Abstract: An angle detection device includes: first and second rotation measuring instruments; an anomaly detection unit detecting occurrences of anomalies in the first and second rotation measuring instruments; and a switching interpolation unit configured to select a first angle signal and a first angular speed signal and output as a third angle signal and a third angular speed signal when the first rotation measuring instrument is normal, and to perform switching so that a second angle signal and a second angular speed signal are output as the third angle signal and the third angular speed signal while performing interpolation so that the difference between the first angle signal and the second angle signal is reduced stepwise if the second rotation measuring instrument is normal when an anomaly has occurred in the first rotation measuring instrument.

Abstract: A non-ferrous shaft includes multiple non-integral ferrous tooth components, thereby allowing a sensor to detect the shaft speed.

Abstract: Techniques are disclosed for providing an optical assembly to provide stereoscopic images of a reflected laser spot to a camera for wind measurement. According to certain embodiments of the invention, an optical assembly can include left and right (or first and second) subassemblies having lens groups and reflective elements that cause light traveling left and right subassemblies to follow similar paths to focus on respective left and right portions of a camera. The camera can then use left and right images of reflected laser light to determine wind based on turbulence patterns in the left and right images.

Abstract: A functional device according to an embodiment of the invention includes: an insulating substrate; a movable section; movable electrode fingers provided in the movable section; and fixed electrode fingers provided on the insulating substrate and arranged to be opposed to the movable electrode fingers. The fixed electrode fingers include: first fixed electrode fingers arranged on one side of the movable electrode fingers; and second fixed electrode fingers arranged on the other side of the movable electrode fingers. The first fixed electrode fingers and the second fixed electrode fingers are arranged to be spaced apart from each other.

Abstract: Provided is a sensor signal output apparatus that outputs a sensor signal at times of the sensor being in steady operation and outputs the operational status of the sensor instead of the sensor signal when the sensor is at fault or in non-steady operation in order to thereby to have a receiver machine obtain a correct sensor signal. The sensor signal output apparatus includes a sensor detecting a physical quantity, a diagnosis part diagnosing the operating state of the sensor, and a communication part transmitting the result of detection by the sensor and the result of diagnosis by the diagnosis part. When the sensor is determined to be normally operating, the communication part selectively outputs the result of detection by the sensor. When the sensor is not determined to be normally operating, the communication part selectively outputs a signal indicative of the operating state of the sensor.

Abstract: A method is provided for calibrating an inertial sensing unit of a device utilizing a vision sensing unit integral to the device. The method includes receiving inertial sensing input data from the inertial sensing unit, receiving vision sensing input data from the vision unit, and determining when the received vision sensing input data represents a predetermined input state of the vision sensing unit. The method includes estimating an error value in the inertial sensing input data received from the inertial sensing unit based on the received vision sensing input data upon determination that the received vision sensing input data represents the predetermined vision sensing input state. The method further includes adjusting first subsequent received inertial sensing input data from the inertial sensing unit based on the estimated error value, thereby calibrating the inertial sensing unit.

Abstract: An atomic force microscope (AFM) comprises a physical system and a controller comprising a plurality of digital filters and configured to control the physical system. The AFM is tuned by performing automatic loop shaping on a loop response defined by a frequency response of the physical system and a frequency response of the controller, and adjusting a gain of the controller according to a peak in a magnitude of the loop response.

Abstract: A scanning probe microscope capable of controlling a decrease of the resolution of an objective lens disposed in the scanning probe microscope, and capable of easily carrying out the adjustment of an optical axis of an optical lever using the objective lens. The scanning probe microscope includes: a cantilever having a probe; a light source part radiating beams; a first reflective part reflecting an incident beam (L0) and guiding the incident beam to a reflective surface; a light receiving part receiving the beams; a second reflective part reflecting a reflected beam (L1) and guiding the reflected beam to the light receiving part; and an objective lens disposed to face the cantilever and adopted to observe and capture an area around the cantilever, the objective lens having the number of openings of NA, wherein the first reflective part is disposed at a position between the objective lens and the cantilever.

Abstract: Described herein is the analysis of nanomechanical characteristics of cells. In particular, changes in certain local nanomechanical characteristics of ex vivo human cells can correlate with presence of a human disease, such as cancer, as well as a particular stage of progression of the disease. Also, for human patients that are administered with a therapeutic agent, changes in local nanomechanical characteristics of ex vivo cells collected from the patients can correlate with effectiveness of the therapeutic agent in terms of impeding or reversing progression of the disease. By exploiting this correlation, systems and related methods can be advantageously implemented for disease state detection and therapeutic agent selection and monitoring.

Abstract: The terminals of a device under test (DUT) are temporarily electrically connected to corresponding contact pads on a load board by a series of electrically conductive pin pairs. The pin pairs are held in place by an interposer membrane with a top facing the device under test, a bottom facing the load board, and a vertically resilient, non-conductive member between the top and bottom contact plates. Each pin pair includes a top and bottom pin, which extend beyond the top and bottom contact plates, respectively, toward the device under test and the load board, respectively. The bottom pins has a lower contact surface which includes an arcuate portion or ridge which increases contact pressure and ablates oxides by the rocking action of ridge when the DUT in inserted.

Abstract: There is provided a substrate inspection apparatus in which a contact between a probe and a semiconductor device is checked without using an IC tester. Further, when an abnormal state is detected in the contact check, a cause of the abnormal state can be determined. A prober includes a probe card having a plurality of probes to be contacted with respective electrode pads of the semiconductor device formed on a wafer W. The probe card includes a card-side inspection circuit configured to reproduce a circuit configuration of DRAM in which the semiconductor device cut from the wafer W is to be mounted, and a comparator configured to measure a potential of a line between the probe and the card-side inspection circuit.

Abstract: The method for forming a semiconductor probe tip comprises depositing a first copper layer onto exposed electrically conductive areas of a wafer. The first copper layer surrounds a non-conductive polymer structure on the wafer. The non-conductive polymer structure is removed to form a primary cavity in the first copper layer. The wafer and the primary cavity are coated with a polymer layer. Regions of the polymer layer are removed to form a secondary cavity within and alongside the primary cavity. A metal layer is deposited on exposed electrically conductive areas of the wafer and within bounds of the secondary cavity.

Abstract: An apparatus and a method are disclosed herein. The apparatus is disclosed that includes a probe head and a circuit board. The probe head includes a metal housing and pins. The pins penetrate through the metal housing. The circuit board is configured to test a semiconductor device and includes a ground pad. The ground pad is electrically coupled between the metal housing and the circuit board.

Abstract: A probe card includes a circuit board, a plurality of probes, and at least one deviation-compensating member. An end of each of the probes is connected to the circuit board. The deviation-compensating member is fixed to the circuit board and connected to the probes. The probes have a first thermal expansion characteristic, the deviation-compensating member has a second thermal expansion characteristic, and the first thermal expansion characteristic and the second thermal expansion characteristic are different.

Abstract: A system can provide current detection in an integrated circuit (IC) chip while compensating for variations in circuit components resulting from process, voltage supply, temperature, or combinations thereof. The system can include the IC chip that has a power switch circuit that includes a power circuit path including a first transistor connected to a power source through a first conductive trace that has a first resistance value, and to a load by a second conductive trace having a second resistance value. A current detection circuit is configured to compensate for the variations in the power switch circuit using a sense circuit path that is configured to match process, voltage supply, and temperature variations in the power circuit path.

Abstract: A method and a device for measuring electrical differential currents, which in addition to the alternating current component also contain a direct current component, by means of an inductive differential current transformer. The known methods for measuring mixed currents require special current transformer designs with respect to the coil winding and magnetic core material and core number. The new method copes with the same current transformers that are common for measuring pure differential alternating currents. According to the invention, the secondary coil (3) of the current transformer is controlled such that the magnetic flux (?) linked with the secondary coil (3) inside the core remains constant, irrespective of the differential current and the secondary current (Is) required for this is measured.

Abstract: Apparatus and methods are provided for the measurement of power consumption at points of interest, such as circuit breakers, machines, and the like. Accordingly, means are provided for measurement of power consumption for each electrical sub-network that is controlled by a circuit breaker. Each apparatus is enabled to communicate its respective data, in an environment of a plurality of such apparatuses, to a management unit which is enabled to provide finer granularity power consumption profiles. Challenges of measuring relatively low supply currents, wireless operation in an environment of a large number of apparatuses, and self-powering are addressed.

Abstract: Apparatus and methods are provided for electrical parameter measurements at points of interest, such as circuit breakers, machines, and the like. The devices which comprise of components that may require corrections, such as the errors induced by, but not limited to, the use of a split core mounted around a current carrier, and hence calibration coefficients are provided based on test, measurements and/or calculations respective of the devices. These coefficients may be stored in a database for retrieval when calibration of measurements received from a measuring device. In one embodiment at least one of the calibration coefficients is stored on the measuring device.

Abstract: A contactless voltage sensing device configured to measure a voltage value of a conductor is provided. The contactless voltage sensing device includes a first impedance element having a first impedance, where the first impedance element is configured to be operatively coupled to the conductor. Further, the contactless voltage sensing device includes an antenna operatively coupled to the first impedance element, a second impedance element having a second impedance, where the second impedance element is formed in part by the antenna and a parasitic impedance element, and where the parasitic impedance element includes a parasitic impedance, and measurement and communication circuitry coupled to the first impedance element to measure the voltage value of the conductor.

Abstract: A TRIAC low voltage dimming control system for effectively controlling the dimming of low voltage lighting using a TRIAC dimmer. The TRIAC low voltage dimming control system generally includes a TRIAC analyzer that applies a test voltage to a TRIAC dimmer and measures the amount of time required for the TRIAC dimmer to conduct electricity. Utilizing the measured time for the TRIAC dimmer to conduct electricity, the TRIAC analyzer is able to calculate an approximate state of the TRIAC dimmer and provide a corresponding level of DC electrical power to a DC load.

Abstract: An electrical test switch has an integral energized circuit indicator. The energized circuit indicator is integrated into the front and/or rear covers of the test switch. The energized circuit indicator is passive and senses properties of the at least one conductor of the device being tested by being placed in proximity of the device. The voltage display provides personnel a visual indication of whether the electrical device being tested is energized without requiring a physical test or direct connection to the at least one conductor of the device being measured.

Abstract: A method is disclosed for checking the absence of voltage on a power electronic component connected to a high-voltage battery and to an electrical machine in a high-voltage network of a motor vehicle, which component has a higher voltage than a low-voltage network of the motor vehicle. The power electronic component includes an intermediate circuit capacitor, a passive discharge resistor, a plug-in terminal for at least one high-voltage load and a fuse which is connected upstream of the plug-in terminal.

Abstract: A shock detector having an electrical detector having a set of water immersible electrodes for detecting hazardous water conditions through the determination of the presence of either an electrical current in a body of water, a voltage in the body of water or a voltage gradient in the body of water and then providing an alert to the existence of hazardous electrical conditions in the body of water which in some cases may transmitted to a power source to shut off a power source thereby removing the hazardous water condition.

Abstract: Methods and systems may provide for receiving a set of voltage samples corresponding to a line voltage of a leg in an electrical system and conducting a time domain analysis to identify one or more loads in the electrical system. Additionally, the time domain analysis may be used to identify one or more loads in the electrical system. In one example, conducting the time domain analysis involves classifying events with respect to cross correlation, shape magnitude, transient amplitude, transient duration, run delta and/or standard deviation.

Abstract: A power distribution management apparatus (10) includes acquiring a measurement result from a meter connected to a customer's load facility which receives a distributed power from a power distribution system, and using different display representation to display a facility where electricity flows from the load facility toward the facility of the power distribution system among facilities of the power distribution system to be distinguished from a facility where electricity flows from the facility of the power distribution system toward the load facility utilizing the measurement result of the meter.

Abstract: An intelligent electronic device for monitoring and determining an amount of electrical power usage by a consumer, or end user, and for providing broadband Internet access to the consumer. The intelligent electronic device includes at least one sensor coupled to an electric circuit configured for measuring at least one power parameter of the electrical circuit and generating at least one analog signal indicative of the at least one power parameter; at least one analog to digital converter coupled to the at least one sensor configured for receiving the at least one analog signal and converting the at least one analog signal to at least one digital signal; a processor configured for receiving the at least one digital signal and calculating energy consumption in the electrical circuit; and a gateway configured for receiving data transmissions imposed on the electrical circuit and for demodulating the imposed data transmission for providing data communications.

Abstract: A radio frequency (RF) measurement system acting as a spectrum analyzer and a method of operating the same eliminates image signals from a detected input RF spectrum. The method includes determining at least three local oscillator (LO) frequencies; determining LO offsets between the LO frequencies; and mixing the LO frequencies with the input RF spectrum to provide corresponding intermediate frequency (IF) signals having an IF bandwidth, where at least one of the IF signals has the input RF spectrum mixed to a different portion of the IF bandwidth than at least one other of the IF signals, providing overlapping coverage. The method further includes acquiring ADC time records for the IF signals; performing Fourier transforms (FTs) on the ADC time records to provide IF spectrums; and detecting RF responses from the IF spectrums to determine an RF response trace corresponding to the input RF spectrum.

Abstract: A phase measurement method in a microwave tomography system may include transmitting a first Tx frequency signal, receiving a signal corresponding to the first Tx frequency signal, and measuring a first phase value; transmitting a second Tx frequency signal separated by a predetermined discrete frequency from the first Tx frequency signal, receiving a signal corresponding to the second Tx frequency signal, and measuring a second phase value; calculating a first phase difference based on a difference between the first and second phase values; calculating a second phase difference based on the discrete frequency; and determining an unwrapped phase value through comparison between the first and second phase differences.

Abstract: In accordance with an embodiment, a method of detecting a phase difference between a first signal and a second signal include latching a state of the first signal using the second signal as a clock to produce a first latched signal, latching a state of the second signal using the first signal as a clock to produce a second latched signal summing the first latched signal and the second latched signal to produce an indication of whether the first signal is leading or lagging the second signal.

Abstract: A system and method to facilitate wireless testing of a radio frequency (RF) signal transceiver device under test (DUT). With the DUT operating in a controlled electromagnetic environment, the tester exchanges multiple test signals wirelessly with the DUT. Signal phases of the respective test signals are controlled in accordance with feedback signals from the DUT and test equipment. Magnitudes of the respective test signals can also be controlled in accordance with such feedback signals, thereby enabling minimizing of apparent signal path loss between the tester and DUT to effectively simulate an electrically conductive signal path.

Abstract: Systems and methods are disclosed herein to provide shielding and radio frequency (RF) antenna coupling for communication test systems for the testing of wireless data communication devices and systems, including Multiple Input Multiple Output (MIMO) devices and systems. In accordance with one or more embodiments, a shielding and coupling system containing an array of RF antennas is disclosed that includes a flexible jacket integrated with RF shielding material that simultaneously isolates a device under test (DUT) and couples signals from the antennas of the DUT. Such a system may offer improved capabilities such as a faster and more efficient method of isolating the DUT from external interference, a more repeatable and simplified method of transmitting and receiving MIMO RF signals from DUTs having built-in antennas, and a more portable and lower cost RF test setup.

Abstract: A noise test apparatus includes a ground plate, a base plate including a ground plate, the ground plate being configured to support a display panel. A first antenna configured to receive electromagnetic waves irradiated by the display panel and disposed on the base plate adjacent to a first side of the ground plate. A second antenna configured to receive the electromagnetic waves irradiated by the display panel and disposed on the base plate adjacent to a second side of the ground plate, the second side extending substantially perpendicular to the first side.

Abstract: In order to detect the current state of a system component, e.g. to display whether an electrical conductor, a cable or the like, is currently live, a field generator that generates a magnetic field in the environment of the system part is provided, which generator is connected to an organic magnetoresistive OMR semiconductor element that is arranged stationary in the environment of the system component to be monitored, and a voltage source for generating an electrical voltage between two electrodes of the OMR semiconductor element is provided. The device and the method can be fitted in a simple manner and cost-effectively to almost any system part, even at a later stage to already existing systems. A corresponding display shows the desired information locally limited and in the simplest manner: if the electric conductor is currently energized, an additional evaluation is not necessary.

Abstract: Disclosed is an earth leakage circuit breaker. The earth leakage circuit breaker is capable of determining an earth leakage signal applied thereto with high accuracy, by performing a trip operation by determining noise components included in the earth leakage signal, such as switching noise or harmonics, based on a determination signal generated by tracking the earth leakage signal. The earth leakage circuit breaker is capable of precisely determining whether to perform a trip operation with respect to an earth leakage signal applied thereto. The earth leakage circuit breaker is capable of preventing a malfunction due to a noise signal similar to an earth leakage signal.

Abstract: A controller area network (CAN) includes a CAN bus having a CAN-H wire, a CAN-L wire, and a pair of CAN bus terminators located at opposite ends of the CAN bus. The CAN further includes a plurality of nodes including controllers wherein at least one of the controllers is a monitoring controller. The monitoring controller includes a detection control routine for isolating faults on the CAN bus including measuring a CAN-H wire voltage, measuring a CAN-L wire voltage, and isolating a short fault based upon the CAN-H wire voltage and the CAN-L wire voltage.

Abstract: A method of evaluating at least one parameter of a first capacitor. The method couples a number of capacitors in a capacitor network to a common node, the number of capacitors comprising at least three capacitors. Further, the method first applies a first voltage range to the capacitor network for causing a first voltage drop across the first capacitor, and it evaluates the at least one parameter in response to the first voltage range. The method second applies a second voltage range to the capacitor network for causing a second voltage drop across the first capacitor, the second voltage drop greater than the first voltage drop, and it evaluates the at least one parameter in response to the second voltage range.

Abstract: A new patch cord connection in a communications network may be automatically identified by using a plug insertion/removal sensor to detect the insertion of a first plug into a first connector port of a patch panel. An electrical cable diagnostic test is used to detect an insertion of a second plug into a first connector port on a network device. It may be inferred that a new patch cord connection has been established between the first connector port of the patch panel and the first connector port of the network device based on the consecutive detections of the insertions of the first and second plugs.

Abstract: A method for maintaining a contact of a connection jig for connecting between a target object to be subjected to an electrical test and a testing apparatus configured to conduct the electrical test on the target object includes: detecting a change in voltage upon supply of power for the electrical test to a test point on the target object through the contact; and issuing maintenance information indicating the contact is abnormal, upon detection of a portion where the voltage does not successively rise.

Abstract: The subject of the present invention is a device for diagnosing the loss of a connection to a ground (M) of an electronic control module (BCM) of a motor vehicle. This device (1) comprises a first branch (B1) connecting the electronic control module (BCM) to the ground(M), a second branch (B2) connecting the electronic control module (BCM) to the ground (M) adapted to receive power currents (I(power)) originating from power equipments (EQP) and comprising unidirectional current-conducting means (D), a diagnostic circuit (CD) connected to the second connecting branch (B2) at the level of a measurement point (PM) situated between the unidirectional current-conducting means (D) and the ground (M) and defining a voltage (Vdiag) for diagnosing a loss of connection to the ground (M) of the electronic control module (BCM) on the first branch connecting (B1).

Abstract: A back-plane connector connects component boards for a cubesat with a processing unit and a board connector electrically connected to the back-plane connector. The board connector mates with complimentary connectors on the component boards. The arrangement facilitates assembly, testing and operational reliability. An image capture system may be included and has an image capture device with a multiplexer for interactive collection and storage of image and video data.

Abstract: Methods and systems for monitoring contact joint integrity in an information handling system may include precisely monitoring a change in resistance of a resistive element associated with a contact joint. The change in resistance of the resistive element may be indicative of the integrity of the contact joint. The resistance may be measured using a modulated current source and by demodulating a voltage signal resulting from the modulated current flowing across the resistive element.

Abstract: A monitoring unit (100; 800) for monitoring an integrity of a signal path (200; 620) configured to receive an input signal (210, 802) and further configured to provide an output (220) in response to the input signal (210, 802), comprises a signal monitor (110; 801) configured to extract a first signal (112; 630) from the signal path (200; 620) corresponding to the input signal (210, 802) in at least a first characteristic. The monitoring unit (100; 800) further comprises a signal interface (120; 803) configured to extract a second signal (122; 631) corresponding to the output (220) in at least a second characteristic from the signal path (200; 620); and an evaluator (130) configured to determine, whether the at least first characteristic of the first signal (112; 630) corresponds to the at least second characteristic of the second signal (122; 631) according to a predefined relation.

Abstract: A method and apparatus for detecting a high energy event in a transistor includes performing the steps of: monitoring a gate to source voltage of a transistor during transistor start up, continuously determining a derivative of the monitored gate to source voltage with respect to time, and detecting a high energy event when the derivative of the gate to source voltage exceeds a predetermined threshold.

Abstract: A method for performing a semiconductor parametric test comprising performing a full voltage sweep for a first component on a first semiconductor wafer to determine a first value of an electrical characterization parameter for the first component, wherein the full voltage sweep comprises a range between about a minimum input voltage level of the first component and about a maximum input voltage level of the first component, determining a smart sensing window (SSW) for a plurality of subsequent components on the first semiconductor wafer according to the first value, wherein the SSW comprises a range comprising a portion of the full voltage sweep range, performing a partial voltage sweep in the SSW for each of the subsequent components to determine a second value of the electrical characterization parameter for each of the subsequent semiconductor components, and adapting the SSW for at least some of the subsequent components.

Abstract: A method of measuring semiconductor output characteristics is provided that includes connecting a pulse generator to the gate structure of a semiconductor device, and applying a plurality of voltage pulses at least some of which having a different pulse width to the gate structure of the semiconductor device. The average current is measured from the drain structure of the device for a duration of each pulse of the plurality of pulses. From the measured values for the average current, a self-heating curve of the average current divided by the pulse width is plotted as a function of the pulse width. The self-heating curve is then extrapolated to a pulse width substantially equal to zero to provide a value of drain current measurements without self-heating effects.

Abstract: The present invention relates generally to testing of interconnects in a semiconductor die, and more particularly to testing of semiconductor chips that are three-dimensionally stacked via an interposer. In one aspect, a method for testing an interconnect in a semiconductor die comprises providing the semiconductor die, which includes a plurality of electrical contact elements formed at one or more surfaces of the semiconductor die, at least one interconnect-under-test disposed between a first electrical contact element and a second electrical contact element, and an electrical component electrically coupled between the interconnect-under-test and at least one third electrical contact element.

Abstract: A semiconductor evaluation apparatus includes a jig for evaluation and a probe substrate. The jig for evaluation is provided such that a plurality of semiconductor devices can be placed thereon. The probe substrate is provided so as to face the jig for evaluation, and includes a contact probe. The jig for evaluation includes a plurality of housing portions divided by a frame portion such that the plurality of semiconductor devices can be separately placed on the plurality of housing portions, respectively. The semiconductor evaluation apparatus is configured such that the contact probe can be brought into contact with a plurality of elements in the state where a space is provided by bringing the frame portion and the probe substrate in proximity to each other. In this space, each of the plurality of semiconductor devices is placed between a corresponding one of the plurality of housing portions and the probe substrate.

Abstract: A piezoelectric and/or electret sensing device includes a piezoelectric and/or electret transducer for producing a measurement current in response to mechanical stimulus, and a control and evaluation circuit connected to the transducer. The control and evaluation circuit includes a transimpedance amplifier having a first and a second input, the transducer being operatively connected between the first input and a reference node, and an electrical waveform generator for generating an electrical waveform, the electrical waveform generator being operatively connected between the second input and the reference node.

Abstract: A system for testing a magnetic sensor according to one embodiment includes a discharge circuit to cause a discharge event on a magnetic sensor; a bias generation circuit to apply at least one first bias current to the sensor and at least one second bias current to the sensor, the second bias current being different than the first bias current; a resistance determination circuit to determine a resistance of the magnetic sensor at each of the applied bias currents; and a damage determination circuit to determine whether the magnetic sensor is damaged and/or was fixed by a discharge event based on the resistances.

Abstract: The present invention discloses a temperature insensitive testing device comprising: a transmission-end test sequence generating circuit to generate a test sequence; a transmission circuit to process the test sequence according to a transmission clock and thereby generate a test signal; a reception circuit to process an echo of the test signal and generate a digital echo signal; a correlation-value generating circuit to generate correlation values including a maximum correlation value according to the test sequence and the digital echo signal; and a decision circuit to determine whether a relation between the maximum correlation value and at least one threshold satisfies a predetermined condition and thereby generate a decision result, wherein the frequency of the transmission clock is lower than a predetermined frequency which confines the variation of the maximum correlation value to a predetermined range provided that the temperature variation of the transmission cable is within a temperature variation ran