Patents Issued in September 11, 2018
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Patent number: 10073109Abstract: Disclosed are genetically-modified phages, comprising a first nucleic acid sequence encoding at least a first peptide able to bind to a magnetic nanoparticle, and a second nucleic acid sequence encoding at least a second peptide able to bind with high specificity to a predetermined biomarker, and a method for using the genetically-modified phage displaying the first peptide and second peptide in a method for analyzing a fluid sample for the predetermined biomarker.Type: GrantFiled: April 5, 2016Date of Patent: September 11, 2018Assignee: The Board of Regents of the University of OklahomaInventors: Chuanbin Mao, Binrui Cao
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Patent number: 10073110Abstract: A device for loading an automated analysis system is presented. The device comprises a chassis, a movable loading element movably coupled to the chassis and configured to move between a first and a second position, a holding structure, the holding structure being floatingly coupled to the movable loading element, the holding structure being configured to hold a receptacle for material to be loaded into the automated analysis system, a first alignment element attached to the chassis and a second alignment element attached to the holding structure. The first alignment element is configured to engage with the second alignment element to align the holding structure in a predetermined position relative to the chassis when the movable loading element is in the second position.Type: GrantFiled: August 18, 2016Date of Patent: September 11, 2018Assignee: Roche Diagnostics Operations, Inc.Inventors: David Huber, Marco Sangermano
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Patent number: 10073111Abstract: The present invention achieves an automatic analysis device which has a probe guard for which the range of motion for accessing a specimen container installation section is small and which can be moved without being removed from a specimen installation section. The directions of movement of a probe guard are the vertical direction of a specimen container erection mechanism and the horizontal direction within an upper region of the specimen container erection mechanism, and a specimen container can be accessed without the need to move the probe guard to outside the upper region of the specimen container erection mechanism. Accordingly, it is possible to achieve an automatic analysis device which has a probe guard for which the range of motion for accessing a specimen installation section is small and which can be moved without being removed from a specimen container erection mechanism.Type: GrantFiled: June 10, 2015Date of Patent: September 11, 2018Assignee: Hitachi High-Technologies CorporationInventors: Takeshi Setomaru, Hideyasu Chiba
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Patent number: 10073112Abstract: An air pressure probe (APP) relates to the field of aviation and is intended to determine aircraft flight parameters or wind tunnel flow parameters. The APP comprises a head part with intake holes located thereon, which are connected by channels to couplers, and a support, attached to the head part from behind. The surface of the head part is provided with flow vortex generators. The generators can be in the form of indentations or protrusions of various shapes on the surface of the air pressure probe, or in the form of ribs formed as a result of the mating of elements of the flat or curved planes that form the surfaces of the head part and the support. The technical result is an increased operational range of measurement and a wider field of practical application.Type: GrantFiled: August 28, 2014Date of Patent: September 11, 2018Assignees: Central Aerohydrodynamic Institute named after prof. N.E. Zhukovsky, Joint stock company AEROPRIBOR VOSKHODInventors: Mikhail A. Golovkin, Andrey V. Vyalkov, Andrey A. Efremov, Vadim V. Sysoev, Oleg A. Gulyaev, Vyacheslav N. Dyatlov, Oleg I. Nazarov, Aleksey A. Koshelev, Vladimir G. Kravtsov
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Patent number: 10073113Abstract: In one aspect, the disclosure is directed to a MEMS device. The MEMS device includes a silicon-based movable MEMS sensor element. The MEMS device also includes a plurality of wells formed into at least one surface of the movable MEMS sensor element. Each well is filled with at least one metal so as to increase the effective mass of the movable MEMS sensor element. The metal may be tungsten or tantalum, or an alloy with tungsten or tantalum.Type: GrantFiled: April 24, 2015Date of Patent: September 11, 2018Assignee: Analog Devices, Inc.Inventors: Xin Zhang, Michael Judy
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Patent number: 10073114Abstract: A physical quantity sensor has a first structure which has a movable section that includes movable electrode fingers, a second structure which includes first fixed electrode fingers that are arranged to oppose the movable electrode fingers, a third structure which includes second fixed electrode fingers that are arranged to oppose the movable electrode fingers, and a first electrostatic capacity forming section that forms an electrostatic capacity between the first structure and the second structure.Type: GrantFiled: August 10, 2015Date of Patent: September 11, 2018Assignee: Seiko Epson CorporationInventor: Satoru Tanaka
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Patent number: 10073115Abstract: A self-diagnostic accelerometer (SDA) field programmable gate array (FPGA) may be capable of real time or near-real time diagnostic processing to determine potential accelerometer issues during flight or other mission critical operational situations. The SDA FPGA may determine accelerometer structural health and an attachment condition using an electronics system that is smaller, more energy efficient, and more cost effective than previous diagnostic tools. Advantages of the system may include diagnosing sensors automatically, immediately, actively (i.e., confirming the fault), and consistently, without the influence of a human operator. Customizable SDA algorithms may be adjusted to the specific needs of the sensor/environment.Type: GrantFiled: April 18, 2016Date of Patent: September 11, 2018Assignee: The United States of America as Represented by the Administrator of National Aeronautics and Space AdministrationInventors: Roger P. Tokars, John D. Lekki
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Patent number: 10073116Abstract: This sample holder for a scanning probe microscope is constituted of (1) a container that retains a liquid and (2) a flat-plate-shaped upper cover that covers an upper opening of the container and that has a narrow slit above the position where a sample is placed. In the upper cover, the slit has a slit width with which a thin film of the liquid is formed over the upper surface of the sample when the liquid fills the space between the container and the upper cover. The thin film of the liquid has a film thickness smaller than the distance between the upper surface of the sample and the upper cover.Type: GrantFiled: December 24, 2014Date of Patent: September 11, 2018Assignee: HITACHI, LTD.Inventors: Sanato Nagata, Tomihiro Hashizume, Akira Nambu, Hideaki Koizumi
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Patent number: 10073117Abstract: The terminals of a device under test (DUT) are temporarily electrically connected to corresponding contact pads on a load board by a series of electrically conductive pin pairs. The pin pairs are held in place by an interposer membrane with a top facing the device under test, a bottom facing the load board, and a vertically resilient, non-conductive member between the top and bottom contact plates. Each pin pair includes a top and bottom pin, which extend beyond the top and bottom contact plates, respectively, toward the device under test and the load board, respectively. The bottom pins has a lower contact surface which includes an arcuate portion or ridge which increases contact pressure and ablates oxides by the rocking action of ridge when the DUT in inserted.Type: GrantFiled: June 12, 2017Date of Patent: September 11, 2018Assignee: Johnstech International CorporationInventors: John E. Nelson, Jeffrey C. Sherry, Brian Warwick, Gary W. Michalko
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Patent number: 10073118Abstract: A method for contacting at least two metal electrodes, wherein the metal electrodes are located in a cavity of a basic body of sintered ceramic and frontal end faces of the metal electrodes. The metal electrodes are arranged essentially planparallel to an outer surface of the basic body. The method includes steps as follows: introducing a solder into at least one hole of the basic body, wherein the hole is so embodied that it leads to a rear portion of the metal electrode away from the frontal end face of the metal electrode wherein the solder can wet the rear portion of the metal electrode, wherein the metal electrodes are in their longitudinal direction shorter than the basic body, especially have only ? of the length of the basic body; introducing a cable into the hole at least until the cable extends into the solder; and heating the basic body with solder and cable above the solidification temperature of the solder.Type: GrantFiled: September 8, 2014Date of Patent: September 11, 2018Assignee: Endress+Hauser Conducta GmbH+Co. KGInventors: Stephan Buschnakowski, Alexander Serfling
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Patent number: 10073119Abstract: A monitor can be installed in the terminal block having a monitor access opening. The installed monitor allows for current measurement without having to disconnect a wire from the terminal block. Similar monitors can measure voltage, detect ground loops, and provide continuous readings of circuit parameters. Embodiments can positively hold probe tips, transmit data over wires, or transmit data wirelessly. Make-before-break monitors allow parameters to be measured without ever breaking the monitored circuit. Break-before-make monitors allow the monitored circuit to be interrupted and then reconnected with a monitor in place.Type: GrantFiled: March 22, 2016Date of Patent: September 11, 2018Assignee: HONEYWELL INTERNATIONAL INC.Inventors: Praveen Kumar Kajjam, Murali Krishna Thavva.V.V, Jaganmohan Y. Reddy, Suresh Kumar Palle, Suresh Babu D T V S Dogiparthi
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Patent number: 10073120Abstract: Optical Hall Effect (OHE) method for evaluating such as free charge carrier effective mass, concentration, mobility and free charge carrier type in a sample utilizing a permanent magnet at room temperature.Type: GrantFiled: October 13, 2017Date of Patent: September 11, 2018Assignees: BOARD OF REGENTS FOR THE UNIVERSITY OF NEBRASKA, J.A. WOOLLAM CO., INC.Inventors: Tino Hofmann, Mathias M. Schubert, Stefan Schoeche, Philipp Kuehne, Craig M. Herzinger, John A. Woollam, Gregory K. Pribil, Thomas E. Tiwald, Sean R. Knight
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Patent number: 10073121Abstract: An input-voltage-off detection apparatus includes a voltage adjustment unit, a time delay unit, a voltage clamp unit, an auxiliary voltage discharge switch unit and an isolation notification unit. The voltage adjustment unit receives an input voltage. The time delay unit utilizes the input voltage to generate a direct current voltage. After the input voltage is cut off, the direct current voltage stored in the time delay unit discharges to the voltage adjustment unit. When the direct current voltage reduces to a predetermined voltage, the auxiliary voltage discharge switch unit is turned on, so that an auxiliary voltage winding sends a working voltage to the isolation notification unit. After the isolation notification unit receives the working voltage, the isolation notification unit notifies an electronic apparatus that the input voltage is cut off.Type: GrantFiled: June 22, 2016Date of Patent: September 11, 2018Assignee: Chicony Power Technology Co., Ltd.Inventors: Kuo-Yang Chen, Chi-Tsung Wu
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Patent number: 10073122Abstract: A measuring transducer for converting an analog electrical input signal into an analog electrical output signal. The measuring transducer contains a detection apparatus for detecting an analog electrical input signal within a predetermined input measurement range, wherein the input measurement range of the measuring transducer is divided into n adjustable partial input measurement ranges and the output range of the measuring transducer is divided into n adjustable partial output ranges, where n is greater than 1. Further, an apparatus is provided for recognizing the partial input measurement range in which the detected analog electrical input signal lies. An imaging apparatus maps each partial input measurement range to a separate partial output measurement range of the n partial output measurement ranges. Another apparatus converts the detected analog electrical input signal into the associated analog electrical output signal depending on the recognized partial input measurement range.Type: GrantFiled: July 8, 2014Date of Patent: September 11, 2018Assignee: Phoenix Contact GmbH & Co. KGInventor: Florian Bergmann
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Patent number: 10073123Abstract: Systems and techniques relating to voltage signal peak level detection used in sensor devices, namely in Fly-Height Sensors (FHS) devices include, according to an aspect, an integrated chip device comprising: peak detection circuitry configured to receive a voltage signal and output a peak voltage signal associated with a peak voltage level of the voltage signal, wherein the peak detection circuitry comprises: a linear loop section configured to store the peak voltage level and hold additional voltage levels of the voltage signal at an output terminal of an amplifier to a value greater than zero; and a feedback loop section configured to reduce a leakage current within the peak detection circuitry and generate a guard voltage signal usable to reduce a feedback voltage and prevent the feedback voltage from successively re-entering into the feedback loop section.Type: GrantFiled: October 26, 2016Date of Patent: September 11, 2018Assignee: Marvell International Ltd.Inventor: Xiao Yu Miao
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Patent number: 10073124Abstract: A method is used in a utility meter having an arm bit and a seal bit. The method includes changing a state of the arm bit to a first state in response to a first set of conditions. The method also includes removing electrical power from the meter. Upon subsequently applying electrical power to the meter, a first signal in a meter processing circuit indicates whether a meter cover is installed or the meter cover is removed. The processing circuit changes the seal bit to a first state responsive to a condition in which the arm bit is in the first state and the first signal indicates that the meter cover is installed. The processing circuit changes the seal bit to a second state responsive to a condition in which the seal bit is in the first state and the first signal indicates that the meter cover is removed.Type: GrantFiled: July 2, 2015Date of Patent: September 11, 2018Assignee: Landis+Gyr, LLCInventors: Hua Kang, David Schamber
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Patent number: 10073125Abstract: A digital measurement system includes an oscillator, a mixer, and a controller coupled to each other. The oscillator provides a reference signal having a second frequency. The mixer generates a down-converted signal based on the output signal and the reference signal. The controller then determines a characteristic of the output signal (e.g., frequency or phase) based on the down-converted signal. An analog measurement system includes a filter having a center frequency, a rectifier, and a controller. The filter filters the output signal and the rectifier rectifies the filtered signal. The controller samples the rectified signal and determines a characteristic of the output signal based on the level of the rectified signal. The reference signal controller may adjust a characteristic of the output signal based on the determined frequency and/or phase of the output signal.Type: GrantFiled: December 13, 2016Date of Patent: September 11, 2018Assignee: Covidien LPInventors: Wayne L. Moul, Robert J. Behnke, II, Scott E. M. Frushour, Jeffrey L. Jensen
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Patent number: 10073126Abstract: Proposed are a C-V characteristic measurement system and a method of measuring C-V characteristics that allow for less change in resistivity with time in repeated measurement of a single crystal silicon wafer using a mercury electrode, as compared to those in the related arts. Measurement is conducted with use of a C-V characteristic measurement system including: a mercury probe 30 for putting mercury as an electrode to contact with a single crystal silicon wafer; an LCR meter 40 for forming a depletion layer by supplying a high-frequency wave to the single crystal silicon wafer via the mercury probe 30 to apply a reverse bias voltage to the single crystal silicon wafer while measuring a capacitance of the depletion layer; analysis software for calculating C-V characteristics based on the reverse bias voltage and the capacitance of the depletion layer; and a static electricity removing device 20 for removing static electricity of the single crystal silicon wafer.Type: GrantFiled: February 19, 2013Date of Patent: September 11, 2018Assignee: SHIN-ETSU HANDOTAI CO., LTD.Inventors: Fumitaka Kume, Hisatoshi Kashino
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Patent number: 10073127Abstract: This surface potential sensor is provided with an electret electrode (28), which is configured of a metal film (26) and an electret film (27), said electret electrode being provided on an upper surface of a diaphragm (25) of a semiconductor substrate. Four piezoresistors (29a, 29b, 29c, 29d) are formed on the diaphragm (25), and a distortion quantity detecting unit (32) is configured by forming a bridge circuit using the piezoresistors. Since an electrostatic force that operates between an object and the electret electrode (28) changes corresponding to potential of the object, and the electret electrode (28) warps corresponding to the change, the potential of the object can be detected by measuring a distortion quantity of the electret electrode (28) by means of the distortion quantity detecting unit (32). Consequently, not only the potential of the object but also a polarity thereof can be detected with reduced size and high sensitivity.Type: GrantFiled: March 14, 2012Date of Patent: September 11, 2018Assignee: OMRON CorporationInventor: Soichi Matsushita
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Patent number: 10073128Abstract: A leak detection device includes a pulse signal outputting portion that outputs predetermined pulse signals to a positive connecting wire connected to a positive side of a battery and a negative connecting wire connected to a negative side of the battery. A response waveform detecting portion of the leak detection device detects a positive response waveform for the pulse signal output to the positive connecting wire and a negative response waveform for the pulse signal output to the negative connecting wire. An amplitude ratio calculating portion calculates an amplitude ratio based on the positive response waveform and the negative response waveform, and a leak detecting portion detects a leak between the battery and a ground based on the amplitude ratio.Type: GrantFiled: December 28, 2012Date of Patent: September 11, 2018Assignee: HITACHI AUTOMOTIVE SYSTEMS, LTD.Inventors: Yuji Yoshioka, Tsuyoshi Kai, Akihiko Kudo, Masahiro Ueda
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Patent number: 10073129Abstract: Method for detecting an electric arc in a photovoltaic installation, characterized in that it comprises the following steps: Measurement (E6) of voltage values at at least one site of the electrical circuit of the photovoltaic installation; Digitization (E8) of the measured voltage values so as to form a data sampling x; Computation (E10) of a first indicator of presence of an electric arc, on the basis of a statistical computation on the data sampling x, from among the variance, a value analogous to the variance, or the interquartile range of the data sampling; Computation (E10) of a second indicator of presence of an electric arc, on the basis of a statistical computation on the data sampling based on one or more estimations of the mean and/or of the median of the data sampling; Comparison (E12) of the first and second indicators of presence of an electric arc with respective thresholds so as to deduce therefrom the presence or absence of an electric arc within the photovoltaic installation.Type: GrantFiled: February 21, 2014Date of Patent: September 11, 2018Assignee: COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVESInventors: Nicolas Chaintreuil, Cédric Gouy-Pailler, Sylvain Lespinats, Alexandre Plissonnier
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Patent number: 10073130Abstract: A method of determining a reduction of remaining service lifetime of an electrical device during a specific time period. The method comprising the steps of providing a measurement system comprising a temperature measurement device; a current measurement device and a voltage measurement device; measuring a temperature value, voltage values and current values by using the measurement device; determining a harmonic load based on the current values; determining a reduced maximum operating temperature based on the harmonic load; determining an amount of transient over-voltages based on the voltage values; determining a transient aging factor based on the amount of transient over-voltages; determining a temperature dependent aging factor based on the temperature value and the reduced maximum operating temperature; and determining the reduction of remaining service life based on the specific time period, the transient aging factor and the temperature dependent aging factor.Type: GrantFiled: October 5, 2015Date of Patent: September 11, 2018Assignee: LANDIS+GYR AGInventors: Joe Imfeld, Andreas Rumsch, Patrick Schmid
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Patent number: 10073131Abstract: An apparatus for evaluating an electrical insulator includes: a frame having a base and a pair of spaced-apart resilient arms each having a distal end; and a flexible probe disposed between the arms, the flexible probe being generally U-shaped and having a pair of distal ends, each distal end of the probe being connected to a respective distal end of one of the arms.Type: GrantFiled: March 11, 2016Date of Patent: September 11, 2018Assignee: ELECTRIC POWER RESEARCH INSTITUTE, INC.Inventors: Andrew John Phillips, J. Mark Major, Robert Carlton Lynch, Lester Ray Harrell
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Patent number: 10073132Abstract: There is provided a method that includes (a) detecting a partial discharge on a power line that carries a power signal, (b) measuring a characteristic of the partial discharge, thus yielding a measured characteristic, (c) determining that the measured characteristic satisfies a measurement criterion, thus yielding a qualified partial discharge, (d) incrementing a count of cycles of the power signal that contain qualified partial discharges, (e) calculating, for a plurality of cycles of the power signal, based on the count, a percentage of the plurality of cycles that contain qualified partial discharges, and (f) utilizing the percentage in a subsequent operation. There is also provided a system that performs the method, and a storage device that contains instructions for a processor to perform the method.Type: GrantFiled: December 11, 2014Date of Patent: September 11, 2018Assignee: Telefonaktiebolaget LM Ericsson (Publ)Inventor: Yehuda Cern
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Patent number: 10073133Abstract: An electronic device for testing of semiconductor components with test needles includes an electric power source, a plurality of test needles connected with the electric power source, a plurality of electric circuits, each one of the electric circuits connected upstream of one of the test needles, each one of the electric circuits including at least one circuit component which has low resistance in a range of electric currents and has high resistance above a given limit electric current, a control voltage source connected with each one of the electric circuits, and two DC/DC converter circuits connected between the control voltage source and the electric circuits.Type: GrantFiled: April 7, 2017Date of Patent: September 11, 2018Assignee: Infineon Technologies AGInventors: Michael Leutschacher, Walter Slamnig
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Patent number: 10073134Abstract: A laminate bond strength detection apparatus is provided. The laminate bond strength detection apparatus includes first circuit elements affixable to a printed circuit board (PCB), a housing having a coefficient of thermal expansion (CTE) mismatched from that of the PCB, second circuit elements affixable to the housing and configured to be laminated to a surface of the PCB, connectors and circuitry. The connectors respectively connect pairs of the first and second circuit elements and are breakable during CTE mismatch inducing heat processing resulting in the corresponding second circuit element becoming delaminated from the surface. The circuitry is coupled to the first and second circuit elements and configured to determine a number of broken connectors following the heat processing and to calculate a laminate bond strength of the PCB from the number of broken connectors.Type: GrantFiled: October 23, 2017Date of Patent: September 11, 2018Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATIONInventors: Stephen M. Hugo, Theron L. Lewis
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Patent number: 10073135Abstract: Among other things, one or more techniques or systems for evaluating a tiered semiconductor structure, such as a stacked CMOS structure, for misalignment are provided. In an embodiment, a connectivity test is performed on vias between a first layer and a second layer to determine a via diameter and a via offset that are used to evaluate misalignment. In an embodiment, a connectivity test for vias within a first layer is performed to determine an alignment rotation based upon which vias are connected through a conductive arc within a second layer or which vias are connected to a conductive pattern out of a set of conductive patterns. In this way, the via diameter, the via offset, or the alignment rotation are used to evaluate the tiered semiconductor structure, such as during a stacked CMOS process, for misalignment.Type: GrantFiled: May 22, 2017Date of Patent: September 11, 2018Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LIMITEDInventors: Mill-Jer Wang, Ching-Nen Peng, Hung-Chih Lin, Hao Chen, Mincent Lee
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Patent number: 10073136Abstract: Methods and apparatus to provide an integrated circuit having a magnetic sensing element having differential first and second outputs and an input, the input to receive current and first and second switches coupled to a respective one of the differential first and second outputs. A first voltage source is coupled between the first and second switches, the first and second switches having a first state in which the first voltage source is coupled across the differential first and second outputs, and an IC output can output a voltage corresponding to the first voltage source when the first and second switches are in the first state for monitoring operation of a signal path from the magnetic sensing element to the IC output.Type: GrantFiled: December 22, 2014Date of Patent: September 11, 2018Assignee: ALLEGRO MICROSYSTEMS, LLCInventors: Shaun D. Milano, Georges El Bacha, Michael C. Doogue, William P. Taylor
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Patent number: 10073137Abstract: SoundWire-based embedded debugging in an electronic system is provided. In this regard, in one aspect, a SoundWire slave circuit receives a SoundWire data input signal over a SoundWire bus including two physical wires. The SoundWire data input signal includes a plurality of debug configuration bits in assigned SoundWire bitslots. The SoundWire slave circuit generates a plurality debug input bits required for debugging the SoundWire slave circuit based on the debug configuration bits received in the assigned SoundWire bitslots. In another aspect, the SoundWire slave circuit returns a SoundWire data output signal, which includes a debug output bit in an assigned SoundWire bitslot, over the SoundWire bus. By receiving debugging configurations and returning debugging results over the SoundWire bus, it is possible to debug the SoundWire slave circuit with a reduced number of physical pins, thus helping to reduce the overall pin count and footprint of the electronic device.Type: GrantFiled: August 2, 2016Date of Patent: September 11, 2018Assignee: QUALCOMM IncorporatedInventors: Oren Reiss, Lior Amarilio, Amit Gil, Boaz Moskovich
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Patent number: 10073138Abstract: An apparatus is described that includes a plurality of circuits each designed to exhibit a unique signature code that is determined from manufacturing tolerances associated with a manufacturing process used to manufacture the circuits. The apparatus also includes error circuitry to determine an error has arisen based on a change in signature codes from the plurality of circuits.Type: GrantFiled: December 22, 2015Date of Patent: September 11, 2018Assignee: Intel CorporationInventors: Suraj Sindia, Robert Kwasnick, Dhruv Singh
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Patent number: 10073139Abstract: Implementations of the present disclosure involve an apparatus and/or method for performing cycle deterministic functional testing of a microprocessor or other computing design with one or more asynchronous clock domains. In general, the method/apparatus involves utilizing an observe bus within the microprocessor design to funnel data from within the chip design to an output bus. In addition, to ensure that the output from the chip is synchronized to a tester clock, the observe bus may feed the information from the observe bus to one or more first-in first-out (FIFO) data buffers. During testing, the data stored in the data buffers may be provided to the output pins of the chip at a rate synchronized to the tester clock such that the output appears to the testing apparatus as being cycle deterministic. Further, one or more mechanisms may be employed within the observe bus or circuit design to control the rate of input of data into the data buffers.Type: GrantFiled: September 30, 2014Date of Patent: September 11, 2018Assignee: Oracle International CorporationInventors: Ali Vahidsafa, Sriram Anandakumar
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Patent number: 10073140Abstract: A monitoring system for people-transporting systems, which systems are in the form of an elevator, escalator or moving walkway, includes at least one interrogation device and at least one safety switch that is connected to the interrogation device via an electrical safety circuit and is used for monitoring an equipment of the people-transporting device. A current direction-dependent unit is arranged in the electrical safety circuit. Furthermore, the interrogation device applies a test voltage with an alternating polarity to the electrical safety circuit. Furthermore, a people-transporting system having such a monitoring system is provided.Type: GrantFiled: January 20, 2014Date of Patent: September 11, 2018Assignee: INVENTIO AGInventor: Ivo Lustenberger
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Patent number: 10073141Abstract: Resistance values for a first time for respective areas of a plurality of electrical connections are generated. Respective normalized resistance values are generated from the resistance values. Respective temperature rise values for a second time for respective ones of the areas of the electrical connections are generated. An average temperature value is generated from the temperature rise values. Respective normalized temperature rise values for the generated temperature rise values are generated based on the average temperature values. An abnormal condition of at least one of the connections is detected responsive to the normalized temperature rise values and the normalized resistance values.Type: GrantFiled: July 9, 2015Date of Patent: September 11, 2018Assignee: Eaton Electrical Equipment Co., Ltd.Inventors: Fangji Wu, Li Yu, Jiong Chen, Zuhui Li
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Patent number: 10073142Abstract: A voltage detector includes a cylindrical hollow body housing including an open end and a tool end. An internal circuit assembly includes a voltage sensing loop, a flashlight, and a microprocessor. The internal circuit assembly is disposed inside the cylindrical hollow body housing. The voltage sensing loop is configured to detect voltage without contacting a detected voltage, and the microprocessor is configured to control power to the flashlight via a flashlight power button independently from power to the voltage sensing loop via a voltage detector button.Type: GrantFiled: March 18, 2016Date of Patent: September 11, 2018Assignee: Klein Tools, Inc.Inventor: Bruce Kuhn
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Patent number: 10073143Abstract: The invention relates to a method for detecting anomalies in a battery cell (22), wherein a short-circuit sensor system (20) detects events (44) in a signal of a terminal voltage of the battery cell, which events have successive edges in an interval of time of microseconds, and wherein events detected by the short-circuit sensor system are transmitted to a battery management system (16) which determines anomalies in the battery cells using the detected events. A short-circuit sensor system (20) and a battery system (12) which are set up to carry out the method are also stated.Type: GrantFiled: February 26, 2015Date of Patent: September 11, 2018Assignee: Robert Bosch GmbHInventors: Stefan Leidich, Schumann Schumann, Fabian Henrici
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Patent number: 10073144Abstract: A state of charge of a battery is estimated in several iterations, each iteration including: acquiring a measurement of intensity of current supplied by the battery, acquiring a measurement of voltage supplied by the battery, estimating a first state of charge of the battery based on a first estimated state of charge obtained upon a previous iteration and on the current intensity measurement, estimating a value of intensity of current supplied by the battery based on the voltage measurement and on a state of charge of the battery obtained upon the previous iteration, and calculating a corrected state of charge by adding to the first estimated state of charge a corrective term obtained by the product of a first correction gain multiplied by a factor representative of a difference between the estimated and measured current intensities.Type: GrantFiled: September 23, 2014Date of Patent: September 11, 2018Assignee: STMICROELECTRONICS (GRENOBLE 2) SASInventors: Christophe Lorin, Jean-Francois Garnier, Aurélien Mazard
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Patent number: 10073145Abstract: Disclosed is a method for estimating a state of charge (SOC) of a secondary battery using a full charge capacity (FCC) of the battery, the method including (S1) measuring voltage and current of the battery, (S2) calculating the FCC using a voltage change and a current integral of the battery during a specific time, (S3) estimating a time remaining until the battery is fully discharged using the calculated FCC and the measured voltage and current to calculate a self-discharge rate, (S4) calculating a capacity deterioration rate of each charge cycle of the battery, and (S5) applying the calculated self-discharge rate and the calculated capacity deterioration rate to estimate the SOC of the battery.Type: GrantFiled: July 4, 2013Date of Patent: September 11, 2018Assignee: LG CHEM, LTD.Inventors: Kyung Jik Kim, Ho Sang Kwon, Jae Chan Lee
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Patent number: 10073146Abstract: An apparatus and a method for estimating voltage of a hybrid secondary battery are provided, in which the hybrid secondary battery includes a first secondary battery and a second secondary battery having different electrochemical characteristics from each other and being connected in parallel with each other. The apparatus includes a sensor unit which measures an operating current of the hybrid secondary battery, and a control unit which estimates the voltage of the hybrid secondary battery using the operating current, and a voltage equation derived from a circuit model including a first circuit unit which simulates a voltage variation of the first secondary battery by a first open-circuit voltage element and optionally, a first impedance element, and a second circuit unit which is connected in parallel with the first circuit unit and simulates a voltage variation of the second secondary battery by a second open-circuit voltage element and optionally, a second impedance element.Type: GrantFiled: October 14, 2014Date of Patent: September 11, 2018Assignee: LG CHEM, LTD.Inventor: Won-Tae Joe
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Patent number: 10073147Abstract: The state of a battery parameter at the time of state estimation is estimated by using a plurality of pieces of parameter transition information (k, k+1), each piece of information representing an aspect of a temporal change in the battery parameter and representing the aspect of the temporal change until a predetermined state is achieved after a predetermined time that has elapsed from an initial state for each of use environments of a battery, and use environment information representing the use environment of the battery from the time of the start of use to the time of state estimation.Type: GrantFiled: March 27, 2014Date of Patent: September 11, 2018Assignee: NEC CorporationInventor: Hiroo Hongo
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Patent number: 10073148Abstract: A method for detecting a fault in an energy supply network. State values are determined for a plurality of measuring points. The state values, which specify an electrical state of the energy supply network at the respective measuring point, are transmitted to a control center. The state values are used by an evaluation device for detecting a fault in the energy supply network. In order to detect errors in energy supply networks with low short-circuit currents with high reliability and selectivity, the evaluation device performs a state estimation, using a model description of the supply network suitable for describing possible electrical states of the energy supply network on the basis of state variables. The estimation examines whether an electrical state at least approximately matches the respective state values, can be described by the model description. If such a state is lacking, the evaluation device generates an fault detection signal.Type: GrantFiled: June 26, 2012Date of Patent: September 11, 2018Assignee: SIEMENS AKTIENGESELLSCHAFTInventors: Pierre Janssen, Jean-Claude Maun
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Patent number: 10073149Abstract: Disclosed herein are a monitoring system and a method for monitoring and reporting an aggregate system status of a DC subsystem and a battery charger. The monitoring system comprises at least one monitoring-enabled module; an aggregator being in electrical communication with each of the at least one monitoring-enabled module; and an aggregate health status indicator in electrical contact with the aggregator.Type: GrantFiled: May 11, 2016Date of Patent: September 11, 2018Assignee: Hindle Power, Inc.Inventors: William A. Hindle, Nicholas C. Hindle, Robert Beck, Larry S. Meisner
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Patent number: 10073150Abstract: A magnetic sensor is provided with first and second magnetoresistive effect elements that can detect an external magnetic field. The first and second magnetoresistive effect elements are a plurality of layers of multilayer body including free layers where their magnetization directions vary due to the external magnetic field. Shapes of the first and second magnetoresistive effect elements viewed from the upper side in the lamination direction are different from each other. The first magnetoresistive effect element has a shape that can increase a slope of an output of the first magnetoresistive effect element relative to the change of the external magnetic field. The second magnetoresistive effect element has a shape that can decrease a slope of an output of the second magnetoresistive effect element relative to the change of the external magnetic field compared to the slope of the output of the first magnetoresistive effect element.Type: GrantFiled: January 15, 2016Date of Patent: September 11, 2018Assignee: TDK CorporationInventors: Kunihiro Ueda, Yoshiyuki Mizoguchi, Hiroshi Yamazaki, Suguru Watanabe
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Patent number: 10073151Abstract: A method and system for measuring Hall effect in a material includes measuring a voltage in two test states, each state alternating the direction and orientation of a current applied across the material or the voltage measured across the material relative to a magnetic field in each state. According to an embodiment, the frequency of measurement at each state differs.Type: GrantFiled: October 12, 2017Date of Patent: September 11, 2018Assignee: Lake Shore Cryotronics, Inc.Inventor: Jeffrey R. Lindemuth
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Patent number: 10073152Abstract: There is provided a magnetic resonance imaging device comprising: a pulse generating unit that generates a saturation pulse for reducing a signal of a water molecule within the living body and a pulse sequence after saturation time for the saturation pulse; a sampling implementing unit that implements sampling in each of a plurality of k-spaces acquired according to a repeated sequence applying the saturation pulse and the pulse sequence, and implements the sampling for a sampling area including a center portion of each of the k-spaces and a certain portion differently determined for each of the k-spaces; and an image acquiring unit that acquires a reconstructed image from the data acquired as a result of the sampling. Here, the pulse generating unit applies a saturation pulse having a different frequency per the sequence, and the sampling implementing unit acquires data for the center portion at a Nyquist rate.Type: GrantFiled: February 24, 2015Date of Patent: September 11, 2018Assignee: KOREA UNIVERSITY RESEARCH AND BUSINESS FOUNDATIONInventors: Jaeseok Park, Hoonjae Lee
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Patent number: 10073153Abstract: A device for attaching and detaching a cryogenic probe to and from a nuclear magnetic resonance (NMR) spectrometer. The device permits the probe to be loaded in the spectrometer in a shortened time and achieves high measurement throughput. The device has loading platforms (11-1, 11-2) on which cryogenic probes (P1, P2) are loaded. Each loading platform has a horizontal drive mechanism, a vertical drive mechanism, and a spacing mechanism. The device further includes probe cooling devices (14-1, 14-2) for circulating a refrigerant to and from the cryogenic probes (P1, P2) via transfer tubes (12-1, 12-2) made of a flexible material, thus cooling the probes (P1, P2). A temperature-controlled gas feeder (18) supplies a temperature variable gas for temperature adjustment to the probes (P1, P2). A vacuum pumping system (15) evacuates the interiors of the probes (P1, P2) via vacuum pipes (17-1, 17-2) made of a flexible material.Type: GrantFiled: November 18, 2014Date of Patent: September 11, 2018Assignee: JEOL Ltd.Inventors: Masanori Hirose, Yoshiaki Yamakoshi, Masahide Nishiyama, Shinji Nakamura, Katsuyuki Toshima, Fumio Hobo, Terumasa Okada, Shigenori Tsuji, Ryoji Tanaka, Hiroto Suematsu
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Patent number: 10073154Abstract: The invention provides for a multi-element transmit coil (100) for a magnetic resonance imaging system (300). The multi-element transmit coil comprises multiple surface coil elements (102) with a coil circuit (104) that has an integrated a radio-frequency sensor (106, 604, 704, 804). The multi-element transmit coil further comprises a power monitoring unit (108) with an analog-to-digital converter (808). The power monitoring unit comprises a processor connected to each analog to digital converter that is operable for receiving a radio-frequency measurement for generating specific absorption rate data (348) for each of the multiple surface coil elements. The multi-element transmit coil further comprises an optical data transmission system (110) connected to the processor. The optical data transmission system is operable for connecting to a magnetic resonance imaging system controller (312, 330).Type: GrantFiled: March 13, 2014Date of Patent: September 11, 2018Assignee: KONINKLIJKE PHILIPS N.V.Inventors: Christoph Leussler, Daniel Wirtz
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Patent number: 10073155Abstract: An adjustment method of a magnetic resonance imaging apparatus includes: a cooling and excitation step in which work of transporting a superconducting magnet to a facility different from a facility where the superconducting magnet is to be installed, cooling a superconducting coil of the superconducting magnet with a refrigerant, and supplying a current from an external power supply for excitation is repeated until a predetermined rated current flows; a demagnetization and transportation step of demagnetizing the superconducting coil and transporting the superconducting magnet to the facility where the superconducting magnet is to be installed in a state where the superconducting coil is cooled by the refrigerant; and an installation step of installing the superconducting magnet in the facility where the superconducting magnet is to be installed and supplying a predetermined rated current from an external power supply to the superconducting coil in order to excite the superconducting coil.Type: GrantFiled: March 1, 2017Date of Patent: September 11, 2018Assignee: HITACHI, LTD.Inventor: Munetaka Tsuda
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Patent number: 10073156Abstract: A magnetic resonance imaging apparatus and method simultaneously measure physical properties including relaxation rates, proton densities, and apparent diffusion coefficients of a subject. The apparatus and method use a single magnetic resonance acquisition of the subject in order to measure the physical properties.Type: GrantFiled: June 28, 2013Date of Patent: September 11, 2018Assignee: SyntheticMR ABInventor: Marcel Warntjes
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Patent number: 10073157Abstract: A computer-implemented method for operating an imaging system, includes in a processor, receiving a measurement task, generating a description of the measurement task in the processor from a sequence accessed by the processor, translating the generated description into instructions, and executing the instructions in an imaging installation of the system. An imaging system is configured to execute such a method, and a non-transitory, computer-readable data storage medium is encoded with programming instructions that cause the method to be executed.Type: GrantFiled: September 5, 2013Date of Patent: September 11, 2018Assignee: Siemens AktiengesellschaftInventor: Swen Campagna
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Patent number: 10073158Abstract: In a magnetic resonance (MR) apparatus and method to evaluate the consistency of a signal model used to generate a quantitative parameter map, the residual of the quantitative parameter map is calculated and a residual map is generated. The residual map is displayed together with the quantitative parameter map, with the residual map serving as an indicator of the quality of fit of the signal model.Type: GrantFiled: March 13, 2015Date of Patent: September 11, 2018Assignee: Siemens AktiengesellschaftInventor: David Grodzki