Abstract: Generally, a liquid holding device with a releasable suction base is a mug or other container operable to hold a substance or device with an integral means for creating a secure suction force with a surface. More specifically, a component of the liquid holding device is not only operable to create a suction force, but the application of the suction force provides a means for stabilizing the device. Advantageously, once the liquid holding device is adhered to a surface via the suction mechanism component, the risk of accidental tipping of the device is greatly reduced. Further, an aspect of the present invention is a mechanism for the convenient creation and release of the stabilizing suction force. In some embodiments, the suction creation and release mechanism can be operated with a single hand.

Abstract: A suction cup combination having a base enveloped by an enveloping member made of elastomer, the enveloping member is shaped to have a peripheral extension and forms a suction cup together with a plate or a plurality of plates; when in use, a vacuum state is formed between the suction cup and a plane being adsorbed, thus the structure and the process of assembling of the suction cup combination can be simplified.

Abstract: A foldable support frame assembly includes a row of support units arranged along a first direction. Each of the support units includes two support frames. Each of the support frames includes two parallel braces, a top rail connected fixedly between upper end portions of the linking rods, and a bottom rail connected fixedly between lower end portions of the braces. The braces of each of the support units constitute two first scissor-linkages spaced apart from each other along a second direction perpendicular to the first direction. The foldable support frame assembly further includes a plurality of second scissor-linkages arranged alternately with the support units along the first direction, and a positioning mechanism for maintaining each of the first and second scissor-linkages in an unfolded state.

Abstract: The present invention improves the shape of a protruding part of a locking member which allows a lower stationary rail and an upper moving rail of a seat moving track assembly to be coupled with each other, thereby enabling a stable movement with a further simplified configuration component.

Abstract: A track system for adjusting the position of a vehicle component is provided. The track system comprises a first lower track member (22), a second lower track member (26) and an upper track assembly (24, 28) moveable relative the first lower track member (22) and the second lower track member (26). The upper track assembly (24, 28) includes a first upper track member (24) associated with the first lower track member (22), a second upper track member (28) associated with the second lower track member (26) and a member (29) extending between the first upper track member (24) and the second upper track member (28) to support the first upper track member (24) and the second upper track member (24) in a use position relative to the first lower track member (22) and the second lower track member (26). The first upper track member (24) and the second upper track member (28) are not supported in the use position until the member (29) is provided.

Abstract: Provided is an optical tomographic imaging apparatus that is capable of shortening a period of time of focusing at multiple focus positions when images split in a depth direction are obtained by zone focusing. The optical tomographic imaging apparatus includes: a focus position setting device for splitting a zone within a predetermined imaging depth range into multiple focus zones so as to set multiple focus positions; a reference position setting device for setting at least two reference positions in an imaging depth direction within the predetermined imaging depth range; and a focus controlling device for performing focusing at the multiple focus positions sequentially based on focus position information generated by the focus position setting device and determining a focus condition of an in-focus state for the at least two reference positions set in advance by the reference position setting device.

Abstract: A light control apparatus for controlling incident light passing through an aperture includes a substrate having the aperture, a plurality of incident light control members that are moved respectively in different planes perpendicular to an optical axis direction on the substrate, a plurality of drive members that drive the incident light control members, and separating members that separate, with a certain gap, moving spaces in which the plurality of incident light control members moves in the respective planes. The plurality of incident light control members are each moved by the drive members between an aperture position and a retracted position away from the aperture position.

Abstract: Light is converted to an electric signal by performing a light-to-frequency conversion of the light received during a first phase of operation. Following the first phase of operation, a light-to-time conversion is performed on light received during a second phase of operation. Following the second phase of operation a digital representation of the light is generated in response to the light-to-frequency conversion and the light-to-time conversion.

Abstract: A snapshot pixel device with an active reset that operates in charge mode.

Abstract: In an optical mouse, an optical sensing module includes a printed circuit board and a packaging body. The printed circuit board has an upper surface and a lower surface on opposite sides. The packaging body including a compound, an optical sensing die and a lead frame is disposed on the lower surface. The compound has a transparent surface. The optical sensing die used for receiving light is located inner the compound and has an optical sensing surface facing the transparent surface of the compound. The lead frame with a shoulder portion is electrically connected to the optical sensing die. The shoulder portion extends out from the compound along a direction that is parallel to the optical sensing surface of the optical sensing die. The shoulder portion is fixed on the lower surface. The optical sensing module may be used in an optical mouse.

Abstract: A sensor includes a proximity-light sensor configured to detect proximity of objects and ambient light conditions, an inertial sensor, and control circuitry coupled to the proximity-light sensor and the inertial sensor and configured to control the operation of the proximity-light sensor and the inertial sensor. The sensor further includes a substrate, wherein the proximity-light sensor, the inertial sensor, and the control circuitry are disposed on the substrate to form a single package.

Abstract: [Problems to be Solved] To provide a rotary encoder capable of carrying out self-calibration for a horizontal encoder as well as a vertical encoder without requiring special equipment and simply and inexpensively with a high degree of accuracy while reducing the burden on a worker.

Abstract: [Object] To provide an angular correction method with which angular skip does not occur in determining an angle between angular graduations of a dial of a rotary encoder by interpolation calculation.

Abstract: An ion beam angle calibration and emittance measurement system, comprising a plate comprising an elongated slit therein, wherein the elongated slit positioned at a rotation center of the plate and configured to allow a first beam portion to pass therethrough. A beam current detector located downstream of the plate, wherein the beam current detector comprises a slit therein configured to permit a second beam portion of the first beam portion to pass therethrough, wherein the beam current detector is configured to measure a first beam current associated with the first beam portion. A beam angle detector is located downstream of the beam current detector and configured to detect a second beam current associated with the second beam portion. The plate, the current beam detector and the beam angle detector are configured to collectively rotate about the rotation center of the plate.

Abstract: A method comprising using a first mass analyzer of a downhole tool to isolate specific ions within a sample received in the downhole tool, using a second mass analyzer of the downhole tool to stabilize the ions isolated by the first mass analyzer, and using a third mass analyzer of the downhole tool to catalog the stabilized ions.

Abstract: A laser spectroscopy system can determine the identity and/or quantity of a component of a fluid at a remote location such as downhole in a wellbore or inside a pipeline, particularly at high temperature, e.g. from about 75 to 175° C., without additional or external cooling. The system includes a fiber laser doped with a rare earth element (e.g. Nd3+, Tm3+, Er3+, Th3+, Ho3+, Yb3+, Pr3+) and generates light in a wavelength between about 900 to about 3000 nm. The system may analyze a drilling mud such as an oil based mud or crude oil, and may detect components such as methane, ethane, carbon dioxide, hydrogen sulfide and the like.

Abstract: The present invention relates to an apparatus and method for the analysis of ions in a mass spectrometer comprising; a means to remove material from the sample at a defined specific point, a means to change either discretely or continuously the said defined point of material removal, at least one ionisation means, at least one ion accelerator, at least one energy selective means, a time focus means, a pulse bunching means and a detection means. Said invention allows the mass of an to be analysed with respect to multiple positions on a sample of a material providing a method and apparatus that allows the effective three dimensional mapping of the sample in terms of its constituent parts, their corresponding distribution in those three dimensions in relation to each other and other points of interest on the said sample and also to retain important chemical information by permitting the analysis of whole and intact molecules present on the surface of or within the material sample.

Abstract: An angled dual-polarity mass spectrometer includes a dual-polarity ion generator, a first mass analyzer, and a second mass analyzer. The dual-polarity ion generator includes an ion source to generate positive ions and negative ions from a sample, and electrodes to generate electric fields for guiding the negative ions into a beam of negative ions and guiding the positive ions into a beam of positive ions. The first mass analyzer can analyze the negative ions, and the second mass analyzer can analyze the positive ions. The central axes of the first and the second mass analyzers are at an angle between 0 to 179 degrees.

Abstract: An electrostatic trap such as an orbitrap is disclosed, with an electrode structure. An electrostatic trapping field of the form U?(r, ?, z) is generated to trap ions within the trap so that they undergo isochronous oscillations. The trapping field U?(r, ?, z) is the result of a perturbation W to an ideal field U(r, ?, z) which, for example, is hyperlogarithmic in the case of an orbitrap. The perturbation W may be introduced in various ways, such as by distorting the geometry of the trap so that it no longer follows an equipotential of the ideal field U(r, ?, z), or by adding a distortion field (either electric or magnetic). The magnitude of the perturbation is such that at least some of the trapped ions have an absolute phase spread of more than zero but less than 2 ? radians over an ion detection period Tm.

Abstract: A spectrometer (10) for sample surface analysis by irradiation of the surface by primary particles and a corresponding method of surface analysis spectroscopy. The spectrometer (10) provides sample viewing and secondary charged particle collection substantially normal to the sample surface. A collection chamber (22) comprises a secondary charged particle lens arrangement (20) to focus the emitted particles in a downstream direction along a first normal axis (24) and thereby to define a charged particle optical crossover location (25); and a light-reflecting optical element (50) downstream of the lens arrangement and arranged to receive image light (41) and reflect it away from a second normal axis (42) for providing a viewable image of the surface.

Abstract: Embodiments can provide systems, methods, and apparatus for monitoring the structural health of one or more structures and associated materials. For example, a structural health monitoring system can be provided. The system can include a structure to be monitored, the structure including a material with multiple triboluminescent sensors and multiple nano-optoelectronic members; and an analyzer in signal communication with the nano-optoelectronic members.

Abstract: In an apparatus for obtaining an image by irradiating a charged particle beam on a specimen, a condition of the beam conditioned differently from vertical incidence as in the case of the beam being tilted is required to be adjusted. To this end, the apparatus has a controller for automatically controlling a stigmator, an objective lens and a deflector such that astigmatism is corrected, focus is adjusted and view filed shift is corrected. The controller has a selector for inhibiting at least one of the astigmatism correction, focus adjustment and FOV shift correction from being executed.

Abstract: A particle-optical arrangement comprises a charged-particle source for generating a beam of charged particles; a multi-aperture plate arranged in a beam path of the beam of charged particles, wherein the multi-aperture plate has a plurality of apertures formed therein in a predetermined first array pattern, wherein a plurality of charged-particle beamlets is formed from the beam of charged particles downstream of the multi-aperture plate, and wherein a plurality of beam spots is formed in an image plane of the apparatus by the plurality of beamlets, the plurality of beam spots being arranged in a second array pattern; and a particle-optical to element for manipulating the beam of charged particles and/or the plurality of beamlets; wherein the first array pattern has a first pattern regularity in a first direction, and the second array pattern has a second pattern regularity in a second direction electron-optically corresponding to the first direction, and wherein the second regularity is higher than the first

Abstract: According to the present invention, a charged particle beam device has an unlimitedly rotatable sample stage and an electric field control electrode for correcting electric field distortion at a sample peripheral part. A voltage is applied to a sample on the unlimitedly rotatable sample stage through a retarding electrode that is in contact with a holder receiver at a rotation center of a rotary stage. An equipotential plane on the electric field control electrode is varied by applying a voltage to the electric field control electrode, and following this the equipotential plane at a sample edge is corrected, which enables the sample to be observed as far as its edge.

Abstract: A phase contrast electron microscope has an objective (8) with a back focal plane (10), a first diffraction lens (11), which images the back focal plane (10) of the objective (8) magnified into a diffraction intermediate image plane, a second diffraction lens (15) whose principal plane is mounted in the proximity of the diffraction intermediate image plane and a phase-shifting element (16) which is mounted in or in the proximity of the diffraction intermediate image plane. Also, a phase contrast electron microscope has an objective (8) having a back focal plane (10), a first diffraction lens (11), a first phase-shifting element and a second phase-shifting element which is mounted in or in the proximity of the diffraction intermediate image plane. The first diffraction lens (11) images the back focal plane of the objective magnified into a diffraction intermediate image plane and the first phase-shifting element is mounted in the back focal plane (10) of the objective (8).

Abstract: A transmission electron microscope (TEM) micro-grid includes a grid, a carbon nanotube film structure and two electrodes electrically connected to the carbon nanotube film structure.

Abstract: A through-substrate optical imaging device for through-imaging of translucent work objects, includes a radiation source outputting radiation that will be transmissive through the work object and an imaging system configured for capturing inspection information from the radiation source through the work object. The radiation source is configured such that the radiation impinges on the surface of the work object under various angles of incidence. A method for through-substrate optical imaging of a translucent work object includes irradiating the translucent work object by radiation from a radiation source; capturing inspection information from the radiation source through the translucent work object, the inspection information being captured by an imaging system; and irradiating the translucent work object. The translucent work object is irradiated by radiation which impinges on the surface of the translucent work object under one of various angles of incidence and orientations.

Abstract: A near-infrared imaging sensor according to the present invention includes a photodiode array sensitive to light with a wavelength of 1.2 to 3 ?m and a multiplexer including a signal readout circuit. The near-infrared imaging sensor is contained in a housing and is vacuum-sealed. The housing includes a main body section and a lid covering the main body section. The lid is made of a material transparent to light with a wavelength of 1.2 to 3 ?m.

Abstract: The invention relates to a device for the detection of an electromagnetic radiation including: a substrate; a resistive imaging bolometer; a circuit for polarizing the bolometer at a predetermined voltage; a rejection circuit generating a common mode current, comprising a compensation bolometer thermalized in the substrate and a polarization circuit thereof; and a measuring circuit for measuring the difference between the current flowing in the imaging bolometer when it is polarized and the common mode current generated by the rejection circuit. According to the invention, the rejection circuit further comprises a current generator capable of producing a current that simulates the current induced by the self-heating of the imaging bolometer under the effect of its polarization, the sum of the current passing through the compensation bolometer and the current generated by the current generator forming the common mode current.

Abstract: A micro-bolometer type infrared (IR) sensing device is provided. The IR sensing device includes an absorbed heat discharging part; a sensing structure part formed as bean structure, spaced apart from the absorbed heat discharging part, supported at least at one end on the absorbed heat discharging part, and discharging heat absorbed in the sensing structure part by being elastically deformed and thus touching the absorbed heat discharging part. The sensing structure part includes: a sensing part with variation in secondary attribute (for example, in electrical resistance property) according to heat; and a light-absorbing part formed into one unit with the sensing part in a manner to surround the sensing part as seen in section view, and converting energy of incident photons into heat. The sensing structure part discharges heat absorbed therein by being elastically deformed and thus touching the absorbed heat discharge part spaced apart downward from the sensing structure part.

Abstract: A photodetector/imaging device comprises a layer of photoconductive material converting incident electromagnetic radiation into electrical charges, the layer of photoconductive material being capable of avalanche multiplication when an electric field of sufficient magnitude is applied thereacross; a readout layer detecting the electrical charge; and at least one interface layer between the layer of photoconductive material and the readout layer, the interface layer coupling electrical charge to or from the layer of photoconductive material and being configured to inhibit uncontrolled rises in current in the photoconductive material during avalanche multiplication.

Abstract: The invention relates to a neutron detector for detection of neutrons in fields with significant ?- or ?-radiation, comprising a neutron sensitive scintillator crystal, providing a neutron capture signal being larger than the capture signal of 3 MeV ?-radiation, a semiconductor based photo detector being optically coupled to the scintillator crystal, where the scintillator crystal and the semiconductor based photo detector are selected so that the total charge collection time for scintillator signals in the semiconductor based photo detector is larger than the total charge collection time for signals generated by direct detection of ionizing radiation in the semiconductor based photo detector, the neutron detector further comprising a device for sampling the detector signals, a digital signal processing device, means which distinguish direct signals from the semiconductor based photo detector, caused by ?- or ?-radiation and being at least partially absorbed in the semiconductor based photo detector, from lig

Abstract: Intended is to suppress the separation by a thermal stress between an upper substrate and a lower substrate jointed through a joint member, and to suppress a creeping discharge from an upper electrode to a lower electrode. An active matrix substrate and a glass substrate are jointed at their outer peripheral portions so that the joint area, in which the active matrix substrate and the glass substrate are jointed, can be reduced. This makes it possible to reduce the thermal stress to be caused between the active matrix substrate and the glass substrate, and to suppress the separation between the active matrix substrate and the glass substrate jointed with an adhesive resin.

Abstract: An apparatus and method are presented for use in optical processing of an article. The apparatus comprises: one or more optical windows for directing predetermined electromagnetic radiation therethrough to illuminate a region of interest and collecting radiation returned from the illuminated region; and two or more ports operable for inputting or discharging one or more gases from the vicinity of the region of interest on the article being processed to create in the vicinity of said region a substantially static state of environment, non-absorbable for said electromagnetic radiation, thereby reducing amount of ambient gas in the vicinity of said region of interest and enabling optical processing of the article while maintaining it in the ambient gas environment.

Abstract: The disclosure is directed at a method of digital imaging comprising sensing photons on at least one pixel within a pixel array of a radiation detector; counting the photons using photon counting to produce a digital signal representative of the sensed photons; monitoring a photon flux associated with the sensed photons; and using photon integration to produce a digital signal representative of the sensed photons when the photon flux is higher than a predetermined photon flux.

Abstract: The method includes scanning a sample in at least one first scan line using a first charged particle beam probe; scanning the sample in at least one second scan line using a second charged particle beam probe, and scanning the sample in at least one third scan line using the first charged particle beam probe. The first or second charged particle beam probe is defocused by a control module of the imaging system through adjusting a condenser lens module, an objective lens module, a sample stage of the imaging system, or their combination. An image of the sample is selectively formed from the first, second and third scan lines. The first and the second charged particle beams induce a first charging condition and a second charging condition on the sample surface respectively. The second charging condition can enhance, mitigate, eliminate, reverse or have no effect on the first charging condition.

Abstract: The present invention relates to an ion emitter device comprising an emitter member including an insulating hollow needle (10), the hollow needle presents an electrically insulating point (16) that projects from its apex (13). In addition, the needle (10) includes a cavity (11) that presents an escape orifice (14) that opens out in the vicinity of the point (16). The invention also provides a focused ion emission method using the above emitter device and an extractor electrode, the method comprising applying an extraction voltage to the extractor electrode. In addition, when the device has a regulator electrode, the method comprises applying a regulation voltage to said electrode.

Abstract: The present embodiments relate to lowering the widening of a radiation beam, for example, using a chamber arranged between a beam output and an object to be irradiated. The chamber is filled with a gas or a gas mixture, the average atomic number of which is smaller than that of air, and the volume expansion of which is changeable. The advantage here is that a widening of a radiation beam caused by multiple scattering is reduced.

Abstract: A method and a device for preparing specimens for a cryo-electron microscope are described. A carrier is fixed to a holder, sample liquid is applied to the carrier, and a blotting device for removing excess sample liquid from the carrier by means of the absorbing medium is applied. The absorbing medium is illuminated with light and a change in the optical properties of the absorbing medium is detected by means of an optical sensor device. A control moves the blotting away from the carrier depending on a change in the detected optical properties.

Abstract: A device for analyzing plants, by luminous excitation and fluorescence measurement, can be used on site without preparation of the plants. The device evaluates the content of a compound in the skin or epidermis of a plant. The geometry of the device is characterized by a direction of the excitation light rays and a direction of the fluorescence light rays which are non-collinear with each other. The device includes several sets of emitters of different wavelengths, each including several emitters, and makes it possible to measure a plurality of excitation-fluorescence combinations. A method for evaluating and monitoring the development and maturity of a crop, as well as a method for monitoring and controlling plant treatment are also described.

Abstract: An apparatus includes a position-sensitive detector to detect intensities of radiation as a function of position on the detector, and an optical system, characterized by a diffraction-limited resolution volume, adapted for imaging light emitted from activated and excited phototransformable optical labels (“PTOLs”) in a sample onto the position sensitive-detector. A first light source provides activation radiation to the sample to activate a subset of the PTOLs that are distributed in the sample with a density greater than an inverse of the diffraction-limited resolution volume of the optical system. A second light source provides excitation radiation to the sample to excite a portion of the PTOLs in the subset of the PTOLs. A controller controls one both of the activation radiation and the excitation radiation provided to the sample such that a density of PTOLs in the portion of the PTOLs is less than the inverse of the diffraction-limited resolution volume.

Abstract: [Technical Problem] To provide a differential evacuation system capable of easily maintaining, at a low cost, a large differential pressure between a light generation chamber and an illumination optical chamber in which optical processing, e.g. exposure, is performed by using extreme ultraviolet (EUV) light generated in the light generation chamber, and yet capable of sufficiently ensuring a desired optical path. [Solution to Problem] The differential evacuation system has a light generation chamber 10 that generates EUV light, an illumination optical chamber 100 in which optical processing is performed by using the EUV light generated in the light generation chamber 10, and a chamber connecting passage 150 that connects together the light generation chamber 10 and the illumination optical chamber 100 to guide the EUV light generated in the light generation chamber 10 into the illumination optical chamber 100.

Abstract: An ion implantation method and system that incorporate beam neutralization to mitigate beam blowup, which can be particularly problematic in low-energy, high-current ion beams. The beam neutralization component can be located in the system where blowup is likely to occur. The neutralization component includes a varying energizing field generating component that generates plasma that neutralizes the ion beam and thereby mitigates beam blowup. The energizing field is generated with varying frequency and/or field strength in order to maintain the neutralizing plasma while mitigating the creation of plasma sheaths that reduce the effects of the neutralizing plasma.

Abstract: A method comprises pre-cooling a first semiconductor wafer outside of a process chamber, from a temperature at or above 15° C. to a temperature below 5° C. The pre-cooled first wafer is placed inside the process chamber after performing the pre-cooling step. A low-temperature ion implantation is performed on the first wafer after placing the first wafer.

Abstract: An ion implanter that comprises a chuck assembly having a chuck to clamp, hold, and cool a wafer is disclosed. The chuck is cooled by a cooling assembly circulated with a special coolant, such that the chuck can be maintained at very low temperatures. A mechanical design is provided to minimize the direct surface-to-surface contact area between the chuck and a base, which is employed to support the chuck. The mechanical design includes fasteners for providing mechanical support between the chuck and the base and thermal insulators for providing thermal insulation between the chuck and the base.

Abstract: A radiation source having self-shading electrodes is disclosed. Debris originating from the electrodes is reduced. The path from the electrodes to the EUV optics is blocked by part of the electrodes themselves (termed self-shading). This may significantly reduce the amount of electrode-generated debris.

Abstract: In an EUV light source apparatus, a collector mirror is protected from debris damaging a mirror coating. The EUV light source apparatus includes: a chamber in which extreme ultraviolet light is generated; a target supply unit for supplying a target material into the chamber; a plasma generation laser unit for irradiating the target material within the chamber with a plasma generation laser beam to generate plasma; an ionization laser unit for irradiating neutral particles produced at plasma generation with an ionization laser beam to convert the neutral particles into ions; a collector mirror for collecting the extreme ultraviolet light radiated from the plasma; and a magnetic field or electric field forming unit for forming a magnetic field or an electric field within the chamber so as to trap the ions.

Abstract: An ultra-violet lamp and reflector/shield assembly designed to be mounted in a commercial HVAC, and to other types of A/C units is described herein. The reflector/shield includes a reflective inner surface creating an illumination pattern and an outer surface shielding the UV lamp from the air flow. An orienting and securing assembly for a UV lamp is also described herein.

Abstract: A particle beam impurity removing device for removing impurities from a particle beam emitted in a beam direction is provided, including an emission angle confinement means adapted to confine emission angles of particles included in the particle beam.

Abstract: An optoelectronic apparatus for transmission of an electrical signal via, galvanically isolated by means of a one-piece, translucent, plastic body, an input current circuit. At least one optical transmission element, and an output current circuit, having at least one optical receiving element, wherein the optical transmission element has a principle transmission axis and the optical receiving element a principle receiving axis, which are oriented so as to concide with a shared optical axis.