Abstract: A transverse volume magnetic resonance (MR) coil includes a cylindrical geometry of electrical conductors configured for generating a B1 field comprising nth mode spatial harmonics along a first transverse axis in a transverse plane orthogonal to a central axis of the coil, while being uniform along a second transverse axis orthogonal to the first transverse axis in the transverse plane, where n is an integer ranging from 1 or greater. The coil may be included with other coils in an array coil. The coil may be utilized to detect geometric echoes resulting from excitation of an MR sample.

Abstract: A method for iteratively calibrating a reconstruction kernel for use in accelerated magnetic resonance imaging (MRI) is provided. An MRI system is used to acquire k-space data from multiple slice locations following the application of a multiband radio frequency (RF) excitation pulse. An initial reconstruction kernel is generated from the acquired k-space data, and this initial reconstruction kernel is used to produce an initial image for each of the multiple slice locations by applying the initial reconstruction kernel to the acquired k-space data. The average phase of each slice location is then calculated from these images, and used to shift the phase values of the subsequently acquired k-space data. From the phase-shifted k-space data, an updated reconstruction kernel is then generated. This process is repeated iteratively until a stopping criterion is satisfied.

Abstract: In magnetic resonance imaging using a measurement sequence of the “free precession of transverse magnetization in the steady state”-type i.e., an SSFP measurement sequence, during the SSFP measurement sequence, the implementation of a preparation sequence takes place to reduce a signal contribution of the transverse magnetization in an outer region surrounding a measurement region in the MR imaging. The implementation of the preparation sequence includes the radiation of a multidimensional, spatially selective RF pulse that acts in a spatially selective manner on the transverse magnetization in the outer region. Saturation of the transverse magnetization and/or dephasing of the transverse magnetization in the outer region can be achieved by the multidimensional, spatially selective RF pulse.

Abstract: A method for generating a magnetic resonance image includes configuring a magnetic field to correspond to a trajectory within a region of interest. The method includes applying RF excitation to spatially control a region of magnetic resonance corresponding to the trajectory. The method includes modulating the magnetic field coincident with the spatially controlled region of magnetic resonance. The method includes acquiring data corresponding to the region of magnetic resonance and generating an image based on the data.

Abstract: The present disclosure provides various methods and systems for performing magnetic resonance studies. In accordance with many embodiments, image or other information of interest is derived from super radiant pulses.

Abstract: A subject support (22) of a magnetic resonance (MR) system (10) includes a table top (20) supported by a support structure (24) and configured to move in and out of an examination volume (14). The subject support (22) further includes a coil connector (34) connected with a local receive coil (32). The coil connector (34) moves between an engaged position in which the coil connector (34) and the local receive coil (32) engage and move with the table top (20) in and out of the examination volume (14) and a disengaged position in which the coil connector (34) and the local receive coil (32) remain stationary out of the examination volume (14) as the table top (20) moves in and out of the examination volume (14).

Abstract: A magnetic resonance imaging apparatus includes a magnetic assembly including a main magnet and a gradient coil unit and forming a static magnetic field and a gradient magnetic field in the bore thereof, and a gradient controller applying a test gradient waveform to the magnetic assembly, and compensating for a distortion of the magnetic field gradients, caused by eddy currents, by reflecting the actual shape of the applied test gradient waveform.

Abstract: In some aspects, a resonator device for spin resonance applications is described. In some examples, the resonator device includes a substrate, terminals, and resonators. The terminals include a first terminal having first terminal segments disposed on a substrate surface, and a second terminal having second terminal segments disposed on the substrate surface opposite the first terminal segments. The resonators include conductors disposed on the substrate surface between the first and second terminals. Each conductor is disposed between one of the first terminal segments and a respective, opposite one of the second terminal segments.

Abstract: A magnetic resonance imaging (MRI) system includes a main magnet configured to generate a static magnetic field, a gradient coil configured to generate a gradient magnetic field, and a radio frequency (RF) coil including a plurality of RF coils corresponding to volumes representing target regions of a subject.

Abstract: According to one embodiment, an MRI apparatus (20) includes a first RF coil device (700), a radio communication unit (640) and an image reconstruction unit (56). The first RF coil device is wirelessly connected to a second RF coil device (800), and receives a nuclear magnetic resonance signal wirelessly transmitted from the second RF coil device. The first RF coil device wirelessly transmits the nuclear magnetic resonance signal detect by the first RF coil device and the nuclear magnetic resonance signal obtained from the second RF coil device to the radio communication unit, via an induced electric field. The radio communication unit receives the nuclear magnetic resonance signals wirelessly transmitted from the first RF coil device via an induced electric field. The image reconstruction unit reconstructs image data on the basis of the nuclear magnetic resonance signals received by the radio communication unit.

Abstract: According to one embodiment, an MRI apparatus (10) includes a power transmitting unit (49, WB1, PT1 and PT2), a signal receiving unit (104, C3, EC1 to EC4, DP1 to DP4, 140 and 160) and an image reconstruction unit (62). The power transmitting unit wirelessly transmits electric power to an RF coil device (100 or 100?) by magnetically coupled resonant type wireless power transfer. The signal receiving unit wirelessly receives a digitized nuclear magnetic resonance signal wirelessly transmitted from the RF coil device (100 or 100?). The image reconstruction unit (62) obtains a nuclear magnetic resonance signal received by the signal receiving unit, and reconstruct image data of an object (P) on the basis of the nuclear magnetic resonance signal.

Abstract: A metal detector system 30 for sensing target (e.g., metal) objects within soil or other strata includes a pickup head 36 carrying an excitation coil configured to generate an excitation signal to energize a target object 400 and uses a 2-D (e.g., planar, rectangular) array of pixel-receive coils configured within the pickup head to receive electro-magnetic energy from the energized target object. As the user moves the pickup head across the strata's surface, the pixel-receive coils sense relative motion between each pixel-receive coil and the energized target object, where motion is detectable as individually sensed changes in received signal levels among the pixel-receive coils. The metal detector system also includes a 2-D display 46 which depicts or visually represents the 2-D array of pixel-receive coils and generates a changing display of any sensed moving target object 60 in response to sensed changes in received signal levels among the pixel-receive coils.

Abstract: A system for spectral induced polarization measurement of a formation is provided. The system provides an intelligent module to be utilized in performing spectral induced polarization (SIP) measurements for geophysical studies or otherwise. The system includes a instrument that includes a housing configured to be inserted into a surface opening. The housing houses a signal generator that generates an excitation signal. A drive electrode directs the excitation signal into the material adjacent the housing. A plurality of electrodes sense the voltage and/or current in the material adjacent the housing and a processor processes the sensed voltage and/or current to measure a property of the material. The system also provides a configuration in which a plurality of instruments configured for spectral induced polarization measurements are interconnected to provide communication, synchronization, a common reference signal or power.

Abstract: A method for mapping geological structures of a formation on a side of a surface, includes: generating a magnetic moment using at least one magnetic moment generator to build up a magnetic field in the formation in an on-period, wherein the magnetic moment has a moment strength, and wherein the magnetic moment is positioned on another side of the surface; changing the magnetic moment to change the magnetic field; and making at least one record in a recording device at a recording time trecord in an off-period, wherein the record includes at least a representation of the change in the magnetic field and/or a representation of the magnetic field obtained by a B/E-measuring unit; wherein the on-period is separated from the off-period by the act of changing the magnetic moment.

Abstract: The present invention provides an LED lighting device and a method for verifying the device's lifespan. The LED lighting device includes multiple LED light sources, a controller configured to keep time for the LED lighting device's lifespan; a low voltage DC power source configured to supply power; a light intensity sensor configured to capture illuminance data; and a display terminal configured to display received data. Further, the controller records time keeping data based on the illuminance data captured by the light intensity sensor and sends the time keeping data to be displayed on the display terminal.

Abstract: A method of estimating a state of charge (SOC) of a battery and a battery management system (BMS) using the method. According to the method of estimating the SOC of the battery, terminal voltage data is collected by periodically measuring a terminal voltage of the battery. Voltage data of a low frequency component is extracted by performing discrete wavelet transform (DWT) based multi-resolution analysis on the terminal voltage data. The SOC of the battery is estimated based on the voltage data of the low frequency component.

Abstract: Disclosed is a method for estimating the maximum power of a battery, which can inexpensively perform an estimation of the maximum power of a battery in a relatively simple manner of using the internal resistance of the battery, which has a correlation with and a largest effect on the maximum power of the battery. The method includes the steps of: measuring an internal resistance and a temperature of the battery and estimating a state of charge, if an estimation of the maximum power of the battery is requested; and reading a value of the maximum power of the battery, which corresponds to the measured temperature, the estimated state of charge, and the measured internal resistance, from a table in which the internal resistances and the maximum powers of the battery are mapped according to the temperatures and states of charge.

Abstract: This device and method use the complex impedance of a rechargeable battery to detect the state of the rechargeable battery. A computer determines the slope of the complex impedance at least two different frequencies in a diffusion region of the rechargeable battery when a straight-line approximation has been made, and compares the slope with a threshold value. If the slope is greater than or equal to the threshold value, the computer determines that the battery has a normal capacity balance, and if the slope is less than the threshold value, the computer determines that the battery has an abnormal unbalanced capacity. Furthermore, if the magnitude of an imaginary axis component of the complex impedance in the diffusion region of the rechargeable battery is greater than the threshold battery, the computer determines that the battery has an abnormal capacity balance, and if said magnitude is less than or equal to the threshold value, the computer determines that the battery has a normal capacity balance.

Abstract: A capacitor has modules each consisting of a plurality of capacitor cells stacked together, and a radiator including heat exchange portions connected to a vehicle body at the ground potential is disposed adjacent to the modules. If an electric leakage occurs to any of the capacitor cells, a leakage detection voltage as a potential difference between the potential of the cell under the leakage and the ground potential is correlated with a module voltage, to provide a constant ratio, from which it is determined that the capacitor is in an abnormal condition.

Abstract: An arc fault circuit interrupter is disclosed. This arc fault circuit interrupter can include any one or more of three different sensors such as a high frequency sensor, and any one of lower frequency sensors such as a current sensor or a differential sensor. The arc fault circuit interrupter can be configured as an in line arc fault circuit interrupter installed in a wall box. In addition, the arc fault circuit interrupter can include a processor configured to determine any one of a series arc fault, or a parallel arc fault.

Abstract: Techniques for detecting mating and un-mating of a first connector with a second connector include providing a pulsed voltage signal at a contact of the second connector and measuring a rate of rise of voltage at the contact. If the measured voltage at the contact exceeds a threshold voltage during the time the pulsed voltage signal is applied, then it is concluded that the first connector is not present and not mated with the second connector. If the measured voltage is lower than or equal to the threshold voltage during the time of application of the voltage pulse, it is concluded that the first connector is present and mated with the second connector.

Abstract: The present invention relates to a wiring connection check method in a wiring structure in which terminal devices are connected with a cable via relay devices and the cable is connected to the terminal devices and the relay devices via connectors. Connection information indicating a connecting relation between the connectors and the cable and a connecting relation between the connectors and any of the terminal devices and the relay devices is stored in a connection table database. In the connection check method of the present invention, a target connector to be checked is designated from among the connectors, and a connection route from the target connector to a connection end thereof is identified by sequentially tracing the connection information.

Abstract: A load-testing circuit is used for simulating maximum standard load currents for different types of USB ports. The load-testing circuit includes a first electronic switch, a second electronic switch, and a current selection module including a plurality of current branch circuits. When one of the current branch circuits is activated, a voltage at a third terminal of the first electronic switch is supplied to a first terminal of the second electronic switch through the activated current branch circuit to turn on the second electronic switch. A current of the third terminal of the first electronic switch is approximately equal to a current of the activated current branch circuit.

Abstract: The present invention relates to a noise sensor for an alternating or direct current power supply. The sensor comprises a noise sensing unit and a noise separator. The noise separator is configured to receive first, second and third input signals and provide a first output signal representative of the common mode noise and a second output signal representative of the differential mode noise. The noise sensing unit comprises a first capacitive element, a second capacitive element, a first resistive element and a second resistive element.

Abstract: A first isolator, which is disposed in a direction where a signal is transmitted only to an antenna direction, is connected directly to a connector portion of an antenna on an oscillation side without a cable, and a second isolator 15b, which is disposed in a direction where a signal is transmitted only to a receiver direction, is connected directly to the connector portion of the antenna on a receiver side without a cable. A data processing apparatus includes a peak level detector, a resonant frequency detector, and an arithmetic part for calculating a moisture content amount and a coating amount of a coating layer of a sample based on the detection values detected by these detectors.

Abstract: Embodiments of the present invention relate to apparatus and method for detecting a card connection status. An apparatus for detecting a card connection status is disclosed. The apparatus comprises a switch component operable to change an electric connection status with a contact terminal of a card connector responsive to a change of a connection status between a card and the card connector; a detection circuit operable to generate a detection signal indicating the electric connection status between the switch member and the contact terminal; and a controller operable to determine the connection status between the card and the card connector based on the detection signal from the detection circuit. The corresponding method, detection circuit, and card connector are also disclosed.

Abstract: The invention relates to a method for determining the piston position of a hydraulic or pneumatic piston cylinder unit, wherein the cylinder jacket and the piston form an electrical conducting path and the piston position is determined with the aid of the inductive and/or resistive properties of the conducting path that is formed. In addition, the invention relates to a piston cylinder unit having a measuring device for carrying out such a method.

Abstract: A touch screen sensor includes a visible light transparent substrate and an electrically conductive micropattern disposed on or in the visible light transparent substrate. The micropattern includes a first region micropattern within a touch sensing area and a second region micropattern. The first region micropattern has a first sheet resistance value in a first direction, is visible light transparent, and has at least 90% open area. The second region micropattern has a second sheet resistance value in the first direction. The first sheet resistance value is different from the second sheet resistance value.

Abstract: Disclosed is a plastic film and a touch module produced therefrom. The module is constructed from two conductive layers with an insulation layer in between, as are used in capacitive touch pads and/or touch screens, for example. The problem of connecting the respective x or y sensors across two planes in a cost-effective manner employs foldable sensor planes in the plastic film suitable for mass production. The connections and conductor tracks are concentrated on one plane on a sensor side wherein the sensor planes are arranged on flexible materials. The registering of the two planes relative to each other is simplified via a secure mechanical connection of the two planes via a fold in the film.

Abstract: An electrode configuration for a capacitive sensor device of a hand-held device for the touch detection of a user has at least one transmitting electrode, at least one receiving electrode and at least one first field measuring electrode. The electrode configuration enables a detection of the position of the hand-held device relative to the body of a user. A method for the detection of a touch of a hand-held device by a user can also be provided, wherein the method is adjusted to detect the position of the hand-held device relative to the body of a user.

Abstract: A gas sensing device that includes differential temperature compensation.

Abstract: Electrically conductive structures produced on or in a substrate, or produced such that the structures are floating in a substrate undergo simple and reliable capacitive contactless and non-destructive inspection using a capacitive sensor having at least two sensor electrode surfaces which are arranged at different constant distances from one another parallel to a surface of the substrate and are arranged beside one another relative to the surface of the substrate.

Abstract: An apparatus including a flexible substrate; a component supported by the flexible substrate; a first input electrode, supported by the flexible substrate and configured to form a first capacitor with a second input electrode and to provide an input to the component; and a first output electrode, supported by the flexible substrate and configured to form a second capacitor with a second output electrode and to provide an output from the component.

Abstract: A non-resistive contact sensor assembly includes an electric field sensor device, including a dielectric component for receiving an electrical signal from an object of interest and a signal processing component for processing the electrical signal, a voltage regulator for controlling voltage to the dielectric component and the signal processing component, and a common ground reference for the dielectric component and the signal processing component.

Abstract: A non-resistive contact sensor assembly includes an electric field sensor device, including a dielectric component for receiving an electrical signal from an object of interest and a signal processing component for processing the electrical signal, a voltage regulator for controlling voltage to the dielectric component and the signal processing component, and a common ground reference for the dielectric component and the signal processing component.

Abstract: In order to measure a state of degradation of a semiconductor integrated circuit more correctly by use of a simple configuration, a degradation diagnosing circuit includes: a test block including a first circuit which is an object of a degradation diagnosis; a reference block including a second circuit which has a configuration identical with a configuration of the first circuit; a judgment unit that judges whether a component of the test block is degraded or not by comparing a characteristic of a first signal outputted from the test block, and a characteristic of a second signal outputted from the reference block, in the case in which a signal indicating a measurement mode is inputted; and a control unit that outputs the signal which indicates the measurement mode to the judgment unit.

Abstract: Methods and structures for testing a microelectronic packaging structure/device are described. Those methods may include placing a device in a floating carrier, wherein the floating carrier is coupled to a socket housing by pin dowels disposed in four corners of the socket housing, and wherein at least two actuating motors are disposed within the socket housing, and micro adjusting the device by utilizing a capacitive coupled or a fiber optic alignment system wherein a maximum measured capacitance or maximum measured intensity between alignment structures disposed in the socket housing and alignment package balls disposed within the device indicate optimal alignment of the device. Methods further include methods for active co-planarity detection through the use of a capacitive-coupled techniques.

Abstract: A contactor including a bellows body, a fixed portion connected to one end of the bellows body, a movable portion connected to the other end of the bellows body, and a movable touch piece that extending from at least one side edge along the bellows body, where the movable portion is configured to be depressed to compress the bellows body and to bring a movable contact point, located at a free end of the movable touch piece, into contact with the fixed portion.

Abstract: A parallel concurrent test (PCT) system is provided for performing the parallel concurrent testing of semiconductor devices. The PCT system includes a pick and place (PnP) handler for engaging and transporting the semiconductor devices along a testing plane, the PnP handler including at least one manipulator. The PCT system also includes a device under test interface board (DIB), the DIB including a broadside test socket for broadside (BS) testing of the semiconductor devices, the broadside testing using at least half of a total number of a semiconductor device pins, and a plurality of design-for-test (DFT) test sockets for DFT testing, the DFT testing using less than half of the total number of the semiconductor device pins, and a tester in electrical contact with the DIB for testing the semiconductor devices in accordance with a stepping pattern test protocol.

Abstract: An RF testing method and system by which a DC measurement pathway can also act like a properly terminated RF pathway. Achieving this requires that the output HI, LO, and Sense HI conductors are terminated in a frequency selective manner such that the terminations do not affect the SMU DC measurements. Once all SMU input/output impedances are controlled, as well as properly terminated to eliminate reflections, the high-speed devices will no longer oscillate during device testing, so long as the instruments maintain a high isolation from instrument-to-instrument (separate instruments are used on the gate and drain, or on the input and output of the device). The output of HI, LO and Sense HI conductors are coupled to various nodes of the DUT via three triaxial cables, the outer shieldings of which are coupled to each other and to an SMU ground.

Abstract: A method includes characterizing the effects of an electric field on a first set of printed wiring boards (PWBs) by testing the first set of PWBs to generate test data, using the test data to determine a dielectric life curve of the first set of PWBs, and based on the dielectric life curve, defining a screening time and a screening voltage to screen for premature failures in a second set of PWBs due to electric fields.

Abstract: The disclosure provides a voltage testing device and a method. A voltage testing device includes a PCB, a computer, and a detecting chip. The PCB includes a CPU socket, a signal producing chip, and a voltage regulator. The computer sets predetermined data. The detecting chip is inserted in the CPU socket. The detecting chip includes a reading module, a converting module, a sending module, and a control module. The signal producing chip sends a start-up signal to the control module. The converting module coverts the predetermined data to SVID data. The sending module sends the SVID data to the voltage regulator. The voltage regulator sends a CPU voltage to the CPU socket. The voltage value testing device calculates a value of the CPU voltage to determine if the value of the CPU voltage associates with a voltage corresponding to the predetermined data.

Abstract: A physically unclonable function (PUF) includes a plurality of PUF elements to generate an N-bit PUF signature. For each bit in the N-bit PUF signature, a PUF group of K number of individual PUF elements indicating a single-bit PUF value is used to generate a group bit. The group bits are more repeatable than the individual PUF elements. The value K may be selected such that (K+1)/2 is an odd number.

Abstract: Hardened programmable logic devices are provided with programmable circuitry. The programmable circuitry may be hardwired to implement a custom logic circuit. Generic fabrication masks may be used to form the programmable circuitry and may be used in manufacturing a product family of hardened programmable logic devices, each of which may implement a different custom logic circuit. Custom fabrication masks may be used to hardwire the programmable circuitry to implement a specific custom logic circuit. The programmable circuitry may be hardwired in such a way that signal timing characteristics of a hardened programmable logic device that implements a custom logic circuit may match the signal timing characteristics of a programmable logic device that implements the same custom logic circuit using configuration data.

Abstract: Described herein are apparatus, method, and system for reducing clock-to-output delay of a sequential logic unit in a processor. The apparatus comprises a sequential unit including: a data path, to receive an input signal, including logic gates to operate on a first power supply level, the data path to generate an output signal; and a clock path including logic gates to operate on a second power supply level, the logic gates of the clock path to sample the input signal using a sampling signal to generate the output signal, wherein the second power supply level is higher than the first power supply level. The apparatus improves (i.e. reduces) setup time of the sequential unit and allows the processor to operate at minimum operating voltage (Vmin) without degrading performance of the sequential unit.

Abstract: A voltage translator translates an input voltage signal in a low voltage domain into a output voltage signal in a high voltage domain using a latch that includes a pair of cross-coupled inverters. The bottom rail voltages for the cross-coupled inverters are varied dynamically to speed switching time for the voltage translator.

Abstract: An improved reference current generator for use in an integrated circuit. A voltage difference generator generates two voltages that are separated by a relatively small electrical potential. The two closely separated voltages are applied across a resistive element with relatively large impedance value resulting in a small and stable reference current. The stable reference current is mirrored and, if desired, amplified for use on the integrated circuit. A driver selectively drives state information off chip for assisting in post-silicon correction of unwanted sensitivities. A configuration memory stores values used to adjust effective device widths and lengths for correcting unwanted sensitivities.

Abstract: A voltage mode driver system includes a plurality of VMD cells, a plurality of auxiliary cells, a control logic and an output node. The plurality of VMD cells are configured to generate a first output. The plurality of VMD cells are configured to generate a calibrated effective resistance at different signal levels according to a calibration signal. The plurality of auxiliary cells are configured to generate a second output. The output node combines the first output and the second output into a driver output. The control logic is configured to control the plurality of auxiliary cells and the second output according to a selected level. The plurality of VMD cells may be configured to generate a calibrated effective resistance at different signal levels according to a calibration signal. A calibration component is configured to determine a voltage dependence effect and to generate a calibration signal according to the determined voltage dependence effect.

Abstract: An electrical-optical modulator may function at high data rates and may be realized in comparably low cost silicon base technology, typically in BJT, BiCMOS or CMOS technologies. The output signal path may include a high transition frequency BJT and by using an active load constituted by a MOS driven by an inverted version of the modulating signal that drives the BJT, the falling edge of the output signal is sped up.

Abstract: In the invention, a circuit control device controlling a semiconductor switching element having a control terminal and driven by voltage inputted to the control terminal, has an input voltage detector, a desired voltage setting portion and a control input generation portion. The input voltage detector detects inputted voltage to the switching element. The desired voltage setting portion sets a desired value of the voltage to be inputted to the switching element. The control input generation portion is connected to the control terminal of the switching element, the control input generation portion generating control input to the switching element such that the value to be detected by the input voltage detector closes to the set desired value. The desired voltage setting portion sets the desired value of the voltage on the basis of predetermined characteristics information and operating parameters of the switching element. The operating parameters include temperature of the switching element, Vce, Ice etc.