Patents Issued in January 7, 2020
  • Patent number: 10527633
    Abstract: Use of prostacyclin or an analogue thereof for treatment of a new medical indication in acute critically ill patients, in particular acute critically ill patients with systemic endothelial damage, a biomarker for identifying individuals that have a new medical indication, and a method for identifying a new medical indication.
    Type: Grant
    Filed: March 22, 2016
    Date of Patent: January 7, 2020
    Assignee: ENDOTHEL PHARMA APS
    Inventors: Sisse Rye Ostrowski, Pär Ingemar Johansson
  • Patent number: 10527634
    Abstract: The invention relates to in vitro or ex vivo methods for assessing the cognitive function of a subject in the context of the prevention of neurodegenerative diseases. A particular method comprises a step of associating a subject to a cognitive status selected from healthy cognitive status, Subjective Cognitive Impairment, Mild Cognitive Impairment and neurodegenerative disease, and the association of cognitive status results from the evaluation of glycosylated MCSF and CCR2 expressed at the surface of PBMC in a biological sample from the subject. The present invention also provides kits suitable for implementing such methods.
    Type: Grant
    Filed: February 26, 2016
    Date of Patent: January 7, 2020
    Assignee: ADventDX
    Inventors: Nicolas Pelletier, Philippe Compagnone, Nathalie Compagnone
  • Patent number: 10527635
    Abstract: Systems, methods, devices, and apparatus for detecting sample defects in blood samples processed in automated processing systems are described herein. One aspect describes an automated blood sample processing apparatus having a pre-analytic specimen integrity monitoring device. Another aspect describes devices, systems, and methods for identifying blood components and properties in blood samples. Further aspects relate to systems and methods for setting reference ranges for sample defects and interference in blood samples. Additionally, devices, systems, and methods for identifying defective samples are described.
    Type: Grant
    Filed: December 31, 2015
    Date of Patent: January 7, 2020
    Assignee: Cerner Innovation, Inc.
    Inventors: Sameer Bhatia, Anton F. Flieg, Jr., Joseph Eugene Rose, Stephen Ward
  • Patent number: 10527636
    Abstract: A user interface for an instrument that processes samples from sample containers supported on a presentation unit. The user interface includes a presentation unit display that includes a graphical representation of the presentation unit. The presentation unit display receives inputs therein to define instructions for the processing of the samples by the instrument. The presentation unit display also displays a status while the samples are being processed.
    Type: Grant
    Filed: March 18, 2015
    Date of Patent: January 7, 2020
    Assignee: Beckman Coulter, Inc.
    Inventors: Rachel E. Moschell, Jessica A. Zeckel, Robert J. Zigon
  • Patent number: 10527637
    Abstract: Provided is an automatic analysis device that enables a reagent to be reliably loaded in and loaded out within a stipulated amount of time, even during analysis and without stopping the analysis, and that enables a reagent to be exchanged without causing a long wait for the operator.
    Type: Grant
    Filed: February 5, 2016
    Date of Patent: January 7, 2020
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Hiroki Fujita, Toshiharu Suzuki
  • Patent number: 10527638
    Abstract: To clean a nozzle that is part of an automated analyzer and is provided with both a tubular discharge unit that discharges a cleaning liquid and a tubular suction unit that suctions in cleaning liquid that was discharged from the discharge unit and is running down an outer surface, first the discharge unit is made to start discharging, and then in parallel with said discharging, the suction unit is made to start suctioning. After the suction unit has suctioned in the cleaning liquid running down the aforementioned outer surface for a prescribed length of time, the suctioning is temporarily stopped. Next, after a prescribed amount of the cleaning liquid has accumulated in a cleaning tank, the discharging is stopped, and with the suction unit immersed in the cleaning liquid accumulated in the cleaning tank, the suctioning is restarted.
    Type: Grant
    Filed: May 7, 2015
    Date of Patent: January 7, 2020
    Assignees: JEOL Ltd., Fujirebio Inc.
    Inventor: Nakamura Mizuki
  • Patent number: 10527639
    Abstract: Radiation detection arrangement and method for measuring the effect of radiation on a biological object using (thermally activated delayed fluorescence) TADF material based detection of radiation.
    Type: Grant
    Filed: November 19, 2018
    Date of Patent: January 7, 2020
    Assignee: SENSONICA LIMITED
    Inventors: Oxana Margaritova, Andrey Khodkin
  • Patent number: 10527640
    Abstract: A method of detecting blockage of a pitot tube includes measuring a pitot tube temperature via one or more temperature sensors located inside a pitot tube, measuring an outside ambient air temperature, comparing the measured pitot tube temperature to a minimum pitot tube temperature threshold for the measured outside ambient air temperature, and determining the pitot tube has a blockage condition when the measured pitot tube temperature is below the minimum pitot tube temperature threshold.
    Type: Grant
    Filed: February 14, 2018
    Date of Patent: January 7, 2020
    Assignee: ROSEMOUNT AEROSPACE INC.
    Inventors: Divakara Rao Vadada, Divya Rajan Pillai
  • Patent number: 10527641
    Abstract: A mobile device possessed by a user is equipped with: a motion sensor which is capable of detecting the motion of the mobile device; a receiver which is capable of receiving a polling signal transmitted from equipment; and a control unit which is configured so as to set, in response to whether or not the polling signal has been received by the receiver, the sampling speed with which the motion sensor detects the motion of the mobile device.
    Type: Grant
    Filed: February 21, 2017
    Date of Patent: January 7, 2020
    Assignee: KABUSHIKI KAISHA TOKAI RIKA DENKI SEISAKUSHO
    Inventors: Masahiro Arakawa, Daisuke Kawamura, Hidenobu Hanaki, Kazunori Sobue, Tetsuya Kawamura
  • Patent number: 10527642
    Abstract: An acceleration sensor (1) includes a fixed portion (33), a movable portion (31) connected to the fixed portion (33), a lower electrode (11) that is disposed to face a lower surface of the movable portion (31), and an upper electrode (21) that is disposed to face an upper surface of the movable portion (31). A distance in an x-axis direction between an end portion (41) of the lower electrode (11) and the fixed portion (33) is shorter than a distance in the x-axis direction between an end portion (51) of the upper electrode (21) and the fixed portion (33). Further, a distance in the x-axis direction between an end portion (42) of the lower electrode (11) and the fixed portion (33) is shorter than a distance in the x-axis direction between an end portion (52) of the upper electrode (21) and the fixed portion (33).
    Type: Grant
    Filed: November 11, 2014
    Date of Patent: January 7, 2020
    Assignee: HITACHI, LTD.
    Inventors: Atsushi Isobe, Noriyuki Sakuma, Chisaki Takubo, Yuudai Kamada, Takashi Shiota
  • Patent number: 10527643
    Abstract: There is provided an inertia sensor with low noise and high sensitivity. The inertia sensor captures a physical quantity as a change of electrostatic capacitance and detects the physical quantity based on a servo voltage generating electrostatic force that cancels the change of the electrostatic capacitance. The inertia sensor includes a detection capacitor unit that captures the physical quantity as the change of the electrostatic capacitance and a servo capacitor unit to which the servo voltage is applied. Here, the detection capacitor unit and the servo capacitor unit are connected mechanically through an insulation material.
    Type: Grant
    Filed: July 10, 2015
    Date of Patent: January 7, 2020
    Assignee: Hitachi, Ltd.
    Inventors: Atsushi Isobe, Yuki Furubayashi, Takashi Oshima, Yuudai Kamada, Takashi Shiota, Chisaki Takubo, Noriyuki Sakuma
  • Patent number: 10527644
    Abstract: A physical quantity detection element includes: a substrate; first and second fixed electrode portions on the substrate; a movable body on the upper portion of the substrate; and a beam on the movable body, the movable body includes a first movable body on a first side of the beam, and a second movable body on a second side of the beam, the first movable body includes a first movable electrode portion facing the first fixed electrode portion and a first mass portion disposed in an opposite direction of the beam from the first movable electrode portion, the second movable body includes a second movable electrode portion facing the second fixed electrode portion, a mass of the first movable body is greater than a mass of the second movable body, and a mass of the first mass portion is greater than a mass of the first movable electrode portion.
    Type: Grant
    Filed: February 26, 2018
    Date of Patent: January 7, 2020
    Assignee: Seiko Epson Corporation
    Inventor: Shota Kigure
  • Patent number: 10527645
    Abstract: A probe for atomic force microscopy comprises a tip for atomic force microscopy oriented in a direction referred to as the longitudinal direction and protrudes from an edge of a substrate in the longitudinal direction, wherein the tip is arranged at one end of a shuttle attached to the substrate at least via a first and via a second structure, which structures are referred to as support structures, at least the first support structure being a flexible structure, extending in a direction referred to as the transverse direction, perpendicular to the longitudinal direction and anchored to the substrate by at least one mechanical linkage in the transverse direction, the support structures being suitable for allowing the shuttle to be displaced in the longitudinal direction. An atomic force microscope comprising at least one such probe is also provided.
    Type: Grant
    Filed: July 12, 2016
    Date of Patent: January 7, 2020
    Assignees: VMICRO, CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE
    Inventors: Benjamin Walter, Marc Faucher
  • Patent number: 10527646
    Abstract: An electrical contact assembly comprised of four identical modules arranged in a four-sided formation. Each module comprises of a bottom housing formed with two rows of through holes to allow a row of front and back contact pairs to be inserted, with separators in between each pair to prevent electrical conductance between the pairs. A top housing is then lowered onto the top of these contact pairs. With the aid of a key tool, the rows of contact pairs are inserted into through holes in the top housing. By virtue of different heights between the front and back rows of through holes, the front and back contact rows are inserted one first, and then the other. This allows for easier installation of an assembly with minimal tolerance accumulation.
    Type: Grant
    Filed: February 21, 2017
    Date of Patent: January 7, 2020
    Assignee: JF MICROTECHNOLOGY SDN. BHD.
    Inventors: Wei Kuong Foong, Kok Sing Goh, Shamal Mundiyath, Eng Kiat Lee
  • Patent number: 10527647
    Abstract: Improved impedance matching is provided in vertical probe arrays having conductive guide plates by providing ground pins connecting the guide plates that do not mechanically touch the device under test or the input test apparatus. Such ground pins can be disposed in predetermined patterns around corresponding signal probes to improve an impedance match between the probes and the test apparatus and/or the device under test. Preferably all impedances are matched to 50? as is customary for high frequency work.
    Type: Grant
    Filed: June 22, 2018
    Date of Patent: January 7, 2020
    Assignee: FormFactor, Inc.
    Inventors: Benjamin N. Eldridge, Edin Sijercic, Eric Hill, John Ebner
  • Patent number: 10527648
    Abstract: According to the present invention, a semiconductor inspection device includes a control section that outputs a signal to inspect a semiconductor wafer, a contact section comprising contact terminals connected to the control section, a probe card that can simultaneously contact a plurality of semiconductor chips formed on the semiconductor wafer and a drive section, wherein the contact terminals can contact some of electrode pads provided for the probe card and the drive section drives the contact section so as to switch electrode pads in contact with the contact terminals.
    Type: Grant
    Filed: February 16, 2017
    Date of Patent: January 7, 2020
    Assignee: Mitsubishi Electric Corporation
    Inventors: Misuzu Nishimura, Yuya Saeki
  • Patent number: 10527649
    Abstract: An adjustable load transmitter for adjusting an alignment between a probe card and a bridge beam of a wafer prober, where the probe card is separated from the bridge beam by a gap. The adjustable load transmitter located in the gap, the adjustable load transmitter comprising two rotatable plates adapted for transmitting a load via a load transmission path between the bridge beam and the wafer prober and each comprising two flat, non-parallel contact faces. The adjustable load transmitter removes an angular misalignment between the bridge beam and the set of plates by rotating each of the rotatable plates about a pre-determined adjustment angle such that two angles of inclination are adjusted to zero. The adjustable load transmitter establishes the load transmission path by closing a clearance between the bridge beam and the contact face.
    Type: Grant
    Filed: July 14, 2017
    Date of Patent: January 7, 2020
    Assignee: International Business Machines Corporation
    Inventors: Martin Eckert, Roland Dieterle, Siegfried Tomaschko
  • Patent number: 10527650
    Abstract: A measurement system is provided that has a digital edge trigger circuit that is capable of operating at the full signal bandwidth of the measurement system. The digital edge trigger circuit comprises a plurality of processors that process time-interleaved digital data samples output from respective time-interleaved ADCs to perform edge trigger detection. The processors share edge detection information with one another to increase the speed at which edge trigger detection is performed to enable the digital edge trigger circuit to operate at the full signal bandwidth of the measurement system.
    Type: Grant
    Filed: January 1, 2017
    Date of Patent: January 7, 2020
    Assignee: Keysight Technologies, Inc.
    Inventor: Allen Montijo
  • Patent number: 10527651
    Abstract: The present invention relates to current measurement apparatus 100. The current measurement apparatus 100 comprises a measurement arrangement 110, 114 which is configured to be disposed in relation to a load 108 which draws a current signal, the measurement arrangement being operative when so disposed to measure the load drawn current signal. The current measurement apparatus 100 also comprises a signal source 112 which is operative to apply a reference input signal to the measurement arrangement 110, 114 whereby an output signal from the measurement arrangement comprises a load output signal corresponding to the load drawn current signal and a reference output signal corresponding to the reference input signal.
    Type: Grant
    Filed: March 2, 2018
    Date of Patent: January 7, 2020
    Assignee: Analog Devices Global
    Inventors: Stephen James Martin Wood, Jonathan Ephraim David Hurwitz, Seyed Amir Ali Danesh
  • Patent number: 10527652
    Abstract: An accessory device for low or medium voltage electric applications includes a casing and electronic means including one or more current sensors for detecting current flowing in an electric cable. The top shell of the casing includes an external recess having a cable seat for accommodating the electric cable in a transversal position with respect to the casing. The cable seat has a cable coupling surface adapted to mechanically couple with the electrical cable. The accessory device includes a holder element mechanically coupleable with the top shell in the external recess. The holder element includes one or more holding surfaces. Each of the holding surfaces is overlapped and mechanically coupled with the electric cable, when the holder element is positioned in the external recess in a corresponding accommodating position that is selectable depending on the size of the electric cable.
    Type: Grant
    Filed: June 16, 2016
    Date of Patent: January 7, 2020
    Assignee: ABB Schweiz AG
    Inventors: Stefano Magoni, Giorgio Magno, Massimo Scarpellini
  • Patent number: 10527653
    Abstract: A method includes measuring an impedance of a shunt as a function of frequency and converting the impedance to an admittance in a time domain. The method further includes connecting the shunt in a circuit and measuring voltage data across the shunt over a predetermined interval. The method includes outputting a signal indicative of a current through the shunt derived from the voltage data convolved with the admittance. The method may be implemented in a controller configured to interface with the shunt.
    Type: Grant
    Filed: March 30, 2017
    Date of Patent: January 7, 2020
    Assignee: Ford Global Technologies, LLC
    Inventors: Richard William Kautz, Xi Lu, Zhuxian Xu, Guangyin Lei, Chingchi Chen, Lan Yu, Michael W. Degner
  • Patent number: 10527654
    Abstract: Vertical sense devices in vertical trench MOSFET. In accordance with an embodiment of the present invention, an electronic circuit includes a vertical trench metal oxide semiconductor field effect transistor configured for switching currents of at least one amp and a current sensing field effect transistor configured to provide an indication of drain to source current of the MOSFET. A current sense ratio of the current sensing FET is at least 15 thousand and may be greater than 29 thousand.
    Type: Grant
    Filed: June 27, 2017
    Date of Patent: January 7, 2020
    Assignee: Vishay SIliconix, LLC
    Inventors: M. Ayman Shibib, Wenjie Zhang
  • Patent number: 10527655
    Abstract: An overload monitoring device for an electrical system including a measuring device for current and/or voltage, a time measuring device and an evaluation device connected to the measuring device and the time measuring device being provided, the evaluation device being designed for generating parameters from measured values of the measuring device and/or for detecting an overload situation based on the measured values and/or the parameters using time data of the time measuring device. A method for overload monitoring of an electrical system is also described, measured values being determined for a current and/or a voltage of the electrical system; time data being determined; parameters based on the measured values being generated; and an overload situation being detected based on the measured values and/or the parameters using the time data.
    Type: Grant
    Filed: November 27, 2014
    Date of Patent: January 7, 2020
    Assignee: Robert Bosch GmbH
    Inventors: Werner Schiemann, Ralph Weinmann, Joachim Joos
  • Patent number: 10527656
    Abstract: A battery power table setting method for using battery power efficiently and preventing battery overcharge includes: a first table generation operation for generating a first table by measuring a maximum charging power that prevents an output of a battery from being more than a maximum allowable voltage when the battery having a predetermined SOC value is charged at a predetermined temperature for a predetermined time; a second table generation operation for generating a second table by measuring an SOC value at the time point that the battery reaches the maximum allowable voltage when the battery is charged with a predetermined power value at a predetermined temperature; a third table generation operation for generating a third table by calculating a second maximum charging power according to a predetermined temperature and a predetermined SOC value based on the second table; and a derating table generation operation for generating a derating table.
    Type: Grant
    Filed: October 26, 2017
    Date of Patent: January 7, 2020
    Assignee: LG Chem, Ltd.
    Inventors: Hae In Choi, Jung Soo Kang, Young Bo Cho, Gyong Jin Oh, Jong Bum Lee
  • Patent number: 10527657
    Abstract: An electrical quantity measuring system includes an electrical circuit of an electrical distribution network and an electrical quantity measuring apparatus. The apparatus includes a synchronization module structured to generate a synchronization signal; and a first measurement apparatus connectable to an electrical circuit and structured to receive the synchronization signal and provide a first Fourier transform coefficients representing a first electrical quantity associated with the electrical circuit and a first delay value depending on a time offset between a measurement instant associated with the measure of the first electrical quantity and a reception instant of the synchronization signal at the first measurement apparatus. The measuring apparatus also comprises a processing module structured to process the first Fourier transform coefficients and the first delay value and provide first time-shifted Fourier transform coefficients representing a first synchronized measured electrical quantity.
    Type: Grant
    Filed: April 30, 2018
    Date of Patent: January 7, 2020
    Assignee: ABB S.P.A.
    Inventors: Enrico Ragaini, Emilio Locatelli
  • Patent number: 10527658
    Abstract: Disclosed embodiments relate to a power monitoring system that may include an external power supply source, an energy storage system, a renewable energy source and a distribution board. In some embodiments, the power monitoring system includes the renewable energy source, the energy storage system, the distribution board, a first power metering device, a second power metering device, a third power metering device, a fourth power metering device and a server.
    Type: Grant
    Filed: September 1, 2016
    Date of Patent: January 7, 2020
    Assignee: LSIS CO., LTD.
    Inventor: Sang-Ki Shon
  • Patent number: 10527659
    Abstract: An apparatus for determining a measure of the frequency of an electrical signal is provided. The apparatus is configured to, based on a plurality of samples of the electrical signal, determine a Hilbert transformation to obtain a value for each of the samples of the electrical signal for use as an imaginary representation of each of the samples of the electrical signal and combine each said imaginary representation with a corresponding real representation of the samples of the electrical signal to form a complex representation of the electrical signal; perform a Fourier transform on each said complex representation of the samples of the electrical signal and determine a phase angle therefrom; and determine a measure of the frequency of the electrical signal based on a derivative of the phase angle with respect to time.
    Type: Grant
    Filed: January 20, 2017
    Date of Patent: January 7, 2020
    Assignee: General Electric Technology GmbH
    Inventors: Hengxu Ha, Sankara Subramanian Sri Gopala Krishna Murthi, Xianwu Zeng
  • Patent number: 10527660
    Abstract: According to another aspect a system is provided for detecting a track signal leakage of a track signal on at least one railway track, a track signal being a signal transmitted via the rails of a railway track to detect the presence of a railway vehicle and/or transmit a provide information to a railway vehicle, the at least one railway track comprising at least two adjacent track sections being isolated against each other, the system comprising: a controller according to an embodiment disclosed herein; at least one transmitter for emitting a test signal via a first track section, the at least one transmitter being connected to the controller; and a plurality of receivers for receiving the test signal via one or more track sections, wherein each receiver is associated to at least one track section.
    Type: Grant
    Filed: September 28, 2016
    Date of Patent: January 7, 2020
    Assignee: ALSTOM TRANSPORT TECHNOLOGIES
    Inventor: Pier-Alessandro Aisa
  • Patent number: 10527661
    Abstract: For calculating load resistance, a pulse generation module drives a pulse width modulation (PWM) inverter in response to a control voltage. The PWM inverter includes a U phase pole, a V phase pole, and a W phase pole. Each U, V, and W phase pole includes an upper pole device and a lower pole device. The PWM inverter turns off the U phase pole, turns on the W upper pole device, turns off the W lower pole device, and applies the control voltage to the V upper pole device and the V lower pole device. A forward drop correction module corrects the control voltage based on a feedforward compensation voltage determined from a forward voltage drop. A load resistance module calculates a load resistance for a load based on an average control voltage, an average bus voltage, and an average load feedback current.
    Type: Grant
    Filed: February 7, 2018
    Date of Patent: January 7, 2020
    Assignee: Rockwell Automation Technologies, Inc.
    Inventors: David Leggate, Russel J. Kerkman, Brian J. Seibel
  • Patent number: 10527662
    Abstract: A tester for testing a transformer is provided. The tester comprises a primary voltmeter and a plurality of secondary voltmeters. The tester may also comprise an ammeter in series with a voltage source configured to apply voltage to the transformer. The primary voltmeter is configured to measure voltage induced across a primary winding of the transformer, while the secondary voltmeters may simultaneously measure voltage outputs at secondary windings of the transformer. The tester is configured to calculate ratios, saturation curves, and knee points for multiple winding combinations based on the measurements simultaneously obtained by the ammeter and the primary and secondary voltmeters.
    Type: Grant
    Filed: September 25, 2017
    Date of Patent: January 7, 2020
    Assignee: AVO Multi-Amp Corporation
    Inventors: David Hembree Milner, John Leonard Shanks, Harvey Wayne Veselka, Jr.
  • Patent number: 10527663
    Abstract: A forward-backward Kalman filter for estimating phase noise present in a received signal. Both the forward and backward Kalman filters use hard-decision measurements of the received symbols. The phase noise estimate from the forward Kalman filter is used as a coarse phase noise estimate for the backward Kalman filter and vice versa. The final phase noise estimate is an optimal combination of the forward phase noise estimate and backward phase noise estimate.
    Type: Grant
    Filed: March 12, 2015
    Date of Patent: January 7, 2020
    Assignee: TEXAS INSTRUMENTS INCORPORATED
    Inventor: Mohamed Mansour
  • Patent number: 10527664
    Abstract: The present application provides a noise source analysis method including measuring a noise using voltage sensors 2a and 2b which are time-synchronized with each other and making an analysis to identify a noise source which is a cause of noise based on data of the noise measured by the voltage sensors 2a and 2b.
    Type: Grant
    Filed: May 29, 2015
    Date of Patent: January 7, 2020
    Assignee: TOSHIBA MITSUBISHI-ELECTRIC INDUSTRIAL SYSTEMS CORPORATION
    Inventors: Shigehiko Matsuda, Norihiro Suzuki, Noriyuki Maehata
  • Patent number: 10527665
    Abstract: A method for predicting noise propagation in a circuit comprising correlating noise results predicted by a circuit model to a transistor level model with a processor, generating a first best fit data analytics model for identifying the optimal output pin capacitance as a function of circuit conditions and store the first best fit model in a noise rule file in a memory, generating a second best fit data analytics model for predicting noise peak output from the circuit model as a function of the circuit conditions and store the second best fit model in the noise rule file in the memory, and applying the first best fit model and the second best fit model in a noise analysis simulation to identify and simulate an optimal circuit.
    Type: Grant
    Filed: March 20, 2019
    Date of Patent: January 7, 2020
    Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Steven Kurtz, Ronald D. Rose, Sanjay Upreti
  • Patent number: 10527666
    Abstract: A method determines a fault location in a fault on an electric line. Accordingly first reference voltage values are determined by current and voltage sampled values at a first line end and an impedance of the line. Second reference voltage values are determined by current and voltage sampled values at a second line end and the impedance. Fictitious first reference voltage values are calculated using a wave guiding model, describing the wave response of the line, with the first reference voltage values. The fictitious first reference voltage values, in the fault-free case, correspond to the second reference voltage values at the second line end. Fictitious second reference voltage values are calculated with the second reference voltage values. The fault location is determined by the first and second reference voltage values and the first and second fictitious reference voltage values.
    Type: Grant
    Filed: November 21, 2016
    Date of Patent: January 7, 2020
    Assignee: Siemens Aktiengesellschaft
    Inventor: Andreas Jurisch
  • Patent number: 10527667
    Abstract: Method and device for detecting the process corner of a transistor are provided. The process corner detection method includes providing a ring oscillator. The ring oscillator includes an odd number of oscillation units connected in series and an output port of one of the oscillation units serves as the output port of the ring oscillator to output an oscillation signal. Each oscillation unit is constructed based on a PMOS transistor and an NMOS transistor. The process corner detection method further includes measuring the period of the oscillation signal and the maintaining time of the oscillation signal at a high level and a low level in each cycle; and determining the process corner of the PMOS transistor and the NMOS transistor in the oscillation unit based on the period of the oscillation signal and the maintaining time of the oscillation signal at a high level and a low level in each cycle.
    Type: Grant
    Filed: February 20, 2018
    Date of Patent: January 7, 2020
    Assignees: Semiconductor Manufacturing International (Shanghai) Corporation, Semiconductor Manufacturing International (Beijing) Corporation
    Inventors: Cheng-Tai Huang, Chia Chi Yang, Chen-Yi Huang
  • Patent number: 10527668
    Abstract: An apparatus for predicting a future state of an electronic component is provided. The apparatus includes a measuring unit configured to measure a waveform of a signal related to the electronic component. Further, the apparatus includes a processing unit configured to calculate a predicted value of a characteristic of the electronic component based on a reliability model of the electronic component using the waveform of the signal.
    Type: Grant
    Filed: June 21, 2016
    Date of Patent: January 7, 2020
    Assignee: Intel IP Corporation
    Inventors: Leonhard Heiss, Andreas Lachmann, Reiner Schwab
  • Patent number: 10527669
    Abstract: An IC device 4 of the present invention includes a robot arm 6 for conveying IC devices D to a test head 2 for testing the IC devices. The test head 2 includes sockets 3 having placement surfaces 3a onto which the IC devices D are placed and for attaching the IC devices placed on the placement surfaces to the test head. The robot arm 6 includes a contact head 61 for holding the IC devices while the IC devices are conveyed and for pressing the IC devices onto the test head during testing, and a non-contact displacement meter 71 that moves in association with the movement of the contact head 61. The non-contact displacement meter 71 is mounted on the robot arm 6 so as to measure a distance by emitting a beam in a direction perpendicular to the placement surfaces 3a.
    Type: Grant
    Filed: August 31, 2015
    Date of Patent: January 7, 2020
    Assignee: HappyJapan, Inc.
    Inventors: Shouhei Matsumoto, Shinichi Hasebe, Mitsuo Koizumi, Yoshinori Arai, Masayoshi Yokoo, Keitaro Harada
  • Patent number: 10527670
    Abstract: Integrated (IC) package testing systems and methods for testing an IC package are provided herein that accommodate IC packages having different die heights. In one example, the IC package testing system includes a test fixture base, a socket, and a test fixture head. The socket is disposed on the test fixture base and configured to receive an IC package for testing. The test fixture head is movable towards and away from the base. The test fixture head includes a base plate and a plurality of independently movable pushers. The plurality of pushers are configured to engage the IC package disposed the socket.
    Type: Grant
    Filed: March 28, 2017
    Date of Patent: January 7, 2020
    Assignee: XILINX, INC.
    Inventors: Gamal Refai-Ahmed, Ivor G. Barber, Suresh Ramalingam, Jaspreet Singh Gandhi, Tien-Yu Lee, Henley Liu, David M. Mahoney, Mohsen H. Mardi
  • Patent number: 10527671
    Abstract: An absorption testing apparatus supports a carrier board and includes a supporting platform, an electrically conductive component, a sealing ring and an electrical probe. The supporting platform has opposite top and bottom surfaces and a pathway penetrating through the top and bottom surfaces. The electrically conductive component, having a plate and elastic arms, is located in the pathway and is embedded in the supporting platform to divide the pathway into absorption and accommodating areas that are isolated by the plate. The elastic arms penetrate through the plate. The sealing ring, on the top surface, surrounds the absorption area and supports the carrier board. Each elastic arm has one end in the absorption area, electrically connecting to the carrier board. The electrical probe is located in the pathway and includes a body and probe heads. Each elastic arm has another end in the accommodating area, electrically connecting to the probe heads.
    Type: Grant
    Filed: December 18, 2017
    Date of Patent: January 7, 2020
    Assignee: CHROMA ATE INC.
    Inventor: Po-Kai Cheng
  • Patent number: 10527672
    Abstract: Disclosed herein is circuitry for bypassing a medium voltage regulator during testing. The circuitry includes a low voltage regulator to, in operation, generate a first voltage within a first voltage range for powering first circuitry, and a medium voltage regulator to, in operation, generate a second voltage within a second voltage range greater than the first voltage range for powering second circuitry. A low voltage regulator bypass circuit generates a low voltage regulator bypass signal that operates to selectively bypass the low voltage regulator. A medium voltage regulator bypass circuit bypasses the medium voltage regulator as a function of the low voltage regulator bypass signal and an external voltage regulator select signal, the bypass of the medium voltage regulator being such that an external voltage can be applied to the second circuitry.
    Type: Grant
    Filed: September 22, 2017
    Date of Patent: January 7, 2020
    Assignee: STMicroelectronics International N.V.
    Inventors: Venkata Narayanan Srinivasan, Srinivas Dhulipalla
  • Patent number: 10527673
    Abstract: A hardware debug system includes a target chip comprising one or more target chip registers and one or more target chip ports, wherein at least one of the one or more target chip ports is used as a target chip debug port, and a debug host with one or more debug host ports, wherein at least one of the one or more debug host ports is connected to the target chip debug port via a hardware debug bus, wherein the debug host is configured to load at least one target chip setting into the one or more target chip registers that enables the target chip to boot via the hardware debug port using the hardware debug bus.
    Type: Grant
    Filed: June 15, 2017
    Date of Patent: January 7, 2020
    Assignee: Microsoft Technology Licensing, LLC
    Inventors: Garrett D. Blankenburg, Michael Gordon Love
  • Patent number: 10527674
    Abstract: Embodiments include techniques for using circuit structures for resolving random testability, the techniques includes analyzing a logic structures of a circuit design, and identifying the logic structures of the circuit that are random resistant structures. The techniques also include replacing the logic structures with random testable structures, and performing a test of the circuit design.
    Type: Grant
    Filed: August 21, 2017
    Date of Patent: January 7, 2020
    Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Raghu G. GopalaKrishnaSetty, Mary P. Kusko, Spencer K. Millican
  • Patent number: 10527675
    Abstract: A motor driving device includes: an insulation resistance measuring unit configured to measure insulation resistance of a motor selected as a measurement target to thereby measure the insulation resistance of each of the multiple motors; a measurement interrupting unit configured to interrupt measurement of insulation resistance if a measurement interrupt condition is established; a storage unit configured to store information indicating the motor selected as the measurement target at the time of interruption of the measurement of insulation resistance; and a measurement resuming unit configured to, when measurement is resumed, resume measurement of the insulation resistance sequentially from the motor that had been selected as the measurement target when the measurement was interrupted, based on the information stored in the storage unit.
    Type: Grant
    Filed: December 3, 2018
    Date of Patent: January 7, 2020
    Assignee: FANUC CORPORATION
    Inventors: Norihiro Chou, Youichirou Ooi
  • Patent number: 10527676
    Abstract: An abnormality diagnosing device diagnoses a driving abnormality of a single motor driven by a plurality of motor driving devices. The motor driving devices drive the motor by supplying three-phase alternating currents to a plurality of three-phase windings possessed by the motor. The abnormality diagnosing device is equipped with a rotational speed acquisition unit for acquiring a rotational speed value of the motor, a current acquisition unit for acquiring phase current values of respective phases flowing through the three-phase windings, and a determination unit for determining the presence of an abnormality, if an absolute value of the rotational speed value exceeds a predetermined value, and an absolute value of the phase current value of any one phase of the three-phase windings is less than a threshold value continuously for a predetermined time period.
    Type: Grant
    Filed: May 1, 2018
    Date of Patent: January 7, 2020
    Assignee: FANUC CORPORATION
    Inventors: Yuuki Morita, Tadashi Okita, Kenji Takahashi
  • Patent number: 10527677
    Abstract: A battery state estimation apparatus estimates a state of a secondary battery based on a battery model thereof. The battery model includes a DC resistance model, a reaction resistance model, and a diffusion resistance model. The apparatus includes a DC information storage section which stores information on the DC resistance related to temperature of the secondary battery, a reaction information storage section which stores information on the reaction resistance parameter related to the temperature, a diffusion information storage section which stores information on each of the first and second parameters related to the temperature, and a state estimation section which calculates the DC resistance, the reaction resistance parameter, and the first and second parameters from the stored information, by using the temperature as input, and estimates the state of the secondary battery based on the DC resistance, reaction resistance parameter, and first and second parameters.
    Type: Grant
    Filed: October 9, 2015
    Date of Patent: January 7, 2020
    Assignee: DENSO CORPORATION
    Inventors: Toshiyuki Kawai, Keiichi Kato, Yuuji Koike
  • Patent number: 10527678
    Abstract: An apparatus and method for estimating state information of a battery are provided. The apparatus may estimate the state information from information, obtained by classifying and preprocessing battery information measured by a battery management system (BMS), using a pre-trained battery degradation model.
    Type: Grant
    Filed: January 7, 2016
    Date of Patent: January 7, 2020
    Assignee: Samsung Electronics Co., Ltd.
    Inventor: Sun-Jae Lee
  • Patent number: 10527679
    Abstract: The present invention provides an improved method for detecting the state of charge (SOC) of a battery. A remaining capacity detection circuit detects the SOC of a rechargeable battery. A coulomb counter circuit integrates the charge and discharge currents IBAT of the battery to generate a coulomb count value CC. A voltage detection circuit detects a voltage VBAT of the battery. An SOC calculation unit calculates a raw SOC value SOC_cc based on the coulomb count value CC. A discharge correction unit corrects the raw SOC value SOC_cc based on a voltage drop of the battery during the discharging of the battery, and generates a discharge SOC value SOC_dis. A charge correction unit measures a minimum value SOC_dis_min reached by the discharge SOC value SOC_dis during the last discharge of the battery, and calculates a charge SOC value SOC_chg using the minimum value SOC_dis_min during the charging of the battery.
    Type: Grant
    Filed: September 19, 2017
    Date of Patent: January 7, 2020
    Assignee: ROHM CO., LTD.
    Inventor: Takahiro Shimizu
  • Patent number: 10527680
    Abstract: Systems (50, 200) and methods for determining a state of charge of a battery (52, 102, 150, 202) are provided. The system (50, 200) includes a power source (56, 206) configured to provide a charging current to a battery (52, 102, 150, 202). A controller (54, 104, 204) is included and configured to determine a state of charge of the battery (52, 102, 150, 202) based on impedance of a battery (52, 102, 150, 202) during a discharge time period based on an impedance and a state of charge relationship of a battery (52, 102, 150, 202) during a charge time period.
    Type: Grant
    Filed: November 15, 2016
    Date of Patent: January 7, 2020
    Assignee: Texas Insturments Incorporated
    Inventor: Chidong Yao
  • Patent number: 10527681
    Abstract: It is an object of an embodiment to provide a degradation estimator for an energy storage device, configured to estimate degradation of the energy storage device, an energy storage apparatus, an input-output control device for the energy storage device, and a method for controlling input and output of the energy storage device. The embodiment includes estimating a temporary power decrease rate of the energy storage device in accordance with at least one of an average load, a maximum load, and a ?SOC obtained from detected current of the energy storage device and detected temperature of the energy storage device.
    Type: Grant
    Filed: March 30, 2016
    Date of Patent: January 7, 2020
    Assignee: GS YUASA INTERNATIONAL LTD.
    Inventors: Kazuki Furukawa, Hiroki Matsui, Seijiro Ochiai, Takaaki Iguchi
  • Patent number: 10527682
    Abstract: A system and method for detecting a magnetic field generated by a magnetic field source located in a circuit. A magnetometer array generates data regarding an activity of the source. A computing device executes a magnetic beamforming data processing program including a hybrid model which receives data generated by the array and detects the magnetic field generated by the source. The hybrid model is based on a weighted sum of contributions to the magnetic field, which include a first modelled magnetic field contribution generated by a current dipole aligned with an axis of the source, and a second modelled magnetic field contribution generated by a loop current flowing around the axis. Weighting factors are applied to the modelled fields, and then the weighted modelled fields are summed to produce the hybrid model. The weighting factors can be adjusted to emphasize the contribution of one modelled field over the other.
    Type: Grant
    Filed: September 27, 2018
    Date of Patent: January 7, 2020
    Assignee: Honeywell Federal Manufacturing & Technologies, LLC
    Inventor: Paul Jeffrey DeRego