supplies a first power supply and second power supply wiring 29 supplies a second power supply of a high-voltage compared to the first power supply. A wiring section 71 (P-channel first substrate power supply wiring and P-channel first power supply wiring) supplies the first power supply as a substrate power supply for P-channel elements of the first circuit block 51 and a source power supply.Type: GrantFiled: March 1, 2006Date of Patent: May 20, 2008Assignee: Matsushita Electric Industrial Co., Ltd.Inventor: Hidekichi Shimura
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Patent number: 7375548Abstract: A new scheme of Schottky FPGA (SFPGA) IC solution is proposed. The chip is organized by embedded analog, memory, and logic units with on chip apparatus and software means to partitioning, altering selected portions of hardware. The process means is based on the combined Schottky CMOS (SCMOS, U.S. Pat. No. 6,590,800) and Flash technology. The circuit means is based on SCMOS-DTL gate arrays. Software means is based on the C++ procedures with levels of LUT. The SFPGA device supports GHz low power ASIC mixed signal product applications with embedded analog, logic, and memory array units. Several multiplexing schemes are disclosed, which accommodate tasks to vary the Vt and transmission line transmission of selected transistor or IO nets, and therefore their analog and digital device properties. A voltage doubler and supply booster and a Digital-Analog-Digital-Translator (DADT) apparatus are also disclosed in accordance with the present invention.Type: GrantFiled: September 22, 2006Date of Patent: May 20, 2008Assignee: Super Talent Electronics, Inc.Inventor: Augustine W. Chang
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Patent number: 7375549Abstract: Improved reconfiguration techniques are provided for programmable logic devices (PLDs). For example, in accordance with an embodiment of the present invention, a programmable logic device includes a plurality of logic blocks, a plurality of input/output blocks and corresponding input/output pins, and a plurality of configuration memory cells. The configuration memory cells are adapted to store configuration data for configuration of the logic blocks and the input/output blocks. A data port is adapted to provide a clock signal to and receive configuration data from an external memory. A plurality of circuits are adapted to hold the input/output pins in a known logic state during the configuration.Type: GrantFiled: February 9, 2006Date of Patent: May 20, 2008Assignee: Lattice Semiconductor CorporationInventors: Howard Tang, Ju Shen, San-Ta Kow
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Patent number: 7375550Abstract: Some embodiments of the invention provide configurable integrated circuit (IC) that includes several configurable circuits that are conceptually in tiles. The IC also includes a first data network for passing data between the configurable circuits. The IC further includes a second packet-switch network for receiving packets of data from the outside of the configurable IC and switchably routing each packet to at least one destination tile. In some embodiments, the second packet-switch network supplies data from the tiles that the configurable circuits output in response to data packets received from outside of the configurable IC. Also, in some embodiments, a particular packet that is for a particular resource in a particular tile includes a fist address that identifies the particular configurable tile from the plurality of configurable tiles, and then a second address that identifies the particular resource within the particular configurable tile.Type: GrantFiled: March 13, 2006Date of Patent: May 20, 2008Assignee: Tabula, Inc.Inventors: Jason Redgrave, Teju Khubchandani