Patents Issued in September 30, 2014
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Patent number: 8848157Abstract: A liquid crystal display includes: a pair of substrates including at least one transparent substrate; a liquid crystal layer disposed between the pair of substrates; and an electrode group formed on at least one of the pair of substrates so as to apply an electric field to the liquid crystal layer. The liquid crystal layer contains at least one kind of liquid crystalline compound and at least one kind of chiral dopant. The concentration c of the chiral dopant is lower than a saturation solubility s thereof. The concentration c of the chiral dopant and a helical twisting power [HTP] of the chiral dopant satisfy a relation of [HTP]·c?5.5 (?m?1).Type: GrantFiled: August 20, 2010Date of Patent: September 30, 2014Assignees: Japan Display Inc., Panasonic Liquid Crystal Display Co., Ltd.Inventors: Mika Oiwa, Shintaro Takeda, Kotaro Araya, Yasushi Tomioka, Yoshiro Mikami
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Patent number: 8848158Abstract: A reverse mode liquid crystal display device, including: a first substantially transparent substrate having an electrically conductive material associated therewith; a second substrate having an electrically conductive material associated therewith; an insulating layer associated with at least one of the first and second substrates; and a liquid crystal medium contained within a chamber positioned between the first and second substrates which includes a macrocyclic ether and/or a borane; and a nematic, negative dielectric anisotropic liquid crystal mixture.Type: GrantFiled: July 1, 2009Date of Patent: September 30, 2014Assignee: Gentex CorporationInventor: Guomin Zhang
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Patent number: 8848159Abstract: A method of fabricating a liquid crystal display device includes: forming an array substrate and a color filter substrate; forming a seal pattern on one of the array substrate and the color filter substrate; forming a liquid crystal layer in the seal pattern and attaching the array substrate and the color filter substrate; curing the seal pattern with a first ultraviolet (UV) ray emitted from a light emitting diode (LED); and cutting the array substrate and the color filter substrate into unit cells.Type: GrantFiled: December 7, 2010Date of Patent: September 30, 2014Assignee: LG Display Co., Ltd.Inventor: Jae-Won Lee
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Patent number: 8848160Abstract: A display screen includes a substrate comprising a first surface and a second surface opposite to the first surface; a beam-splitting polarizer formed on a first surface of the substrate; and a non-conductive metal layer formed on a second surface of the substrate. The beam-splitting polarizer is a cholesterol liquid crystalline polarization layer.Type: GrantFiled: June 27, 2011Date of Patent: September 30, 2014Assignees: Shenzhen Futaihong Precision Industry Co., Ltd., FIH (Hong Kong) LimitedInventors: Qi-Jian Du, Chwan-Hwa Chiang
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Patent number: 8848161Abstract: The present invention provides a resist coating and developing apparatus, a resist coating and developing method, a resist-film processing apparatus, and a resist-film processing method, capable of reducing a line width roughness by planarizing a resist pattern. The resist coating and developing apparatus comprises: a resist-film forming part configured to coat a resist onto a substrate to form a resist film thereon; a resist developing part configured to develop the exposed resist film to obtain a patterned resist film; and a solvent-gas supply part configured to expose the resist film, which has been developed and patterned by the resist developing part, to a first solvent of a gaseous atmosphere having a solubility to the resist film. A solvent supply part supplies, to the resist film which has been exposed to the first solvent, a second solvent in a liquid state having a solubility to the resist film.Type: GrantFiled: March 13, 2013Date of Patent: September 30, 2014Assignee: Tokyo Electron LimitedInventor: Yuichiro Inatomi
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Patent number: 8848162Abstract: A system to recycle immersion fluid in an immersion fluid lithographic apparatus is described. A recycling path comprising a plurality of parallel paths, each of which has its own parallel liquid treatment unit optimized to treat fluid which is directed through it, is disclosed.Type: GrantFiled: October 8, 2010Date of Patent: September 30, 2014Assignee: ASML Netherlands B.V.Inventor: Johannes Catharinus Hubertus Mulkens
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Patent number: 8848163Abstract: A lithography apparatus generates a tunable magnetic field to facilitate processing of photoresist. The lithography apparatus includes a chamber and a substrate stage in the chamber operable to hold a substrate. A magnetic module provides a magnetic field to the substrate on the substrate stage. The magnetic module is configured to provide the magnetic field in a tunable and alternating configuration with respect to its magnitude and frequency. The magnetic field is provided to have a gradient in magnitude along a Z-axis that is perpendicular to the substrate stage to cause magnetically-charged particles disposed over the substrate stage to move up and down along the Z-axis. The lithography apparatus also includes a radiation energy source and an objective lens configured to receive radiation energy from the radiation energy source and direct the radiation energy toward the substrate positioned on the substrate stage.Type: GrantFiled: March 17, 2011Date of Patent: September 30, 2014Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.Inventors: Hsien-Cheng Wang, Chin-Hsiang Lin, Heng-Jen Lee, Ching-Yu Chang, Hua-Tai Lin, Burn Jeng Lin
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Patent number: 8848164Abstract: A fluid supply system for a lithographic apparatus includes a first fluid flow path for fluid between a fluid source and a first component and a drain fluid flow path for fluid flow from a junction in the first fluid flow path to a drain component. A controller is provided to vary a fluid flow rate to the first component from the fluid source by regulating flow of fluid through the drain fluid flow path.Type: GrantFiled: May 31, 2011Date of Patent: September 30, 2014Assignee: ASML Netherlands B.V.Inventors: Laurentius Johannes Adrianus Van Bokhoven, Nicolaas Ten Kate, Pieter Jacob Kramer
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Patent number: 8848165Abstract: An immersion lithography apparatus is disclosed in which liquid is supplied to a space between a projection system and a substrate, and a plate structure is provided to divide the space into two parts. The plate structure has an aperture to allow transmission of the projection beam, has through holes in it to reduce the damping effect of the presence of the plate and optionally has one or more inlets and outlets to provide various flows around the aperture in the plate. An embodiment of the invention may reduce the transportation of contaminants, stray light, temperature gradients, and/or the effect of bubbles on the imaging quality.Type: GrantFiled: February 9, 2012Date of Patent: September 30, 2014Assignee: ASML Netherlands B.V.Inventors: Sjoerd Nicolaas Lambertus Donders, Bob Streefkerk, Martinus Hendrikus Antonius Leenders
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Patent number: 8848166Abstract: An immersion exposure apparatus and method expose a substrate with an exposure beam via an optical assembly and via immersion liquid. A first stage on which a substrate is mounted is positioned below the optical assembly so that the immersion liquid is maintained in a space between the optical assembly and the substrate. The first stage is replaced below the optical assembly with a second stage while maintaining the immersion liquid below the optical assembly. The replacing includes arranging a movable member, which is independently movable relative to the first and second stages and away from below the optical assembly, to face the optical assembly so as to substantially maintain the immersion liquid below the optical assembly while the first and second substrate stages are away from below the optical assembly. A control system controls a drive system to move the first and second stages.Type: GrantFiled: July 19, 2013Date of Patent: September 30, 2014Assignee: Nikon CorporationInventor: Michael Binnard
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Patent number: 8848167Abstract: To reduce deformations which may be caused by a functional coating on a substrate in an optical element for UV or EUV lithography, an optical element is suggested comprising a functional coating (46) on a first surface (42) of a substrate (41), wherein the substrate (41) comprises a second surface (43) having a common edge (45) with the first surface (42), and the second surface (43) also has a coating (47) and the thickness t2 and the stress ?2 of the coating (47) on the second surface (33, 43) are chosen such that, in combination with the thickness t1 and the stress ?1 of the functional coating (36, 46) on the first surface (32, 42), the condition t 1 · ? 1 t 2 · ? 2 = X is fulfilled, wherein X has a value between 0.8 and 5.0.Type: GrantFiled: August 12, 2011Date of Patent: September 30, 2014Assignee: Carl Zeiss SMT GmbHInventors: Johannes Lippert, Dirk Schaffer
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Patent number: 8848168Abstract: An apparatus and method maintain immersion fluid in the gap adjacent to the projection lens during the exchange of a work piece in a lithography machine. The apparatus and method include an optical assembly that projects an image onto a work piece and a stage assembly including a work piece table that supports the work piece adjacent to the optical assembly. An environmental system is provided to supply and remove an immersion fluid from the gap between the optical assembly and the work piece on the stage assembly. After exposure of the work piece is complete, an exchange system removes the work piece and replaces it with a second work piece. An immersion fluid containment system maintains the immersion liquid in the gap during removal of the first work piece and replacement with the second work piece.Type: GrantFiled: June 22, 2007Date of Patent: September 30, 2014Assignee: Nikon CorporationInventor: Michael Binnard
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Patent number: 8848169Abstract: A lithographic apparatus includes an illumination system configured to condition a radiation beam and a support constructed to support a patterning device. The patterning device may be capable of imparting the radiation beam with a pattern in its cross-section to form a patterned radiation beam. The lithographic apparatus further includes a substrate table constructed to hold a substrate and a projection system configured to project the patterned radiation beam onto a target portion of the substrate. The lithographic apparatus may be provided with a composite material wherein a layer of carbon fiber and a layer of titanium is provided within the composite.Type: GrantFiled: May 15, 2009Date of Patent: September 30, 2014Assignee: ASML Netherlands B.V.Inventors: Mark Scholten, Jacob Kleijn, Stephan Christiaan Quintus Libourel, Mark Petrus Ubbink
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Patent number: 8848170Abstract: A technique includes using at least one emitter to generate a first optical signal to propagate along a first optical path to interact with a target, to generate a second optical signal and generate a third optical signal to propagate along a second optical path other than the first optical path to generate a fourth optical signal. The technique includes using at least one receiver to acquire a first measurement of the second optical signal and acquire a second measurement of the fourth optical signal. The technique includes generating an indication of a parameter that is associated with a target, which includes scaling a ratio of the first and second measurements based at least in part on optical communication between the emitter(s) and the receiver(s) that does not involve interaction with the target.Type: GrantFiled: January 3, 2012Date of Patent: September 30, 2014Assignee: Silicon Laboratories Inc.Inventors: Christophe Jean Erez Hakim, Geoffrey Byron Noakes, Jr.
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Patent number: 8848171Abstract: Highly accurate electro-optical time of flight distance measuring device for determining a distance to a target, including a transmitter for sending out a pulse shaped optical radiation to the target as well as a receiver for an optical signal built for turning the optical signal to an electrical signal, and a filter with a transfer function for filtering the electrical signal whereby the filter is built in such a way that its transfer-function is of at least 4th order, in particular 5th or 7th or higher order, so that aliasing is suppressed. Further a waveform-sampler, as an analog-to-digital-converter, for digitalizing the pulse shape from the filtered electrical signal as time- and value-quantized digital data, and a computation means for a numerical evaluation of the distance according to the pulse shape or a pulse shape representing numerical signature from the digital data.Type: GrantFiled: December 22, 2010Date of Patent: September 30, 2014Assignee: Leica Geosystems AGInventors: Reto Stutz, Robert Fritsch, Juerg Hinderling, Marcel Rohner
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Patent number: 8848172Abstract: A handheld measuring device for optical distance measurement includes a transmitting device, a receiving device, an evaluation device, and a homogenizing device. The transmitting device is configured to transmit periodically modulated optical measurement radiation toward a target object. The receiving device is configured to detect optical measurement radiation returning from the target object. The evaluation device is configured to receive and evaluate detection signals of the receiving device. The evaluation device comprises a plurality of accumulation devices configured to accumulate detection signals. The evaluation device conducts detection signals during a sampling time window from a plurality of sampling time windows temporally schematically changeably to an assigned accumulation device from the plurality of accumulation devices, such that the accumulation device accumulates the detection signals during the sampling time window.Type: GrantFiled: February 16, 2011Date of Patent: September 30, 2014Assignee: Robert Bosch GmbHInventors: Andreas Eisele, Bernd Schmidtke, Reiner Schnitzer
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Patent number: 8848173Abstract: An enhanced photoemission spectroscopy (EPS) system uses at least three photoelectric detection processes to identify a substance or substances in a target. The target can be in a container, and the EPS system accounts for this in the identification process. The photoelectric detection processes include Raman scattering, fluorescence and spectral reflection. The EPS system uses all three processes to generate spectral data that is then combined to derive a target signature. The target signature is then compared to stored signature data to determine the substance or substances in the target.Type: GrantFiled: November 9, 2012Date of Patent: September 30, 2014Assignee: CDEX, Inc.Inventors: Wade M. Poteet, Carey W. Starzinger, Jeffery K. Brumfield
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Patent number: 8848174Abstract: A method and corresponding apparatus for coupling an optical beam into a first end of an optical fiber includes two steps. First, light is coupled into a second end of the optical fiber such that an optical reference beam is output from the first end of the optical fiber. Second, at least one beam parameter of the optical beam is matched with the corresponding beam parameter of the optical reference beam. The second step may be performed using a wavefront sensor.Type: GrantFiled: July 7, 2005Date of Patent: September 30, 2014Assignee: Qinetiq LimitedInventors: Andrew M Scott, Andrew J Turner
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Patent number: 8848175Abstract: A test system for a multi-mode fiber comprises a launching device that is configured to generate optical pulses and has a rest position. A centering system is operable to move the launching device in a circular motion having a center corresponding to the rest position and a diameter corresponding to a core diameter of the multi-mode fiber. The centering system is further operable to adjust a position of the multi-mode fiber relative to the launching device while the launching device is moving in the circle until an optical power coupled from the launching device into the multi-mode fiber is below a threshold. The centering system optically centers the launching device with the multi-mode fiber by fixing the position of the multi-mode fiber responsive to the optical power coupled from the launching device into the multi-mode fiber being below the threshold and returning the launching device to the rest position.Type: GrantFiled: March 10, 2011Date of Patent: September 30, 2014Assignee: CommScope, Inc. of North CarolinaInventor: Abhijit Sengupta
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Patent number: 8848176Abstract: A dispersion measurement apparatus includes: a pulse generator to output optical pulses including an optical pulse with a first wavelength and an optical pulse with a second wavelength to an optical transmission path, the second wavelength being different from the first wavelength; a reception pulse analyzer including an optical receiver that receives the optical pulses output by the pulse generator, and an analyzer that performs a wavelet transform on an electrical pulse output through the reception performed by the optical receiver; and a calculator to detect, based on a result of the wavelet transform, a time difference between the optical pulse with the first wavelength and the optical pulse with the second wavelength, and to determine dispersion in the optical transmission path.Type: GrantFiled: August 11, 2011Date of Patent: September 30, 2014Assignee: Fujitsu LimitedInventors: Motoyoshi Sekiya, Yusaku Yamamoto
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Patent number: 8848177Abstract: An in-line laser beam waist analyzer system includes an optical prism that picks off a portion of a second surface reflection from either a laser processing focus lens or a protective debris shield for the processing lens and directs that focused light to a pixelated detector. This provides real time monitoring of the focused laser beam while it is processing material by welding, cutting, drilling, scribing or marking, without disrupting the process.Type: GrantFiled: April 28, 2014Date of Patent: September 30, 2014Assignee: Haas Laser Technologies, Inc.Inventor: Michael J. Scaggs
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Patent number: 8848178Abstract: An in-line laser beam waist analyzer system includes an optical prism that picks off a portion of a second surface reflection from either a laser processing focus lens or a protective debris shield for the processing lens and directs that focused light to a pixelated detector. This provides real time monitoring of the focused laser beam while it is processing material by welding, cutting, drilling, scribing or marking, without disrupting the process.Type: GrantFiled: April 28, 2014Date of Patent: September 30, 2014Assignee: Haas Laser Technologies, Inc.Inventor: Michael J. Scaggs
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Patent number: 8848179Abstract: An in-line laser beam waist analyzer system includes an optical prism that picks off a portion of a second surface reflection from either a laser processing focus lens or a protective debris shield for the processing lens and directs that focused light to a pixelated detector. This provides real time monitoring of the focused laser beam while it is processing material by welding, cutting, drilling, scribing or marking, without disrupting the process.Type: GrantFiled: April 28, 2014Date of Patent: September 30, 2014Assignee: Haas Laser Technologies, Inc.Inventor: Michael J. Scaggs
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Patent number: 8848180Abstract: A reference system configured in accordance with a particular embodiment includes a light-emitting device having a first light emitter, a second light emitter, and a housing. The housing includes a base operably connected to the first and second light emitters. The first light emitter is configured to emit a planar light region having a vertical orientation. The second light emitter is configured to emit an indicator light beam. A slope of the indicator light beam is adjustable to change a position of the indicator light beam within a vertical adjustment field. The system further includes a controller configured to cause the first and second light emitters to rotate in concert relative to the base about a vertical axis so as to rotationally reposition the planar light region and the indicator light beam in response to a detected misalignment of the planar light region.Type: GrantFiled: September 5, 2013Date of Patent: September 30, 2014Assignee: Laserline Mfg., Inc.Inventors: Robert W. Vanneman, Timothy A. Treichler
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Patent number: 8848181Abstract: An optical inspector includes a radiating source, a time varying beam reflector, a telecentric scan lens, a first and second waveplate, a polarizing beam splitter, a first detector, a focusing lens, a blocker, and a second detector. The radiating source irradiates the first waveplate generating circularly polarized source beam that irradiates a first position of on the time varying beam reflector with a source beam. The time varying beam reflector directs the source beam to the telecentric scan lens, which in turn directs the source beam to a sample. Reflected radiation from a sample is directed to the second waveplate generating linearly polarized beam that irradiates the polarizing beam splitter which directs a portion of the reflected radiation to the first detector. Scattered radiation from the sample is directed by the focusing lens to the second detector. Contemporaneous measurements by the first and second detectors are compared to differentiate.Type: GrantFiled: April 12, 2013Date of Patent: September 30, 2014Assignee: Zeta Instruments, Inc.Inventors: Steven W. Meeks, Rusmin Kudinar, Hung P. Nguyen
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Patent number: 8848182Abstract: An optical device includes a first projection group in which electrically conductive projections are arranged at a first period along a direction parallel to a virtual plane. When light traveling in a direction inclined with respect to a vertical line directed to the virtual plane is incident on the first projection group, surface plasmon resonance is generated at a first resonance peak wavelength and a second resonance peak wavelength. A first resonance peak wavelength band including the first resonance peak wavelength includes an excitation wavelength in surface-enhanced Raman scattering. A second resonance peak wavelength band including the second resonance peak wavelength includes a Raman scattering wavelength in the surface-enhanced Raman scattering.Type: GrantFiled: April 27, 2011Date of Patent: September 30, 2014Assignee: Seiko Epson CorporationInventors: Jun Amako, Kohei Yamada
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Patent number: 8848183Abstract: An apparatus includes a substrate and a plurality of nano-fingers attached at respective first ends to the substrate and freely movable along their lengths, in which a first set of the plurality of nano-fingers comprises a first physical characteristic, wherein a second set of the plurality of nano-fingers comprises a second physical characteristic, and wherein the first physical characteristic differs from the second physical characteristic.Type: GrantFiled: July 22, 2011Date of Patent: September 30, 2014Assignee: Hewlett-Packard Development Company, L.P.Inventors: Wei Yi, Fung Suong Ou, Min Hu, Wei Wu, Zhiyong Li
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Patent number: 8848184Abstract: In an optical position-measuring device for recording the relative position of a scanning unit and a measuring standard, the scanning unit includes a light source, first annular scanning graduation, reflector element, beamsplitter element, and detection unit. A beam emitted by the light source impinges on the measuring graduation and is split into at least two partial beams of rays. The partial beams propagate toward the scanning unit, impinge the first scanning graduation on the reflector element, are reflected through the first scanning graduation toward the measuring graduation, impinge the measuring graduation, propagate toward the scanning unit and undergo superposition, and are deflected by the beamsplitter element toward the detection unit. There, a plurality of positionally dependent, phase-shifted scanning signals can be recorded.Type: GrantFiled: December 1, 2011Date of Patent: September 30, 2014Assignee: Dr. Johannes Heidenhain GmbHInventor: Wolfgang Holzapfel
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Patent number: 8848185Abstract: An optical system is presented for use in measuring in patterned structures having vias. The system is configured and operable to enable measurement of a via profile parameters. The system comprises an illumination channel for propagating illuminated light onto the structure being measured, a detection channel for collecting light returned from the illuminated structure to a detection unit, and a modulating assembly configured and operable for implementing a dark-field detection mode by carrying out at least one of the following: affecting at least one parameter of light propagating along at least one of the illumination and detection channels, and affecting propagation of light along at least the detection channel.Type: GrantFiled: January 18, 2012Date of Patent: September 30, 2014Assignee: Nova Measuring Instruments Ltd.Inventors: Gilad Barak, Boaz Brill
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Patent number: 8848186Abstract: A method for determining an overlay offset may include, but is not limited to: obtaining a first anti-symmetric differential signal (?S1) associated with a first scatterometry cell; obtaining a second anti-symmetric differential signal (?S2) associated with a second scatterometry cell and computing an overlay offset from the first anti-symmetric differential (?S1) signal associated with the first scatterometry cell and the second anti-symmetric differential signal (?S2) associated with the second scatterometry cell.Type: GrantFiled: July 21, 2010Date of Patent: September 30, 2014Assignee: KLA-Tencor CorporationInventors: Daniel Kandel, Vladimir Levinski, Noam Sapiens
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Patent number: 8848187Abstract: A spectroscopic sensor that applies lights in a wavelength band containing plural wavelengths to an object and spectroscopically separates reflected lights or transmitted lights from the object using plural light band-pass filters that transmit the respective specific wavelengths and plural photosensor parts to which corresponding transmitted lights are input based on output results of independent photosensors. The spectroscopic sensor may be integrated in a semiconductor device or module by integration using a semiconductor process and downsizing may be realized.Type: GrantFiled: March 2, 2011Date of Patent: September 30, 2014Assignee: Seiko Epson CorporationInventors: Akira Uematsu, Yoichi Sato, Akira Komatsu, Kunihiko Yano
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Patent number: 8848188Abstract: In order to provide a fluorescence measurement method and a fluorescence measurement device that are provided by a simpler structure, and are more inexpensive and capable of measuring an amount of fluorescence using a very small amount of sample, using a fluorescence measurement device including a light-blocking measurement box to which a microtube is loaded; a container support part disposed inside the measurement box, the container support part vertically supporting the microtube; an excitation light source part disposed inside the measurement box, the excitation light source part including a light source that horizontally irradiates excitation light a sidewall surface of the loaded microtube; and a fluorescence detection part provided at an upper portion of the measurement box and above the loaded microtube, the fluorescence detection part measuring an amount of fluorescence in a particular wavelength range from a target sample, a microtube charged with a target liquid sample is loaded into the measurementType: GrantFiled: September 28, 2011Date of Patent: September 30, 2014Assignees: Peptide Support Ltd., The Yoshida Dental Mfg. Co., Ltd.Inventors: Norikazu Nishino, Mitsuhiro Fukamachi, Fumio Obayashi
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Patent number: 8848189Abstract: A device, system, and method for measuring acetone levels exhaled from a patient and correlating the measured level to a blood glucose concentration.Type: GrantFiled: May 26, 2009Date of Patent: September 30, 2014Assignee: PositiveID CorporationInventors: Benjamin Atkin, Vadim Goldshtein
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Patent number: 8848190Abstract: A method includes measuring intensities of light passing through a sample of an algae culture at different wavelengths. The method also includes identifying, using the measured intensities, a peak absorption wavelength of at least one type of chlorophyll in the sample and/or an absorption ratio involving multiple types of chlorophyll in the sample. The method further includes determining whether the algae culture has a problem using the peak absorption wavelength and/or the absorption ratio. The peak absorption wavelength could be identified by identifying a specified wavelength at which a smallest amount of light passes through the sample. The absorption ratio could be identified by identifying an average absorption wavelength of first and second types of chlorophyll in the sample and identifying a peak absorption wavelength of the first type of chlorophyll.Type: GrantFiled: June 21, 2012Date of Patent: September 30, 2014Assignee: Honeywell ASCa Inc.Inventors: Sebastien Tixier, Adrian M. Fuxman
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Patent number: 8848191Abstract: A photoacoustic sensing device includes a laser tuned to emit light to cause optical absorption by a gas to be detected, a resonant acoustic sensor positioned to receive pressure waves from the gas, wherein the laser is modulated to match a resonant frequency of the resonant acoustic sensor, and a first mirror positioned to receive light from the laser after the light has passed through the gas and to reflect the received light back through the gas to cause additional optical absorption.Type: GrantFiled: March 14, 2012Date of Patent: September 30, 2014Assignee: Honeywell International Inc.Inventor: Lisa Lust
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Patent number: 8848192Abstract: Disclosed are methods and apparatus for treating and analyzing a gas stream to determine the ammonia concentration. A gas stream is continuously monitored to determine the ammonia concentration by extracting gas samples from one or more locations and sending it to a tunable diode laser absorption spectroscopy instrument for analysis. By proper placement of sampling probes within a duct, depending on the particular flow patterns that have been determined by suitable modeling, e.g., computational fluid dynamics or cold flow modeling, the valves can be operated manually or by a controller to take samples at predetermined locations within the duct. This will enable taking samples from particular locations, samples representative of the entire cross section, or samples that are an average of a particular cross section. It will be possible by judicious placement of the probes and operation of the valves to map the concentrations of ammonia at a plurality of load settings and will permit continuous control.Type: GrantFiled: May 9, 2013Date of Patent: September 30, 2014Assignee: Fuel Tech, Inc.Inventors: Paul G. Carmignani, John M. Boyle, Scott M. Mayhew
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Patent number: 8848193Abstract: A laser emitting section 59A and a laser receiving section 59B for measuring an oxygen concentration are provided on two sides of an inspection area so as to be moved toward and away from a bag-shaped container 1. Gas-filled chambers 61 provided on the end faces of the laser emitting section 59A and the laser receiving section 59B are brought into contact with the gas phase portion of the container 1 to keep a constant thickness of the gas phase portion. A tilting device 81 is provided to press the container 1, which is held by a container holder 16, from both sides with a container pressing member 88 and tilts the container 1 in a vertical plane. When an oxygen concentration is measured, the tilting device 81 tilts the bag-shaped container 1 to measure the gas phase portion at the shoulders of the container 1.Type: GrantFiled: April 13, 2012Date of Patent: September 30, 2014Assignee: Hitachi Zosen CorporationInventors: Takayasu Yokobayashi, Yoshinari Horimoto
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Patent number: 8848194Abstract: An integrated plasmonic sensing device is described wherein the integrated device comprises: at least one optical source comprising a first conductive layer and a second conductive layer, and a optical active layer between at least part of said first and second conductive layers; at least one nanocavity extending through said first and second conductive layers and said optical active layer, wherein said optical source is configured to generate surface plasmon modes suitable for optically activating one or more resonances in said nanocavity; and, at least one optical detector comprising at least one detection region formed in said substrate in the vicinity of said nanocavity resonator, wherein said optical detector is configured to sense optically activated resonances in said nanocavity.Type: GrantFiled: April 6, 2011Date of Patent: September 30, 2014Assignee: Integrated Plasmonics CorporationInventors: Robert Walters, Jurriaan Schmitz, Albert Polman, Ihor Brunets
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Patent number: 8848195Abstract: In a method for determining one or more properties of a substrate, scatterometry spectra can be measured from one or more targets on the substrate. Reconstructions of each of said spectra can be performed to derive one or more values for the property of the substrate, by comparing representations of each of the measured spectra with one or more modeled representations of spectra calculated using variable parameter values. At least one parameter in the reconstruction for each spectrum can be linked to the value of the parameter used in the reconstruction for a different spectrum.Type: GrantFiled: October 22, 2009Date of Patent: September 30, 2014Assignee: ASML Netherlands B.V.Inventors: Christian Marinus Leewis, Marcus Adrianus Van De Kerkhof, Karel Diederick Van Der Mast, Peter Clement Paul Vanoppen, Ruben Alvarez Sanchez
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Patent number: 8848196Abstract: A spectrophotometer includes a fixed substrate having a fixed reflecting film, a movable substrate having a movable reflecting film, a tunable interference filter having a static actuator changing the gap distance of an inter-reflecting film gap between the fixed reflecting film and the movable reflecting film, a detecting section detecting the light intensity of a light extracted by the tunable interference filter, a voltage setting section and a voltage controlling section that apply a continuously-varying analog voltage to the static actuator, a voltage monitoring section monitoring the voltage applied to the static actuator, and a light intensity obtaining section obtaining the light intensity detected by the detecting section when the voltage monitored by the voltage monitoring section becomes a predetermined voltage to be measured.Type: GrantFiled: October 12, 2012Date of Patent: September 30, 2014Assignee: Seiko Epson CorporationInventors: Teruyuki Nishimura, Nozomu Hirokubo
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Patent number: 8848197Abstract: A mass sensor system including multiple Fabry-Perot microcavities connected in parallel by multiple waveguides. Each of the mass sensors includes a microbridge having a fundamental resonance frequency, and a movable reflective mirror etched into the microbridge; a fixed reflective mirror etched in a substrate, the fixed reflective mirror being fixed to the substrate in a region spaced apart from the movable reflective mirror; and an optical waveguide etched in the substrate that connects the movable mirror and the fixed mirror forming the Fabry-Perot microcavity interferometer. The system includes a tunable continuous-wave laser operative to optically interrogate the Fabry-Perot microcavity of each of the plurality of mass sensors, and a receiver operative to receive sensor signals from each of the plurality of mass sensors, the sensor signals comprising reflective signals and transmitted signals.Type: GrantFiled: July 18, 2013Date of Patent: September 30, 2014Assignee: The United States of America, as represented by the Secretary of the NavyInventors: Marcel W. Pruessner, Todd H. Stievater, William S. Rabinovich
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Patent number: 8848198Abstract: A method for determining a tilt of an image sensor surface plane in a camera in relation to a lens reference plane of the camera includes sending light onto the image sensor, receiving light reflected from the image sensor, identifying an interference pattern in the reflected light, identifying a feature of the interference pattern, and determining the tilt of the image sensor surface plane based on a position of the feature identified in the interference pattern.Type: GrantFiled: July 19, 2012Date of Patent: September 30, 2014Assignee: Axis ABInventors: Jonas Hjelmström, Anders Johannesson
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Patent number: 8848199Abstract: The present invention relates to systems and methods for quantitative three-dimensional mapping of refractive index in living or non-living cells, tissues, or organisms using a phase-shifting laser interferometric microscope with variable illumination angle. A preferred embodiment provides tomographic imaging of cells and multicellular organisms, and time-dependent changes in cell structure and the quantitative characterization of specimen-induced aberrations in high-resolution microscopy with multiple applications in tissue light scattering.Type: GrantFiled: July 10, 2008Date of Patent: September 30, 2014Assignee: Massachusetts Institute of TechnologyInventors: Wonshik Choi, Ramachandra Rao Dasari, Christopher M. Fang-Yen, Michael S. Feld
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Patent number: 8848200Abstract: Methods and systems are provided for suppressing speckle and/or diffraction artifacts in coherent structured illumination sensing systems. A coherent radiation pattern forms an interference pattern at an illumination image plane and illuminates an object. Radiation scattered or otherwise emitted by the object is detected to produce a signal, which is integrated in time. Coherent artifact suppression is attained by using a spatial modulator, such as an acousto-optic device, to vary a phase gradient at the illumination image plane during the signal integration time. Various embodiments are provided for purposes including without limitation: preserving the depth of field of the coherent illumination; using the same acousto-optic device for pattern generation and coherent artifact suppression; electronically controlling the effective spatial coherence of the illumination system; and reducing errors due to coherent artifacts in a laser-based three dimensional imaging system.Type: GrantFiled: October 5, 2012Date of Patent: September 30, 2014Inventor: Daniel Feldkhun
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Patent number: 8848201Abstract: Methods and systems for multi-modal three-dimensional (3D) scanning of objects are described. An example method may include receiving, from a scanning system, 3D information associated with an object having a first resolution. A region of interest of the object may be determined by a processor based on the 3D information associated with the object. Additionally, instructions for operating the scanning system to determine additional information associated with the region of interest of the object may be determined. The additional information associated with the region of interest may have a second resolution that is higher than the first resolution. The instructions may be provided to the scanning system to determine the additional information associated with the region of interest of the object.Type: GrantFiled: March 11, 2013Date of Patent: September 30, 2014Assignee: Google Inc.Inventors: James R. Bruce, Ryan Hickman, Arshan Poursohi
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Patent number: 8848202Abstract: An optical proximity sensor includes a driver, light detector and offset signal generator. The driver selectively drives a light source. The light detector produces an analog detection signal indicative of an intensity of light detected by the light detector. The detected light can include light transmitted by the light source that reflected off an object within the sense region of the optical sensor, interference light and ambient light. The interference light includes light transmitted by the light source, and detected by the light detector, that was not reflected off an object within the sense region of the optical sensor. The offset signal generator selectively produces an analog offset signal that is combined with the analog detection signal produced by the photodetector to produce an analog compensated detection signal. The analog offset signal compensates for at least a portion of the interference light included in the light detected by the photodetector.Type: GrantFiled: January 27, 2012Date of Patent: September 30, 2014Assignee: Intersil Americas LLCInventors: Kenneth C. Dyer, Xijian Lin
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Patent number: 8848203Abstract: A method of conveying information to a user of a coordinate measurement device, includes providing a first target projector, sending a first light beam from the device to a retroreflector; receiving a second light beam from the retroreflector; measuring the orientational and translational sets, the translational set based on the second light beam; selecting first information to be conveyed from the group consisting of one or more positions on the object, a direction indicated by a moving pattern, a message that includes one or more symbols or alphanumeric characters, a hidden feature, a measured object characteristic, a modeled characteristic, a magnified representation of surface characteristics, a pattern having meaning according to a rule, and combinations thereof; determining a first light pattern corresponding to the information; storing the first light pattern; and projecting the first light pattern onto the object based on the translational and orientational sets.Type: GrantFiled: April 11, 2012Date of Patent: September 30, 2014Assignee: Faro Technologies, Inc.Inventors: Robert E. Bridges, David H. Parker
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Patent number: 8848204Abstract: An image forming apparatus includes: a manual feed detecting unit that detects if a recording medium is set in a manual medium feeding unit; a print data receiving unit that receives print data; a medium orientation setting unit that receives an instruction for an orientation of the recording medium to be fed from the manual medium feeding unit, and sets the orientation; a printing control unit that controls the printing device to print an image based on the print data and executes a manual feed forcing operation if the manual feed detecting unit has detected the recording medium; and an image generating unit that generates the image based on the print data and determines an orientation of the image based on the orientation of the recording medium.Type: GrantFiled: December 7, 2012Date of Patent: September 30, 2014Assignee: KYOCERA Document Solutions Inc.Inventor: Kozo Tao
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Patent number: 8848205Abstract: An information processing apparatus capable of realizing setting of an insert including an interleaf sheet and a chapter sheet, on an image forming apparatus, by an intuitive operation similar to an actual insertion operation. An operation terminal includes a touch screen display and a network communication section which communicates with an MFP, and is capable of performing an operation on the MFP concerning document printing, and setting an insert to a printed matter to be printed by the MFP. When a user's drag operation causes insertion of an insert image displayed on the touch screen display between adjacent preview images of pages of the printed matter displayed on the same, the insert image is set as an interleaf sheet, and when the operation causes superimposing of the insert image on a preview image, the insert image is set as a chapter sheet.Type: GrantFiled: December 5, 2013Date of Patent: September 30, 2014Assignee: Canon Kabushiki KaishaInventor: Kanako Kaneda
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Patent number: 8848206Abstract: An image forming apparatus includes a communication part that performs communication with an external device; an image processing part that processes image data that is received by the communication part and that is for forming an image; an image forming part that forms an image of the image data processed in the image processing part; and a power supply controller that controls power supplied to the communication part, the image processing part, or the image forming part. The communication part includes a memory part that stores status information of the image forming apparatus, and a server part that performs communication with the external device, and the power supply controller supplies power to only the communication part in a power saving mode during a standby period, and the server part responds to a status information reference request and a status information update request from the external device.Type: GrantFiled: March 14, 2012Date of Patent: September 30, 2014Assignee: Oki Data CorporationInventor: Naoki Otsuka