Patents Issued in June 6, 2013
-
Publication number: 20130141087Abstract: A magnetic encoder including an object to be detected, a casing opposite to the object, a magnet and a magnetic sensor accommodated in the casing is provided. The casing of the magnetic encoder has an opposite wall opposite to the object. The opposite wall has a thickened portion and a thin portion integrally formed with the thickened portion. The thin portion has a smaller thickness than the thickened portion. The magnetic sensor is situated at the thin portion.Type: ApplicationFiled: November 14, 2012Publication date: June 6, 2013Applicant: FANUC CORPORATIONInventor: Fanuc Corporation
-
Publication number: 20130141088Abstract: Methods and apparatus for non-intrusive power monitoring and current measurement in a circuit breaker without modification of the breaker panel or the circuit breaker itself. In one example, an inductive pickup sensor senses current from the breaker face, an inductive link transmits power through a steel breaker panel door, and a passive balanced JFET modulator circuit modulates a carrier signal on the inductive link with information regarding the sensed current. A demodulated breaker current signal is available outside of the breaker panel door. The JFET modulator circuit does not require DC power to modulate the carrier signal with the information regarding the sensed current from the breaker. Such methods and apparatus may be interfaced with a spectral envelope load detection system that can monitor multiple loads from a central location.Type: ApplicationFiled: November 28, 2012Publication date: June 6, 2013Applicant: Massachusetts Institute of TechnologyInventor: Massachusetts Institute of Technology
-
Publication number: 20130141089Abstract: A giant magneto-impedance (GMI) magnetometer is formed in a semiconductor wafer fabrication sequence, which significantly reduces the size and cost of the GMI magnetometer. The semiconductor wafer fabrication sequence forms a magnetic conductor, a non-magnetic conductor that is wrapped around the magnetic conductor as a coil, and non-magnetic conductors that touch the opposite ends of the magnetic conductor.Type: ApplicationFiled: December 1, 2011Publication date: June 6, 2013Inventors: Terry Dyer, Anuraag Mohan, Peter J. Hopper
-
Publication number: 20130141090Abstract: Magnetic field sensor designs that provide both increased directionality and proximate coupling desirable for improved directionality and sensitivity and methods for fabricating them.Type: ApplicationFiled: December 16, 2011Publication date: June 6, 2013Inventor: Alan L. Sidman
-
Publication number: 20130141091Abstract: A magnetic field sensor has a magnetoresistive rod having a stack of stacked layers that include a pinned layer having a fixed magnetization direction almost perpendicular to a longitudinal direction, a free layer comprising a magnetostrictive material having a coefficient of magnetostriction greater than 20 ppm to 25° C. and a longitudinal axis of easiest magnetization, the magnetization changing when the free layer is exposed to a magnetic field, a non-magnetic spacer layer interposed between the free and pinned layers to form a tunnel junction or spin valve, and a stress-generating layer for exerting uniaxial stress essentially such that a product of stress and magnetostriction coefficient is greater than 500 ppm·MPa at 25° C. The rod's length is at least ten times its greatest width.Type: ApplicationFiled: November 20, 2012Publication date: June 6, 2013Applicant: Commissariat a l'energie atomique et aux energies alternativesInventor: Commissariat a l'energie atomique et aux energie
-
Publication number: 20130141092Abstract: A method (100) that automates the process of selecting parameters for MR imaging acquisition to provide imaging with optimal image contrast.Type: ApplicationFiled: December 2, 2011Publication date: June 6, 2013Applicant: Siemens CorporationInventors: Aaron J. Flammang, Christopher Glielmi, Peter Weale
-
Publication number: 20130141093Abstract: For use in MR imaging of a patient a plurality of surface electrodes such as ECG or defibrillator are provided for obtaining electrical signals for determining electrical activity within the body of the patient and remain in place during the MR imaging. The surface electrodes include a quick disconnect wire for carrying the signals to a signal processing system to be removed during the MR imaging to prevent heating. Each electrode comprises a conductive layer divided by slits into separate side by side sections to reduce eddy currents which are induced in the surface electrodes when they are exposed to variations in the magnetic field. The sections all are connected through the layer to the conductive location to allow the signal therefrom to be connected to the communication conductor.Type: ApplicationFiled: December 6, 2011Publication date: June 6, 2013Inventors: Michael Lang, Labros Petropolous, Mark Alexiuk
-
Publication number: 20130141094Abstract: A magnetic resonance imaging apparatus according to an exemplary embodiment includes a first imaging unit, an identifying unit, and a second imaging execution unit. The first imaging execution unit acquires, after applying a labeling RF pulse to blood flowing into the myocardium of a subject, multiple non-contrast MR data for which the time intervals between labeling and acquiring data are different by performing sequential imaging of an imaging area including the myocardium in each segment of a k-space for a given time interval. The identifying unit identifies a time interval taken by the labeled blood to reach a given position in the imaging area. The second imaging execution unit sets the identified time interval and, after applying a labeling RF pulse to the blood flowing into the myocardium of the subject, acquires non-contrast MR data by imaging the imaging area including the myocardium.Type: ApplicationFiled: November 14, 2012Publication date: June 6, 2013Applicants: TOSHIBA MEDICAL SYSTEMS CORPORATION, KABUSHIKI KAISHA TOSHIBAInventors: KABUSHIKI KAISHA TOSHIBA, TOSHIBA MEDICAL SYSTEMS CORPORATION
-
Publication number: 20130141095Abstract: Processes and apparatuses are provided for contactless Nuclear magnetic resonance (“NMR”) spectrum acquiring and spectroscopic analysis and/or measuring or monitoring, in-line, in-situ and/or in real time, at least one composition or object under test of one or more solid, liquid, and/or gaseous substances and/or one or more bulk materials. One or more apparatus may include a resonance type impedance sensor having at least two coils, at least one coil of the at least two coils being at least one excitation coil, at least one other coil of the at least two coils being at least one sensing coil. The method(s) involve acquiring an NMR spectrum of an object under test while changing at least one of the frequency of an IR sensor and the intensity of the magnetic field applied to an object under test and/or sweeping intensity of the magnetic field applied to the object under test.Type: ApplicationFiled: November 30, 2012Publication date: June 6, 2013Applicant: NeoVision LLCInventor: NeoVision LLC
-
Publication number: 20130141096Abstract: A system for measuring nuclear magnetic resonance spin-lattice relaxation time T1 and spin-spin relaxation time T2 of a sample includes a source of a substantially uniform magnetic field B0 for immersing at least a portion of the sample; a nuclear magnetic resonance excitation and detection system constructed and arranged to excite at least a portion of the sample with a plurality of nuclear magnetic resonance pulse sequences, each applied with a repetition time that is preselected to be sensitive to a T1 value of at least a portion of the sample, and to detect nuclear magnetic resonance emissions from the sample in response to excitations to provide a plurality of detection signals; and a signal processing system configured to communicate with the nuclear magnetic resonance excitation and detection system to receive the plurality of detection signals.Type: ApplicationFiled: December 3, 2012Publication date: June 6, 2013Applicant: The Johns Hopkins UniversityInventor: The Johns Hopkins University
-
Publication number: 20130141097Abstract: The MRI apparatus includes an image generating unit, an area setting unit, a slice condition determining unit and an imaging executing unit. The image generating unit images an object at a predetermined imaging position, and generates an image for positioning. The area setting unit sets a slab area and a slice area on a basis of a recommended value that is stored in a storage and corresponds to the predetermined imaging position, and to display the set slab area and the set slice area on the image for positioning, the storage storing the recommended value of a parameter concerning a slice condition for each of a plurality of imaging positions. The slice condition determining unit determines the slice condition on a basis of the slice area. The imaging executing unit executes an imaging of the slab area in accordance with the determined slice condition.Type: ApplicationFiled: December 27, 2012Publication date: June 6, 2013Applicants: TOSHIBA MEDICAL SYSTEMS CORPORATION, KABUSHIKI KAISHA TOSHIBAInventors: Mayumi MORINAGA, Kazuhiro Sueoka
-
Publication number: 20130141098Abstract: A phantom for co-registering a magnetic resonance image and a nuclear medical image is disclosed. The phantom includes a longitudinal member having a first end cap and a second end cap and a chamber contained within the longitudinal member. The chamber contains a fluid for producing a first image using a first imaging modality. The phantom further includes a first rod disposed within the chamber of the longitudinal member. The first rod contains a radioactive substance for producing a second image using a second imaging modality.Type: ApplicationFiled: January 30, 2013Publication date: June 6, 2013Applicants: Siemens Aktiengesellschaft, Siemens Medical Solutions USA, Inc.Inventors: Jun Bao, David Faul, Ralf Ladebeck, John Thomas Pawlak, Elmar Rummert, Charles C. Watson
-
Publication number: 20130141099Abstract: In a magnetic resonance system and a method and device for generating a control command sequence for operating the magnetic resonance system, a magnetic resonance data acquisition sequence is provided to a processor and is modified in the processor. The sequence operates the magnetic resonance system to acquire magnetic resonance data from a subject in multiple individual data acquisitions for subsequent automated evaluation of the individual data acquisitions with respect to an evaluation parameter. The individual evaluation results are combined into an overall evaluation result. The control command sequence is automatically modified in the processor by varying at least one sequence control parameter between different individual data acquisitions so that a variance of a measurement error in the overall evaluation result is minimized.Type: ApplicationFiled: May 19, 2011Publication date: June 6, 2013Inventor: Oliver Heid
-
Publication number: 20130141100Abstract: An embodiment of a method for detecting an anomaly in at least a portion of a wireline cable, comprises providing at least one wireline cable, providing a wireline surface equipment system comprising an anomaly detection system and disposing the anomaly detection system adjacent the wireline cable, operating the surface equipment to enable the wireline cable to pass by the anomaly detection system, operating the anomaly detection system to detect the presence of an anomaly in at least a portion of the wireline cable, the anomaly detection system generating an output when an anomaly is detected, and sending the output of the anomaly detection system to a control unit.Type: ApplicationFiled: August 27, 2012Publication date: June 6, 2013Applicant: Schlumberger Technology CorporationInventors: Sherif Labib, Matthew R. Hackworth, Richard L. Christie, David P. Smith
-
Publication number: 20130141101Abstract: The invention relates to instruments designated for geophysical survey, in particular for soil mass exploration using electromagnetic waves. Radio frequency assisted geostructure analyzer comprising transmitting antenna and radio transmitter (2) installed on the first pillar (3), with transmitting antenna consisting of transmitting loop (1) and antenna rod (10), and also receiving loop (4) and radio receiver (7) installed on the second pillar (9), and receiving ferrite antenna (5).Type: ApplicationFiled: December 13, 2010Publication date: June 6, 2013Inventor: Anatolii Kudelia
-
Publication number: 20130141102Abstract: Various embodiments include apparatus and methods of operation with respect to well logging. Apparatus and methods include a tool having an arrangement of transmitters and receivers to capture a signal from a first region relative to the tool such that signal contributions from a second region relative to the tool are cancelable, based on placement of the transmitters and receivers with respect to each other. Additional apparatus, systems, and methods are disclosed.Type: ApplicationFiled: August 16, 2010Publication date: June 6, 2013Applicant: Halliburton Energy Services, Inc.Inventors: Burkay Donderici, Luis E. San Martin, Michael S. Bittar
-
Publication number: 20130141103Abstract: Methods and related systems are described for making an electromagnetic induction survey of a formation surrounding a cased section of a borehole. An electromagnetic transmitter and/or receiver is deployed into the cased section of the borehole. Electromagnetic survey measurements and impedance measurements relating to impedance of the transmitter and/or receiver are made while deployed in the section of the borehole. Compensation is made for the attenuation amplitude and/or phase in the electromagnetic survey measurements due to the conductive casing. The compensation is based on the impedance measurements and equivalent circuit parameters. The impedance measurements are correlated with numerical modeling results of a purely inductive electromagnetic transducer, and calculated equivalent circuit parameters are combined with the numerical modeling results.Type: ApplicationFiled: January 15, 2013Publication date: June 6, 2013Applicant: Schlumberger Technology CorporationInventor: Schlumberger Technology Corporation
-
Publication number: 20130141104Abstract: This disclosure relates to a downhole logging tool for acquiring data in an earth formation. In one embodiment, the downhole logging tool has a tool body with a longitudinal axis, a set of antennas located on the tool body and including coil windings forming a closed-loop pattern, and a shield disposed over the antennas and having an arrangement of slots with each slot being substantially perpendicular to a proximate portion of at least one of the underlying coil windings, wherein the path length around each slot is more than twice the length of the distance between the slot and a directly adjacent slot along an arc of the coil windings. The downhole logging tool may be a wireline or while-drilling tool, and it may be an induction or propagation tool.Type: ApplicationFiled: January 25, 2013Publication date: June 6, 2013Applicant: SCHLUMBERGER TECHNOLOGY CORPORATIONInventor: Schlumberger Technology Corporation
-
Publication number: 20130141105Abstract: A test system for a battery module is provided. The system includes a housing having a bottom plate; and first, second, third and fourth side walls coupled to the bottom plate that defines an interior region. The system further includes a mounting fixture that fixedly holds the battery module thereon. The system further includes first, second, third and fourth coupling members. The system further includes a lid coupled to the housing utilizing the first, second, third and fourth coupling members. The system further includes a battery charging system that charges the battery module.Type: ApplicationFiled: December 1, 2011Publication date: June 6, 2013Inventors: Kwok Tom, William Koetting, Steve Howay
-
Publication number: 20130141106Abstract: A circuit for measuring voltage of a battery and a power storage system using the same are disclosed. According to one aspect, the circuit includes a switching element connected to the battery and configured to output a first signal at a first voltage level. The switching element is configured to be turned-on in response to a voltage measuring control signal. The circuit also includes a voltage conversion circuit connected to the switching element. The voltage conversion circuit is configured to output a second signal at a second voltage level that is proportional to the first voltage level. An analog-digital converter is configured to receive the second signal and convert the received second signal into a digital signal. A controller is configured to transfer the voltage measurement control signal to the switching element, and receive the digital signal from the analog-digital converter.Type: ApplicationFiled: July 2, 2012Publication date: June 6, 2013Applicant: Samsung SDI Co., Ltd.Inventors: JONG-WOON YANG, TETSUYA OKADA, EUI-JEONG HWANG
-
Publication number: 20130141107Abstract: A battery inspection apparatus includes: a battery inspection table having a plurality of inspection units each for inspecting a rechargeable battery; and a controller that is provided separately from the battery inspection table and configured to control the battery inspection table. Each of the inspection units includes: a contactor for inspection configured to contact a corresponding battery; and a measurement circuit that is connected to the contactor and configured to generate an analog measured signal by measuring at least one of a current, voltage, and temperature, based on an input from the contactor. The battery inspection table has a control board mounted, the control board being configured to convert the analog measured signal generated by each of the inspection units into a digital signal to output to a common communication cable, and the communication cable connects the control board and the controller together.Type: ApplicationFiled: November 19, 2012Publication date: June 6, 2013Inventor: Hideki Yuasa
-
Publication number: 20130141108Abstract: The invention relates to a method for recognising a critical battery condition after a reset (200) of a battery monitoring device (100), wherein a data item indicating the critical battery condition is stored (221) in a non-volatile memory (121) when a critical battery condition is recognised (220) by the battery monitoring device (100), and after the reset (200) of the battery monitoring device (100) a critical battery condition is recognised (211, 220) if the data item indicating the critical battery condition is stored in the non-volatile memory (121).Type: ApplicationFiled: July 14, 2011Publication date: June 6, 2013Applicant: ROBERT BOSCH GMBHInventors: Juergen Motz, Joachim Kizler
-
Publication number: 20130141109Abstract: A method and system for monitoring the health of a battery is provided. A precision frequency can be determined for the battery by applying one of an AC current or voltage perturbation across a frequency sweep with impedance spectroscopy equipment to obtain an impedance response; collecting data related to the impedance response at a plurality of various states of charge within a recommended voltage window of the battery; plotting the collected data on one or more impedance curves; and analyzing the one or more impedance curves at the various states of charge to determine the precision frequency. Next, one of an AC current or voltage perturbation can be applied at the precision frequency resulting in an impedance response. The value of the impedance response can be recorded, and a determination can be made of a battery classification zone that the impedance value falls within.Type: ApplicationFiled: December 5, 2012Publication date: June 6, 2013Inventors: Corey T. Love, Karen Swider-Lyons
-
Publication number: 20130141110Abstract: Methods and apparatus for continuous ground fault self-test are disclosed. An example ground fault detection device includes a sense coil to detect current in a line conductor and a neutral conductor, the sense coil comprising a winding influenced by a current difference between the line conductor and the neutral conductor. The example ground fault detection device also includes a current bypass to facilitate a continuous current imbalance detected by the sense coil, and a ground fault detector circuit to detect at least one of the continuous current imbalance in the sense coil or a ground fault current imbalance.Type: ApplicationFiled: January 23, 2013Publication date: June 6, 2013Applicant: Texas Instruments IncorporatedInventor: Texas Instruments Incorporated
-
Publication number: 20130141111Abstract: Methods to determine the location of an arc fault include a first method utilizing the inherent resistance per unit length of the wire. A second and a third method utilize an inherent inductance per unit length of the wire. The second method derives the inherent inductance from the output voltage and a rate of current rise. The third method derives the inherent inductance from a resonant frequency of an oscillating current. The information is useful to locate a fault emanating from a wire member of a wiring harness used to distribute power about an aircraft.Type: ApplicationFiled: January 29, 2013Publication date: June 6, 2013Applicant: Astronics Advanced Electronic Systems Corp.Inventor: Astronics Advanced Electronic Systems Corp.
-
Publication number: 20130141112Abstract: Methods to determine the location of an arc fault include a first method utilizing the inherent resistance per unit length of the wire. A second and a third method utilize an inherent inductance per unit length of the wire. The second method derives the inherent inductance from the output voltage and a rate of current rise. The third method derives the inherent inductance from a resonant frequency of an oscillating current. The information is useful to locate a fault emanating from a wire member of a wiring harness used to distribute power about an aircraft.Type: ApplicationFiled: January 29, 2013Publication date: June 6, 2013Applicant: Astronics Advanced Electronic Systems Corp.Inventor: Astronics Advanced Electronic Systems Corp.
-
Publication number: 20130141113Abstract: Communications patching system and methods utilizing common-mode channel communications are provided for identifying patch panel ports to which a backbone cable is connected in a communications patching system, for identifying a patch panel port to which a horizontal cable terminating at a telecommunications outlet is connected in a communications patching system, and for identifying the physical location of first and second connectors of a patch cord in a communications patching system having multiple patching zones.Type: ApplicationFiled: January 31, 2013Publication date: June 6, 2013Applicant: CommScope, Inc. of North CarolinaInventor: CommScope, Inc. of North Carolina
-
Publication number: 20130141114Abstract: A non-linear kerf monitor, methods of manufacture and design structures are provided. The structure includes a coplanar waveguide provided in a kerf of a wafer between a first chip and a second chip. The structure further includes a shunt switch and a series switch coupled to the coplanar waveguide.Type: ApplicationFiled: December 2, 2011Publication date: June 6, 2013Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATIONInventors: Alan B. BOTULA, Alvin J. JOSEPH, Randy L. WOLF
-
Publication number: 20130141115Abstract: Automatic process and installation for inspecting and/or sorting objects or articles belonging to at least two different categories, and made to advance approximately in a single layer, for example on a conveyor belt or a similar transport support. The process includes subjecting the advancing flow of objects or articles to at least two different types of contactless analysis by radiation, whose results are used in a combined manner for each object or article to perform a discrimination among these objects or articles and/or an evaluation of at least one characteristic of the latter, the analyses including at least one surface analysis process able to determine the physical and/or chemical composition of the outer layer of an object or article exposed to the radiation used in this process, and at least one volume analysis process able to determine the equivalent thickness of material of the same object or article.Type: ApplicationFiled: December 5, 2012Publication date: June 6, 2013Applicants: UNIVERSITE DE SAVOIE, PELLENC SELECTIVE TECHNOLOGIESInventors: Pellenc Selective Technologies, Universite De Savoie
-
Publication number: 20130141116Abstract: A conductivity sensor is disclosed. The conductivity sensor includes an oscillator for providing an input signal and a reactive circuit having an induction coil, a capacitive element, and a resistive element connected in parallel. The induction coil is adapted to be placed adjacent to a specimen. The conductivity sensor further includes a control circuit for driving the reactive circuit to resonance when the induction coil is placed adjacent to the specimen. The reactive coil is configured to provide an output signal having a parameter representative of the conductivity of the specimen when the reactive circuit is at resonance. The induction coil may include a first conductive element that spirals outward to an external perimeter and a second conductive element operably connected to the first conductive element. The second conductive element spirals inward from the external perimeter staggered relative to the first conductive element.Type: ApplicationFiled: January 30, 2013Publication date: June 6, 2013Applicant: KIMBERLY-CLARK WORLDWIDE, INC.Inventor: Kimberly-Clark Worldwide, Inc.
-
IMPEDANCE RESONANCE SENSOR FOR REAL TIME MONITORING OF DIFFERENT PROCESSES AND METHODS OF USING SAME
Publication number: 20130141117Abstract: Processes and apparatuses are provided for contactless measuring or monitoring in-situ and in real time composition or other electromagnetic impedance correlated properties of liquid or gaseous substances or bulk materials. One or more apparatus may include a resonance type impedance sensor having at least two coils, at least one coil of the at least two coils being at least one excitation coil connectable to at least one alternating current source with frequency sweep, at least one other coil of the at least two coils being at least one sensing coil connectable to at least one data processing system. The one or more methods may include calculating changes in amplitude and resonant frequency induced by electromagnetic interaction between said sensor and object to determine impedance of said object under test; and matching said impedance with predetermined calibration data to determine said chemical or physical properties of said object under test.Type: ApplicationFiled: November 30, 2012Publication date: June 6, 2013Applicant: NeoVision LLCInventor: NeoVision LLC -
Publication number: 20130141118Abstract: In one embodiment, a system includes a touch sensor comprising a first set of electrodes and a first set of bond pads electrically coupled to the first set of electrodes. The system also includes a second set of bond pads capacitively coupled to the first set of bond pads. Each bond pad of the second set of bond pads is coincident with a bond pad of the first set of bond pads. The system also includes a circuit electrically coupled to the second set of bond pads such that signals may be communicated from the first set of bond pads to the circuit.Type: ApplicationFiled: December 1, 2011Publication date: June 6, 2013Inventor: David Brent Guard
-
Publication number: 20130141119Abstract: In one embodiment, an apparatus is provided that includes a touch sensor. The touch sensor includes a plurality of drive electrodes made of conductive material, a plurality of sense electrodes made of conductive material, and a plurality of edges. Each of the drive electrodes and each of the sense electrodes are coupled to at least one track. The tracks are located along only one of the plurality of edges of the touch sensor.Type: ApplicationFiled: December 6, 2011Publication date: June 6, 2013Applicant: Atmel CorporationInventor: Esat Yilmaz
-
Publication number: 20130141120Abstract: A technique comprising: producing a plurality of devices according to a common production process; and determining the thickness of a layer of one of said plurality of devices using an indicator of a first electrical property dependent on the area of overlap between a first element of the device and a second element of the device partially underlying said first element via said layer, wherein the method further comprises: additionally using an indicator of a second electrical property dependent on the area of overlap between said first element of the device and a third element of the device also partially underlying said first element via said layer, wherein (a) the difference between (i) a measured indicator of said first electrical property, and (ii) a measured indicator of said second electrical property provides a more reliable indicator of the thickness of said layer than (b) an indicator of said first electrical property.Type: ApplicationFiled: June 3, 2011Publication date: June 6, 2013Applicant: PLASTIC LOGIC LIMITEDInventor: Stephan Riedel
-
Publication number: 20130141121Abstract: A capacitive sensing circuit is disclosed, wherein the mixer is directly connected to the sense electrode. The AC transimpedance amplifier in front of the mixer in prior art is removed and replaced by a differential DC transimpedance amplifier respectively integrator. The mixer DC offset voltage or current together with the large amplification factor required after the mixer now would result in an inacceptable DC offset at the output of the signal chain. In order to eliminate the effect of the mixer offset, the amplifying stages after the mixer are AC coupled to the mixer output and one of the signals entering the mixer is phase modulated or amplitude modulated with a known low frequency signal. An additional mixer after the AC coupled amplifying stages is driven with the same low frequency modulating signal, resulting in the wanted DC output signal responsive to the capacitance to be measured.Type: ApplicationFiled: June 8, 2011Publication date: June 6, 2013Applicant: IEE INTERNATIONAL ELECTRONICS & ENGINEERING S.AInventor: Laurent Lamesch
-
Publication number: 20130141122Abstract: Methods and devices for detecting a concentration of one or more element in hydrocarbon and/or natural gas in an oil and gas field application. The device including a microstructure having a low thermal mass suspended within a channel, the microstructure includes a supporting layer and a insulating layer; a controllable thermal device in communication with the supporting layer of the microstructure, wherein the controllable thermal device is controllably heated to one or more release temperature of the one or more element; a sensing layer arranged on the insulating layer to absorb molecules of the one or more element from hydrocarbon and/or natural gas; a detecting and measuring resistance device in communication with the sensing layer for measuring the resistance changes caused by absorption of molecules of the one or more element onto the sensing layer at a first temperature and a second temperature, and storing the data on a processor.Type: ApplicationFiled: January 25, 2013Publication date: June 6, 2013Applicant: SCHLUMBERGER TECHNOLOGY CORPORATIONInventor: Schlumberger Technology Corporation
-
Publication number: 20130141123Abstract: A pH-meter capable of measuring conductivity and dissolved oxygen at the same time is composed of a gauge and three probes. Three power sources and three measuring circuits are mounted to the gauge. The detectors of the probes include a pH detector, a conductivity detector and a dissolved oxygen detector. Each of the probes is independently connected with the gauge via a transmission cable to be independently supplied with electricity and the signals of two probes are independently transmitted by electric insulation. Thus, the detecting elements can measure the pH value, conductivity, and dissolved oxygen at the same time with interference with one another.Type: ApplicationFiled: February 7, 2012Publication date: June 6, 2013Applicant: AZ INSTRUMENT CORP.Inventor: Chen-Heng CHENG
-
Publication number: 20130141124Abstract: A circuit testing interface and test method are disclosed. The circuit testing interface may include a test current transmitting pad, a test voltage measuring pad, and at least one driving circuit comprising an output terminal. The output terminal of the at least one driving circuit may be coupled to a through-silicon via (TSV). The circuit testing interface may further include at least one switch module, coupled to (1) the output terminal of the driving circuit, (2) the test current transmitting pad, and (3) the test voltage measuring pad.Type: ApplicationFiled: December 1, 2011Publication date: June 6, 2013Applicant: NANYA TECHNOLOGY CORPORATIONInventors: Bret Dale, Oliver Kiehl
-
Publication number: 20130141125Abstract: A test device is connected to a plurality of electronic devices to test a stability of the electronic devices is provided. The test device includes a parameter setting module, a signal generating module, a communication module, and a monitoring module. The parameter setting module sets test parameters for a test in response to a user input. The signal generating module generates a control signal according to the test parameters set by the user to control the electronic devices to execute operations corresponding to the test parameters. The communication module transmits the control signal to the electronic devices. The monitoring module monitors whether the electronic devices are running in a normal state during the test to determine the stability of the electronic devices and further informs the monitoring result to the user.Type: ApplicationFiled: June 12, 2012Publication date: June 6, 2013Applicant: HON HAI PRECISION INDUSTRY CO., LTD.Inventor: SEN-FENG CHANG
-
Publication number: 20130141126Abstract: A simulation test card to simulate a peripheral card to be inserted into a system to be tested includes a board, an edge connector formed on a bottom side of the board, and a first heating circuit. The first heating circuit includes a number of first switches, a number of first resistors, and a heating element. First terminal of the first switches are connected to a power pin of the edge connector. A first terminal of each first switch is connected to a first terminal of the first heating element through a corresponding first resistor. A second terminal of the first heating element is connected to a ground pin of the edge connector. Each of the switches can be selectively switched to make the first heating circuit generate different heat.Type: ApplicationFiled: December 29, 2011Publication date: June 6, 2013Applicants: HON HAI PRECISION INDUSTRY CO., LTD., HONG FU JIN PRECISION INDUSTRY (ShenZhen) CO., LTD.Inventors: LEI LIU, XIAO-FENG MA
-
Publication number: 20130141127Abstract: The present invention provides a probe assembly for inspecting power semiconductor devices, which comprises (1) a probe block having more than one probe holding hole, (2) more than one probe, each of which is contained in one of the probe holding holes with its outer surface being in contact with the inner surface of the probe holding hole, and which has lower end protruding from the probe block and coming into contact with the power semiconductor device on inspection, and (3) one or more cooling means which cool the probe block. According to the probe assembly and the inspection apparatus having the prove assembly of the present invention, it is possible to inspect characteristics of power semiconductor devices accurately by suppressing temperature rises of the probes as well as the power semiconductor device under test.Type: ApplicationFiled: December 5, 2012Publication date: June 6, 2013Applicant: KABUSHIKI KAISHA NIHON MICRONICSInventor: KABUSHIKI KAISHA NIHON MICRONICS
-
Publication number: 20130141128Abstract: A test method includes: generating a start command in responses to a user input; testing each of the electronic devices in responses to the start command, and generating a test result for each of the electronic devices; obtaining a unique identifier of each of the electronic devices; obtaining the test result of each electronic device and generating a test file corresponding to each of the electronic device to record the test result; naming the test file according to the unique identifier of the corresponding electronic device; obtaining the test files, identifying the test files according to the test file name and determining whether each of the electronic devices are running in a normal state by analyzing the test result recorded in the test file. A test device using the above method is also described.Type: ApplicationFiled: July 18, 2012Publication date: June 6, 2013Applicant: HON HAI PRECISION INDUSTRY CO., LTD.Inventor: YI-TSANG CHEN
-
Publication number: 20130141129Abstract: Provided is a test contactor for testing a semiconductor device which includes a cylinder, a piston which is configured to reciprocate between a first position and a second position according to a change in pressure in the cylinder, and a pressing part which is configured to change its location according to the reciprocating motion of the piston. The pressing part is configured to be in contact with the semiconductor device when the piston is located at the first position, and the pressing part is configured not to be in contact with the semiconductor device when the piston is located at the second position.Type: ApplicationFiled: August 10, 2012Publication date: June 6, 2013Inventor: Tae-Youn LIM
-
Publication number: 20130141130Abstract: A wafer probe card has an adapter module and a probe module detachably mounted together. The adapter module has a holding member and an interposer mounted within the holding plate. The probe module has a frame assembly and a space transformer and a probe assembly mounted within the frame assembly. A fixing plate is mounted on the holding member of the adapter module to constitute an electrical connection among the interposer, space transformer and probe assembly. When any element of the wafer probe card is faulty, the adapter module or the probe module is detached and the faulty element is replaced. The adapter module or the probe module with the replaced element is then reassembled. Alternatively, the adapter module or the probe module can be replaced on a modular basis. Accordingly, all components are unnecessarily to be detached entirely, thereby improving the operational speed and efficiency.Type: ApplicationFiled: December 5, 2011Publication date: June 6, 2013Inventors: Chia-Huang Wang, Hsin Chieh Lu, Jung Fu Lee
-
Publication number: 20130141131Abstract: A suspended IO trace design for SSP cantilever Read/Write is described. Instead of having the whole I/O trace attached to surface of the cantilever, the cantilever is designed with fish-bone-like support and the I/O traces are anchored to cantilever structures 110 at some specific attachment locations with dielectric insulation in between. This design provides very compliant trace compared to cantilever's see-saw actuation around the torsional beam pivot and is also insensitive to residual stress variations from I/O trace in fabrication.Type: ApplicationFiled: July 1, 2008Publication date: June 6, 2013Inventors: Tsung-Kuan Allen Chou, David Harrar, II
-
Publication number: 20130141132Abstract: The present invention provides an inspection apparatus, which comprises probes for front side electrodes, probes for back side electrodes, and a chuck stage, wherein the probes for front side electrodes and the probes for back side electrodes are formed on the upper surface of the chuck stage, and the probe contact area electrically continues to the wafer holding area, and the probes for front side electrodes and the probes for back side electrodes are located leaving a distance in horizontal direction between them so that the probes for back side electrodes move relatively within the probe contact area when the probes for front side electrodes are moved relatively within the wafer under test by the movement of the chuck stage. According to the inspection apparatus of the present invention, it is possible to inspect characteristics of semiconductor devices having electrodes on both side of a wafer more accurately in wafer state.Type: ApplicationFiled: December 5, 2012Publication date: June 6, 2013Applicant: KABUSHIKI KAISHA NIHON MICRONICSInventor: Kabushiki Kaisha Nihon Micronics
-
Publication number: 20130141133Abstract: The apparatus for monitoring a photovoltaic system includes an incoupling circuit configured to couple an AC voltage test signal into the photovoltaic system, and an outcoupling circuit configured to outcouple a response signal, which is associated with the test signal, from the photovoltaic system, and an evaluation device, which is connected to the outcoupling circuit. The evaluation device is configured to identify events which adversely affect correct operation of the photovoltaic system. The apparatus is distinguished in that the outcoupling circuit includes a first transformer and a second transformer, each having a respective primary winding and each having a respective secondary winding which is connected to the evaluation device, with the primary windings of the first and second transformers being arranged in different electrical lines between a generator and an inverter in the photovoltaic system. The disclosure also relates to a corresponding method for monitoring a photovoltaic system.Type: ApplicationFiled: January 15, 2013Publication date: June 6, 2013Applicant: SMA Solar Technology AGInventor: SMA Solar Technology AG
-
Publication number: 20130141134Abstract: A circuit system for testing a chip is provided. The circuit system includes a first layer coupled with a plurality of ground communication mediums. Each ground communication medium facilitates communication of a ground signal. The circuit system includes a second layer coupled with a first integrated circuit chip. The second layer is coupled with a plurality of radio frequency (RF) communication mediums. The RF communication mediums facilitate communication of RF signals. The first integrated circuit chip communicates via one of the RF signals and the ground signal with a second integrated circuit chip. The first and second layers are used to probe the RF signals and the ground signal.Type: ApplicationFiled: October 9, 2012Publication date: June 6, 2013Inventor: Evgeni Bassin
-
Publication number: 20130141135Abstract: An apparatus is described for burn-in and/or functional testing of microelectronic circuits of unsingulated wafers. A large number of power, ground, and signal connections can be made to a large number of contacts on a wafer. The apparatus has a cartridge that allows for fanning-in of electric paths. A distribution board has a plurality of interfaces that are strategically positioned to provide a dense configuration. The interfaces are connected through flexible attachments to an array of first connector modules. Each one of the first connector modules can be independently connected to a respective one of a plurality of second connector modules, thereby reducing stresses on a frame of the apparatus. Further features include for example a piston that allows for tight control of forces exerted by terminals onto contacts of a wafer.Type: ApplicationFiled: January 30, 2013Publication date: June 6, 2013Applicant: Aehr Test SystemsInventors: Donald P. Richmond, II, Kenneth W. Deboe, Frank O. Uher, Jovan Jovanovic, Scott E. Lindsey, Thomas T. Maenner, Patrick M. Shepherd, Jeffrey L. Tyson, Mark C. Carbone, Paul W. Burke, Doan D. Cao, James F. Tomic, Long V. Vu
-
Publication number: 20130141136Abstract: The invention relates to a method for parasitic current detection in a power supply system, which comprises at least one electrical unit, a power grid having power paths for supplying the unit, and a central electrical feed apparatus for feeding electrical power into the power grid, wherein the feed apparatus is connected to a first of the power paths, at which a reference potential is present, and is connected to at least a second of the power paths, at which a potential for generating an operating current through the unit is present, wherein the first power path is earthed by means of a defined first earthing branch of a connecting portion of the first power path, said connecting portion being connected directly to the feed apparatus and being otherwise unbranched. The invention further relates to an apparatus for carrying out the method.Type: ApplicationFiled: February 4, 2013Publication date: June 6, 2013Applicant: Phoenix Contact GmbH & Co. KGInventor: Phoenix Contact GmbH & Co. KG