Patents Issued in July 10, 2014
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Publication number: 20140192323Abstract: To measure internal information on the subject, the OCT (optical coherence tomographic) control device is equipped with: a first imaging control means for initiating imaging when it is determined that input of a measurement instruction to scan the laser light at a prescribed pitch in the imaging target area of a sample using the galvano mirror has been received, and completing imaging in an imaging time that matches the prescribed pitch; and with a second imaging control means for initiating imaging when it is determined that input of a preview instruction to scan at a coarser pitch than the prescribed pitch has been received, and for completing imaging when it is determined that input of a measurement instruction as an instruction to cancel the preview instruction has been received.Type: ApplicationFiled: January 16, 2012Publication date: July 10, 2014Applicant: THE YOSHIDA DENTAL MFG. CO., LTD.Inventor: Hideo Kakuma
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Publication number: 20140192324Abstract: An optical coherence tomography device is disclosed for improved imaging. Reduced levels of speckle in the images generated by the device are obtained by forming a B-scan from a plurality of A-scans, wherein each resolution cell of the B-scan is generated through compounding of a subset of the A-scans and wherein at least some of the subset of A-scans are separated by at least half the diameter of a speckle cell both tangent to and orthogonal to the B-scan at that cell.Type: ApplicationFiled: January 14, 2014Publication date: July 10, 2014Applicant: CARL ZEISS MEDITEC, INC.Inventors: Jochen STRAUB, Clement Louis-Rene VIARD
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Publication number: 20140192325Abstract: The present systems and methods provide a mechanism to assess viewer behavior, features of stimuli, and the interaction between viewer behavior and stimuli. The systems and methods described herein for quantifying blink response and blink inhibition provide moment-by-moments measurements of viewer engagement by measuring what is or is not engaging enough to warrant viewers' inhibition of blinking. The present disclosure describes measures of visual scanning, eye movements, blink data, and blink timing data to derive a measure of how engaged a person is with what he or she is looking at. Blink-related data as a measure of viewer engagement provides a mechanism for determining the most engaging spatial and temporal aspects of a stimulus.Type: ApplicationFiled: December 11, 2013Publication date: July 10, 2014Inventors: Ami KLIN, Warren JONES, Sarah SHULTZ
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Publication number: 20140192326Abstract: A portable VOG device is disclosed that will facilitate the effective and efficient screening for TBI in military personnel in forward deployed military settings or remote locations using minimally trained staff. This includes the establishment of a protocol that will provide cost effective pre-screening of military personnel prior to deployment to establish a baseline of brain function prior to possible future injury. The efficiency of the device will promote subsequent follow-up screening to assess the effectiveness of prescribed TBI treatment. Further protocols for diagnosis and rehabilitation applications using the same virtual reality portable device will allow more advanced usage for clinicians providing ongoing evaluation and treatment.Type: ApplicationFiled: November 18, 2013Publication date: July 10, 2014Inventors: Alexander D. Kiderman, Howison Schroeder, Thomas Joos, Greg Frank, Daniel Sweeney, Thomas Vernon Baker
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Publication number: 20140192327Abstract: A method of obtaining an impression of an eye, the method comprises preparing an impression material, contacting the impression material with an eye of a subject, obtaining an impression of the eye on the impression material, creating an indication of the orientation of the impression with respect to the eye, and removing the impression material from the eye. The impression can be used in a method of manufacturing a lens for an eye that comprises receiving one or more data files comprising a back lens surface calculation and a front lens surface calculation, forming a back lens surface from a lens blank based on the back lens surface calculation, forming a front lens surface from the lens blank based on the front lens surface calculation, and forming one or more asymmetric features in the back lens surface based on the back lens surface calculation.Type: ApplicationFiled: February 21, 2014Publication date: July 10, 2014Applicant: EyePrint Prosthetics LLCInventors: Christine W. Sindt, Keith D. Parker
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Publication number: 20140192328Abstract: An illumination system for a stereoscopic projection device is provided. The illumination system comprises a luminous element and a color wheel module. The luminous element is adapted to generate a plurality of first wave band lights when the color wheel module has a plurality of wave band transmitting transforming areas and a plurality of wave band reflecting transforming areas. When the first wave band lights are projected to the wave band transmitting transforming areas, the first wave band lights are adapted to transmit the wave band transmitting transforming areas to excite a plurality of first selected wave band lights. When the first wave band lights are projected to the wave band reflecting transforming areas, the wave band reflecting transforming areas are adapted to excite and reflect a plurality of second selected wave band lights.Type: ApplicationFiled: January 9, 2014Publication date: July 10, 2014Applicant: DELTA ELECTRONICS, INC.Inventor: Shengwei LIN
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Publication number: 20140192329Abstract: An apparatus for projecting a spatial image in which the spatial image with a background is projected into a space through a projection unit is discussed. The apparatus according to an embodiment includes a receiving unit to receive a spatial image and a background image, a display unit to display the spatial image and the background image and to project light, a control unit to control the display unit to display the spatial image and the background image, and a spatial image projection unit to project the spatial image and the background image by transmitting or reflecting the light. Thus, a spatial image may be viewed from every direction, and the spatial image may be projected to different positions according to images and a background image may be displayed at the same time. In addition, a user may perform interaction such as reaching of hands into the projected image, and the like.Type: ApplicationFiled: December 12, 2013Publication date: July 10, 2014Applicants: Kwangwoon University Industry-Academic Collaboration Foundation, LG ELECTRONICS INC.Inventors: Sungchul SHIN, Eunsoo KIM, Seungcheol KIM, Bolam KIM
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Publication number: 20140192330Abstract: An illumination device includes: a light emitting element that includes an active layer, a first clad layer and a second clad layer with the active layer interposed therebetween, and a first gain region and a second gain region generating light when a current flows through the active layer; a control unit that operates the light emitting element so that light is alternately generated in the first gain region and the second gain region; and a first lens to which light emitted from a first light emitting portion of the first gain region and light emitted from a second light emitting portion of the second gain region are incident, wherein the light emitted from the first light emitting portion and the light emitted from the second light emitting portion are emitted in the same direction and are incident to the first lens.Type: ApplicationFiled: January 7, 2014Publication date: July 10, 2014Applicant: Seiko Epson CorporationInventor: Yasutaka Imai
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Publication number: 20140192331Abstract: A projector includes a light detector that detects light brightness information on the brightness of light emitted from a light source and an adjuster that corrects the light brightness information detected with the light detector and adjusts the output from the light source based on the corrected light brightness information.Type: ApplicationFiled: December 13, 2013Publication date: July 10, 2014Applicant: SEIKO EPSON CORPORATIONInventor: Takashi TOYOOKA
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Publication number: 20140192332Abstract: A projector (1) which projects a guide image (Pg). A first region above the center of the guide image (Pg) shows a perspective view (D) representing the projector (1) and a supporting device (2) supporting the projector (1). A second region on the upper right of the guide image (Pg), shows six illustrations (G1-G6) affixed with numbers 1 to 6. The six illustrations (G1-G6) respectively correspond to six adjustment items related to a supporting state of the projector (1). The six illustrations (G1-G6) indicate how a projected image changes when the adjustment items are adjusted. The perspective view (D) is an explanatory diagram for clearly showing the positions of adjustment operation units that adjust the six adjustment items of the supporting device (2). In the perspective view (D), the numbers 1 to 6 are affixed near the respective adjustment operation units in balloons.Type: ApplicationFiled: August 2, 2012Publication date: July 10, 2014Applicant: SEIKO EPSON CORPORATIONInventors: Mika Koyama, Tetsu Nakayama, Shingo Yoshida, Hiroto Miyauchi
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Publication number: 20140192333Abstract: A system and method of manufacturing a semiconductor device lithographically and an article of manufacture involving a lithographic double patterning process having a dye added to either the first or second lithographic pattern are provided. The dye is used to detect the location of the first lithographic pattern and to directly align the second lithographic pattern to it. The dye may be fluorescent, luminescent, absorbent, or reflective at a specified wavelength or a given wavelength band. The wavelength may correspond to the wavelength of an alignment beam. The dye allows for detection of the first lithographic pattern even when it is over coated with a radiation sensitive-layer (e.g., resist).Type: ApplicationFiled: March 10, 2014Publication date: July 10, 2014Applicants: ASML Netherlands B.V., ASML Holding N.VInventors: Harry SEWELL, Mircea Dusa, Richard Johannes Franciscus Van Haren, Manfred Gawein Tenner, Maya Angelova Doytcheva
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Publication number: 20140192334Abstract: System and method for applying mask data patterns to substrate in a lithography manufacturing process are disclosed. In one embodiment, the method includes providing a parallel imaging writer system, where the parallel imaging writer system includes a plurality of multiple charged-particle beam (MCB) imaging units arranged in one or more parallel arrays, receiving a mask data pattern to be written to a substrate, processing the mask data pattern to form a plurality of partitioned mask data patterns corresponding to different areas of the substrate, identifying one or more objects in an area of the substrate to be imaged by corresponding MCB imaging units, and performing multiple exposures to image the one or more objects in the area of the substrate by controlling the plurality of MCB imaging units to write the plurality of partitioned mask data patterns in parallel.Type: ApplicationFiled: March 10, 2014Publication date: July 10, 2014Applicant: PineBrook Imaging, Inc.Inventors: Jang Fung CHEN, Thomas Laidig
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Publication number: 20140192335Abstract: An EUV exposure apparatus according to embodiments includes a reticle stage which suctions a rear surface side of an EUV mask to retain the EUV mask. In addition, the EUV exposure apparatus includes a detection unit which detects a position of a measurement mark formed on the rear surface of the EUV mask in the state where the EUV mask is suctioned on the reticle stage. In addition, the EUV exposure apparatus includes a control unit which calculates a distortion amount of the EUV mask based on the position of the measurement mark and performs exposure control on a wafer while correcting the distortion amount.Type: ApplicationFiled: March 13, 2013Publication date: July 10, 2014Applicant: KABUSHIKI KAISHA TOSHIBAInventors: Yoshinori HAGIO, Yosuke OKAMOTO
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Publication number: 20140192336Abstract: System and method for applying mask data patterns to substrate in a lithography manufacturing process are disclosed. In one embodiment, a parallel imaging writer system comprises a plurality of spatial light modulator (SLM) imaging units, and a controller configured to control the plurality of SLM imaging units. Each of the plurality of SLM imaging units includes one or more illumination sources, one or more alignment sources, one or more projection lenses, and a plurality of micro mirrors configured to project light from the one or more illumination sources to the corresponding one or more projection lens. The controller synchronizes movements of the plurality of SLM imaging units with movement of a substrate in writing a mask data to the substrate in a lithography manufacturing process.Type: ApplicationFiled: March 10, 2014Publication date: July 10, 2014Applicant: PineBrook Imaging, Inc.Inventors: Jang Fung CHEN, Thomas LAIDIG
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Publication number: 20140192337Abstract: A lithographic apparatus having a programmable patterning device and a projection system. The programmable patterning device is configured to provide a plurality of radiation beams. The projection system has a lens group array configured to project the plurality of radiation beams onto a substrate. The projection system further includes a focus adjuster in an optical path corresponding to a lens group of the lens group array. The focus adjuster has an optical element having substantially zero optical power.Type: ApplicationFiled: July 24, 2012Publication date: July 10, 2014Applicant: ASML Netherlands B.V.Inventors: Arno Jan Bleeker, Erik Roelof Loopstra, Harmen Klaas Van Der Schoot, Danny Maria Hubertus Philips, Ruud Antonius Catharina Maria Beerens
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Publication number: 20140192338Abstract: Systems, methods, and apparatus are provided for determining overlay of a pattern on a substrate with a mask pattern defined in a resist layer on top of the pattern on the substrate. A first grating is provided under a second grating, each having substantially identical pitch to the other, together forming a composite grating. A first illumination beam is provided under an angle of incidence along a first horizontal direction. The intensity of a diffracted beam from the composite grating is measured. A second illumination beam is provided under the angle of incidence along a second horizontal direction. The second horizontal direction is opposite to the first horizontal direction. The intensity of the diffracted beam from the composite grating is measured. The difference between the diffracted beam from the first illumination beam and the diffracted beam from the second illumination beam, linearly scaled, results in the overlay error.Type: ApplicationFiled: March 10, 2014Publication date: July 10, 2014Applicant: ASML Netherlands B.V.Inventor: Arie Jeffrey DEN BOEF
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Publication number: 20140192339Abstract: A collector for a projection exposure apparatus for microlithography comprises a plurality of reflective sections which are embodied and arranged in such a way that they can be impinged upon during the focusing of radiation from a first focus into a second focus with angles of impingement in a predefined angular spectrum.Type: ApplicationFiled: March 14, 2014Publication date: July 10, 2014Inventors: Ingo Saenger, Joerg Zimmermann, Daniel Kraehmer, Johannes Ruoff, Martin Meier, Frank Schlesener, Christoph Hennerkes, Wolfgang Singer
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Publication number: 20140192340Abstract: A ranging apparatus transmits an optical input signal to an optical signal input/output unit mounted on a measurement target. The optical signal input/output unit receives the optical signal and transmits an optical output signal applied with an optical change, to the ranging apparatus. The ranging apparatus receives the optical output signal, measures a propagation distance from a light source a the light receiving unit through the optical signal input/output unit, and measures a relative position of the optical signal input/output unit based on the propagation distance. Thus, a distributed aperture radar is realized from the ranging apparatus and the optical signal input/output unit.Type: ApplicationFiled: June 3, 2013Publication date: July 10, 2014Inventors: Shingo NISHIKATA, Yuki UCHIYAMA, Hiroyuki DAIGO, Takuya KOYAMA, Hiroki UCHIDA
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Publication number: 20140192341Abstract: Methods for determining the planarity of two components of a semiconductor processing tool, such as a 3D wafer bonder are disclosed. The two components may be fixtures, chucks, or platens of the tool. A test wafer comprising multiple solder balls is compressed and the deformity of multiple solder balls is measured to assess the planarity of the tool. The measurement of the deformed solder balls may be performed manually, or with an automated wafer inspection tool, which may use lasers to measure the height of each solder ball. The planarity of the two components is computed based on the height of the deformed solder balls.Type: ApplicationFiled: January 7, 2013Publication date: July 10, 2014Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATIONInventors: Sarah H. Knickerbocker, Jerry Allen Gorrell, Christopher Lee Tessler
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Publication number: 20140192342Abstract: The invention relates to a method for the spectrophotometric determination of the concentration of multiple substances, preferably bilirubin, haemoglobin and lipids, in a sample of body fluid.Type: ApplicationFiled: July 16, 2012Publication date: July 10, 2014Applicant: SIEMENS HEALTHCARE DIAGNOSTICS PRODUCTS GMBHInventors: Karl Sass, Dirk Greis, Michael Noah, Christian Ueckermann
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Publication number: 20140192343Abstract: An efficient absorption spectroscopy system is provided. The spectroscopy system may be configured to measure solid, liquid or gaseous samples. Vacuum ultra-violet wavelengths may be utilized. Some of the disclosed techniques can be used for detecting the presence of trace concentrations of gaseous species. A preferable gas flow cell is disclosed. Some of the disclosed techniques may be used with a gas chromatography system so as to detect and identify species eluted from the column. Some of the disclosed techniques may be used in conjunction with an electrospray interface and a liquid chromatography system so as to detect and identify gas phase ions of macromolecules produced from solution. Some of the disclosed techniques may be used to characterize chemical reactions. Some of the disclosed techniques may be used in conjunction with an ultra short-path length sample cell to measure liquids.Type: ApplicationFiled: March 11, 2013Publication date: July 10, 2014Applicant: VUV ANALYTICS, INC.Inventor: VUV ANALYTICS, INC.
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Publication number: 20140192344Abstract: A method for determining the absorption of a blank (2) for producing an optical element (3), including: radiating a heating light ray (8) through the blank (2) for the purpose of heating the blank (2), and determining the absorption in the blank (2) by measuring at least one property of a measurement light ray (10) influenced by the heating of the blank (2). In the method, either the heating light ray (8) and the measurement light ray (10) or the heating light ray and a further heating light ray are oriented to enter into the blank (2) through a first polished surface (2a) or a second polished surface (2b), situated opposite the first surface, and meet one another exclusively in the interior of the blank (2), preferably in a volume (12) used for the production of the optical element (3). An associated measuring apparatus (1), optical element (3), and optical arrangement are also disclosed.Type: ApplicationFiled: January 8, 2014Publication date: July 10, 2014Applicant: CARL ZEISS SMT GmbHInventor: Eric EVA
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Publication number: 20140192345Abstract: An eyeglass support is adapted for pinch-holding the eyeglass (5) between three first contact portions (41-43) and three second contact portions (61-63). The first contact portions form a height reference for positioning the eyeglass whereas the second contact portions ensure application of the eyeglass against the first contact portions while conforming to any possible shape for the eyeglass. The support suits for being incorporated in a reflection measurement apparatus. In particular, it is useful for measuring reflection of eyeglasses provided with antireflecting coatings or for rating a protection against UV hazards which is provided by an eyeglass to a wearer of the eyeglass.Type: ApplicationFiled: March 14, 2014Publication date: July 10, 2014Applicant: ESSILOR INTERNATIONAL COMPAGNIE GENERAL D'OPTIQUEInventors: Olivier POPHILLAT, Stephane GUEU
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Publication number: 20140192346Abstract: An apparatus and method are provided for characterizing a replica tape which has been embossed, compressed or cast on a surface of a material to be measured to replicate that surface. The replica tape is secured between first and second holding components such that a compressible surface of the replica tape is secured against the first holding component. A light source transmits light through the second holding component, the replica tape and the first holding component. An image sensor measures intensity of the light respectively transmitted through at least two measurement points of the compressible surface of the replica tape. A processing unit converts the measured light intensity transmitted through the at least two measurement points into at least two data values each respectively relating to a measurement statistic of the replica tape at a corresponding one of the at least two measurement points, respectively.Type: ApplicationFiled: January 9, 2014Publication date: July 10, 2014Applicant: DEFELSKO CORPORATIONInventors: Leon VANDERVALK, ROBERT V. STACHNIK, JAMES EDWARD DAVIS
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Publication number: 20140192347Abstract: Systems and methods for measuring the isotope ratio of one or more trace gases and/or components of gas mixtures such as different gas species present in a gas mixture. The system includes a resonant optical cavity having two or more mirrors and containing a gas, the cavity having a free spectral range that equals the difference between frequencies of two measured absorption lines of different gas species in the gas, or of two different isotopes, divided onto an integer number. The system also includes a continuous-wave tunable laser optically coupled with the resonant optical cavity, and a detector system for measuring an absorption of laser light by the gas in the cavity. The detector system includes one of a photo-detector configured to measure an intensity of the intra-cavity light or both a photo-acoustic sensor configured to measure photo-acoustic waves generated in the cavity and a photo-detector configured to measure an intensity of the intra-cavity light.Type: ApplicationFiled: January 16, 2014Publication date: July 10, 2014Applicant: LI-COR, Inc.Inventors: Serguei Koulikov, Alexander Kachanov
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Publication number: 20140192349Abstract: A film thickness measurement apparatus includes: an ECT sensor for measuring a film thickness of a thermal barrier coating formed on a turbine blade; a storage unit for storing a measurement point on the turbine blade which is a point where the film thickness of the thermal barrier coating is measured; a laser displacement meter for measuring a shape of the turbine blade; a measurement position calculation unit for calculating an actual measurement point suitable for actual film thickness measurement using the ECT sensor, based on the shape of the turbine blade measured by the laser displacement meter and the measurement point on the turbine blade stored in the storage unit; and an arm drive unit for driving the ECT sensor to adjust a measurement position of the ECT sensor based on the actual measurement point calculated by the measurement position calculation unit.Type: ApplicationFiled: August 21, 2012Publication date: July 10, 2014Applicant: MITSUBISHI HEAVY INDUSTRIES, LTD.Inventors: Masaaki Kurokawa, Jun Yasui, Keiichi Kenmotsu, Shigetoshi Shiotani
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Publication number: 20140192350Abstract: A flow cell for differential refractive index detection. The flow cell includes a transparent body that extends from a first end to a second end along a longitudinal axis. The transparent body defines a sample prism chamber and reference prism chamber. The sample prism chamber is configured to allow fluid flow between the first and second ends of the transparent body along the longitudinal axis. The reference prism chamber is configured to receive a reference fluid. The sample and reference prism chambers each include a grating comprising a plurality of grooves extending along the longitudinal axis in the direction of fluid flow.Type: ApplicationFiled: August 16, 2012Publication date: July 10, 2014Applicant: WATERS TECHNOLOGIES CORPORATIONInventor: Anthony C. Jeannotte
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Publication number: 20140192351Abstract: Disclosed is an inspecting equipment for inspecting a light emission characteristic of a display screen includes: a carrying device provided for carrying the display screen, a cover device and a data analyzing device. The cover device has a detecting surface provided with a plurality of luminance detectors, and covers an emitting surface of the display screen to form a darkroom between the cover device and the detecting surface. A plurality of corresponding luminance information is generated by the luminance detectors provided for detecting a plurality of measuring zones of the emitting surface. The data analyzing device receives the luminance information and analyzes the light emission characteristic of the display screen according to the luminance information. And, it is thus able to rapidly inspect the light emission characteristic of the display screen during manufacture process, and is easy to be applied to a present producing line.Type: ApplicationFiled: March 21, 2013Publication date: July 10, 2014Inventor: Yu-Chiang LIN
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Publication number: 20140192352Abstract: This optical inspection device has: a line sensor on which channels are arranged; a moving means for moving a wafer mounted on a stage relative to the line sensor; a stage position detection means for detecting the on-stage positions of pseudo-defects in images formed on the channels as pseudo-defect stage coordinates, said coordinate management wafer being a wafer on which one pseudo-defect die is formed per row and column of a matrix of dies and each pseudo-defect die has a plurality of pseudo-defects formed in a line in the columnar direction; a coordinate transformation means for transforming the pseudo-defect stage coordinates into pseudo-defect die coordinates; a difference computation means for computing the differences of the pseudo-defect die coordinates from design coordinates; and a characteristic pattern acquisition means for obtaining a coordinate error characteristic pattern in which the differences from the pseudo-defect stage coordinates increase or decrease along a straight line.Type: ApplicationFiled: June 22, 2012Publication date: July 10, 2014Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATIONInventors: Yoshio Bamba, Yukihisa Mohara, Kowa Tabei
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Publication number: 20140192353Abstract: An inspection method and apparatus for detecting defects or haze of a sample, includes illuminating light to the sample from an oblique direction relative to a surface of the sample with an illuminator, detecting first scattered light at a forward position relative to an illuminating direction from the sample with a first detector, detecting second scattered light at a sideward or backward position relative to the illuminating direction from the sample with a second detection, and processing a first signal of the first scattered light and a second signal of the second scattered light with different weighting for the first signal and for the second signal with a processor.Type: ApplicationFiled: March 11, 2014Publication date: July 10, 2014Applicant: Hitachi High-Technologies CorporationInventors: Yoshimasa OSHIMA, Yuta URANO, Toshiyuki NAKAO
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Publication number: 20140192354Abstract: A spectroscope comprises a package provided with a light entrance part, a plurality of lead pins penetrating through a support part opposing the light entrance part in the package, and a spectroscopic module supported on the support part within the package. The spectroscopic module has a light detection unit provided with a light transmission part for transmitting therethrough light incident thereon from the light entrance part and a spectroscopic unit, secured to the light detection unit so as to be arranged on the support part side of the light detection unit, including a spectroscopic part for spectrally resolving the light transmitted through the light transmission part while reflecting the light to a light detection part. The lead pins are fitted into fitting parts provided with the light detection unit and electrically connected to the light detection part.Type: ApplicationFiled: May 28, 2012Publication date: July 10, 2014Applicant: HAMAMATSU PHOTONICS K.K.Inventors: Takafumi Yokino, Katsumi Shibayama, Masaki Hirose, Katsuhiko Kato
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Publication number: 20140192355Abstract: A method of microscopy and an illumination optical device with a hollow cone for a microscope, the illumination device includes a first conical lens (1) able to receive a collimated incident light beam (10) and form a conical light beam (20), a second conical lens (5) arranged in such a way as to receive the conical light beam (20, 40) and to form a cylindrical light beam with a black background (50) and an optical lens (6) having an image focal plane (12) arranged in such a way as to receive the cylindrical light beam with a black background (50), to form a hollow cone light beam (60) and to focus the hollow cone light beam (60) into a point (18) in the image focal plane (12).Type: ApplicationFiled: July 20, 2012Publication date: July 10, 2014Inventors: Emmanuel Froigneux, Joachim Schreiber
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Publication number: 20140192356Abstract: A method for detecting atmospheric icing potential comprises emitting, by a lidar (light detection and ranging) entity (108a, 108b) such as a Doppler lidar entity, electromagnetic radiation to the atmosphere and receiving radiation backscattered from the aerosol, such as a cloud, present in the atmosphere (304), determining an indication of signal intensity, such as the CNR (carrier-to-noise ratio), on the basis of the received backscattered signal relative to one or more distances such as heights from a predetermined basic level such as the location of the lidar (306), comparing the indication of signal intensity with at least one predetermined reference in order to obtain an indication of the likelihood of cloud (110) presence at said one or more distances (308), and determining an indication of the icing potential at said number of distances on the basis of the comparison and an indication of the temperature at said one or more distances (310). An arrangement for executing the method is presented.Type: ApplicationFiled: June 15, 2012Publication date: July 10, 2014Applicant: TEKNOLOGIAN TUTKIMUSKESKUS VTTInventors: Petteri Antikainen, Andrea Vignaroli, Esa Peltola
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Publication number: 20140192357Abstract: A spectroscopic measurement device includes a variable wavelength interference filter, an imaging section (an imaging element and a light intensity acquisition section) adapted to image the light dispersed by the variable wavelength interference filter to obtain a spectral image, and a data output section (a storage section and a communication section) adapted to output profile-generating data used to generate a profile of an image display device, and the data output section outputs measurement data which includes a light intensity in each pixel of each of the spectral images and a coordinate value of the pixel associated with each other, as profile-generating data in a case in which the imaging section obtains the spectral images with respect to a color pattern including a plurality of differently colored color patches output from the image display device.Type: ApplicationFiled: January 7, 2014Publication date: July 10, 2014Applicant: Seiko Epson CorporationInventor: Akira SANO
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Publication number: 20140192358Abstract: The present disclosure relates to a color measurement apparatus (100) for measuring a color on a printed item (9). The color measurement apparatus (100) comprises a first body (1), a second body (2) including a sensor (26) for measuring color data of a printed item (9), and a guiding rail (3). The second body (2) is movable relative to the first body (1) along a measurement direction (210) and the guiding rail (3) guides the movement of the second body (2) relative to the first body (1). The guiding rail (3) is positioned between the first body (1) and the second body (2). The second body (2) is slidingly mounted on the guiding rail (3) and can slide along the guiding rail (3) in a first sliding direction (210); the guiding rail (3) is slidingly mounted on the first body (1) and can slide along the first body (1) in a second sliding direction (310) parallel to the first sliding direction (210).Type: ApplicationFiled: August 31, 2011Publication date: July 10, 2014Inventors: Markus Barbieri, Stefan Barbieri
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Publication number: 20140192359Abstract: A filter arrangement can transmit and/or reflect light emanating from a moving object so that the emanating light has time variation, and the time variation can include information about the object, such as its type. For example, emanating light from segments of a path can be transmitted/reflected through positions of a filter assembly, and the transmission functions of the positions can be sufficiently different that time variation occurs in the emanating light between segments. Or emanating light from a segment can be transmitted/reflected through a filter component in which simpler transmission functions are superimposed, so that time variation occurs in the emanating light in accordance with superposition of two simpler non-uniform transmission functions. Many filter arrangements could be used, e.g. the filter component could include the filter assembly, which can have one of the simpler non-uniform transmission functions.Type: ApplicationFiled: January 14, 2014Publication date: July 10, 2014Inventors: Joerg Martini, Peter Kiesel, Malte Huck, Marshall W. Bern, Noble M. Johnson, Michael Bassler, Markus Beck
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Publication number: 20140192360Abstract: Systems and methods for measuring a light intensity. An example photodetector measurement circuit comprises a photodetector that receives a light and generates a photodetector current indicative of the light intensity. The measurement circuit includes a first integrator coupled along a first signal path to the photodetector to generate a first voltage signal at a first integrator output indicative of an integral of the photodetector current level. A second integrator is configured to generate a second voltage signal at a second integrator output indicative of an integral of the photodetector current level. A differential amplifier receives the first voltage signal and the second voltage signal and generates a third output signal at a differential amplifier output indicative of a difference between the first voltage signal and the second voltage signal. The differential amplifier outputs the third voltage signal to an analog-to-digital conversion function (“ADC function”) input.Type: ApplicationFiled: January 9, 2013Publication date: July 10, 2014Applicant: Molecular Devices, LLCInventors: Josef J. Atzler, Bernhard Schinwald
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Publication number: 20140192361Abstract: A recording medium determining device includes a light irradiating portion that irradiates a recording medium with visible light; a regular reflection light receiving portion that receives regular reflection light regularly reflected by the recording medium irradiated with light from the light irradiating portion; a diffused reflection light receiving portion that receives diffused reflection light diffusely reflected by the recording medium irradiated with light from the light irradiating portion; and a determining portion that determines the type of recording medium on the basis of each light amount of two or more visible light components with different wavelengths to one another among the light components received by the regular reflection light receiving portion and each light amount of two or more visible light components with different wavelengths to one another among the light components received by the diffused reflection light receiving portion.Type: ApplicationFiled: January 6, 2014Publication date: July 10, 2014Inventors: Tsunenobu ENDO, Yuto TOGAWA, Shogo KUROSAWA
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Publication number: 20140192362Abstract: An optical measurement apparatus includes: a recording unit that records therein a value of a ratio of a first detection intensity to a second detection intensity, the first detection intensity being an intensity of the returned light detected when a first medium having a refractive index that is the same as that of a specimen is irradiated with illumination light by a measurement probe, and the second detection intensity being an intensity of the returned light detected when a second medium is irradiated with the illumination light by the measurement probe; and a calculation unit that calculates, from a product of a third detection intensity and the value of the ratio, a background intensity of background light to be used in correcting the returned light from the specimen, the third detection intensity being an intensity of the returned light detected when the second medium is irradiated with the illumination light.Type: ApplicationFiled: March 12, 2014Publication date: July 10, 2014Applicant: OLYMPUS CORPORATIONInventors: Hideyuki TAKAOKA, Ryosuke ITO
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Publication number: 20140192363Abstract: A spectroscopy assembly having a first and a second optical ring resonator, each provided with a material having an intensity-dependent refraction index. The spectroscopy assembly further includes at least one waveguide, which is guided along the optical ring resonator at a distance such that the light of a continuous wave laser guided in the waveguide can be coupled into the optical ring resonator, and a frequency comb generated from the light of the continuous wave laser in the optical ring resonator can be coupled out of the waveguide. The optical ring resonators and the at least one waveguide are provided on a common substrate.Type: ApplicationFiled: April 27, 2012Publication date: July 10, 2014Inventors: Tobias Kippenberg, Ronald Holzwarth
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Publication number: 20140192364Abstract: An ellipsometry system and a detection unit thereof are capable of achieving miniaturization and price reduction associated therewith. The ellipsometry system includes the detection unit that: has an optical polarization element; separates an interference polarization beam obtained by causing the object-reflected polarization beam and reference reflected polarization beam to interfere with each other into a plurality of interference polarization beams on a wavelength basis; and detects the respective separated polarization components in each wavelength.Type: ApplicationFiled: July 9, 2012Publication date: July 10, 2014Applicant: UTSUNOMIYA UNIVERSITYInventors: Toyohiko Yatagai, Cense J. Abraham
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Publication number: 20140192365Abstract: A spatial splitting-based optical Micro Electro-Mechanical Systems (MEMS) Interferometer includes a spatial splitter for spatially splitting an input beam into two interferometer beams and a spatial combiner for spatially combining the two interferometer beams. A MEMS moveable mirror is provided to produce an optical path difference between the first interferometer beam and the second interferometer beam.Type: ApplicationFiled: February 4, 2013Publication date: July 10, 2014Applicant: SI-WARE SYSTEMSInventors: Bassem Mortada, Diaa Abdel Maged Khalil, Bassam A. Saadany
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Publication number: 20140192366Abstract: There is provided an exposure condition determining method for determining an exposure condition for an exposure-objective substrate having a plurality of semiconductor pattern features formed by predetermined exposure on a surface thereon, the method including, irradiating an illumination light onto a surface of a substrate, which has the pattern features, detecting a diffracted light from the plurality of semiconductor pattern features of the substrate irradiated with the illumination light, and determining the exposure condition based on a variation in brightness of the detected diffracted light.Type: ApplicationFiled: January 16, 2014Publication date: July 10, 2014Inventor: Hiroaki OKAMOTO
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Publication number: 20140192367Abstract: A laser detection and warning system and associated methods of warning a pilot of an aircraft of incoming laser radiation and determining a location of a source of laser radiation including a detector configured to be mounted to an aircraft, the detector having an optical subsystem, a detector subsystem, and a processor subsystem to determine characteristics of incoming laser radiation and transmit a laser warning output signal, wherein the laser warning output signal may include wavelength characteristics of the laser radiation, corresponding protective eyewear type, and location of the source of the laser radiation.Type: ApplicationFiled: January 7, 2013Publication date: July 10, 2014Applicant: The Boeing CompanyInventor: The Boeing Company
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Publication number: 20140192368Abstract: A recording medium determination apparatus includes a light radiation unit which radiates light toward a recording medium; a light receiving unit which receives diffuse reflection light, which is light radiated from the light radiation unit and diffuse reflected by the recording medium; a reflection portion which can reflect transmitted light, which is radiated from the light radiation unit and transmitted through the recording medium, to cause the transmitted light to be incident to the recording medium again; a switching unit which switches a reflectance state such that a reflectance of the reflection portion changes; and a determination unit which determines a thickness of the recording medium on a basis of a value of a ratio between light amounts of a plurality of the diffuse reflection lights which are reflected by the reflection portion in different reflectance states and are received by the light receiving unit.Type: ApplicationFiled: January 7, 2014Publication date: July 10, 2014Applicant: SEIKO EPSON CORPORATIONInventor: Tsunenobu ENDO
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Publication number: 20140192369Abstract: An automatic printing adjustment method for a page-width array printing device is provided. The page-width array printing device includes a printing module, a scanning module and a print region. Firstly, the printing module prints a print medium placed on the print region to obtain a printed image, and the scanning module scans the printed image of the print medium. Then, the printed image is transmitted from the scanning module to a processor. Then, a noise eliminating operation, a tilt calibration operation, a ROI selecting operation, a horizontal detection operation and a vertical detection operation are performed on the printed image. Afterwards, a calibrating result is feedback from the processor to the printing module. The printing conditions of nozzles of the respective inkjet head structures are adjusted according to the calibrating result.Type: ApplicationFiled: December 27, 2013Publication date: July 10, 2014Applicant: MICROJET TECHNOLOGY CO., LTDInventors: Kwo-Yuan Shi, Ching-Sung Lin, Wei-Lun Ma, Hsueh-Kuan Shih
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Publication number: 20140192370Abstract: Disclosed is an image deformation processing device including: a shift amount calculating unit configured to calculate the difference between the coordinate of the input image which is mapped to the position of the specified pixel by the deformation process and the coordinate of the specified pixel as a shift amount, for each specified pixel in the output image; and an output unit configured to obtain the threshold corresponding to the coordinate of the specified pixel in the second direction from the dispersion threshold table, to calculate a pixel shift amount by comparing the obtained threshold with a decimal component of the shift amount for the specified pixel and by rounding the decimal component of the shift amount, and to output the pixel in the input image, which has a coordinate shifted from the coordinate of the specified pixel by the pixel shift amount, as the specified pixel.Type: ApplicationFiled: January 6, 2014Publication date: July 10, 2014Applicant: KONICA MINOLTA, INC.Inventor: Yuhei KURIGATA
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Publication number: 20140192371Abstract: Color conversion conditions corresponding to medium types belonging to the same group as a selected representative type are collectively updated based on calibration results. It is judged whether or not there is a fluctuating factor concerning color reproduction characteristics between a print medium that is used at present in the calibration and a print medium that was used in the past. If a fluctuating factor is determined to exist, then only the color converting condition corresponding to the representative type is updated.Type: ApplicationFiled: January 8, 2014Publication date: July 10, 2014Applicant: FUJIFILM CorporationInventor: Eiji TERAUE
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Publication number: 20140192372Abstract: An image processing method and an image forming apparatus using the same. The method of processing includes dividing an image into a predetermined number of blocks, calculating an average of color signals of pixels existing in each of the blocks divided, classifying the blocks into color blocks and monochrome blocks using the calculated average, and determining whether the image is a color image or a monochrome image using a proportion of the color blocks. Accordingly, for a document wherein color and monochrome images are mixed, it is automatically determined whether an image is a color image or a monochrome image.Type: ApplicationFiled: March 13, 2014Publication date: July 10, 2014Applicant: Samsung Electronics Co., LtdInventor: Ki-min KANG
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Publication number: 20140192373Abstract: A method includes the step of printing a calibration target with a printing device, the printing device including a plurality of groups of printheads, the printheads of the same group being fed with ink of the same colour, the calibration target including a plurality of coloured zones that are intended to be subsequently processed, the method further including the steps of: generating a series of control zones printed by the printheads of a group with the same nominal quantity of the corresponding ink, the control zones being free of overlapping between inks applied by different printheads; measuring a parameter of each control zone; comparing the measured values of said parameter for evaluating whether the control zones exhibit print anomalies.Type: ApplicationFiled: September 14, 2012Publication date: July 10, 2014Inventor: Antonio Maccari