Patents Issued in April 3, 2014
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TUNNEL WATER INRUSH ADVANCE PREDICTION DEVICE USING NUCLEAR MAGNETIC RESONANCE DIFFERENCE AND METHOD
Publication number: 20140091789Abstract: An equipment and method for forecasting tunnel water inrush using a magnetic resonance differential, where a computer is connected to a transmitting bridge circuit through a high voltage power supply, to a control unit, a first and second signal modulating circuits and a multi-channel collecting circuit; the control unit is connected to a transmitting driver circuit, a first and second protection switches, and the transmitting bridge circuit through the transmitting driver circuit; two ends of a transceiving multi-turn coil are connected to the multi-channel collecting circuit through the first and second protection switches; two ends of a receiving multi-turn coil are connected to the multi-channel collecting circuit through the second protection switch and the second signal modulating circuit; one end of the transceiving multi-turn coil is connected to the transmitting bridge circuit, and the other end is connected to the transmitting bridge circuit through a resonant capacitor.Type: ApplicationFiled: May 17, 2012Publication date: April 3, 2014Applicant: JILIN UNIVERSITYInventors: Yingji Wang, Jun Lin, Shuqin Sun, Chuandong Jiang, Jianpeng Wang, Bo Pang, Zhe Zhang -
Publication number: 20140091790Abstract: In a method and magnetic resonance (MR) apparatus for time-dependent intensity correction of diffusion-weighted MR images that are acquired with a sequence of different diffusion gradient fields, different diffusion gradient fields are associated with at least one group, with the association with groups being established so that the diffusion gradient fields that are associated with the same group satisfy an orthogonality criterion. For each group, an MR result image is created from the MR images associated with the group, such that the MR result image has a suppressed direction dependency of the diffusion weighting in comparison to the constituent MR images. An intensity correction can be made based on the multiple MR result images and used to correct the constituent MR images.Type: ApplicationFiled: October 2, 2013Publication date: April 3, 2014Inventors: Stefan Huwer, David Andrew Porter
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Publication number: 20140091791Abstract: A system for inductively communicating signals in a magnetic resonance imaging system is presented. The system includes first array of primary coils configured to acquire data from a patient positioned on a patient cradle. Furthermore, the system includes a second array of secondary coils operatively coupled to the first array of primary coils. Moreover, the system includes a third array of tertiary coils disposed at a determined distance from the second array of secondary coils. In addition, the system includes a tuning unit operatively coupled to the third array of tertiary coils by a cable having a quarter-wave electrical wavelength and configured to control the first array of primary coils through impedance transformation, where the second array of secondary coils is configured to inductively communicate the acquired data to the third array of tertiary coils.Type: ApplicationFiled: September 28, 2012Publication date: April 3, 2014Applicant: GENERAL ELECTRIC COMPANYInventors: Selaka Bandara Bulumulla, Christopher Judson Hardy, Karthikeyan Veeraswamy Sathyamurthy
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Publication number: 20140091792Abstract: A method for producing a hyperpolarized sample for use in a magnetic resonance investigation has the following steps: a) providing a solid sample (50), containing long T1 nuclei and short T1 nuclei in the same molecules (51); b) hyperpolarizing the short T1 nuclei in the solid sample (50); c) transforming the solid sample (50) into a liquid sample (52); and d) transferring the polarization of the short T1 nuclei to the long T1 nuclei within the molecules in the liquid sample (52) by Cross Polarization. The method can provide samples with hyperpolarized long T1 nuclei, in particular 13C or 15N, in a simple and efficient way.Type: ApplicationFiled: October 3, 2012Publication date: April 3, 2014Applicants: ECOLE POLYTECHNIQUE FEDERALE DE LAUSANNE (EPFL), BRUKER BIOSPIN AGInventors: Sami Jannin, Joost Lohman, Geoffrey Bodenhausen, Klaes Golman
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Publication number: 20140091793Abstract: A method for diffusion magnetic resonance imaging may be provided. The method may comprise steps of performing sampling on an object at N diffusion weighted directions to acquire undersampled but complementary k-space data, combining the complementary data from different directions to obtain a full sampled k-space data, performing initial reconstruction based on common information among images at the N diffusion weighted directions, and performing joint iterative regularized reconstruction to k-space data in all diffusion weighted directions based on the initial images to obtain the desired final images. Due to the utilization of common information at the N diffusion weighted directions, the acquisition efficiency may be enhanced and image resolution and SNR of acquired images may be improved accordingly.Type: ApplicationFiled: November 14, 2012Publication date: April 3, 2014Applicant: Tsinghua UniversityInventor: Tsinghua University
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Publication number: 20140091794Abstract: In a method to operate a magnetic resonance apparatus with a magnetic resonance sequence—in particular a PETRA sequence—in which k-space is radially scanned for an image acquisition in a first region of k-space that does not include the center of k-space, and in which an excitation pulse is radiated as the full strength of at least two phase coding gradients is reached, and in which k-space is scanned in a Cartesian manner—in particular by single point imaging—in a second region of k-space remaining without the first region, the gradient strength corresponding to a shortest total acquisition time is determined automatically from predetermined sequence parameters and/or sequence parameters defined by a user.Type: ApplicationFiled: September 27, 2013Publication date: April 3, 2014Inventor: David Grodzki
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Publication number: 20140091795Abstract: In a method and magnetic resonance apparatus for automatic calculation of a maximum pulse length of a non-selective excitation pulse for a magnetic resonance data acquisition pulse sequence in which gradients are switched during the radiation of at least one non-selective excitation pulse, a first parameter, which indicates the field of view (FOV) desired in the measurement for which the pulse length of the excitation pulse should be maximized, is loaded into a processor, and a second parameter, which indicates the maximum gradient strength (Gmax) which corresponds to the highest gradient strength applied in the entire measurement, is also loaded into the processor. The processor then calculates the maximum pulse length of the excitation pulse on the basis of the first and second parameter. By the maximization of the pulse length, the SAR exposure is reduced for the examination subject from whom the magnetic resonance data are acquired with the pulse sequence.Type: ApplicationFiled: September 27, 2013Publication date: April 3, 2014Inventor: David Grodzki
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Publication number: 20140091796Abstract: In a method and magnetic resonance (MR) system for the creation of an artifact-free image data set of an imaging area located in a measurement volume of the MR system, measurement data are acquired from which an image data is to be reconstructed, with gradients for spatially coding of the measurement data are ramped continuously over time to a strength desired for the acquisition of the measurement data, without abrupt changes in the gradient strength. The actual gradients present in the measurement volume are measured by a field mapping device in the measurement volume of the MR system. The trajectories along which k-space is scanned during the acquisition of the measurement data are calculated on the basis of the measured actual gradients. An artifact-free image data set is reconstructed from the acquired measurement data under consideration of the calculated trajectories, and is displayed and/or stored.Type: ApplicationFiled: September 27, 2013Publication date: April 3, 2014Inventors: David Grodzki, Patrick Gross
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Publication number: 20140091797Abstract: In the acquisition of MR data with diffusion information nuclear spins in a volume segment are excited with radiation of a diffusion coding module and a subsequent diffusion decoding module, and at least one RF pulse is radiated after the excitation, and the MR data are read out. At least one of a time period that defines a time interval between a point in time at which the spin echo condition is satisfied, and the echo time, a first time interval that defines a minimum time interval between the end of the diffusion coding module and the start of the diffusion decoding module, and a second time interval that defines a minimum time interval between the end of the excitation module, and the start of the diffusion coding module, and a third time interval that defines a minimum time interval between the end of the diffusion coding module and the start of the readout of the MR data, is set.Type: ApplicationFiled: October 2, 2013Publication date: April 3, 2014Inventor: Thorsten Feiweier
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Publication number: 20140091798Abstract: A system and method for rapid acquisition of MRI data at multiple points in time in an.Type: ApplicationFiled: February 23, 2012Publication date: April 3, 2014Inventor: Arjun Arunachalam
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Publication number: 20140091799Abstract: Nuclear magnetic resonance apparatus for measuring properties of a fluid stream flowing within a pipeline has one or more magnet systems for applying magnetic field to the fluid stream and also has means for inducing and observing magnetic resonance within the fluid stream as it passes through a said magnetic field. The apparatus may also include a polarizing magnetic field upstream of the magnetic field in which resonance is observed. The fluid stream may be hydrocarbon from an underground reservoir. In order to guard against accumulation of magnetisable iron debris particles entrained in the fluid flow, the apparatus comprises one or more upstream traps having a magnetic field to attract and hold solid magnetizable material and an exit path for the removal of the solid magnetizable material so that it does not continue towards any polarizing field and the field where resonance is observed.Type: ApplicationFiled: September 26, 2013Publication date: April 3, 2014Applicant: SCHLUMBERGER TECHNOLOGY CORPORATIONInventors: EDMUND J. FORDHAM, CHRISTOPHER LENN
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Publication number: 20140091800Abstract: Nuclear magnetic resonance spectrometer for examination of a sample under pressure has a coolant vessel containing a radio-frequency coil cooled by coolant in the vessel while located within the magnetic field of the spectrometer. A pressurizable sample holder comprises a nonmagnetic pressure retaining tube formed of electrically insulating matrix material containing electrically insulating reinforcing filaments. The spectrometer is configured to accommodate this sample holder with the axis of the pressure retaining tube transverse to the magnetic field, and the radiofrequency coil at the exterior of the pressure retaining tube. Cooling of the coil improves the signal to noise ratio and offsets the low coil filling factor which is a consequence of placing the coil outside a non-metallic pressure retaining tube. End pieces at each end of the tube are connected together and contain longitudinal pressure stress.Type: ApplicationFiled: September 26, 2013Publication date: April 3, 2014Applicant: SCHLUMBERGER TECHNOLOGY CORPORATIONInventor: EDMUND J. FORDHAM
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Publication number: 20140091801Abstract: An arrangement includes a plurality of split ring resonators on a planar substrate. Each split ring resonator of the plurality of split ring resonators includes two mutually parallel ring structures of a metal conductor element spaced apart by the substrate. The two mutually parallel rings structures are respectively separated by at least one gap. At least two split ring resonators of the plurality of split ring resonators are positionable relative to one another such that the separated ring structures may be reciprocally guided through a gap of the respective other ring structures and interlock. Overlap regions may be produced by common ring structure inner surfaces.Type: ApplicationFiled: September 27, 2013Publication date: April 3, 2014Inventors: Andreas Fackelmeier, Sebastian Martius
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Publication number: 20140091802Abstract: An integrated electron spin resonance (ESR) circuit chip includes a chip substrate, a transmitter circuit, and a receiver circuit. The transmitter circuit and receiver circuit are disposed on the chip substrate. The transmitter circuit includes an oscillator circuit configured to generate an oscillating output signal and a power amplifier (PA) circuit configured to generate an amplified oscillating output signal based on the oscillating output signal. The receiver circuit receives an ESR signal from an ESR probe. The receiver circuit includes a receiver amplifier circuit configured to generate an amplified ESR signal based on the received ESR signal, a mixer circuit configured to receive the amplified ESR signal and to down-convert the amplified ESR signal to a baseband signal, and a baseband amplifier circuit configured to generate an amplified baseband signal based on the baseband signal.Type: ApplicationFiled: September 30, 2013Publication date: April 3, 2014Applicant: William Marsh Rice UniversityInventors: Xuebei Yang, Charles Chen, Payam Seifi, Aydin Babakhani
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Publication number: 20140091803Abstract: In accordance with aspects of the present disclosure, techniques for monitoring subterranean sequestered CO2 are disclosed. Tools for gathering relevant data are disclosed, and techniques for interpreting the resultant data also disclosed. For example, electrodes and micro-gravity sensors may be deployed, and their readings interpreted to detect underground CO2 migration.Type: ApplicationFiled: October 3, 2012Publication date: April 3, 2014Applicant: BP CORPORATION NORTH AMERICA INC.Inventors: Kevin Dodds, Charles Christopher
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Publication number: 20140091804Abstract: A method for detecting a leakage bright spot includes: providing a driving circuit of data lines and a gate drive of a gate side and connecting a terminal area of the gate side by conductive adhesive; dividing the terminal area of the gate side into a first area and a second area, turning on switches of pixel electrodes, and transmitting a driving signal to the data side; and detecting the leakage bright spot by optionally driving conductive terminals on the first area or the second area of the gate side. The present disclosure further provides a device for detecting a leakage bright spot.Type: ApplicationFiled: November 15, 2012Publication date: April 3, 2014Applicant: SHENZHEN CHINA STAR OPTOELECTRONICS TECHNOLOGY CO., LTD.Inventors: Hao Huang, Zhiming Li, Chang-hung Pan
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Publication number: 20140091805Abstract: A battery module includes a metal casing and a battery cell accommodated in the casing. The casing is provided on its outer surface with an insulation layer and a conductive portion.Type: ApplicationFiled: September 27, 2013Publication date: April 3, 2014Applicant: Lithium Energy JapanInventors: Suguru Moriguchi, Hirohisa Toritani, Yoshihiro Masuda, Hironori Aida
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Publication number: 20140091806Abstract: A static-electricity-quantity measuring apparatus and a static-electricity-quantity measuring method are optimum for a manufacturing site under a difficult-to-measure situation and measure the quantity of static electricity of electronic parts, machine parts, etc. simply with high accuracy. A static-electricity-quantity measuring apparatus of the present invention has: a receiving unit which receives virtual electromagnetic waves generated by vibrations applied to a measured object; a measuring unit which measures at least one of the intensity, frequency, and phase of the virtual electromagnetic waves received by the receiving unit; and a calculating unit which calculates the quantity of static electricity of the measured object based on the measurement result of the measuring unit.Type: ApplicationFiled: April 11, 2012Publication date: April 3, 2014Applicant: NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGYInventors: Kazuya Kikunaga, Kazuhiro Nonaka
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Publication number: 20140091807Abstract: A system and method for non-intrusive fault detection of a ground fault in a communication channel is provided. A bias voltage may be established on a first portion of the communication channel and a second portion of the communication channel. A first voltage may be detected across a first resistor electrically connected to the first and second portions of the communication channel. Data indicative of whether the ground fault exists in the first or second portions of the communication channel may be provided based on the detecting.Type: ApplicationFiled: September 28, 2012Publication date: April 3, 2014Applicant: SIEMENS INDUSTRY, INC.Inventor: Karen D. Lontka
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Publication number: 20140091808Abstract: A device, circuit, system, and method for contact separation detection is described. A contact separation detector includes a capacitive element configured to be coupled across a pair of electrical contacts and a current sensor coupled to the capacitive element, configured to measure a current through the capacitive element and output an indication of a separation state of the pair of electrical contacts based on the current as measured.Type: ApplicationFiled: September 27, 2013Publication date: April 3, 2014Applicant: Arc Suppression TechnologiesInventor: Reinhold Henke
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Publication number: 20140091809Abstract: In a method for detecting disruptions proximate to an underground conduit, at least one signal carrying cable is positioned along a length of the conduit and between the conduit and a ground surface. At least one cable engaging member is connected to spaced apart locations on the at least one signal carrying cable to extend laterally outward of the at least one signal carrying cable. Each of the at least one cable engaging members is configured to transmit a force to the at least one signal carrying cable when impacted by an external force. A monitoring signal is provided to the at least one signal carrying cable, and a reflected monitoring signal is received in response to the supplied monitoring signal. One or more properties of the reflected monitoring signal are compared to one or more corresponding properties of a predicted reflected monitoring signal.Type: ApplicationFiled: March 26, 2012Publication date: April 3, 2014Applicant: OHIO UNIVERSITYInventors: Shad M. Sargand, Gayle F. Mitchell
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Publication number: 20140091810Abstract: An apparatus is described for burn-in and/or functional testing of microelectronic circuits of unsingulated wafers. A large number of power, ground, and signal connections can be made to a large number of contacts on a wafer. The apparatus has a cartridge that allows for fanning-in of electric paths. A distribution board has a plurality of interfaces that are strategically positioned to provide a dense configuration. The interfaces are connected through flexible attachments to an array of first connector modules. Each one of the first connector modules can be independently connected to a respective one of a plurality of second connector modules, thereby reducing stresses on a frame of the apparatus. Further features include for example a piston that allows for tight control of forces exerted by terminals onto contacts of a wafer.Type: ApplicationFiled: December 5, 2013Publication date: April 3, 2014Applicant: Aehr Test SystemsInventors: Donald P. Richmond, II, Kenneth W. Deboe, Frank O. Uher, Jovan Jovanovic, Scott E. Lindsey, Thomas T. Maenner, Patrick M. Shepherd, Jeffrey L. Tyson, Mark C. Carbone, Paul W. Burke, Doan D. Cao, James F. Tomic, Long V. Vu
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Publication number: 20140091811Abstract: A method for multivariable measurements using a single-chip impedance analyzer includes providing a sensor, exposing the sensor to an environmental parameter, determining a complex impedance of the sensor over a measured spectral frequency range of the sensor, and monitoring at least three spectral parameters of the sensor.Type: ApplicationFiled: September 28, 2012Publication date: April 3, 2014Applicant: GENERAL ELECTRIC COMPANYInventors: Radislav Alexandrovich Potyrailo, Jeffrey Michael Ashe, Sm Shajed Hasan, Naresh Kesavan Rao, Krishnakumar Sundaresan
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Publication number: 20140091812Abstract: A method for deciding a scan clock domain allocation of an integrated circuit includes: utilizing a circuit netlist file and a timing constraints file of the integrated circuit to find out the amount of crossing paths between any two function clock domains of a plurality of function clock domains, and generate a clock domain report file; and grouping the plurality of function clock domains and allocating the plurality of function clock domains after being grouped into a plurality of scan clock domains according to the clock domain report file.Type: ApplicationFiled: September 16, 2013Publication date: April 3, 2014Applicant: Realtek Semiconductor Corp.Inventors: Ming-Chung Wu, Shuo-Fen Kuo, Ying-Yen Chen, Jih-Nung Lee, Ching-Feng Su
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Publication number: 20140091813Abstract: Disclosed are systems, devices and methods related to scanners that can be utilized for multiple electrical and/or magnetic field measurements at different locations of a radio-frequency (RF) module. In some embodiments, a scanning system can include a miniature probe such as a magnetic probe, a fixture system configured to hold a device under test (DUT) such as an RF module, an operating system configured to operate the DUT, and a measurement system configured to obtain field strength measurements through the miniature probe at different locations of the DUT. Such measurements can yield a near-field distribution over a plurality of selected areas of the DUT, with each of the selected areas being smaller than an overall lateral area of the DUT. In some implementations, such a scanning system can be utilized to facilitate applications such as electromagnetic (EM) shielding designs.Type: ApplicationFiled: September 7, 2013Publication date: April 3, 2014Inventors: Dinhphuoc Vu HOANG, Dean Kazuo ENOMOTO, Guohao ZHANG, Hoang Mong NGUYEN, Howard E. CHEN
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Publication number: 20140091814Abstract: An FET RF signal detector circuit comprising two unbalanced differential transistor pair circuits is disclosed. A current mirror output circuit is included for generating an output current derived from currents flowing in the differential transistor pair circuits. The first unbalanced differential transistor pair circuit comprises two branches, each with a respective tail, and a first variable resistor between the branch tails. The first unbalanced differential transistor pair circuit connects to a first current source tail arrangement. The second unbalanced differential transistor pair circuit comprises two branches, each with a respective tail, and a second variable resistor between the branch tails. The second unbalanced differential transistor pair circuit connects to a second current source tail arrangement.Type: ApplicationFiled: September 18, 2013Publication date: April 3, 2014Applicant: NXP B.V.Inventors: Claire Boucey, Fabian Rivière, Sidina Wane
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Publication number: 20140091815Abstract: A capacitive position sensor system for determining the position of an object, in particular on a surface of a contactless smartcard, is provided. The object is positioned within a sensitive area of the capacitive position sensor system and changes the capacitance of capacitors being arranged underneath the object. The capacitive position sensor system comprises a set of sensing elements being arranged in the form of a column. Each sensing element includes a first capacitor having a first electrode and a second electrode and a second capacitor having a first electrode and a second electrode. A specific weighting factor is assigned to each capacitor. A control unit is adapted to determine the position of the object in one dimension by analyzing the results of a plurality of sensed voltage levels for the first capacitors and the second capacitors of a plurality of integration cycles.Type: ApplicationFiled: September 26, 2013Publication date: April 3, 2014Applicant: NXP B.V.Inventor: Thomas Suwald
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Publication number: 20140091816Abstract: A method for determining and retrieving positional information includes forming a grid by locating a plurality of first conductive elements on a surface and a plurality of second conductive elements on the surface. A second grid is coupled to the surface and electrically isolated from the grid. The surface is penetrated with a projectile and a first location of a first penetration of the surface is electronically determined based on a first change in a first electrical measurement. A plurality of third and fourth electric& measurements are performed in a second plurality of locations of the second grid and the location impact is electronically determined.Type: ApplicationFiled: February 25, 2013Publication date: April 3, 2014Inventor: Bruce Hodge
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Publication number: 20140091817Abstract: An electronic device includes a touch panel and a position detection circuit operable to output a position signal indicating a position at which the touch panel operated with an object. The detection circuit is operable perform a correction process to capacitance measurement values of electrodes of the touch panel to provide capacitance correction values. The detection circuit is operable to determine whether or not the electronic device is in a holding status in which the electronic device is held based on the capacitance measurement values or the capacitance correction values. The detection circuit is operable to perform a calibration process to correct the correction process if determining that the electronic device is in the holding status. The detection circuit is operable to output the position signal based on the capacitance measurement values or the capacitance correction values. This electronic device can avoid a false detection in approaching detection.Type: ApplicationFiled: September 26, 2013Publication date: April 3, 2014Applicant: PANASONIC CORPORATIONInventor: Takuma BESSHI
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Publication number: 20140091818Abstract: A probe card for testing integrated circuit devices. The probe card includes a first circuit having a plurality of traces disposed thereon. The probe card also includes a plurality of pins to couple to a device under test. An interface element interfaces a first set of pins of the plurality of pins with the plurality of traces on the first circuit. The interface element includes a conductive plane coupled to a second set of pins of the plurality of pins to provide power and ground to the device under test.Type: ApplicationFiled: October 3, 2012Publication date: April 3, 2014Applicant: CORAD TECHNOLOGY INC.Inventor: CORAD TECHNOLOGY INC.
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Publication number: 20140091819Abstract: An integrated circuit (IC) comprises routing circuitry including a plurality of signal line segments in routing layers of the IC, and a plurality of micro-bump contacts coupled to the routing circuitry. The IC includes a plurality of test circuits coupled to respective subsets of the plurality of signal line segments. Each test circuit is configured to connect micro-bump contacts in the respective subset to form first and second sets of daisy chains. Each test circuit is configured to test the first and second sets of daisy chains for open circuits and test for short circuits between the first and second sets of daisy chains. Each test circuit is configured to determine the locations of detected open circuits and determine the locations of detected short circuits.Type: ApplicationFiled: September 28, 2012Publication date: April 3, 2014Applicant: XILINX, INC.Inventors: Yuqing Gong, Henley Liu, Myongseob Kim, Suresh P. Parameswaran, Cheang-Whang Chang, Boon Y. Ang
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Publication number: 20140091820Abstract: Detecting misalignment of test probes with component carriers in an automated test system is taught. Automated test systems for testing electronic components can have electronic components held in component carriers in preparation for testing. Testing can include moving test probes through openings provided in the component carrier to contact the electronic components held therein. Aspects of disclosed implementations use force feedback from the test probes to determine if the test probes have successfully contacted the electronic component without, for example, contacting the component carrier.Type: ApplicationFiled: September 28, 2012Publication date: April 3, 2014Applicant: ELECTRO SCIENTIFIC INDUSTRIES, INC.Inventors: Joseph Johann Emery, Jae H. Kim, Daniel Joel Boatright, Michael Charley Stocks, James Ray Huntington
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Publication number: 20140091821Abstract: An electrical probe of an aspect includes a high yield strength wire core. The high yield strength wire core includes predominantly one or more materials selected from tungsten, tungsten-copper alloy, tungsten-nickel alloy, beryllium-copper alloy, molybdenum, stainless steel, and combinations thereof. The high mechanical strength wire core has a yield strength of at least 1 gigapascal (GPa) at temperature of 250° C. The electrical probe also includes a low electrical resistivity layer concentrically around the high yield strength wire core. The concentric layer includes predominantly one or more materials selected from silver, gold, copper, and combinations thereof. The low electrical resistivity layer has an electrical resistivity of no more than 2×10?8 Ohm-meters. The electrical probe has an outer cross-sectional dimension of the electrical probe that is no more than 50 micrometers. Between 60 to 85% of the outer cross-sectional dimension is provided by the high mechanical strength wire core.Type: ApplicationFiled: September 28, 2012Publication date: April 3, 2014Inventors: David Shia, Todd P. Albertson, Kip P. Stevenson
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Publication number: 20140091822Abstract: A blade type micro probe and a method of manufacturing the same are disclosed. The method includes forming a plating seed layer on a substrate, a first blade structure on the plating seed layer and a second blade structure on the first blade structure, wherein the first blade structure includes a first second patterned photo resist layer and a metal layer filling up the voids in the first second patterned photo resist layer and the second blade structure includes a second patterned photo resist layer and an another metal layer filling up the voids in the second patterned photo resist layer, then removing the first and second patterned photo resist layers, and finally removing the plating seed layer and the substrate, thereby forming the blade type micro probe. The first patterned photo resist layer is different from the second patterned photo resist layer in shape.Type: ApplicationFiled: September 28, 2012Publication date: April 3, 2014Inventors: Horng-Jee Wang, Ya-Ru Huang
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Publication number: 20140091823Abstract: Provided is an electrical contact member which is capable of maintaining stable conductivity over a long period of time, while achieving low adhesion to a test subject, in particular, an electrical contact member which is capable of maintaining stable electrical contact over a long period of time by suppressing increase in the contact resistance, while achieving low adhesion to a test subject even after repeated contact at high temperatures around 85° C. or after being left in the atmosphere for a long period of time. The present invention relates to an electrical contact member, which repeatedly comes into contact with a test subject, and wherein the surface of the electrical contact member, said surface coming into contact with the test subject, is configured of a carbon coating film that contains Pd.Type: ApplicationFiled: June 15, 2012Publication date: April 3, 2014Applicant: Kabushiki Kaisha Kobe Seiko Sho (Kobe Steel, Ltd.)Inventors: Norihiro Jiko, Takayuki Hirano
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Publication number: 20140091824Abstract: A mechanism is described for facilitating a dynamic electro-mechanical interconnect capable of being employed in a test system according to one embodiment. A method of embodiments of the invention may include separating, via a cavity, a first conductor of an interconnect from a second conductor of the interconnect, and isolating, via the cavity serving as a buffer, a first electrical path provided through the first conductor from a second electrical path provided through the second conductor.Type: ApplicationFiled: September 28, 2012Publication date: April 3, 2014Inventors: Evan M. Fledell, Joe F. Walczyk, Dinia P. Kitendaugh
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Publication number: 20140091825Abstract: A probe card interface for interfacing a probe head with a first circuit. The probe card interface includes an impedance control element to interface a first set of pins of the probe head with the first circuit. The impedance control element is further configured to control the impedance of the first set of pins. The probe card interface includes a conductive plane to interface a second set of pins of the probe head with the first circuit. The conductive plane is further coupled to provide at least one of power or ground to the second set of pins.Type: ApplicationFiled: December 7, 2012Publication date: April 3, 2014Applicant: CORAD TECHNOLOGY INC.Inventor: Corad Technology Inc.
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Publication number: 20140091826Abstract: A probe card interface for interfacing a probe head with a first circuit. The probe card interface includes an impedance control element to interface a first set of pins of the probe head with the first circuit. The impedance control element is further configured to control the impedance of the first set of pins. The probe card interface includes a printed circuit board (PCB) to interface a second set of pins of the probe head with the first circuit. The PCB is further coupled to provide at least one of power or ground to the second set of pins. For some embodiments, the PCB comprises a flexible polyimide substrate coupled between a first conductive layer and a second conductive layer. The first conductive layer is coupled to ground. The second conductive layer is coupled to a power source on the first circuit.Type: ApplicationFiled: July 3, 2013Publication date: April 3, 2014Inventor: Ka Ng Chui
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Publication number: 20140091827Abstract: A probe card for circuit-testing comprising a testing PCB, a probe head, and a silicon interposer substrate is provided. The probe head has a plurality of probes provided with a fine pitch arrangement and held inside. The silicon interposer substrate is used for conveying signals between said probes and said test PCB. The interconnection of said silicon interposer substrate is formed by utilizing the through-silicon via process. A plurality of upper terminals and a plurality of lower terminals are respectively array-arranged on the top surface and the bottom surface of said silicon interposer substrate. The pitch between the upper terminals is larger than the pitch between the lower terminals and the pitch between adjacent lower terminals is equal to the fine pitch of the arrangement of probes.Type: ApplicationFiled: August 26, 2013Publication date: April 3, 2014Applicant: Hermes-Epitek Corp.Inventor: Chien-Yao HUNG
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Publication number: 20140091828Abstract: A sort probe gripper includes a body, a jaw mount inserted into the body, a plurality of grippers mounted in the jaw mount and an actuator sleeve slidable along the body to engage the plurality of grippers.Type: ApplicationFiled: September 28, 2012Publication date: April 3, 2014Inventors: David Shia, Todd P. Albertson
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Publication number: 20140091829Abstract: According to one embodiment, a semiconductor device includes a circuit board, a plurality of semiconductor chips stacked above the circuit board, first and second bumps, third and fourth bumps, and first and second detection units. The first and second bumps are provided in either a gap between the circuit board and the semiconductor chip or a gap between the two semiconductor chips. The third and fourth bumps are provided in any of gaps other than the gap in which the first and second bumps are provided. The first detection unit is electrically connected to the first bump to detect damage of the first bump and to generate a first signal indicating the damage of the first bump. The second detection unit is electrically connected to the third bump to detect damage of the third bump and to generate a second signal indicating the damage of the third bump.Type: ApplicationFiled: August 29, 2013Publication date: April 3, 2014Applicant: Kabushiki Kaisha ToshibaInventors: Yuu YAMAYOSE, Kenji HIROHATA
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Publication number: 20140091830Abstract: A judgment unit judges the pass/fail of DUTs. A power supply circuit has changeable characteristics, and supplies a power supply signal to the DUTs. A condition setting unit performs a pilot test before a main test for the DUTs, and acquires a test condition to be used in the main test. The condition setting unit executes: (a) measuring a first device characteristic value for each of multiple pilot samples sampled from among the DUTs while emulating a power supply characteristic close to what is used in a user environment in which the DUT is actually used; (b) measuring a predetermined second device characteristic value for each of the multiple pilot sample devices while emulating a power supply characteristic close to what is used in a tester environment in which the main test is performed; and (c) determining the test condition based on the first and second device characteristic values.Type: ApplicationFiled: October 2, 2013Publication date: April 3, 2014Applicants: The University of Tokyo, ADVANTEST CORPORATIONInventors: Masahiro Ishida, Satoshi Komatsu, Kunihiro Asada, Toru Nakura
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Publication number: 20140091831Abstract: Technologies for enforcing an expiration policy on an electronic engineering sample component includes a one-time programmable fuse to store a manufacture date of the electronic engineering sample component, another one-time programmable fuse to store an expiration date of the electronic engineering sample component, and a component life management engine to compare a current date of the electronic engineering sample component with the expiration date of the electronic engineering sample component. The component life management engine to disable or lock the electronic engineering sample component in response to determining that the current date of the electronic engineering sample component exceeds the expiration date of the electronic engineering sample component. In some embodiments, a computing device may enforce the expiration policy for the electronic engineering sample component.Type: ApplicationFiled: September 28, 2012Publication date: April 3, 2014Inventors: Abdi Nassib, Gyan Prakash
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Publication number: 20140091832Abstract: An integrated circuit substrate of an aspect includes a plurality of exposed electrical contacts. The integrated circuit substrate also includes an inaccessible set of Physically Unclonable Function (PUF) cells to generate an inaccessible set of PUF bits that are not accessible through the exposed electrical contacts. The integrated circuit substrate also includes an accessible set of PUF cells to generate an accessible set of PUF bits that are accessible through the exposed electrical contacts. Other apparatus, methods, and systems are also disclosed.Type: ApplicationFiled: September 28, 2012Publication date: April 3, 2014Inventors: Kevin C. Gotze, Gregory M. Iovino, Jiangtao Li, David Johnston, Sanu K. Mathew, George W. Cox, Anand Rajan
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Publication number: 20140091833Abstract: A driver circuit for a digital signal transmitting bus includes a main switch. The main switch is connected to the bus, is controllable by the digital signal to be transmitted, and has one on-switching state in which it has maximum electrical conductivity, one off-switching state in which it has minimum electrical conductivity and at least one intermediate switching state with an electrical conductivity between the minimum and maximum conductivity. The digital signal has a first logic state and a second logic state, the first logic state controls the main switch to be in the on-switching state and the second logic state controls the main switch to be in the off-switching state. The main switch is in the intermediate switching state during switching from the on-switching state to the off-switching state and/or vice versa.Type: ApplicationFiled: September 29, 2012Publication date: April 3, 2014Applicant: Infineon Technologies AGInventors: David Astrom, Daniel Mandler
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Publication number: 20140091834Abstract: An apparatus comprises a first integrated circuit (IC) die, and a second IC die stacked on the first IC die. The first and second IC dies are operational independently of each other. Each respective one of the first and second IC dies has: at least one circuit for performing a function; an operation block coupled to selectively disconnect the circuit from power; and an output enable block coupled to selectively connect the circuit to at least one data bus.Type: ApplicationFiled: December 10, 2013Publication date: April 3, 2014Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.Inventor: Shyh-An CHI
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Publication number: 20140091835Abstract: Apparatus and method for digital configuration of integrated circuits (ICs) are provided herein. In certain implementations, an IC includes an impedance sensing circuit and at least one pin used for digital configuration. The impedance sensing circuit can detect an impedance value of an external passive network electrically connected to the pin, and can digitally configure the IC based on the detected impedance. For example, an end-user can connect an external resistor of a particular resistance to the pin, and the impedance sensing circuit can sense or detect the external resistor's resistance and digitally configure the IC based on the detected resistance. Accordingly, an end-user can digitally configure the IC by connecting a passive external component corresponding to a desired digital configuration to the pin. In certain implementations, the IC includes multiple pins, and the digital configuration is based on the impedances detected on each of the pins.Type: ApplicationFiled: September 28, 2012Publication date: April 3, 2014Applicant: ANALOG DEVICES, INC.Inventor: Reuben P. Nelson
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Publication number: 20140091836Abstract: The multi-dimensional data registration integrated circuit for driving array-arrangement devices, comprising: a plurality of the i-th hierarchy sets, each of the i-th hierarchy sets is divided into a plurality of the (i+1)-th hierarchy sets; a i-th hierarchy address selection circuit, comprising a signal generation unit and a multiplexing unit, wherein the former generates an enable signal, the latter is connected to the signal generating unit and shifts the input data based on the enable signal and a second timing signal to further generate n bits of address signals, the i-th hierarchy address selection circuit is used to scan the plurality of the i-th hierarchy sets and select at least one of the i-th hierarchy sets to function; and a data supply circuit to follow a scan sequence of a j-th hierarchy address selection circuit and write a plurality of data into the selected j-th hierarchy sets.Type: ApplicationFiled: December 4, 2013Publication date: April 3, 2014Applicant: NATIONAL TSING HUA UNIVERSITYInventors: Fan-Gang TSENG, Jian Chiun LIOU
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Publication number: 20140091837Abstract: One or more techniques and systems for starting an output driver and an associated start-up circuit are provided herein. In some embodiments, a voltage provider is configured to charge a charge store to a pre-turn-on voltage. In some embodiments, an output driver is configured to control a connection between the charge store and the output driver. For example, the connection enables the charge store to discharge a voltage to the output driver, thus starting the output driver. Accordingly, a response time associated with starting the output driver is mitigated at least because the charge store is charged to the pre-turn-on voltage and connected to the output driver such that a gate of the driver is biased in a sudden fashion. In this manner, the driver is turned on more quickly. Additionally, effects associated with process, voltage, and temperature variations are mitigated, for example.Type: ApplicationFiled: September 28, 2012Publication date: April 3, 2014Applicant: Taiwan Semiconductor Manufacturing Company LimitedInventor: Taiwan Semiconductor Manufacturing Company Limited
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Publication number: 20140091838Abstract: A driver circuit suitable for outputting a signal onto an output line affected by conducted EMI, has a slope control circuit and an output circuit, (op-amp, Mo, M13 to M21). It can be used for driving a LIN network. The slope control circuit outputs a slope controlled version of the input signal to the output circuit, which (M6,M7) is arranged to reduce an amount of conducted EMI induced DC shift in the output circuit. This can involve clipping a feedback signal, and regulating an output stage of the op-amp to prevent the DC shift. Having a separate output circuit can help shield the slope control circuit from the EMI on the output line.Type: ApplicationFiled: June 13, 2013Publication date: April 3, 2014Inventors: Jean-Michel Vladimir Redouté, Michiel Steyaert