Abstract: Methods and apparatus for simulating resistive loads, and facilitating series, parallel, and/or series-parallel connections of multiple loads to draw operating power. Current-to-voltage characteristics of loads are altered in a predetermined manner so as to facilitate a predictable and/or desirable behavior of multiple loads drawing power from a power source. Exemplary loads include LED-based light sources and LED-based lighting units. Altered current-to-voltage characteristics may cause a load to appear as a substantially linear or resistive element to the power source, at least over some operating range. In connections of multiple such loads, the voltage across each load is relatively more predictable. In one example, a series connection of multiple loads with altered current-to-voltage characteristics may be operated from a line voltage without requiring a transformer.

Abstract: Systems and methods for selectively changing the current threshold of current limiting circuitry are provided. The current limit threshold of current limiting circuitry may be selectively changed based on a detected power source using a resistive network. The current limiting threshold may be selected by changing a resistance value of a resistive network electrically coupled to an input on the current limiting circuitry (e.g., battery controller) for programming the current limiting threshold. The resistance value received by the currently limiting circuitry at this input may set the current threshold and thus the maximum magnitude of current that may be provided to charge a battery or other energy storage device located in the electronic device (e.g., a mobile phone).

Abstract: A current sensing circuit and power supply using the same are provided. The current sensing circuit includes a transistor, a control circuit and a sensing circuit, wherein the voltage endurance capability between a drain terminal of the transistor and a gate of the transistor is larger than the voltage endurance capability between a source terminal of the transistor and the gate of the transistor. The drain terminal is coupled to an under testing current source with an external high voltage. The control circuit is coupled to the gate of the transistor to control the conduction between the drain and the source terminals. The sensing circuit receives a sensing current signal from the source terminal of the transistor and transfers thereof to be a current sensing voltage.

Abstract: A control circuit for a DC voltage supply is provided that includes a circuit, an error amplifier and modulator. The circuit is operable to measure a voltage difference between a negative voltage rail and a ground reference in the DC voltage supply. The circuit is further operative to create an offset voltage proportional with the measured voltage difference. The circuit is further yet operative to add the offset voltage to a reference voltage to create a modified reference voltage. The error amplifier has a first input coupled to receive the modified reference voltage and a second input coupled to a positive voltage rail in the DC voltage supply. The error amplifier further has an output. The modulator is coupled to the output of the error amplifier. The modulator is operative to maintain the positive rail at a select value corresponding to the modified reference voltage.

Abstract: Techniques are disclosed to adjust a current limit in a switching regulator. One example switching regulator includes a comparator having first and second inputs and an output. The first input of the comparator is adapted to sense a current flow through a switch and the second input of the comparator is adapted to sense a variable current limit value. A controller is coupled to the output of the comparator and to the switch to control switching of the switch to regulate an output of a power supply in response a feedback signal. The controller disables the switch if the sensed current flow through the switch is greater than the sensed variable current limit value. The variable current limit value is set to a first variable current limit value by the controller in response to an input line voltage of the power supply if there is not an over current condition during a first switching cycle that occurs after a skipped switching cycle of the switch.

Abstract: A digital current-mode controller for a DC-DC converter is disclosed. The controller comprises a digital current reference; and a current loop compensator adapted to receive a digital current error signal derived from a digital current sample sensed from the DC-DC converter and the digital current reference and to generate a duty-cycle command, wherein the current loop compensator comprises a low-pass filter that is used in generating the duty-cycle command. A DC-DC regulator comprising a digital current-mode controller and a method of controlling a DC-DC converter are also disclosed.

Abstract: A particle counter for measuring the number of floating particles contained in a sample to determine the particle concentration therein includes: a memory section for storing a relational expression between the direct current level output from a photoelectric converter when no particles exist and the frequency of occurrence of false counts; and a subtraction section for determining the frequency of occurrence of the false counts corresponding to the direct current level output from the photoelectric converter at the time of commencement of measurement with reference to the relational expression stored in the memory section and subtracting a value based on the frequency of occurrence of the false counts from a discrete value after commencement of measurement.

Abstract: A method for operating a measuring device, in particular, a vectorial network analyzer, which can be connected via at least two ports to a device under test, with excitation units assigned to each port, wherein each excitation unit provides a signal generator, with which the assigned port can be supplied with an excitation signal, provides the following procedural stages: a measurement at measuring positions of the actual phase offset between the excitation signals output at the ports; and a variation of the frequency of at least one of the two signal generators during a correction interval so that a specified set phase offset is achieved at reference positions between the excitation signals output at the ports.

Abstract: To identify a phase in a multi-phase electrical system, the following method is proposed: transmission, on a defined phase (L1, L2, L3) of a line of the system, of a message with a known synchronization with respect to the phase voltage (V1, V2, V3); reception of the message on an undefined phase (X, Y, Z) of the line; identification of the phase on which the message has been received according to the displacement between the voltage on said undefined phase and the message received.

Abstract: A method and device for sampling ultra-fast optical signals by generating a sampling signal comprising a train of short pulses and coupling the sampling signal together with an optical data signal to be sampled into a highly non-linear optical fibre. Four-wave mixing (FWM) occurs between the two signals resulting in a secondary signal output from the fibre consisting of pulsed components having energy proportional to the instantaneous power of points along the data signal. An analysis of this secondary signal can be carried out to create a normal trace or eye-diagram of the data signal.

Abstract: An electric current measurement device includes a housing defining first and second open ends sealed by first and second sealing means, respectively: a first optical fibre received in an aperture in the first sealing means and in optical communication with a first optical lens in the housing; a first polarisation filter in the housing in optical communication with the first lens; a magneto-optical rod within the housing in optical communication with the first polarisation filter; a second polarisation filter in the housing in optical communication with the rod; and a second optical lens in the housing in optical communication with the second polarisation filter. The second sealing means has an aperture for receiving a second optical fibre fixed to the second lens. First and second lids, attachable to the first and second housing ends, respectively include apertures for receiving the first and second optical fibres, respectively.

Abstract: A display system for an automotive vehicle indicates a state of the vehicle by the position of an indicator bar. The indicator bar moves as the state of the vehicle changes.

Abstract: In order to provide an angle sensor in an embodiment, which is axially short in particular and on the other hand radially wider, with a functionality that is as good as possible, on the one hand certain shielding measures against interfering magnetic fields are proposed, and on the other hand a certain geometric design is proposed, in particular comprising an intermediary magnet.

Abstract: In order to be able to provide magnetic angle sensors thin and slender, while still minimizing magnetic interference fields, the angle sensor, comprised of a longitudinally extending main circuit board and a sensor element, transversally disposed in front of the end of the main circuit board, is housed in a pin shaped sleeve type housing, in which at least the side walls are magnetically shielded in the portion of the sensor, and additionally also the backside and circumferential surface of the encoder magnet.

Abstract: The invention relates to the use of magneto-impedance on a contactless position sensor and to the corresponding sensor. According to the invention, an electrical conductor (1) is produced which has a magnetically-sensitive surface (10) that is subjected to the magnetic force of a permanent magnet (11), said surface varying depending on the relative position thereof in relation to the magnet. The relative position between the magnet and the magnetically-sensitive surface is varied, thereby varying at least one physical characteristic of the conductor, and the variation in the physical characteristic(s) of the electrical conductor is noted, said variation being in correlation with the position of the magnet (11).

Abstract: Inductive angular-position sensor, including a partially metallized disk that moves in rotation around its axis of revolution; and a stator that includes a primary coil and several secondary coils, whereby the secondary coils are arranged essentially symmetrically in pairs relative to the axis of revolution, so as to form one or more pairs of secondary coils, whereby the secondary coils of each pair are connected, on the one hand, to one another, in series and in phase opposition relative to one another, and, on the other hand, to the terminals of a measuring element that can generate an output signal that depends on the voltage at the terminals of the pair.

Abstract: An arrangement for measuring the position of a magnet relative to a ferromagnetic magnetic core, has a magnetic core, a conductor, which is guided in such a way through the toroidal core that the conductor and the toroidal core form an inductive arrangement, and an evaluation circuit for evaluating the saturation state of the toroidal core of the inductive arrangement as a measure of the distance of the magnet relative to the magnetic core.

Abstract: Apparatus for detecting vibration of an object adapted to rotate includes one or more vibration processors selected from: a direction-change processor adapted to detect changes in a direction of rotation of the object, a direction-agreement processor adapted to identify a direction of rotation of the object in at least two channels and identify an agreement or disagreement in direction of rotation identified by the at least two channels, a phase-overlap processor adapted to identify overlapping signal regions in signals associated with the rotation of the object, and a running mode processor adapted to identify an unresponsive output signal from at least one of the at least two channels.

Abstract: A method of electrically characterizing a magnetic tunnel junction film stack having three metal layers separated by two dielectric layers comprises three steps. In a first step, four or more probes are electrically coupled to a surface of the magnetic tunnel junction film stack. In a second step, electrical resistance is determined with the four or more probes for each of a plurality of spacings between the probes. Finally, in a third step, the plurality of resistance measurements are fitted with one or more equations that relate electrical resistance to probe spacing.

Abstract: A method and apparatus are disclosed for Magnetic Resonance Imaging using specialized signal acquisition and processing techniques for image reconstruction with a generally inhomogeneous static magnetic field. New signal processing methods for image reconstruction and for minimizing dephasing effects are disclosed. Imaging systems with smaller static magnetic field strengths and smaller hardware demands than those with homogeneous static magnetic fields are provided, leading to significant reductions in system size and cost as compared to standard MRI systems. Such systems can also exploit imaging coils having high Signal-to-Noise-Ratio (SNR), including those made from Carbon nanotube conductors, leading to further imaging system efficiencies.

Abstract: A miniaturized instrument and method of using electron spin resonance spectrometry for measuring the degradation of lubricating fluids, and the like, that includes continuously passing a sample of such fluid through a resonating RF microwave cavity resonator during the application therethrough of a uniform slowly varying uniform magnetic field that is rapidly modulated and measuring the resulting phase modulation or amplitude modulation thereof to derive an electron spin resonance signal that directly senses the molecular changes in the fluid sample resulting from fluid degradation during operation of the vehicle, such as peroxy radicals in vehicle engine oil and the like.

Abstract: A system and method for simultaneously acquiring PET and MR data from a subject of interest with a hybrid PET-MR scanner includes monitoring transmission times of RF and gradient coils of the MR equipment and blanking segments of the PET data stream accordingly. By excluding PET data acquired during active MR transmissions, the remaining PET data used for image reconstruction will provide improved PET image quality.

Abstract: A magnetic resonance imaging apparatus includes a static magnetic field magnet which generates a static magnetic field, a gradient coil unit which generates a gradient magnetic field for overlapping with the static magnetic field, a shim unit which is disposed between the static magnetic field magnet and the gradient coil unit to control the static magnetic field, and a heat shielding member which is disposed between the gradient coil unit and the shim unit to shield a radiant heat of the gradient coil unit.

Abstract: A method and apparatus for actively controlling quench protection of a superconducting magnet includes a magnetic resonance imaging (MRI) system and a computer readable storage medium having stored thereon a computer program comprising instructions which when executed by a computer cause the computer to detect a quench condition of the superconducting magnet. The instructions also cause the computer to actively control a quench protection system of the superconducting magnet in response to the detected quench condition.

Abstract: In a magnetic resonance imaging system (10), a main magnet (20) generates a substantially uniform main magnetic field (B0) through an examination region (14). An imaging subject (16) generates inhomogeneities in the main magnetic field (B0). One or more shim coils are positioned adjacent a gradient coil (26). The gradient coil (26) is driven in halves by first and second power sources (28, 30) which have slightly dissimilar power characteristics which induce an inductive coupling between the shim coil (60) and the gradient coil (26). The shim coil (60) is designed to produce a desired magnetic field, such that the inductive coupling of the shim coils (60) to the gradient coil (26) is substantially minimized while the inhomogeneities in the main magnetic field (B0) caused by the imaging subject are corrected based on prespecified spatial characteristics.

Abstract: In an arrangement for conversion of an analog acquisition signal of an acquisition coil of a magnetic resonance apparatus into a digital signal, the output of the acquisition coil is connected with a low-noise amplifier such that the analog acquisition signal from the acquisition coil arrives at the amplifier. The amplifier is connected at the output side with a device for analog-digital conversion, such that the analog acquisition signal arrives at the device for analog-digital conversion as an amplified acquisition signal for analog-digital conversion. The device for analog-digital conversion is designed as a delta-sigma modulator that forms a digital data stream with a width of one bit from the amplified acquisition signal.

Abstract: A method and system for measuring voltage of individual cells connected in series includes a pair of busses connectable to the cells and a flying capacitor connectable to the busses. The capacitor stores the charge of one of the cells such that an analog-to-digital converter (ADC) connected to the capacitor may process an accurate representation of the voltage of the cell being measured. In order to prevent electrical interference with the capacitor and the ADC, the charge on the busses is reduced prior to measurement by the ADC.

Abstract: A battery voltage monitoring apparatus monitoring an assembled battery voltage, the assembled battery including a plurality of battery cells, includes a voltage sensor detecting potential of the plurality of battery cells; an output logic circuit outputting a potential detect signal based on an output of the voltage sensor, the potential detect signal representing that abnormal potential is detected; and a delay circuit adding certain delay to the output of the voltage sensor and outputting the delayed voltage detect signal to the output logic circuit; wherein, the voltage sensor comprises at least one comparator having hysteresis characteristic, and detects the potential of the battery cell based on an output of the comparator.

Abstract: A system and method for measuring voltage of individual cells connected in series includes a single flying capacitor. The capacitor stores the charge of one of the cells such that a primary analog-to-digital converter (ADC) connected to the capacitor may process a representation of the voltage of the cell being measured. A secondary ADC is connected directly to the cell being measured. The measurements of the primary and secondary ADCs are then compared to verify the accuracy of the flying capacitor.

Abstract: A power cycle test method for testing an electronic equipment (30) includes: configuring a total test count and a current test count; updating the current test count by incrementing the current test count by a value; utilizing a corresponding AC control signal, a corresponding DC control signal, and a reboot control signal to control the electronic equipment in sequence; checking whether the electronic equipment is in a workable condition when the electronic equipment is respectively controlled under said control signals; repeating said updating step, said utilizing step and said checking step until the current test count is equal to the total test count; and generating a result message if the current test count is equal to the total test count. A related system is also disclosed.

Abstract: A system and method of classifying a high powered device (PD) with an increased current limit includes: connecting a voltage to the PD, measuring current through a classification resistor connected to the PD, and determining a PD classification signature based on the current according to classification steps such that a minimum classification step includes a minimum current of 0 mA and a maximum classification step includes a maximum current beyond a predetermined current limit. The system includes a PSE, voltage source, PD classification resistor, and PD voltage, connected to the P. An alternative embodiment further includes a discrete classification circuit and discrete classification resistor to be used to measure the current for classification purposes instead of the PD classification resistor when the PD and PD classification resistor do not support power classification under the classification scheme.

Abstract: A non-destructive test structure for printed circuit board characterization and method of testing the same are disclosed. In one form, a method for testing a printed circuit board can include applying a test signal to a first test location of a first test structure associated with a first inner bus layer of a printed circuit board. The method can also include measuring a crosstalk voltage at a second test location operably associated with the first test structure. The method can further include comparing the crosstalk voltage to a crosstalk specification of the printed circuit, board.

Abstract: The invention relates to an inductive sensor device (1) having at least one electric coil (4, 16), a coil core (6) being provided which dips into the coil (4, 16) and can be adjusted corresponding to a path or angle to be measured. The invention provides that the coil core (6) has a section (10) that tapers, starting from a section (12) of a constant cross-section adjoining on one side, viewed in the longitudinal direction of the coil core, step-by-step or continuously, to a section (14) of a constant cross-section adjoining on the other side. When the measuring path is defined, shorter coils can therefore be used, whereby space is saved.

Abstract: The application concerns a measuring apparatus for determining a dielectric property, in particular the moisture and/or density, of a product, in particular tobacco, Cotton or some other fibrous product, having a measuring capacitor, a device for generating a high-frequency field in the measuring capacitor, which is influenced by a product which is arranged in a measuring volume of the measuring apparatus, and having a circuit device which includes the measuring capacitor and which is designed to determine suitable measurable variables of the high-frequency field influenced by the product, and is distinguished in that the circuit device is substantially non-resonant at the measuring frequency of the high-frequency field that is used, and measurement is based on the propagation of a travelling high-frequency wave in the measuring capacitor, and the circuit device is designed to determine two mutually independent measurable variables which are dependent on the amplitude and phase of the high-frequency wave infl

Abstract: An electrostatic capacity sensor includes a sensor die including a bias electrode and a signal electrode, which are positioned opposite to each other with a very small distance therebetween, and a shield member including a potential stabilizing conductive film whose external shape encompasses the vertically projected area of the signal electrode. The sensor die joins the joint surface of the shield member. The signal electrode is positioned between the bias electrode and the potential stabilizing conductive film. A noise shield adapted to the signal electrode is formed using the bias electrode and the potential stabilizing conductive film; hence, it is possible to improve the noise resistance of the signal electrode and to increase the S/N ratio in sensitivity.

Abstract: A detecting apparatus for checking shape, size and/or position of a hole of a workpiece, includes a platform for supporting the workpiece, a detecting board, which includes a detecting unit, movably set above the platform, an electrical source, a processor, and an indicator. The source, the unit, and the workpiece make up a circuit connected to the processor. When the board is moved to the workpiece, and the unit enters the hole without touching the workpiece the circuit will remain open, and the processor will control the indicator to indicate that the hole is eligible. If the detecting unit touches the workpiece, the circuit closes, and the processor will control the indicator to indicate that the hole is ineligible. An end of the unit that enters the hole is radially deformable. The apparatus improves detecting efficiency and accuracy, and is suitable for use in mass production.

Abstract: A method of determining an effective resistance between a power sourcing equipment and a powered device, the powered device exhibiting an interface and an operational circuitry, the method comprising: prior to connecting power to the operational circuitry of the powered device, impressing two disparate current flow levels (I1, I2) between the power sourcing equipment and the powered device; measuring the voltage at the powered device interface (VPD1, VPD2) responsive to each of the impressed disparate current levels; measuring the voltage at the power sourcing equipment (VPSE1, VPSE2) responsive to each of the impressed disparate current levels; and determining the effective resistance between the power sourcing equipment and the powered device responsive to the VPD1, PPD2, VPSE1, VPSE2, I1 and I2.

Abstract: The present invention discloses a universal grid composite circuit board testing tool having a probe station, a clamp base and a conducting wire base. The probe station and clamp base separately have a plurality of conducting probes and long needles. Both ends of the long needle are electrically contacted with the testing point and conducting probe of the testing printed circuit board. The conducting wire base includes a conducting wire contact point electrically connected to a plurality of conducting probes in the probe station at the same time, such that when a testing printed circuit board is tested, it is not necessary to prepare a new probe station and a new conducting wire base. The test simply requires users to change the installation positions of the long needles and run a comparison program according to the positions of the testing points of the testing printed circuit board.

Abstract: An object of the present invention is to make it possible that a probe for testing electrical characteristics of an object to be tested is easily attached to a support member such as a contactor. A through hole is formed in the contactor. In the probe, a fitting/locking portion which can be fitted in this through hole is formed. The fitting/locking portion is formed to penetrate the through hole of the contactor and to be locked in the contactor in a state that a tip thereof is in contact with a connecting terminal of a printed wiring board. The fitting/locking portion itself is locked in the contactor by hooking a locking portion thereof to an end face on an upper side of the through hole.

Abstract: Provided is a probe card for testing a wafer. The probe card includes: a main card having a flat plate in which a hole is formed; an auxiliary card vertically mounted on the main card through the hole; and a plurality of probe needles attached to the auxiliary card. Costs and time for manufacturing the probe card are greatly reduced.

Abstract: A system and method for testing a semiconductor integrated circuit (IC) in parallel includes a probe chuck, a test head, and a test controller. The probe chuck loads a plurality of different types of semiconductor DUTs. The test head provides a plurality of circuit sites to independently and simultaneously test the different types of semiconductor DUTs, and the test controller controls the test head and the probe chuck.

Abstract: Noise reduction for application of structural test patterns to a Device Under Test (DUT) is accomplished with a capacitor “booster” bypass network on the probe card in which the capacitors are charged to a much higher voltage Vboost than the DUT power supply voltage VDD. Charging the capacitors to a voltage N×VDD allows the buster network to store N times the charge of a conventionally configured capacitance network, and effectively provides N times the capacitance of the original network in the same physical space.

Abstract: The present invention is directed to structures having a plurality of discrete insulated elongated electrical conductors projecting from a support surface which are useful as probes for testing of electrical interconnections to electronic devices, such as integrated circuit devices and other electronic components and particularly for testing of integrated circuit devices with rigid interconnection pads and multi-chip module packages with high density interconnection pads and the apparatus for use thereof and to methods of fabrication thereof. Coaxial probe structures are fabricated by the methods described providing a high density coaxial probe.

Abstract: Example embodiments relate to a semiconductor memory device including a first pad having a probe region and a sensing region, the first pad may be adapted to come in contact with a primary probe, a sensing unit adapted to sense a weak contact of the first pad and the primary probe, the sensing unit may generate an output current in response to a contact point of the primary probe, and a second pad may be adapted to come in contact with a secondary probe to input/output an electric signal. The output current of the sensing unit may be output through the second pad or the secondary probe.

Abstract: There are provided a probe card for test of semiconductor chips and a method for testing semiconductor chips using the probe card. In implementing the probe card for electrically testing semiconductor chips, the probe blocks corresponding to multiple selected ones of the semiconductor chips on the wafer can be selected so that the selected semiconductor chips are EDS tested in a one-step process. As the selected semiconductor chips are EDS tested in a one-step process, equipment efficiency is improved, and statistical objectivity of data indicating characteristics of the wafer can be achieved.

Abstract: Pressing an electronic device (2) to be tested to contact terminals (132a and 132b) while bringing a heater (112) having equal or close temperature change characteristics to those of the electronic device to be tested by a test pattern, transmitting a test pattern to the electronic device to be tested in this state, and controlling a power consumption of a heater so that total power of a power consumption of the electronic device to be tested by the test pattern and a power consumption of the heater becomes a constant value.

Abstract: A probe for high frequency signal transmission includes a metal pin, and a metal line spacedly arranged on and electrically insulated from the metal pin and electrically connected to grounding potential so as to maintain the characteristic impedance of the probe upon transmitting high frequency signal. The maximum diameter of the probe is substantially equal to or smaller than two times of the diameter of the metal pin. Under this circumstance, a big amount of probes can be installed in a probe card for probing a big amount of electronic devices, so that a wafer-level electronic test can be achieved efficiently and rapidly.

Abstract: There is provided a multilayer type test board assembly for high-precision inspection. The multilayer test board assembly comprises: a plurality of test boards separated from each other according to their functions, having input/output signal terminals, and including at least one test board each having a first section where first mounting devices sensitive to an influence of electrical signals are mounted and a second section where second mounting devices insensitive to an influence of electrical signals are mounted; spacers that arrange the test boards in parallel by spacing apart the test boards by predetermined intervals; connection cables connected to the input/output signal terminals of the test boards; and a signal shielding fence formed on each of the at least one test board so as to protect the first mounting devices from electrical signals generated by the second mounting devices.

Abstract: Provided is an inspection device which inspects a thin film transistor (TFT) for supplying a current to a light emitting element. The inspection device includes: a first current supply circuit which supplies a drain current between a drain and a source of the TFT; a gate voltage adjustment circuit which adjust a gate voltage to be applied to a gate of the TFT so as to allow a predetermined specified current to flow between the drain and source of the TFT; and a measurement unit which measures the gate voltage adjusted by the gate voltage adjustment circuit.

Abstract: Integrated circuit (IC) system architectures that allow for the reduction of on-chip or across-chip transient noise budgets by providing a means to avoid simultaneous high current demand events from at least two functional logic blocks, i.e., noise contributors, are disclosed. Embodiments of the IC systems architectures include at least one noise event arbiter and at least two noise contributor blocks. A method of scheduling on-clip noise events to avoid simultaneous active transient noise events may include, but is not limited to: the noise event arbiter receiving simultaneously multiple requests-to-operate from multiple noise contributers; the noise event arbiter determining when each noise contributer may execute operations based on a pre-established dI/dt budget; and the noise event arbiter notifying each noise contributer as to when permission is granted to execute its operations.